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1、a Date: 27 November 2006 Origin: International Latest date for receipt of comments: 2 February 2007 Project no.: 2006/01389 Responsible committee: GEL/210/8 EMC - Low frequency standards Interested committees: Title: Draft IEC 61000-4-30 ED.2 : Electromagnetic compatability (EMC) - Part 4 -30: Testi
2、ng and measurment techniques- Power quality measurement method s Supersession information: If this document is published as a standard, the UK implementation of it will supersede BSEN61000-4-30 : 2003 and partially supersede NONE . If you are aware of a current national standard which may be affecte
3、d, please notify the secretary (contact details below). WARNING: THIS IS A DRAFT AND MUST NOT BE REGARDED OR USED AS A BRITISH STANDARD. THIS DRAFT IS NOT CURRENT BEYOND 2 February 2007. This draft is issued to allow comments from interested parties; all comments will be given consideration prior to
4、 publication. No acknowledgement will normally be sent. See overleaf for information on commenting. No copying is allowed, in any form, without prior written permission from BSI except as permitted under the Copyright, Designs and Patent Act 1988 or for circulation within a nominating organization f
5、or briefing purposes. Electronic circulation is limited to dissemination by e-mail within such an organization by committee members. Further copies of this draft may be purchased from BSI Customer Services, Tel: +44(0) 20 8996 9001 or email ordersbsi-. British, International and foreign standards ar
6、e also available from BSI Customer Services. British Standards on CD or Online are available from British Standards Publishing Sales Limited. Tel: 01344 404409 or email bsonlinetechindex.co.uk. Information on the co-operating organizations represented on the committees referenced above may be obtain
7、ed from the responsible committee secretary. Cross-references The British Standards which implement International or European publications referred to in this draft may be found via the British Standards Online Service on the BSI web site http:/www.bsi-. Direct tel: 020 8996 7205 Responsible Committ
8、ee Secretary: Mr A Ashrafi (BSI) E-mail: asghar.ashrafibsi- Draft for Public Comment Head Office 389 Chiswick High Road London W4 4AL Telephone: +44(0)20 8996 9000 Fax: +44(0)20 8996 7001 Form 36 Version 6.1 DPC: 06/30159310 DC Licensed Copy: London South Bank University, London South Bank Universit
9、y, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI b Introduction This draft standard is based on international discussions in which the UK has taken an active part. Your comments on this draft are welcome and will assist in the preparation of the consequent standard. If no comments a
10、re received to the contrary, then the UK will approve this draft. There is a high probability that this text could be adopted by CENELEC as a reference document for harmonization or as a European Standard. Recipients of this draft are requested to comment on the text bearing in mind this possibility
11、. UK Vote Please indicate whether you consider the UK should submit a negative (with reasons) or positive vote on this draft. Submission The guidance given below is intended to ensure that all comments receive efficient and appropriate attention by the responsible BSI committee. Annotated drafts are
12、 not acceptable and will be rejected. All comments must be submitted, preferably electronically, to the Responsible Committee Secretary at the address given on the front cover. Comments should be compatible with Version 6.0 or Version 97 of Microsoft Word for Windows, if possible; otherwise comments
13、 in ASCII text format are acceptable. Any comments not submitted electronically should still adhere to these format requirements. All comments submitted should be presented as given in the example below. Further information on submitting comments and how to obtain a blank electronic version of a com
14、ment form are available from the BSI web site at:http:/www.bsi- Template for comments and secretariat observations Date: xx/xx/200x Document: ISO/DIS xxxxx 1 2 (3) 4 5 (6) (7) MB Clause No./ Subclause No./ Annex (e.g. 3.1) Paragraph/ Figure/Table/ Note (e.g. Table 1) Type of com- ment Comment (justi
15、fication for change) by the MB Proposed change by the MB Secretariat observations on each comment submitted 3.1 Definition 1 ed Definition is ambiguous and needs clarifying. Amend to read . so that the mains connector to which no connection . 6.4 Paragraph 2 te The use of the UV photometer as an alt
16、ernative cannot be supported as serious problems have been encountered in its use in the UK. Delete reference to UV photometer. Microsoft and MS-DOS are registered trademarks, and Windows is a trademark of Microsoft Corporation. Licensed Copy: London South Bank University, London South Bank Universi
17、ty, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI FORM CD (IEC) 2002-08-08 77A/552/CD COMMITTEE DRAFT (CD) IEC/TC or SC: 77A Project number 61000-4-30 Ed.2 Title of TC/SC: EMC : Low frequency phenomena Date of circulation 2006-11-24 Closing date for comments 2007-03-02 Also of inter
18、est to the following committees TC 85 Supersedes document 77A/539/CD, 77A/548/CC Functions concerned: Safety EMC Environment Quality assurance Secretary: Herv ROCHEREAU THIS DOCUMENT IS STILL UNDER STUDY AND SUBJECT TO CHANGE. IT SHOULD NOT BE USED FOR REFERENCE PURPOSES. RECIPIENTS OF THIS DOCUMENT
19、 ARE INVITED TO SUBMIT, WITH THEIR COMMENTS, NOTIFICATION OF ANY RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE AND TO PROVIDE SUPPORTING DOCUMENTATION. Title: IEC 61000-4-30 Ed.2: Electromagnetic compatibility (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods (Ti
20、tre) : CEI 61000-4-30 Ed.2 : Compatibilit lectromagntique (CEM) Partie 4-30 : Techniques dessai et de mesure Mthodes de mesure de la qualit de lalimentation Introductory note Copyright 2006 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this electron
21、ic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions. You may not copy or “mirror“ the file or printed version of the document, or any part of it, for any other purpose without permission in writing from IEC. Licensed Copy: London South
22、Bank University, London South Bank University, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 61000-4-30/Ed 2/2CD IEC 2 77A/552/CD CONTENTS 1 Scope.5 2 Normative references5 3 Definitions 6 4 General 10 4.1 Classes of measurement performance.10 4.2 Organization of the measurements.10
23、 4.3 Electrical values to be measured11 4.4 Measurement aggregation over time intervals 11 4.5 Measurement aggregation algorithm 11 4.6 Time-clock uncertainty.13 4.7 Flagging concept .13 5 Power quality parameters14 5.1 Power frequency14 5.2 Magnitude of the supply voltage.14 5.3 Flicker .15 5.4 Sup
24、ply voltage dips and swells.16 5.5 Voltage interruptions18 5.6 Transient voltages .19 5.7 Supply voltage unbalance 19 5.8 Voltage harmonics.20 5.9 Voltage interharmonics 20 5.10 Mains signalling voltage on the supply voltage .21 5.11 Rapid voltage changes.22 5.12 Measurement of underdeviation and ov
25、erdeviation parameters.22 6 Uncertainty, measurement ranges, and influence quantities.23 6.1 Table R Summary of Requirements.23 6.2 Range of influence quantities.24 6.3 Steady-state performance verification 24 Annex A (informative) Power quality measurements Issues and guidelines.26 A.1 Installation
26、 precautions26 A.2 Transducers 29 A.3 Transient voltages and currents.31 A.4 Rapid voltage changes.34 A.5 Current34 A.6 Guidelines for contractual applications of power quality measurements 37 A.7 Trouble-shooting applications 41 A.8 Statistical survey applications (see Annex B)42 A.9 Voltage dip ch
27、aracteristics.42 Annex B (informative) Guidance for Statistical Power Quality Surveys using Class S Measurement Methods45 B.1 Considerations 45 B.2 Locations and types of surveys 47 B.3 Connections and quantities to measure48 B.4 Selecting the monitoring thresholds and monitoring period .50 B.5 Stat
28、istical analysis of the measured data50 Annex C (informative) Guidance for Certificates based on this Standard 53 Bibliography54 Licensed Copy: London South Bank University, London South Bank University, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 61000-4-30/Ed 2/2CD IEC 3 77A/552
29、/CD INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national
30、electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their
31、 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates
32、 closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on t
33、he relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards, technical specifications, technical reports or guides and they
34、are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standa
35、rd and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any instrument declared to be in conformity with one of its standards. 6) Attention is drawn to th
36、e possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-30 has been prepared by subcommittee 77A: Low- frequency phenomena, of I
37、EC technical committee 77: Electromagnetic compatibility. This standard forms part 4-30 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. The text of this standard is based on the following documents: FDIS Report on voting 77A/XX/FDIS 77A/XX/RVD Full inform
38、ation on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until 20
39、05. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. Licensed Copy: London South Bank University, London South Bank University, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 61000-4-30/Ed 2/2CD IEC 4 77A/552/CD INTRODUCTION IEC
40、 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits
41、Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and device
42、s Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards or as Technical Specifications or Technical Reports, some of which have already been published as sections. Others will be published with the part number
43、followed by a dash and completed by a second number identifying the subdivision (example: 61000-6-1). Licensed Copy: London South Bank University, London South Bank University, Sun Dec 24 04:26:06 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 61000-4-30/Ed 2/2CD IEC 5 77A/552/CD ELECTROMAGNETIC COMPATI
44、BILITY (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods 1 Scope This part of IEC 61000-4 defines the methods for measurement and interpretation of results for power quality parameters in 50/60 Hz a.c. power supply systems. This standard addresses measurement meth
45、ods for in situ measurements. Measurement of parameters covered by this standard is limited to those phenomena that can be conducted in a power system. These include the voltage and/or current parameters, as appropriate. The power quality parameters considered in this standard are power frequency, m
46、agnitude of the supply voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage and current harmonics and interharmonics, mains signalling on the supply voltage and rapid voltage changes. Depending on the purpose of the measuremen
47、t, all or a subset of the phenomena on this list may be measured. This standard defines three Classes of measurement methods: Class A: Any two instruments that use the methods of Class A will, when connected to the same signals, produce the same results within the measurement uncertainty. The measur
48、ements will be reliable, repeatable and comparable results regardless of the compliant instrument being used and regardless of its environmental conditions. Class S: Instruments that use the methods of Class S will produce useful and comparable information for statistical applications such as survey
49、s, and will generally be less expensive than instruments that use Class A methods. Class B: Instruments that use the methods of Class B will produce useful information. This Class is primarily intended to avoid making many existing instruments obsolete. This standard is a performance specification, not a design specification. The uncertainty tests in the ranges of influence quantities