《BS-CECC-51001-1987.pdf》由会员分享，可在线阅读，更多相关《BS-CECC-51001-1987.pdf（22页珍藏版）》请在三一文库上搜索。
1、BRITISH STANDARD BS CECC 51001:1987 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Mercury wetted change-over contact units, magnetically biased Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00
2、:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 BSI 12-1999 ISBN 0 580 35652 3 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC
3、51001:1987 BSI 12-1999i Contents Page National forewordii Forewordiii Text of CECC 510011 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 ii BSI 12-1999 National foreword This British Standar
4、d has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 51001:1986 “Harmonized system of quality assessment for electronic components. Blank detail specification: Mercury wetted change-over contact
5、units, magnetically biased”. This standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not ide
6、ntical with those used in British Standards; attention is drawn especially to the following: The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CEC
7、C 00100 is BS 9000 “General requirements for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as m
8、andatory requirements in accordance with BS CECC 51000 in any detail specification for these devices. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take precedence, except that the front page layout
9、 shall be in accordance with BS 9000 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from
10、 legal obligations. International StandardCorresponding British Standard CECC 19000:1978BS CECC 19000:1979 Harmonized system of quality assessment for electronic components: Generic specification: Dry reed make contact units (Identical) CECC 51000:1985BS CECC 51000:1986 Harmonized system of quality
11、assessment for electronic components: Generic specification: Mercury wetted change-over contact units, magnetically biased (Identical) IEC 410:1973BS 6001:1972 Sampling procedures for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside
12、front cover, pages i and ii, the CECC title page, pages ii to vi, pages 1 to 10 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank Un
13、iversity, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 ii BSI 12-1999 Contents Page Forewordiii
14、 1Ratings1 2Characteristics1 3Qualification approval test schedule2 4Quality conformance inspection test schedule2 5Test system2 6Marking2 7Certified test records2 8Ordering information2 9Related documents2 102 Appendix 110 Table 1 Single schedule for qualification approval3 Table 2 Quality conforma
15、nce inspection6 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 BSI 12-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the Europea
16、n Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electr
17、onic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for
18、those countries taking part in the System who wish to issue national harmonized specifications for MERCURY WETTED CHANGE-OVER REED CONTACT UNITS MAGNETICALLY BIASED. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification was prepare
19、d by Working Group 19: “Reed contact devices”. It is one of a series of blank detail specifications all relating to the generic specification printed as CECC 51000. The text of this specification was circulated to the CECC for voting in the document listed below, and was ratified by the President of
20、 the CECC for publication as a CECC specification. DocumentVoting DateReport on the Voting CECC(Secretariat)1648November 1984CECC(Secretariat)1755 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1
21、987 iv BSI 12-1999 Key for page v The numbers in brackets on page v correspond to the following indications which shall be given: Identification of the detail specification (1) The name of the National Standards Organization under whose authority the detail specification is published, and, if applic
22、able, the organization from whom the specification is obtainable. (2) The CECC symbol and the number alloted to the detail specification by the CECC General Secretariat. (3) The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different.
23、(4) If different from the CECC number, the national number of the detail specification, date of issue and any further information required by the national system, together with any amendment numbers. Identification of the reed contact unit (5) A short description of the type of reed make contact uni
24、t (6) Information on typical construction (see examples given on page v) (7) Quick reference data (see examples given on page v) and quality assessment level. (8) Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international doc
25、uments for outlines. For (5) and (6), the text given should be suitable for an entry in CECC 00200 or CECC 00300. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 BSI 12-1999v When a dimension
26、, rating or characteristic is not supported by a test in test schedules 1 or 2, it shall be indicated as “not for inspection purposes”. Full information shall also be given in an Appendix to the Detail Specification, on how this dimension, rating or characteristic is derived. Specification available
27、 fromPage of CECC 51001-XXX (1)(2) Electronic components of assessed quality. Detail specification in accordance with (3)(4) DETAIL SPECIFICATION FOR mercury wetted change-over reed contact units magnetically biased.(5) STYLE: wire terminations; round or flat for welding or soldering with the termin
28、al finish being a maximum of l6 from the seal end material of envelope material of blades contact material : : : mercury (6) Function: (7)Outline and dimensional data:(8) General applications Dimensions in millimetres (*) If not round give cross-section. Assessment level: I, II, III (See Clause Page
29、 2) NOTE 1bend or cut not permitted within mm from the seal end NOTE 2requirements for concentricity may be added to the Guide for visual inspection of Appendix 1. Information about manufacturers who have components qualified according to this specification is available in the current CECC 00200: Qu
30、alified Products List Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI vi blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (
31、c) BSI BS CECC 51001:1987 BSI 12-19991 1 Ratings 1.1 Contact rating resistive load 1) Contact Voltage and contact current 2) Rated load and life expectancy at ambient temperature, 50 % duty cycle and operations per s. 1.2 Insulation resistance .M7 min. 1.3 Maximum voltage across open contact circuit
32、s .V d.c. (*) 1.4 Environmental category ./ /. 2 Characteristics 2.1 2.2 The values indicated by (*) cover the total range of operate and release values. Subdivisions of this total range may be given under the same Detail Specification number, with graphs or tables indicating the relationship betwee
33、n these five values. Every subdivision shall fulfil all the other requirements of the Detail Specification. a.c. :. V max A max VA max. d.c. :. V max A max VA max. . V min mA min. a.c. :. VA max. atV max. . operations d.c. :. VA max. atV max. . operations a.c. :. VA max. atI max. . operations d.c. :
34、. VA max. atI max. . operations d.c. :at V min. andI min. operations 1)Mounting: preferred position: mounting position restricted at . . 2)Saturate value.A (Ampre-turns) 3)Must-release value.A (Ampre-turns) (*) 4)Must-operate value.A (Ampre-turns) (*) 5)Contact circuit resistance: initial value for
35、both contact circuits.ohm max. 6)Mass.g * See 2.2, page 1 1)Must-not-release value.A (Ampre-turns) (*) 2)Must-not-operate value.A (Ampre-turns) (*) 3)Characteristic non release value.A (Ampre-turns) 4)Operate time.ms max. 5)Release time.ms max. 6)Bounce time at operate on make contact.ms max. 7)Boun
36、ce time at release on break contact.ms max. 8)Magnetic dwell.A (Ampre-turns)max. 9)Transfer time or bridging time.ms max. .ms min. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 2 BSI 12-199
37、9 3 Qualification approval test schedule The tests and inspections performed shall be those prescribed in Table 1 or Table 2 (see 3.3.3 of CECC 19000). These should be read in conjunction with Generic specifications CECC 19000, CECC 51000 and the appropriate IEC publications. Samples which have been
38、 subjected to destructive tests shall not be delivered to the customer, even if they pass all the post test inspection requirements. 4 Quality conformance inspection test schedule The change-over reed contact units covered by this specification shall be tested to the inspection schedule given in Tab
39、le 2. These should be read in conjunction with Generic specification CECC 19000, CECC 51000 and the appropriate IEC publications. Samples which have been subjected to destructive tests shall not be delivered to the customer, even if they pass all the post test inspection requirements. Sampling for p
40、eriodic tests: samples shall be representative of the whole production period 5 Test system The CECC test system number and the position of the reed contact unit within the test system shall be specified in the relevant detail specification. (See Annex A of CECC 51000) 6 Marking The package shall be
41、 marked with the following: 1) The number of the relevant detail specification 2) The date code 3) The manufacturers factory and identification code 4) Details of the ampere-turn sensitivity (ies) (if required by the detail specification) 7 Certified test records (C T R) The C T R shall give the inf
42、ormation from all A,B,C and D-tests in Table 2. 8 Ordering information Orders for reed contact units covered by this specification shall make reference to the number of the relevant detail specification. 9 Related documents CECC 19000, Dry reed make contact units Generic specification. CECC 51000, M
43、ercury wetted reed change-over contact units magnetically biased. (National Authorized Institutions will complete this section, making reference to any documents, recommendations or specifications directly referred to in their national equivalent of this document.) 10 This blank detail specification
44、 covers three assessment levels. Assessment level III corresponds to the highest quality. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:1987 BSI 12-19993 Table 1 Single schedule for qualificatio
45、n approval Test procedures 1.Group 0: all the specimens + spares are submitted to all tests mentioned in Group 0 in the given order 2.Each further group uses specimens accepted by test Group 0, possibly complemented by those spares passing Group 0 3.For each group of tests the same specimens are use
46、d and the tests are performed in the given order 4.Defectives are replaced by spares before carrying out the next test in the group. Inspection D(*) or ND CECC 51000 reference and conditions of test Assessment levels Performance requirements (CECC 51000 reference unless otherwise stated) IIIIII n *
47、c * n * c * n * c * Group 0ND 4.4Visual inspection as in 4.480 + 30 5125 + 30 5200 + 30 7As listed in Appendix 1 of this detail specification 4.4Dimensionsas in 4.4 gauges 553See outline and dimensional data of page v + seal eccentricity 4.10Operate release and bounce transfer or bridging time as in
48、 4.10 (4.10.1 and 4.10.3 of CECC 19000) 333as in 4.10 (4.10.2 of CECC 19000) 4.5Functional test as in 4.5 (4.5.1 and 4.5.3 of CECC 19000) 332as in 4.5 (4.5.2 of CECC 19000) 4.8Voltage testas in 4.8 (4.8.1 and 4.8.3 of CECC 19000) 222as in 4.8 (4.8.2 of CECC 19000) 4.9Insulation test as in 4.9 (4.9.1
49、 and 4.9.3 of CECC 19000) 553as in 4.9 (4.9.2 of CECC 19000) 4.22Sealingas in 4.22 method 1 (4.22.1 and 4.22.3 of CECC 19000) or 4.22 method 2 221as in 4.22 Total number of defectives permitted in Group 0101010 Group 1D 4.13Solderabilityas in 4.13 4.13.1 1) and 4.13.3 of CECC 19000 322321321as in 4.13 (4.13.2 of CECC 19000) 4.11Contact sticking as in 4.11.1532as in 4.11.1 * See note 2 on page 10 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:47 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 51001:198