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1、BRITISH STANDARD BS QC 400102:1992 IEC 115-2-2: 1992 Specification for Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification Fixed low-power non-wirewound resistors Assessment level F Licensed Copy: London South B
2、ank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-1999 ISBN 0 580 35647 7 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08
3、 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-1999i Contents Page National forewordii Introduction1 Section 1. General data2 1General data2 Section 2. Inspection requirements3 2Inspection requirements3 Table I2 Table II4 Licensed Copy: London South Bank University, Lo
4、ndon South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with IEC 115-2-2:
5、1992 (QC 400102) “Fixed resistors for use in electronic equipment. Part 2: Blank detail specification: Fixed low-power non-wirewound resistors. Assessment level F”, published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ System of quality as
6、sessment for electronic components. IEC 115-2-2 was prepared by IEC Technical Committee No. 40, Capacitors and resistors for electronic equipment, and the United Kingdom participation in the drafting was provided by Technical Committee ECL/4, Capacitors and resistors for electronic equipment. Scope.
7、 This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS QC 400100 in any detail specifications for these components. The British Standard which implements the IECQ Rules of Procedure is BS 9000 “General req
8、uirements for a system for electronic components of assessed quality” Part 3:1991 “Specification for the national implementation of the IECQ System”. The Technical Committee has reviewed the provisions of IEC 410 to which reference is made in the text and has decided that they are acceptable for use
9、 in conjunction with this standard. Detail Specification. Detail specifications shall comply with the requirements of this Blank Detail Specification and BS QC 001002:1991 “Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ)”. A British Standard does not purport
10、to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International StandardCorresponding British Standard IEC 115
11、-1:1982 (QC 400000) BS QC 400000:1990 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Generic specification (Identical) IEC 115-2:1982 (QC 400100) BS 9940 Harmonized system of quality assessment for electronic components. Fixed resi
12、stors for use in electronic equipment Part 01.0:1983: Sectional specification for fixed low-power non-wirewound resistors (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 8 and a back cover. This standard has been updated (see copy
13、right date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-19991 Intr
14、oduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered
15、 as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause 1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the following information
16、 which shall be inserted in the position indicated. Identification of the detail specification 1) The “International Electrotechnical Commission” or the National Standards Organisation under whose authority the detail specification is drafted. 2) The IEC or National Standards number of the detail sp
17、ecification, date of issue and any further information required by the national system. 3) The number and issue number of the IEC or national Generic Specification. 4) The IEC number of the blank detail specification. Identification of the resistor 5) A short description of the type of resistor. 6)
18、Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7) Outline drawing with main dimensions which are of importance for interchangeability and/or
19、 reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8) Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be
20、selected from the sectional specification, Sub-clause 3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9) Reference data on the most important properties, to allow comparison between
21、 the various resistor types. (1)IEC 115-2-2-XXX QC 400102-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-2-2 QC 400102 (4) (3) FIXED LOW-POWER NON-WIREWOUND RESISTORS (5) Outline drawing: (see Table I) (. . . angle projection) (7) Insulated/non-insulated(6) (Other shap
22、es are permitted within the dimensions given) Assessment level(s): F(8) Stability class: . . . % Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 2 BSI 10-1999 Section 1. General data 1 General
23、 data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publication 115-2.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetres or inches and millimetres. 1.2.1 Derating Resistors covered by this specification are derated according
24、to the curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause 2.2.3 of the sectional specification. 1.3 Related documents Information on the availability of components qualified to this detail specification is given in the Qualified Products List. (9) Style Rate
25、d dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V.d.c. or a.c. peak) Maximum dimensionsdnom: LDTol.: Resistance rangea. . . to . . . 7 Tolerance on rated resistance . . . % Climatic category/ Low air pressure8,5 kPa (85 mbar) Stability class. . . % Limit
26、s for change of resistance: for long-term tests (. . . %R + . . . 7) for short-term tests (. . . %R + . . . 7) Variation of resistance with temperature (for carbon composition types) k . . . % Temperature coefficient (for all other resistors) !: . . . 106/C a The preferred values are those of the E-
27、series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors. Generic Specification:IEC Publication 115-1:(1982): Fixed Resistors for Use in Electronic Equipment Part 1: Generic Specification. Amendment No. 2 (1987). Sectional Specification:IEC Publication 115-2:(1982): Part 2:
28、 Sectional Specification: Fixed Low-power Non-wirewound Resistors. %R R - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-19993 1.4 Marking The marking of the components and packaging s
29、hall be in accordance with the requirements of IEC Publication 115-1, Sub-clause 2.4. NOTEThe details of the marking of the component and packaging shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear
30、or in coded form, the following minimum information: a) Rated resistance. b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspecti
31、on purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2 Inspection requirements 2.1 Procedures 2.1.1 For
32、Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publication 115-2, Sub-clause 3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is
33、covered by Sub-clause 3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause 4.3 of the Generic Specification, IEC Publication 115-1, shall be used. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006,
34、Uncontrolled Copy, (c) BSI BS QC 400102:1992 4 BSI 10-1999 Table II NOTE 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication 115-1, except for resistance change requirements, which shall be selected from the Table I and Table II of the section
35、al specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p= periodicity (in months) n= sample size c= acceptance criterion (permitted number of defectives) D= destructive
36、 ND= non-destructive IL= inspection level IEC Publication 410 AQL= acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQL Performance requirements (see Note 1) (see Note 2) Group A Inspection (lot-by-lot) Sub-group A1NDS31,5 % 4.4.1Visual exami
37、nation As in 4.4.1 Legible marking and as specified in 1.4 of this specification Sub-Group A2NDS41,5 % 4.5ResistanceAs in 4.5.2 Group B Inspection (lot-by-lot) Sub-group B1DS21,0 % 4.17SolderabilityWithout ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of t
38、he terminations or solder shall flow within . . . s, as applicable 4.30Solvent resistance of the marking (if applicable) Solvent: . . . Solvent temperature: . . . Method 1 Rubbing material: cotton wool Legible marking Recovery: . . . Licensed Copy: London South Bank University, London South Bank Uni
39、versity, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-19995 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Group C Inspection (p
40、eriodic) Sub-group C1D6201 4.25.1 Endurance at 70 CDuration: 1 000 h Examination at 48 h, 500 h and 1 000 h: Visual examinationNo visible damage Resistance%R k (. . . %R + . . . 7) Examination at 1 000 h: Insulation resistance (Insulated resistors only) R U 1 G7 If required by the detail specificati
41、on the test shall be extended to 8 000 h 1220 Examination at 2 000 h, 4 000 h and 8 000 h: Resistance%R k (. . . %R +. . . 7) (The results obtained are for information only) Sub-group C2ND6201 4.4.2Dimensions (gauging) A gauge-plate of . . . mm shall be used (if applicable) As specified in Table I o
42、f this specification Group D Inspection (periodic) Sub-group D1D6201 4.24Damp heat, steady state 1) Sub-clause 4.24.2.1 1st group 6: specimens 2nd group 7: specimens 3nd group 7: specimens 2) Sub-group 4.24.2.2 1st group 10: specimens 2nd group 10: specimens Visual examinationNo visible damage Legib
43、le marking Resistance%R k (. . . %R + . . . 7) Insulation resistance (Insulated resistors only) R U 100 M7 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 6 BSI 10-1999 Sub-clause number and T
44、est (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Sub-group D2AD3610 Half of the sample of Sub-group D2 4.16Robustness of terminations Tensile, bending and torsion tests (as applicable) Visual exam
45、inationNo visible damage Resistance%R k (. . . %R + . . . 7) 4.18Resistance to soldering heat Method: . . . Visual examinationNo visible damage Legible marking Resistance%R k (. . . %R + . . . 7) 4.29Component solvent resistance (if applicable) Solvent: . . . Solvent temperature: . . . Method 2 See
46、detail specification Recovery: . . . Sub-group D2BD3610 Other half of the sample of Sub-group D2 4.19Rapid change of temperature FA:Lower category temperature FB:Upper category temperature Visual examinationNo visible damage Resistance%R k (. . . %R + . . . 7) 4.22VibrationMethod of mounting: see 1.
47、1 of this specification Procedure B4 Frequency range: . . . Hz to . . . Hz (see 2.3.2 of the sectional specification) Amplitude: 0,75 mm or 98 m/s2 (whichever is the less severe) Total duration: 6 h Visual examinationNo visible damage Resistance%R k (. . . %R + . . . 7) Licensed Copy: London South B
48、ank University, London South Bank University, Fri Dec 08 17:11:35 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 400102:1992 BSI 10-19997 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (
49、see Note 1) pnc Sub-group D236201 Combined sample of Sub-groups D2A and D2B 4.23Climatic sequence Dry heat Damp heat, cyclic, Test Db, first cycle Cold Low air pressure8,5 kPa (85 mbar) Damp heat, cyclic, Test Db, remaining cycles D.C. load (for non-wirewound types only) Visual examinationNo visible damage Legible marking Resistance%R k (. . . %R + . . . 7) Insulation resistance (Insulated resistors only) R U 100 M7 Sub-group D3D36201 4.4.3Dimensions (detail) As specified in Table I of this spe