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1、 IEC 62429 Edition 1.0 2007-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Reliability growth Stress testing for early failures in unique complex systems Croissance de fiabilit Essais de contraintes pour rvler les dfaillances prcoces dun systme complexe et unique IEC 62429:2007 Copyright Internation
2、al Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Sw
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17、9 02 11 Fax: +41 22 919 03 00 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- IEC 62429 Edition 1
18、.0 2007-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Reliability growth Stress testing for early failures in unique complex systems Croissance de fiabilit Essais de contraintes pour rvler les dfaillances prcoces dun systme complexe et unique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELE
19、CTROTECHNIQUE INTERNATIONALE W ICS 03.120.01; 03.120.99 PRICE CODE CODE PRIX ISBN 2-8318-9427-1 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 21:34:33 MSTNo reproduction or netwo
20、rking permitted without license from IHS -,-,- 2 62429 IEC:2007 CONTENTS FOREWORD.4 1 Scope.6 2 Normative references .6 3 Terms, definitions, abbreviations and symbols7 3.1 Terms and definitions7 3.2 Acronyms 9 3.3 Symbols 9 4 General 10 5 Planning and performing a reliability growth test.13 5.1 Ste
21、p 1 Should a reliability growth test be used? .13 5.2 Step 2 Failure definitions and data collection13 5.3 Step 3 Stress levels14 5.3.1 General .14 5.3.2 Increased operating load .14 5.3.3 Increased environmental stress .15 5.4 Step 4 Failure analysis and classification of failures.15 5.4.1 General
22、.15 5.4.2 Relevant failures .16 5.4.3 Non-relevant failures .17 5.5 Step 5 Stop criteria.17 5.5.1 General .17 5.5.2 Method 1 Fixed testing programs17 5.5.3 Method 2 Graphical analysis.18 5.5.4 Method 3 Success ratio test19 5.5.5 Method 4 Estimation of reliability 21 5.5.6 Method 5 Comparison with ac
23、ceptable instantaneous failure intensity.22 5.5.7 Method 6 Estimation of remaining latent faults24 5.5.8 Method 7 Reliability indicator testing 24 5.6 Step 6 Verification of repairs and reliability growth .25 5.7 Step 7 Reporting and feedback.26 Annex A (informative) Practical example of method 3 Su
24、ccess ratio test.27 Annex B (informative) Practical example of method 5 Comparison with acceptable instantaneous failure intensity.28 Annex C (informative) Practical example of method 6 Estimation of remaining latent faults 31 Bibliography33 Figure 1 The bathtub curve 12 Figure 2 Evaluating whether
25、the cumulative failure curve has levelled out18 Figure 3 Method 219 Figure B.1 A reliability growth plot of the data from Table B.1 29 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/20
26、07 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 62429 IEC:2007 3 Table 1 Probability that a system with failure probability of 0,001 will pass N successive tests .21 Table 2 Probability that a system with failure probability of 0,000 001 will pass N successive t
27、ests .21 Table 3 Correct and incorrect decisions using reliability indicators.25 Table B.1 Reliability growth and stopping times for the practical example 28 Table C.1 Determining when to stop the test32 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicens
28、ee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 62429 IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RELIABILITY GROWTH STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS FOREW
29、ORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the elec
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38、 Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held
39、responsible for identifying any or all such patent rights. International Standard IEC 62429 has been prepared by IEC technical committee 56: Dependability. The text of this standard is based on the following documents: FDIS Report on voting 56/1232/FDIS 56/1249/RVD Full information on the voting for
40、 the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result da
41、te indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Japan, IHS Not for R
42、esale, 12/17/2007 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 62429 IEC:2007 5 reconfirmed, withdrawn, replaced by a revised edition, or amended. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/11
43、11111001, User=Japan, IHS Not for Resale, 12/17/2007 21:34:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 6 62429 IEC:2007 RELIABILITY GROWTH STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS 1 Scope This International Standard gives guidance for reliability g
44、rowth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” means that no information exists on similar systems, and the small number of produced systems means that information deducted f
45、rom the test has limited use for future production. This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, “running-in“, and to ensure that reliability of a delivered s
46、ystem is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of inter
47、nal production testing during manufacturing of prototypes, single systems or small series. It is applicable mainly to large hardware/software systems, but does not cover large networks, for example telecommunications and power networks, since new parts of such systems cannot usually be isolated duri
48、ng the testing. It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated operating loads are used. It addresses growth testing before or at delivery of a finished system. The testing can therefore take place at the manufacturers or at the end users premises. If the user of a syste