IEEE-95-2002-R2007.pdf

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1、IEEE Std 95-2002 (Revision of IEEE Std 95-1977) IEEE Standards 95 TM IEEE Recommended Practice for Insulation Testing of AC Electric Machinery (2300 V and Above) With High Direct Voltage Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997,

2、USA 12 April 2002 IEEE Power Engineering Society Sponsored by the Electric Machinery Committee IEEE Standards Print: SH94982 PDF: SS94982 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS No

3、t for Resale, 07/30/2008 02:35:23 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2002 by the Institute of Electrical and Electronics Engineers, Inc. All rights

4、 reserved. Published 12 April 2002. Printed in the United States of America. Print: ISBN 0-7381-3245-4 SH94982 PDF: ISBN 0-7381-3246-2 SS94982 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publis

5、her. IEEE Std 95-2002 (R2007) (Revision of IEEE Std 95-1977) IEEE Recommended Practice for Insulation Testing of AC Electric Machinery (2300 V and Above) With High Direct Voltage Sponsor Electric Machinery Committee of the IEEE Power Engineering Society Reaffirmed 26 September 2007 Approved 20 March

6、 2002 IEEE-SA Standards Board Abstract: This recommended practice provides information on the use of high direct voltage for proof tests and for periodic diagnostic tests on the groundwall insulation of stator (armature) wind- ings in ac electric machines. Keywords: electric machine windings, electr

7、ical insulation, high direct voltage Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:35:23 MDTNo reproduction or networking permitted without license from IHS

8、 -,-,- IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus develop- ment process, approved by the American National Standards Instit

9、ute, which brings together volunteers representing varied viewpoints and interests to achieve the fi nal product. Volunteers are not necessarily members of the Institute and serve with- out compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensu

10、s devel- opment process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property or other dam- age, of any nature whatsoeve

11、r, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEEE Standard document. The IEEE does not warrant or represent the accuracy or content of the material contained herein, and expressly disc

12、laims any express or implied warranty, including any implied warranty of merchantability or fi tness for a specifi c purpose, or that the use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “ AS IS .” The existence of an IEEE Standard does not

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14、n the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every fi ve years for revi- sion or reaffi rmation. When a document is more than fi ve years old and has not been reaffi rmed, it is reasonable to conclude that its contents,

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16、s for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing this, and any other IEEE Standards document, should rely upon the advice of a com- petent professional in determining the exercise of reas

17、onable care in any given circumstances. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specifi c applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appr

18、opriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its soci- eties and Standards Coordinating Committees are not

19、able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affi liation with IEEE. Suggestions for changes

20、in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA Authorization to

21、 photocopy portions of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance

22、Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Note: Attention is called to the possibility that implementatio

23、n of this standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license

24、 may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=J

25、apan, IHS Not for Resale, 07/30/2008 02:35:23 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2002 IEEE. All rights reserved. iii Introduction This introduction is not part of IEEE Std 95-2002, IEEE Recommended Practice for Insulation Testing of AC Electric Machin

26、ery (2300 V and Above) With High Direct Voltage. Traditionally, the insulation of rotating machines has been tested for dielectric strength with alternating volt- age. In 1952, attention was directed to testing with direct voltage. Since then, high direct voltage has been widely used. Many reports o

27、f procedure and results are found in the IEEE Transactions with expressions of widely differing opinion. In 1957, the Insulation Subcommittee of the IEEE Rotating Machinery Committee appointed a working group to review the existing literature and to prepare a guide for the conduct and interpretation

28、 of high direct-voltage insulation tests. It was found that many methods of making the tests have been used and that there was no uniform opinion of their relative merits. In 1971, the Insulation Subcommittee of the IEEE Rotating Machinery Committee appointed a working group to revise the existing g

29、uide to a recommended practice. In 1996, the Materials Subcommittee of the IEEE Electric Machinery Committee appointed a working group to revise the existing recommended practice. The document has been updated in a number of respects and typical test results using the ramped voltage test method have

30、 been included. At present there is wide usage of high direct voltage for insulation testing, but there are still areas of dis- agreement regarding the utility of such tests. In this recommended practice every effort has been made to state facts and to indicate what is not certain. This document giv

31、es the present opinion and evaluation of high direct-voltage insulation testing of a large number of investigators with experience in a wide area of test activities. Many of those who have used the methods described in this recommended practice have found them to be satisfactory and a valuable addit

32、ion to other test procedures. It is hoped that the use of this recommended practice will achieve more uniform results and a fuller understanding and appreciation for the benefi ts of the high direct-voltage dielectric test. A general discussion of test procedures, a comparison between alternating an

33、d direct-voltage testing, and requirements for high voltage power supplies may be found in Annex A of this recommended practice. For background information on overvoltage testing, see Clause 8 of IEEE Std 56-1977 and see IEEE P62.2/ D23. a Participants This document was originally developed by a wor

34、king group of the Insulation Subcommittee of the IEEE Rotating Machinery Committee. The members of this working group were: C. D. Sidway, Chair B. R. Loxley, Secretary a Information on references can be found in Clause 2. C. E. Asbury J. S. Askey B. M. Cain A. W. W. Cameron E. B. Curdts J. L. Kuehlt

35、hau H. M. Marsden G. L. Moses E. R. Scattergood W. Schneider H. R. Tomlinson H. P. Walker W. A. Weddendorf E. S. Yates Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30

36、/2008 02:35:23 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright 2002 IEEE. All rights reserved. The 1977 revision was prepared by a working group of the Insulation Subcommittee. The members were: R. F. Sharrow, Chair This revision was prepared by a working group

37、 of the Materials Subcommittee of the Electric Machinery Committee. The members were: N. E. Nilsson, Chair The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standa

38、rd on 20 March 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vice Chair Judith Gorman, Secretary *Member Emeritus J. M. Brown A. W. W. Cameron E. B. Curdts R. J. Hillen W. J. Sheets G. Wolff R. Bartnikas K. Becker J. Grant V. Green B. K. Gupta M. Jacobs W. McDermid B.

39、 Nindra L. Rodland L. Rux V. Warren C. A. Wilson Paul A. Anderson William E. Anderson Roy L. Balke William H. Bartley R. Bartnikas K. Becker Thomas H. Bishop E. A. Boulter Steven R. Brockschink Stephen P. Conrad Roger H. Daugherty Guru Dutt Dhingra James H. Dymond James S. Edmonds Franklin T. Emery

40、Jorge Fernandez-Daher Nirmal K. Ghai J. Grant John Travis Griffi th Franklin H. Grooms Thomas J. Hammons Adrienne M. Hendrickson Gary A. Heuston Peter H. Landrieu Antonio J. Marques-Cardoso Walter J. Martiny C. V. Maughan W. McDermid Jeffrey L. McElray Sr Donald G. McLaren James R. Michalec Gary L.

41、Michel Rihong Mo Daleep C. Mohla Glenn Mottershead Arthur S. Neubauer N. E. Nilsson James A. Oliver Madan Rana R. V. Rebbapragada Jesus Martinez Rodriguez Charles M. Rowe James A. Ruggieri L. Rux Maurice A. Secrest John Shea Daniel Slomovitz Greg C. Stone Qi Su James E. Timperley Paul Dieter Wagner

42、V. Warren Karim Younsi H. Zhu Sid Bennett H. Stephen Berger Clyde R. Camp Richard DeBlasio Harold E. Epstein Julian Forster* Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfi nger* Peter H. Lips Nader Mehravari

43、Daleep C. Mohla William J. Moylan Malcolm V. Thaden Geoffrey O. Thompson Howard L. Wolfman Don Wright Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:35:23 MD

44、TNo reproduction or networking permitted without license from IHS -,-,- Copyright 2002 IEEE. All rights reserved. v Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Andrew D. Ickowicz IEEE Standards Pro

45、ject Editor Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:35:23 MDTNo reproduction or networking permitted without license from IHS -,-,- vi Copyright 2002

46、IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 1.3 Application and limitations 1 2.References 3 3.Definitions 4 4.Test preparations 6 4.1 Safety precautions required for high direct-voltage tests 6 4.2 Influencing factors. 6 4.3 Gas-cooled machines. 8 4.4 Liquid-cooled m

47、achines. 8 4.5 Isolation of the winding from cables and auxiliary equipment 8 4.6 Sectionalizing the winding. 9 5.Test equipment and connections 9 5.1 High direct-voltage test equipment 9 5.2 Discharge and grounding provisions . 10 5.3 High-voltage test connection to the winding. 11 5.4 Test connect

48、ion to ground 12 6.Test procedure: proof tests. 12 6.1 Test voltage for acceptance proof testing 13 6.2 Test voltage for maintenance proof testing 13 6.3 Voltage application 13 6.4 Discharging and grounding 13 6.5 Test results. 14 6.6 Insulation failure 14 7.Test procedure: controlled overvoltage te

49、st. 14 7.1 Test method 14 7.2 Test setup. 14 7.3 Measured current . 15 7.4 Test voltage for controlled overvoltage testing . 15 7.5 Initial voltage level 15 7.6 Voltage increments 16 7.7 Discharging and grounding 18 7.8 Test results. 18 7.9 Use of controlled overvoltage tests 26 8.Fault location . 26 9.Suggested t

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