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1、BRITISH STANDARD BS EN61164:2004Reliability growth Statistical test and estimation methodsThe European Standard EN 61164:2004 has the status of aBritish StandardICS 03.120.01; 03.120.30 BS EN 61164:2004National forewordThis British Standard is the official English language version of EN 61164:2004.
2、It is identical with IEC 61164:2004. It supersedes BS 5760-17:1995 which is withdrawn.The UK participation in its preparation was entrusted to Technical CommitteeDS/1, Dependability and terotechnology, which has the responsibility to:aid enquirers to understand the text;present to the responsible in
3、ternational/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed;monitor related international and European developments and promulgate them in the UK.A list of organizations represented on this committee can be obtained on request to it
4、s secretary.Cross-referencesThe British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic C
5、atalogue or of British Standards Online.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard does not of itself confer immunity from legal obligations.This British Standard was pu
6、blished under the authority of the Standards Policy and Strategy Committee on2 September 2004 BSI 2 September 2004ISBN 0 580 44365 5Summary of pagesThis document comprises a front cover, an inside front cover, the EN title page, pages 2 to 55 and a back cover.The BSI copyright notice displayed in th
7、is document indicates when the document was last issued.Amd. No.DateCommentsAmendments issued since publicationEUROPEAN STANDARDEN 61164NORME EUROPENNEEUROPISCHE NORMApril 2004ICS 03.120.01; 03.120.30English versionReliability growth -Statistical test and estimation methods(IEC 61164:2004)Croissance
8、 de la fiabilit - Tests et mthodes destimation statistiques (CEI 61164:2004)Zuverlssigkeitswachstum - Statistische Prf- und Schtzverfahren (IEC 61164:2004)This European Standard was approved by CENELEC on 2004-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
9、 stipulate the conditions for giving this European Standard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.This European Sta
10、ndard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.CENELEC members are the natio
11、nal electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Ki
12、ngdom.CENELECEuropean Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels 2004 CENELEC - All rights of exploitation in any form and by any means reser
13、ved worldwide for CENELEC members.Ref. No. EN 61164:2004 EPage 55EN 61164:2004ForewordThe text of document 56/920/FDIS, future edition 2 of IEC 61164, prepared by IEC TC 56, Dependability, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61164 on2004-04-01.This Europe
14、an Standard should be used in conjunction with EN 61014:2003. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identicalnational standard or by endorsement(dop)2005-01-01 latest date by which the national standards conflictingwi
15、th the EN have to be withdrawn(dow)2007-04-01Annex ZA has been added by CENELEC.Endorsement noticeThe text of the International Standard IEC 61164:2004 was approved by CENELEC as a EuropeanStandard without any modification.CONTENTS1Scope . 62Normative references . 63Terms and definitions . 64Symbols
16、 . 75Reliability growth models in design and test . 106Reliability growth models used for systems/products in design phase . 126.1Modified power law model for planning of reliability growth in product designphase . 126.1.1General . 126.1.2Planning model for the reliability growth during the product
17、designperiod . 136.1.3Tracking the achieved reliability growth . 146.2Modified Bayesian IBM-Rosner model for planning reliability growth in designphase . 156.2.1General . 156.2.2Data requirements . 156.2.3Estimates of reliability growth and related parameters . 166.2.4Tracking reliability growth dur
18、ing design phase. 177Reliability growth planning a tracking in the product reliability growth testing . 177.1Continuous reliability growth models . 177.1.1The power law model . 177.1.2The fixed number of faults model . 187.2Discrete reliability growth model . 197.2.1Model description . 197.2.2Estima
19、tion . 218Use of the power law model in planning reliability improvement test programmes . 229Statistical test and estimation procedures for continuous power law model . 229.1Overview . 229.2Growth tests and parameter estimation . 229.2.1Case 1 Time data for every relevant failure. 229.2.2Case 2 Tim
20、e data for groups of relevant failures . 259.3Goodness-of-fit tests . 269.3.1General . 269.3.2Case 1 Time data for every relevant failure. 269.3.3Case 2 Time data for groups of relevant failures . 279.4Confidence intervals on the shape parameter . 289.4.1General . 289.4.2Case 1 Time data for every r
21、elevant failure. 289.4.3Case 2 Time data for groups of relevant failures . 299.5Confidence intervals on current MTBF . 309.5.1General . 309.5.2Case 1 Time data for every relevant failure. 309.5.3Case 2 Time data for groups of relevant failures . 319.6Projection technique . 32Annex A (informative) Ex
22、amples for planning and analytical models used in designand test phase of product development . 36A.1Reliability growth planning in product design phase . 36A.1.1Power law planning model example . 36A.1.2Construction of the model and monitoring of reliability growth. 36A.2Example of Bayesian reliabi
23、lity growth model for the product design phase . 39A.3Failure data for discrete trials . 41A.4Examples of reliability growth through testing . 41A.4.1Introduction . 41A.4.2Current reliability assessments . 42A.4.3Projected reliability estimates . 43Annex B (informative) The power law reliability gro
24、wth model Backgroundinformation .49B.1The Duane postulate . 49B.2The power law model . 49B.3Modified power law model for planning of reliability growth in product designphase . 50B.4Modified Bayesian IBM-Rosner model for planning reliability growth in thedesign phase . 51Annex ZA (normative) Normati
25、ve references to international publications with theircorresponding European publications . 54Figure 1 Planned improvement of the average failure rate or reliability . 11Figure A.1 Planned and achieved reliability growth Example . 39Figure A.2 Planned reliability growth us ing Bayesian reliability g
26、rowth model. 40Figure A.3 Scatter diagram of expected and observed test times at failure based ondata of Table A.2 with power law model . 47Figure A.4 Observed and estimated accumulated failures/accumulated test timebased on data of Table A.2 with power law model . 48Table 1 Categories of reliabilit
27、y growth models with clause references . 12Table 2 Critical values for Cramr-von Mises goodness-of-fit test at 10 % level ofsignificance. 33Table 3 Two-sided 90 % confidence intervals for MTBF from Type I testing . 34Table 4 Two-sided 90 % confidence intervals for MTBF from Type II testing . 35Table
28、 A.1 Calculation of the planning model for reliability growth in design phase . 38Table A.2 Complete data All relevant failures and accumulated test times forType I test . 45Table A.3 Grouped data for Example 3 derived from Table A.2 . 45Table A.4 Complete data for projected estimates in Example 4 A
29、ll relevant failuresand accumulated test times . 46Table A.5 Distinct types of Category B failures, from Table A.4, with failure times,time of first occurrence, number observed and effectiveness factors . 46INTRODUCTIONThis International Standard describes the power law reliability growth model and
30、related projection model and gives step-by-step directions for their use. There are several reliabilit y growth models available, the power law model being one of the most widely used. This standard provides procedures to estimate some or all of the quantities listed in Clauses 4, 6 and 7 of IEC 61014.Two types of input are required. The first one is for reliability growth planning through analysis and design improvements in the design phase in terms of the design phase duration, initial reliability, reliability goal, and planned design i