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1、Recognized as an American National Standard (ANSI) The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1999 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 16 April 1999. Printed in the
2、 United States of America. Print: ISBN 0-7381-1429-4 SH94679 PDF: ISBN 0-7381-1430-8 SS94679 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1293-1998 (R2008) IEEE Standard Spec
3、ification Format Guide and Test Procedure for Linear Single-Axis, Nongyroscopic Accelerometers Sponsor Gyro and Accelerometer Panel of the IEEE Aerospace and Electronic Systems Society Approved 25 September 1998 Reaffirmed 10 December 2008 IEEE-SA Standards Board Approved 17 September 2003 American
4、National Standards Institute Abstract: The specification and test requirements for a linear, single-axis, nongyroscopic accelerometer for use in internal navigation, guidance, and leveling systems are defined. A standard specification guide and a compilation of recommended test procedures for such a
5、ccelerometers are provided. Informative annexes are given on the various types of such accelerometers (force or pendulous torque rebalance with analog or digital output, vibrating beam, and micromechanical) and error effects, on filtering, noise, and transient analysis tech- niques, and on calibrati
6、on and modeling techniques (multipoint tumble analysis, vibration and shock test analyses, and geophysical effects in inertial instrument testing). Keywords: accelerometer, inertial instrument, inertial sensor, pendulous accelerometer, vibrating beam ac- celerometer, micromechanical accelerometer, p
7、ower spectal density, vibration and shock, geophysical effects, specification, testing. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. iii Introduction (This introduction is not a part of IEEE Std C37.20.6-1997, I
8、EEE Standard for 4.76 kV to 38 kV Rated Grounding and Testing Devices Used in Enclosures.) Although grounding and testing devices (G&T) have been used as accessory devices in metal-clad switchgear for decades, they have never been covered by standards. This is because they are specialized accessory
9、devices, designed and tested in accordance with applicable sections of circuit breaker standards, and based on user-unique operational requirements. This standard complements IEEE Std C37.20.2-1993, IEEE Standard for Metal-Clad and Station-Type Cubicle Switchgear, and addresses the more popular G&T
10、device types. This standard also clarifies that G&T devices are not required to have the interrupting and continuous current ratings of the circuit breakers they may temporarily replace for the purpose of grounding and testing medium-voltage circuits. G&T devices are supplied in various forms and th
11、e following generally summarizes the more popular forms: a)Simple manual devices. These are equipped with either one or two terminal sets for grounding through cables, manually connected to the device ground connection system. Hot stick voltage testing is possible. b)Simple electrical devices. These
12、 are equipped with one terminal set connected, through a power-operated ground-making switch, to the device ground connection system. Voltage test ports may be provided. c)Complex electrical devices. These are equipped with two terminal sets and a manually operated switch for selecting which termina
13、l set is to be connected, through the power-operated ground-making switch, to the device ground connection system. Voltage test ports may be provided. All G&T devices are equipped with necessary isolation barriers and locking or interlocking mechanisms to provide some degree of protection during han
14、dling and operation. This standard does not cover G&T devices that are specially equipped with current and voltage transformers, glow- tubes and like components, nor those that have short-circuit current interrupting capability. G&T devices designed before the approval of this standard may not meet
15、all of these established requirements. The user should consult with the manufacturer if any question exists regarding the proper application of these G&T devices on the users system. Suggestions gained from use will be welcomed for guidance in future revisions of this standard. Authorized licensed u
16、se limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. iv The Standards Committee on Power Switchgear, C37, which reviewed and approved this standard had the following personnel at the time of approval: E. Byron, Chair M. Calwise, Secretary A
17、. K. McCabe, (Executive Vice-Chair of High-Voltage Switchgear Standards) J. C. Scott, (Executive Vice-Chair of Low-Voltage Switchgear Standards) D. L. Swindler, (Executive Vice-Chair of IEC Activities) Organization RepresentedName of Representative Association of Iron and Steel Engineers(vacant) Ele
18、ctric Light and Power GroupD. E. Galicia Joseph L. Koepfinger D. G. Komassa G. Miller J. H. Provanzano T. E. Bruck (Alt) Institute of Electrical and Electronics Engineers.Steve C. Atkinson L. R. Beard Peter W. Dwyer David G. Kumbera Lawrence V. McCall Alec C. Monroe David F. Peelo Dean Sigmon B. Haa
19、s (Alt) National Electrical Manufacturers Association.Ruben D. Garzon William Kracht H. Lee Miller T. Olsen David L. Stone E. Byron (Alt) Gary T. Jones (Alt) G. Sakats (Alt) D. L. Swindler (Alt) Tennessee Valley Authority D. N. Reynolds Testing Laboratory Group .Leonard Frier P. Notarian U.S. Depart
20、ment of the Army, Office of the Chief of EngineersJ. A. Gilson U.S. Department of the Navy, Naval Construction Battalion CenterRomulo R. Nicholas Western Area Power Administration.Gerald D. Birney Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IE
21、EE Xplore. Restrictions apply. v This standard was developed by a joint effort of the High-Voltage Circuit Breaker and the Switchgear Assemblies Subcommittees of the IEEE Switchgear Committee. The members of this joint Working Group were as follows: Ruben D. Garzon, Chair T. A Burse P. W. Dwyer P. L
22、. Kolarik W. E. Laubach D. Lemmerman R. W. Long G. O. Perkins S. H. Telander B. F. Wirtz The following persons were on the balloting committee: Roy W. Alexander J. G. Angelis Richard H. Arndt Steve Atkinson L. Ronald Beard Harvey L. Bowles Matthew Brown John H. Brunke Raymond L. Capra Alexander Dixo
23、n J. J. Dravis C. J. Dvorak Peter W. Dwyer Ruben D. Garzon Louis W. Gaussa Keith I. Gray Kenneth Hendrix H. L. Hess W. F. Hoenigmann Jerry M. Jerabek P. L. Kolarik David G. Kumbera Stephen R. Lambert Ward E. Laubach John G. Leach George N. Lester Don Lott E. L. Luehring P. C. Mayo Andrew K. McCabe L
24、awrence V. McCall William C. McKay Don C. Mills Alec C. Monroe Georges F. Montillet F. J. Muench James F. ODonnell Raymond P. OLeary A. F. Parks David F. Peelo G. O. Perkins R. Kris Ranjan J. C. Ransom David N. Reynolds H. C. Ross Tim E. Royster Larry H. Schmidt E. W. Schmunk C. A. Schwalbe Devki N.
25、 Sharma Guy St. Jean D. L. Swindler John S. Tannery S. H. Telander Frederick C. Teufel Thomas J. Tobin Edward F. Veverka Charles L. Wagner When the IEEE Standards Board approved this standard on 20 March 1997, it had the following membership: Donald C. Loughry, Chair Richard J. Holleman, Vice Chair
26、Andrew G. Salem, Secretary Clyde R. Camp Stephen L. Diamond Harold E. Epstein Donald C. Fleckenstein Jay Forster* Thomas F. Garrity Donald N. Heirman Jim Isaak Ben C. Johnson Lowell Johnson Robert Kennelly E. G. “Al” Kiener Joseph L. Koepfinger* Stephen R. Lambert Lawrence V. McCall L. Bruce McClung
27、 Marco W. Migliaro Louis-Franois Pau Gerald H. Peterson John W. Pope Jose R. Ramos Ronald H. Reimer Ingo Rsch John S. Ryan Chee Kiow Tan Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE Standards Board liaisons: Satish K. Aggarwal Alan H. Cookson Kim Breitfelder, IEE
28、E Standards Project Editor Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. viCopyright 1998 IEEE All Rights Reserved Designation (Variable)HeaderTitleLeft (Variable) Authorized licensed use limited to: IEEE Xplore.
29、 Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Copyright 1998 IEEE All Rights Reservedvii HeaderTitleRight (Variable) Designation (Variable) Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restri
30、ctions apply. viiiCopyright 1998 IEEE All Rights Reserved Designation (Variable)HeaderTitleLeft (Variable) Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Copyright 1998 IEEE All Rights Reservedix HeaderTitleRight
31、(Variable) Designation (Variable) Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply
32、. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limite
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40、ctions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized license
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42、ownloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at
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49、ized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 25,2010 at 10:15:20 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: IEEE X