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1、 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2002 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 23 September 2002. Printed in the United States of America. Print: ISBN 0-7381-3351-5
2、SH95023 PDF: ISBN 0-7381-3352-3 SS95023 National Electrical Code and NEC are both registered trademarks of the National Fire Protection Association, Inc. IEEE Buff Book, IEEE Green Book, and IEEE Red Book are registered trademarks of the Institute of Electrical and Electronic Engineers, Inc. No part
3、 of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1584 -2002 IEEE Guide for Performing Arc-Flash Hazard Calculations Sponsor Petroleum and Chemical Industry Committee of the Industry App
4、lications Society Abstract: This guide provides techniques for designers and facility operators to apply in determining the arc-flash hazard distance and the incident energy to which employees could be exposed during their work on or near electrical equipment. Keywords: arc fault currents, arc-flash
5、 hazard, arc-flash hazard analysis, arc-flash hazard marking, arc in enclosures, arc in open air, bolted fault currents, electrical hazard, flash protection boundary, incident energy, personal protective equipment, protective device coordination study, short-circuit study, working distances Authoriz
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23、se limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std 1584-2002, IEEE Guide for Performing Arc-Flash Hazard Calculations.) A technica
24、l paper by Lee, “The other electrical hazard: electric arc blast burns” B19 provided insight that electrical arc burns make up a substantial portion of the injuries from electrical malfunctions. a He identifi ed that electrical arcing is the term applied to current passing through vapor of the arc t
25、erminal conductive metal or carbon material. The extremely high temperatures of these arcs can cause fatal burns at up to about 5 ft and major burns at up to about 10 ft distance from the arc. Additionally, electrical arcs expel droplets of molten terminal material that shower the immediate vicinity
26、, similar to, but more extensive than that from electrical arc welding. These fi ndings started to fi ll a void created by early works that identifi ed electrical shock as the major electrical hazard. Mr. Lees work also helped establish a relationship between time to human tissue cell death and temp
27、erature, as well as a curable skin burn time-temperature relationship. Once forensic analysis of electrical incidents focused on the arc-fl ash hazard, experience over a period of time indicated that Ralph Lees formulas for calculating the distance-energy relationship from source of arc did not serv
28、e to reconcile the greater thermal effect on persons positioned in front of opened doors or removed covers, from arcs inside electrical equipment enclosures. A technical paper by Doughty, Neal, and Floyd, “Predicting incident energy to better manage the electric arc hazard on 600 v power distributio
29、n systems” B4 presented the fi ndings from many structured tests using both “arcs in open air” and “arcs in a cubic box.” These three phase tests were performed at the 600 V rating and are applicable for the range of 16 000 to 50 000 A short-circuit fault current. It was established that the contrib
30、ution of heat refl ected from surfaces near the arc intensifi es the heat directed toward the opening of the enclosure. The focus of industry on electrical safety and recognition of arc-fl ash burns as having great signifi cance highlighted the need for protecting employees from all arc-fl ash hazar
31、ds. The limitations on applying the known “best available” formulas for calculating the “curable” and “incurable” burn injuries have been overcome. This guide does that with new, empirically derived models based on statistical analysis and curve fi tting of the overall test data available. Conductin
32、g an arc-fl ash hazard analysis has been diffi cult. Not enough arc-fl ash incident energy testing had been done from which to develop models that accurately represent all the real applications. The available algorithms are diffi cult for engineers in offi ces to solve and near impossible for people
33、 in the fi eld to apply. This working group has overseen a signifi cant amount of testing and has developed new models of incident energy. The arc-fl ash hazard calculations included in this guide will enable quick and comprehensive solutions for arcs in single- or three- phase electrical systems ei
34、ther of which may be in open air or in a box, regardless of the low or medium voltage available. Warranty THE IEEE DOES NOT WARRANT OR REPRESENT THE ACCURACY OR CONTENT OF THE WORK AND EXPRESSLY DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, INCLUDING ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS F
35、OR A SPECIFIC PURPOSE OR THAT THE USE OF THE WORK IS FREE FROM PATENT INFRINGEMENT. THE WORK IS SUPPLIED ONLY “AS IS.” USE AT YOUR OWN RISK. a The numbers in brackets correspond to those of the bibliography in Annex F. Authorized licensed use limited to: Peking University. Downloaded on December 26,
36、2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. iv Copyright 2002 IEEE. All rights reserved. Acknowledgments Many organizations and individuals made cash or in-kind contributions that enabled the test program on which this guide is based. The IEEE Std 1584-2002 working group and IEEE grat
37、efully acknowledge these contributions. Sponsors Cooper Bussmann Cooper Crouse-Hinds DuPont Nomex Kinectrics Inc. U. S. Navy NAVSEA Command Square D Company Supporters Agrium Inc. The Dow Chemical Company Eastman Kodak L Bruce McClung Contributors Duke Energy Eastman Chemical SKM Systems Sophisticat
38、ed statistical analysis was required to develop the empirically derived model which is presented in this guide. The IEEE Std 1584-2002 working group recognizes and thanks Dr. David Berengut for his work on this analysis. The “Bolted Fault Calculator” worksheet in the “IEEE_1584_Bolted_Fault_Cal.xls”
39、 was contributed by Paul and Dick Porcaro. The IEEE Std 1584-2002 working group recognizes and thanks them for this contribution. The calculators can be accessed via the auxiliary fi les, “IEEE_1584_Bolted_Fault_Cal.xls” and “IEEE_1584_Arc_Flash_Hazard.xls”, and test data can be accessed via the aux
40、iliary fi les, “Data_set.xls”, “Test_results_database.xls”, and “CL_Fuse_test_data.xls” provided with this standard (CD ROM for print versions and spreadsheet fi les for the PDF version). Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE
41、Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved. v Participants At the time this standard was completed, the working group had the following membership: Craig M. Wellman, Chair L. Bruce McClung, Vice Chair The following members of the balloting committee voted on this standard.
42、Balloters may have voted for approval, disapproval, or abstention. Allen H. Bingham James E. Bowen E. William Buss John Cadick Micheal I. Callanan Donald M. Colaberardino Anthony Cortez Greg Crawford Stephen Cress D. Ray Crow Daniel Doan Paul Dobrowsky Mike Doherty Richard L. Doughty Ray Duff John G
43、allagher Tammy Gammon George D. Gregory Hugh Hoagland Dennis Johnson Jane Jones Ray Jones William C. Jordan Herman (Buddy) Kemp Kevin Lippert Ken Mastrullo Daleep C. Mohla Ali Nasle Tom Neal David ONeill David A. Pace Robert Pettis Melvin K. Sanders Vincent Saporita Brian Savaria Farrokh Shokooh Nat
44、han Spivey Conrad St. Pierre Alan Turner William E. Veerkamp George Weitzenfeld Gary Wetzel Kenneth P. White Kathleen Wilmer Brian Wright Alonza W. Ballard Louis A. Barrios Henry A. Becker James E. Bowen Frederick Bried Kristine K. Buchholz Donald M. Colaberardino Gary DiTroia Daniel Doan Paul Dobro
45、wsky Gary Donner Richard L. Doughty Bruce G. Douglas Kimberly Eastwood H. Landis Floyd George D. Gregory Mark S. Halpin Erling C. Hesla Jim D. Hill Danny Liggett L. Bruce McClung Michael McNeil Daleep C. Mohla William J. Moylan Paul W. Myers Daniel R. Neeser Arthur S. Neubauer David ONeill Ted W. Ol
46、sen David A. Pace Lorraine K. Padden Giuseppe Parise John E. Propst Franklin Roberts Melvin K. Sanders Vincent Saporita Sukanta Sengupta Dennis R. Thonsgard Michael K. Toney William E. Veerkamp Michael Wactor Craig M. Wellman Donald W. Zipse Authorized licensed use limited to: Peking University. Dow
47、nloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. vi Copyright 2002 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 12 September 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vice Chair Judith Gorma
48、n, Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Noelle D. Humenick IEEE Standards Project Editor Sid Bennett H. Stephen Berger Clyde R. Camp Richard DeBlasio Harold E. Eps
49、tein Julian Forster* Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfi nger* Peter H. Lips Nader Mehravari Daleep C. Mohla William J. Moylan Malcolm V. Thaden Geoffrey O. Thompson Howard L. Wolfman Don Wright Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. Copyright 2002 IEEE. All rights reserved. vii Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.References 2 3.Definitions 2 4.Analysis p