IEEE Std C37.41-2000 IEEE Standard Design Tests for High-Voltage Fuses, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories.pdf

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1、The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2000 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 29 November 2000. Printed in the United States of America. Print:ISBN 0-7381-1974-1SH94

2、829 PDF:ISBN 0-7381-1975-XSS94829 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std C37.41-2000 (Revision of IEEE Std C37.41-1994) IEEE Standard Design Tests for High-Voltage Fuse

3、s, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories Sponsor Switchgear Committee of the IEEE Power Engineering Society Approved 30 January 2000 IEEE-SA Standards Board Abstract: Required procedures for performing design tests for high-voltage distribution

4、class and power-class fuses, as well as for fuse-disconnecting switches and enclosed single-pole air switch- es,are specified. These design tests, as appropriate to a particular device,include the following test types: dielectric, interrupting, load-break, making-current, radio-influence, short-time

5、 current, tem- perature-rise, time-current, manual operation, thermal-cycle, bolt torque, and liquid-tightness. Keywords: distribution enclosed single-pole air switches, fuse accessories, fuse design tests, fuse disconnecting switches, high-voltage fuses IEEE Standards documents are developed within

6、 the IEEE Societies and the Standards Coordinating Com- mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consen

7、sus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are

8、 no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the ar

9、t and comments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is rea- sonable to conclude that its contents, although still of some va

10、lue, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Suggestions for ch

11、anges in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought

12、 to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE

13、and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests for interpretations should be addresse

14、d to: Secretary, IEEE-SA Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA IEEE is the sole entity that may authorize the use of certification marks, trademarks, or other designations to indicate compliance with the materials set forth herein. Authorization to photocopy porti

15、ons of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus- tom

16、er Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copy- right Clearance Center. Note: Attention is called to the possibility that implementation of this sta

17、ndard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be require

18、d by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright 2000 IEEE. All rights reserved.iii Introduction (This introduction is not part of IEEE Std C37.41-2000, IEEE Standard Design Tests for High-Voltage Fuses,

19、Distribu- tion Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories.) IEEE Std C37.41-2000 is a revision of IEEE Std C37.41-1994, in order to bring it up to date and into agree- ment with current requirements for high-voltage fuses and switches. Previously approved supplem

20、ents have been incorporated. The standard was prepared by the IEEE Subcommittee on High-Voltage Fuses, with cooperation from the National Electrical Manufacturers Association (NEMA). This standard is one of a series of complementary standards covering various types of high-voltage fuses and switches

21、, so arranged that two of the standards apply to all devices, while each of the other standards provide additional specifications for a particular device. For each device, IEEE Std C37.40-1993, IEEE Std C37.41- 2000,plusthestandardcoveringthatdevice,constituteacompletesetofstandardsforeachdevice.Ina

22、ddition, IEEE Std C37.48-1997 is an application, operation, and maintenance guide for all the devices. The following standards comprise this series: ANSI C37.42-1996, American National Standard for SwitchgearDistribution Cutouts and Fuse Links Specifications. ANSI C37.44-1981 (Reaff 1987), American

23、National Standard Specifications for Distribution Oil Cutouts and Fuse Links. ANSI C37.45-1981 (Reaff 1987), American National Standard Specifications for Distribution Enclosed Single-Pole Air Switches. ANSI C37.46-2000, American National Standard Specifications for Power Fuses and Fuse Disconnectin

24、g Switches. ANSI C37.47-2000, American National Standard Specifications for Distribution Fuses and Fuse Discon- necting Switches Fuse Supports, and Current-Limiting Fuses. IEEE Std C37.40-1993, IEEE Standard Service Conditions and Definitions for High-Voltage Fuses, Distri- bution Enclosed Single-Po

25、le Air Switches, Fuse Disconnecting Switches, and Accessories (ANSI). IEEE Std C37.41-2000, IEEE Standard Design Tests for High-Voltage Fuses, Distribution Enclosed Single- Pole Air Switches, Fuse Disconnecting Switches, and Accessories (ANSI). IEEE Std C37.48-1997, IEEE Guide for Application, Opera

26、tion, and Maintenance of High-Voltage Fuses, Distribution Enclosed Single-Pole Air Switches, Fuse Disconnecting Switches, and Accessories (ANSI). ivCopyright 2000 IEEE. All rights reserved. The Working Group on the Revision of Fuse Standards, High-Voltage Fuse Subcommittee that prepared this standar

27、d had the following membership: John G. Leach, Chair T. A. Bellei, Secretary The following members of the balloting committee voted on this standard: When the IEEE-SA Standards Board approved this standard on 30 January 2000, it had the following membership: Richard J. Holleman, Chair Donald N. Heir

28、man, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Robert E. Hebner Janet Rutigliano IEEE Standards Project Editor J. Angelis R. H. Arndt L. Ronald Beard Glenn R. Borchardt H. E. Foelker S. P. Hassler G. J. Luzzi J. R.

29、Marek F. L. Muench R. Neville Parry R. Kris Ranjan P. Rosen Tim E. Royster J. S. Schaffer E. W. Schmunk John G. St. Clair Elbert M. Worland Maria Zandonella Janusz Zawadzki Cary J. Ahrano Roy W. Alexander Edwin Averill L. Ronald Beard T. A. Bellei Stan Billings Glenn R. Borchardt Harvey L. Bowles Te

30、d Burse Carlos L. Cabrera-Rueda Raymond L. Capra James F. Christensen Alexander Dixon Denis Dufournet Douglas J. Edwards Marcel Fortin Mietek T. Glinkowski Keith Gray Harold L. Hess Rick Jackson Edward Jankowich Joseph L. Koepfinger Stephen R. Lambert John G. Leach George N. Lester Albert Livshitz R

31、. W. Long Nigel P. McQuin Daleep C. Mohla Georges F. Montillet Anne F. Morgan Jeffrey H. Nelson Paul J. Notarian R. Neville Parry Gordon O. Perkins R. Kris Ranjan David N. Reynolds Tim E. Royster Gerald Sakats J. S. Schaffer Larry H. Schmidt E. W. Schmunk Curt A. Schwalbe R. Kirkland Smith John G. S

32、t. Clair David Stone David Swindler Stan H. Telander Malcolm V. Thaden Charles L. Wagner B. Scott Wilson John G. Wood Elbert M. Worland Maria Zandonella Janusz Zawadzki Satish K. Aggarwal Dennis Bodson Mark D. Bowman James T. Carlo Gary R. Engmann Harold E. Epstein Jay Forster* Ruben D. Garzon James

33、 H. Gurney Lowell G. Johnson Robert J. Kennelly E. G. “Al” Kiener Joseph L. Koepfinger* L. Bruce McClung Daleep C. Mohla Robert F. Munzner Louis-Franois Pau Ronald C. Petersen Gerald H. Peterson John B. Posey Gary S. Robinson Akio Tojo Hans E. Weinrich Donald W. Zipse Copyright 2000 IEEE. All rights

34、 reserved.v Contents 1.Scope 1 1.1 Fuses and fuse equipment 1 1.2 Description of fuse-enclosure packages (FEP) using expulsion type indoor power class fuses 2 1.3 Description of FEPs using current-limiting type indoor distribution and power class fuses 2 2.References 2 2.1 American National Standard

35、s 2 2.2 Other standards 3 3.Required tests. 3 3.1 Device tests 4 3.2 FEP tests 4 3.3 Test values . 4 3.4 Testing responsibility. 4 4.Common test requirements 4 4.1 Test site conditions 5 4.2 Frequency and wave shape of test voltage. 5 4.3 Devices to be tested . 5 4.4 Acceptance criteria 5 4.5 Test-c

36、onductor dimensions 6 4.6 Mounting and grounding of the device for tests 6 5.Dielectric tests 7 5.1 Measurement of test voltages 8 5.2 Description of power-frequency dry-withstand voltage tests 8 5.3 Description of power-frequency wet-withstand voltage tests on outdoor devices 8 5.4 Description of p

37、ower-frequency dew-withstand voltage tests on indoor devices. 8 5.5 Description of impulse-withstand voltage tests. 9 5.6 Distribution class expulsion type fuses, cutouts, and fuse-disconnecting switch test connections and test values 10 5.7 Distribution class oil cutout test connections and test va

38、lues 10 5.8 Distribution class enclosed single-pole air switch test connections and test values 11 5.9 Power class expulsion and current-limiting fuse, and fuse-disconnecting switch test connections and test values 11 5.10 Distribution class current-limiting fuse and fuse-disconnecting switch test c

39、onnections and test values 12 5.11 Distribution class and power class expulsion and current-limiting type fuses, and fuse disconnecting switches used in FEPs 12 5.12 Distribution and power class external fuses for shunt capacitors 14 6.Interrupting tests 14 6.1 Procedures common to all interrupting

40、tests 14 6.2 Description of interrupting tests on distribution class open-link cutouts 16 viCopyright 2000 IEEE. All rights reserved. 6.3 Description of interrupting tests on distribution class oil cutouts . 16 6.4 Description of interrupting tests on distribution class fuse cutouts (open and enclos

41、ed) (except current-limiting fuses). 16 6.5 Description of interrupting tests on power class fuses and fuse-disconnecting switches (except current-limiting fuses and liquid-submerged power fuses). 17 6.6 Description of interrupting tests on current-limiting power and distribution fuses. 17 6.7 Descr

42、iption of interrupting tests for FEPs using current-limiting type indoor distribution and power class fuses. 24 6.8 Description of interrupting tests for FEPs using liquid-submerged, expulsion type indoor power class fuses 25 6.9 Description of interrupting tests for air-insulated FEPs using expulsi

43、on type indoor power class fuses 26 6.10 Description of interrupting tests for external fuses for shunt capacitors. 27 7.Load-break tests. 31 7.1 Procedures common to all load-break tests . 31 7.2 Description of load-break tests for all fused devices except distribution class oil cutouts . 34 7.3 De

44、scription of load-break tests for distribution class oil cutouts. 34 8.Making-current tests (distribution class oil cutouts) 34 8.1 Procedures common to all making-current tests for distribution class oil cutouts 34 8.2 Description of making-current tests for distribution class oil cutouts. 35 9.Rad

45、io-influence tests 35 9.1 Procedures common to all radio-influence tests 35 9.2 Description of radio-influence tests on a single device. 37 9.3 Description of radio-influence tests on multiple devices. 37 9.4 Description of radio-influence tests for assembled apparatus . 37 10.Short-time current tes

46、ts 38 10.1 Mounting and grounding of device for test . 38 10.2 Test connections 38 10.3 Test circuit ratio. 38 10.4 Description of momentary current tests. 39 10.5 Description of 15-cycle current tests. 39 10.6 Description of 3 s current tests 40 10.7 Acceptance criteria 40 11.Temperature-rise tests

47、 40 11.1 Procedures common to all temperature-rise tests 40 11.2 Description of temperature-rise tests (except on distribution oil cutouts). 41 11.3 Description of temperature-rise tests for air-insulated FEPs using expulsion type indoor power class fuses 41 12.Time-current tests 41 12.1 Procedures

48、common to all time-current tests. 41 12.2 Description of melting time-current tests 43 12.3 Description of total-clearing time-current tests. 43 Copyright 2000 IEEE. All rights reserved.vii 13.Manual-operation, thermal-cycle, and bolt-torque tests (distribution cutouts) 44 13.1 Description of manual

49、-operation tests. 44 13.2 Description of thermal-cycle tests . 44 13.3 Description of torque tests. 45 14.Liquid-tightness tests. 45 14.1 Description of liquid-tightness tests 45 14.2 Test series 46 14.3 Acceptance criteria 46 15.Description of expendable-cap static-relief pressure tests. 46 Annex A (informative) Recommended methods for determining the value of a sinusoidal current wave and a power-frequency recovery voltage 67 A.1 Current waves. 67 A.2 Power-frequency recovery voltage. 68 Annex B (informative) Recommended method for determining the equivalent steady-state rms c

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