《IEEE Std C37.90.2-2004 IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers.pdf》由会员分享，可在线阅读，更多相关《IEEE Std C37.90.2-2004 IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers.pdf（18页珍藏版）》请在三一文库上搜索。
1、IEEE Std C37.90.2-2004 (Revision of IEEE Std C37.90.2-1995) IEEE Standards C37.90.2 TM IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers 3 Park Avenue, New York, NY 10016-5997, USA IEEE Power Engineering Society Sponsored by the Power
2、Systems Relaying Committee IEEE Standards 17 December 2004 Print: SH95285 PDF: SS95285 Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Ave
3、nue, New York, NY 10016-5997, USA Copyright 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 17 December 2004. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portion
4、s of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no posi
5、tion is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that a
6、re brought to its attention. Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved.iii Introduction IEEE Standard for Withstand Capability of Relay Systems to Radiated El
7、ectromagnetic Interference from Transceivers was developed and published initially as a Trial Use Standard with an field strength requirement of 10 volts/meter over the frequency range of 25 Mhz. to 1000 Mhz. The Trial Use standard expired after 2 years of publication. Following reviews of inputs re
8、ceived from use of the Trial Use Standard, the final C37.90.2 document was subsequently released with a field strength requirement of 35 volts/meter. This field strength magnitude was established based upon test information received from the Working Group members. This publication is a revision of t
9、he IEEE Std C37.90.2-1995. This revision of IEEE Std C37.90.2 contains changes so it will harmonize more closely with currently published IEC standards whenever possible. The test requirement changes are as described below. a)The minimum test frequency of the sweep range has been changed from 25 Mhz
10、 to 80 Mhz, which is the same as IEC 60255-22-3 B1. b)The maximum sweep rate was changed from 0.005 octave/sec. to 1.5 103 decades per second, which is the same as IEC 60255-22-3 B1. c)Added a Spot Frequency test, as specified in IEC 60255-22-3 B1. Notice to users Errata Errata, if any, for this and
11、 all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/
12、ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection
13、therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. (This introduction is not par
14、t of IEEE Std C37.90.2-2004, IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers.) Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. ivCopyright
15、 2004 IEEE. All rights reserved. Participants This standard was prepared by the I18 Working Group of the Relaying Practices Subcommittee of the IEEE Power System Relaying Subcommittee. At the time this standard was approved, the working group had the following members. Jeffrey A. Burnworth, Chair At
16、 the time this standard was approved, the Relaying Practices and Consumers Interface Subcommittee membership was as follows: J. Gilbert, Chair Jeffrey Gilbert William Higinbotham G. Johnson William C. Kotheimer Robert D. Pettigrew Roger E. Ray Miriam Sanders Mark Simon Veselin Skendzic John Tengdin
17、A. P. Apostolov M. Bajpai B. L. Beckwith J. R. Boyle Jeffrey A. Burnworth M. W. Carpenter Jack Chadwick, Jr. M. Clark M. W. Conroy C. Downs P. R. Drum I. O. Hasenwinkle S. H. Horowitz J. D. Huddleston J. W. Ingleson M. Kezunovic William C. Kotheimer P. A. Kotos E. Kritzauskas W. Lowe W. J. Marsh, Jr
18、. M. J. McDonald P. J. Mclaren M. Meisinger B. Nelson Robert D. Pettigrew T. Phillippee M. M. Renieri M. S. Sachdev T. S. Sidhu Mark Simon L. E Smith J. E. Stephens R. Sullivan Mark Swanson J. Teague J. S. Thorp D. A. Tziouvaras E. A. Udren Y. Young S. E. Zocholl Authorized licensed use limited to:
19、BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved.v The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention.
20、 When the IEEE-SA Standards Board approved this standard on 24 September 2004, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC R
21、epresentative Richard DeBlasio, DOE Representative Alan Cookson, NIST Representative William Ackerman Steve Alexanderson Munnu Bajpai Michael Basler Kenneth Behrendt Robert Beresh Stuart Bouchey Daniel Brosnan Gustavo Brunello John Burger Jeffrey A. Burnworth John W. Chadwick, Jr. R Daubert Byron Da
22、venport Matthew Davis Paul Drum Amir El-Sheikh Walter Elmore Gary Engmann Kenneth Fodero Marcel Fortin Frank Gerleve Jeffrey Gilbert Anthony Giuliante Roger Hedding Charles Henville William Higinbotham Edward Horgan, Jr. John Horwath James D. Huddleston, III Joseph L Koepfinger William Kotheimer Mar
23、c Lacroix Jason Lin William Lowe John McDonald Mark McGranaghan Gary Michel Bruce Muschlitz Gerald Nicely Mario Ranieri Peter Raschio Roger E. Ray Michael Roberts Charles Rogers James Ruggieri Mohindar S. Sachdev Miriam Sanders Tarlochan Sidhu H. Jin Sim Mark Simon H. Lee Smith James Smith John Teng
24、din Ron Westfall Karl Zimmerman Charles Wagner Chuck Adams H. Stephen Berger Mark D. Bowman Joseph A. Bruder Bob Davis Roberto de Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Hermann Koch Thom
25、as J. McGean Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Doug Topping Joe D. Watson Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. viCopyrig
26、ht 2004 IEEE. All rights reserved. CONTENTS 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.Definitions . 1 3.Test severity level 2 4.Test equipment. 2 5.Test set-up 3 6.Test procedure 3 6.1 Frequency sweep or step test. 4 6.2 Keying test. 4 6.3 Spot Frequency test 4 6.4 Criteria for acceptance. 5 7.Test
27、records 6 Annex A (informative) Transceiver field strength. 7 Annex B (informative) Test Waveform specification . 8 Annex C (informative) Field strength calibration, IEC 61000-4. 9 Annex D (informative) Bibliography 11 Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded
28、on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. Copyright 2004 IEEE. All rights reserved.1 IEEE Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers 1. Overview 1.1 Scope This standard defines a required withstand level and estab
29、lishes a test method to evaluate the susceptibility of protective relays to single-frequency electromagnetic fields in the radio frequency domain, such as those generated by portable or mobile radio transceivers and wireless communication devices. This publication includes test requirements, signal
30、levels, and setups. 1.2 Purpose The purpose of this standard is to establish a common reference and test procedure for evaluating the performance of equipment used for power system protection when subject to Radiated Electromagnetic Interference from Transceivers. 2. Definitions Definitions of relay
31、 terms are not included in this standard. Refer to IEEE Std C37.100-1992, Standard Definitions for Power Switchgear B61 for definitions of relay terms. These terms are also included in The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition B4. 2.1 far field: Region where the power flu
32、x density from an antenna approximately obeys an inverse square law of distance. 2.2 frequency band: Continuous range of frequencies extending between two limits. 2.3 polarization: Orientation of the electric field vector of a radiated field. 2.4 shielded enclosure: Screen or solid metal housing des
33、igned expressly for the purpose of isolating the internal from the external electromagnetic environment. 1The numbers in brackets correspond to those in the bibliography in Annex D. Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xpl
34、ore. Restrictions apply. IEEE Std C37.90.2-2004IEEE STANDARD FOR WITHSTAND CAPABILITY OF RELAYING SYSTEMS TO 2Copyright 2004 IEEE. All rights reserved. 3. Test severity level The rms field strength prior to modulation shall be 20 V/m. The waveform shall be amplitude modulated with a 1 kHz sine wave.
35、 Modulation shall be equal to 80%, with the resulting maximum rms field strength not being less than 35 V/m. The test carrier frequency shall be swept or stepped through the range of 80 MHz to 1000 MHz. 4. Test equipment The following types of test equipment are recommended. The use of other means o
36、f establishing and controlling the field is acceptable providing the required conditions can be verified: a)Anechoic Chamber: of a size adequate to maintain a uniform field of sufficient dimensions with respect to the equipment under test (EUT). Additional absorbers may be used to damp reflections i
37、n chambers, which are not fully lined. NOTEAlternative methods of generating electromagnetic fields include TEM cells and stripline circuits, unlined screened rooms, partially lined shielded rooms, and open area test sites. Care should be taken to ensure that the conditions of tests are equivalent t
38、o those in the anechoic chamber.2 b)Radio Frequency (RF) Signal generator(s) capable of covering the frequency range with capability of an 80% amplitude modulation by a 1 kHz sinewave. If the test carrier is to be swept, the RF signal generator should be capable of achieving a sweep rate of 1.5 10 3
39、 decades per second. c)A power amplifier to amplify signal and provide antenna drive to the necessary field level, if signal generator is inadequate. 2Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement the standard. 0.8 m MINIMUMNONC
40、ONDUCTING TABLE 0.3 m MINIMUM ANTENNA CL TEST SPECIMEN 0.8 m MINIMUM 1 m 1 m MINIMUM 0.8 m MINIMUM 0.5 m MINIMUM 1 m MINIMUM Figure 1Test set-up Authorized licensed use limited to: BEIJING UNIVERSITY OF TECHNOLOGY. Downloaded on May 5, 2009 at 10:50 from IEEE Xplore. Restrictions apply. IEEE RADIATE
41、D ELECTROMAGNETIC INTERFERENCE FROM TRANSCEIVERSStd C37.90.2-2004 Copyright 2004 IEEE. All rights reserved.3 d)Field generating antennas capable of covering the frequency range such as biconical, conical logarithmic spiral, or any other linearly polarized antenna system capable of satisfying frequen
42、cy requirements. e)Associated equipment to record the power levels necessary for the required field strength and to control the generation of that level for testing. f)Associated equipment to monitor output of the relay under test to establish operating performance and signals during test. 5. Test s
43、et-up Where possible, it is recommended that all auxiliary equipment should be located outside the boundary of the test enclosure or site. The equipment under test shall be individually tested, with the EUT placed on a non-conducting table, 0.8 m above the ground plane. All parts of the EUT shall be
44、 at least 0.8 m from any metal surfaces. When the EUT is exclusively mounted in a cubicle, the test may be conducted with the EUT in the cubicle. The cubicle should be placed on a non-conducting support, and for the practical reasons, a distance of approximately 0.1 m is recommended between the cubi
45、cle and the ground plane. Where earth connections are required for safety purposes, they shall be connected to the ground plane. Where they are not otherwise provided or specified by the manufacturer, earth connections shall be, where practical, 0.1 m from the auxiliary power supply connection. Othe
46、r earth connections (e.g. for electromagnetic compatibility purposes) either specified or supplied by the manufacturer for connection to the same terminal as the safety earth connection, shall also be connected to the ground plane. The length of these connections shall be as short as possible. Inter
47、connecting cables shall be as follows: The manufacturers specified wiring types and connectors shall be used. If the manufacturers specification requires a wiring length of less than or equal to 3 m, then the specified length shall be used. The wiring shall be bundled to 1m lengths. If the specified
48、 length is greater than 3 m, or is not specified, then the exposed length shall be 1 m. The bundled length of exposed wiring shall be ran in a configuration that essentially simulates normal wiring. 6. Test procedure It is the intent of this test to duplicate as nearly as possible in-service conditi
49、ons with the relay in its normal non-transitional state. Where appropriate, the relay shall be energized with rated voltage and with current equal to 75% of the nominal current transformer (CT) rating. The relay settings should be chosen such that the relay is as close as possible to its transitional state, but not closer than the recommended margins for its application. Time delay settings of the EUT shall be set to their minimum practical values as defined by their intended application. Input voltage to the power supply circuits must be within the