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1、BRITISH STANDARD BS 9460:1974 Incorporating Amendment Nos. 1 and 2 Rules for the preparation of Detail specifications for Integrated circuits of assessed quality differential operational amplifiers general application category Licensed Copy: London South Bank University, London South Bank University
2、, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 BSI 02-2000 ISBN 0 580 34397 9 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British
3、Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 7 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be
4、 indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.Date of issueComments 1833December 1975 4028May 1982Indicated by a sideline in the margin Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00
5、2006, Uncontrolled Copy, (c) BSI BS 9460:1974 BSI 02-2000i Contents Page 1Introduction1 2Scope1 3Limiting conditions of use (Ratings)1 4Recommended conditions of use and associated characteristics1 5Inspection requirements2 6Additional information6 Licensed Copy: London South Bank University, London
6、 South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 BSI 02-20001 1 Introduction This British Standard sha
7、ll be read and used in conjunction with Section 2 of BS 9400:1970, “Integrated electronic circuits of assessed quality: generic data and methods of test”, which gives the general rules for the preparation of detail specifications for integrated circuits. The object of the general rules given in Sect
8、ion 2 of BS 9400 is to ensure that detail specifications for integrated circuits are broadly similar as regards their subject matter and presentation. The object of the additional rules given in this standard is to ensure that all detail specifications for differential operational amplifiers are clo
9、sely similar. 2 Scope This British Standard lists the ratings, characteristics, inspection requirements and supplementary information for differential operational amplifiers which shall be included as minimum mandatory requirements, in accordance with the general rules given in Section 2 of BS 9400,
10、 in the detail specification for these devices. A complete detail specification is, therefore, a combination of the requirements of both documents. Its purpose is to describe fully the particular amplifiers so that the detail specification can be used for contractual purposes in the procurement of a
11、mplifier circuits, for acceptance test purposes and for circuit design and equipment maintenance purposes. The rules given in this standard do not apply to other forms of analogue circuits. The rules for such circuits are given in other standards in this series. The rules given in this standard refe
12、r primarily to amplifiers, using a sealed package type of encapsulation. They can be used, however, for solid encapsulation (plastics) types of device provided that the modifications listed in 2.2.5 of BS 9400 are included in the detail specifications for these devices. 3 Limiting conditions of use
13、(Ratings) (see 2.1.5 of BS 9400) Where it is necessary to ensure stable operation of a circuit by use of external elements the values of the external elements shall be specified. If externally connected elements have an influence on the values of the ratings, the ratings shall be given for the ampli
14、fier with the elements connected. Any instructions on the switching sequence of supply voltages, as appropriate, shall be stated. The following conditions of use (ratings) shall be given as absolute limiting values and shall not be used for inspection purposes: 4 Recommended conditions of use and as
15、sociated characteristics (see 2.1.6 of BS 9400) The following recommended conditions of use and associated characteristics shall be given. They shall not be used for inspection purposes except as prescribed in Clause 5. They shall apply over the full ambient operating temperature range unless otherw
16、ise specified. Where the stated performance of the circuit varies over the ambient operating temperature range the values of the input and output voltages and their associated currents shall be stated at 25 C and at the extremes of the operating temperature range. Maximum (and where appropriate mini
17、mum) value(s) of voltage(s) between the reference terminal and each other terminal. Any other limiting value of voltage between any specified pair(s) of terminals. RL, ILMinimum value of load resistance RL and the associated maximum value of load current IL. Where appropriate, a time de-rating curve
18、 for IL should also be given. TambMaximum and minimum ambient operating temperature. TstgMaximum and minimum storage temperature. Any specific mechanical or environmental ratings peculiar to the particular device shall be stated. Any interdependence of limiting conditions shall be stated. + VCCMaxim
19、um and minimum positive supply operating voltage(s) VCCMaximum and minimum negative supply operating voltage(s) Any recommended inter-relationship between the supply voltages shall be stated. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 200
20、6, Uncontrolled Copy, (c) BSI BS 9460:1974 2 BSI 02-2000 Minimum input impedance Maximum output impedance Maximum supply current (s) Minimum common mode rejection ratio Maximum acquisition time When it is necessary to use external elements to ensure stable operation of the amplifier, the values of t
21、he characteristics specified refer to the amplifier with such elements connected. 5 Inspection requirements (see 2.2 of BS 9400) The following data shall be given for Groups A, B, C and D inspection requirements. The inspection levels and AQL to be quoted in the detail specification shall be as spec
22、ified in 2.2 of BS 9400 unless otherwise stated. Unless otherwise indicated tests shall be made at 25 C. External elements necessary to ensure stable operation shall be specified and shall be connected for all electrical tests. IBMaximum and minimum values of input bias current(s), where appropriate
23、 VBMaximum and minimum values of input bias voltage(s), where appropriate Where appropriate, nominal value of bias current at an output terminal AVOLMinimum and, where appropriate, maximum open-loop voltage amplification VIOSMaximum input off-set voltage Maximum temperature coefficient of input off-
24、set voltage VOUTMaximum positive and negative voltage swing at output terminal(s) as appropriate IIOSMaximum input off-set current ZLMinimum output load impedance InspectionBS 9400:1970 reference and conditions of test Limits to be specified at this point Group A Subgroup A1 Subgroups A4 and A5 not
25、applicable Visual inspection1.2.2.1NoneNone Subgroup A2 Open-loop small-signal voltage amplification 3030VCC= specified positive and negative values RS= specified value ZL= specified value VOUT= specified quiescent and peak-to-peak values Frequency = specified value (where appropriate) Bias voltage
26、= specified value 80 % of the limit value for the test in subgroup A3 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 BSI 02-20003 InspectionBS 9400:1970 reference and conditions of test Limits to
27、be specified at this point Subgroup A3 Input bias current, IB Input off-set current IIOS 3020 3021 VCC= specified positive and negative values ZL= specified value VOUT= specified value VCC= specified positive and negative values ZL= specified value VOUT= specified value Maximum Maximum Input off-set
28、 voltage VIOS Open-loop small-signal voltage amplification, AVOL Output voltage swing, positive and negative VOUT Common-mode rejection ratio 3011 3030 3012 3033 R1= specified value R2= specified value R3= specified value VCC= specified positive and negative values ZL= specified value VOUT= specifie
29、d value R1= specified value R2= specified value VCC= specified positive and negative values RS= specified value ZL= specified value VOUT= specified quiescent and peak-to-peak values Frequency = specified value (where appropriate) Bias voltage = specified value VCC= specified positive and negative va
30、lues RL= specified value Frequency (where appropriate) VCC= specified positive and negative values RS= specified value ZL= specified value VOUT= specified quiescent and peak-to-peak values Frequency = specified value (where appropriate) Bias voltage = specified value Maximum Minimum Minima Minimum L
31、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 4 BSI 02-2000 InspectionBS 9400:1970 reference and conditions of test Limits to be specified at this point Group B Subgroup B1 Subgroups B4 and B5 not
32、 applicable Dimensions1.2.3As requiredAs required Subgroup B2 (a)See also 2.2.2.2 of BS 9400 Solderability1.2.6.15.1See Note 1 Subgroup B2 (b) Rapid change of temperature, followed by: either Sealing (fine and gross leak) for cavity packages or Damp heat, cyclic for non-cavity packages 1.2.6.13 1.2.
33、6.14 1.2.6.5 Rated maximum and minimum Tstg values Six cycles None None None Subgroup B3 Terminal robustness, bending 1.2.6.16.1 to 1.2.6.16.4 As appropriate to the terminations of the integrated circuit under test. None Subgroup B6 Acceleration steady state1.2.6.9Value depending on construction and
34、 weight Mounting and direction of acceleration None Subgroup B7 Electrical endurance1.2.7Duration = 160 h minimum Ambient or reference point temperature Test circuit to be specified Electrical conditions to be applied to all terminals None Post-test end-points for subgroups B2(b), B6 and B7 Input bi
35、as current Input off-set current Input off-set voltage Open-loop small-signal voltage amplification 3020 3021 3011 3030 ) ) ) ) ) ) ) ) Condition and limits as for subgroup A3 Subgroup B8 CTR information1.1.11Attributes information for subgroups B2 (a), B2 (b), B6 and B7 Group C Subgroup C1 Dimensio
36、ns1.2.3As requiredAs required Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 BSI 02-20005 InspectionBS 9400:1970 reference and conditions of test Limits to be specified at this point Subgroup C2 (
37、a) Temperature coefficent of input off-set voltage 3070As for input off-set voltage in subgroup A3 except Tamb= maximum and minimum ambient operating temperatures Maximum Subgroup C2 (b) Output impedance Zo Input impedance (for input impedance not exceeding 1 M 7) Cut-off frequencies Acquisition tim
38、e Overshoot Noise (where appropriate) 3051 3050 3034 3036 3036 VCC= specified positive negative values Generator frequency, impedance and amplitude Bias at input and output (where appropriate) to be specified VCC= specified positive and negative values Generator frequency Input bias Output load impe
39、dance VOUT= specified value As for open-loop voltage amplification in subgroup A3 VCC= specified positive and negative values, probably maxima RS and feedback resistance required for unity gain Load impedance Phase compensation network (if any) Input pulse characteristics Conditions as for acquisiti
40、on time VCC= specified positive and negative values RS and RL to be specified Frequency and bandwidth Maximum Minimum Maximum and where appropriate Minimum Maximum Maximum Maximum Supply voltage rejection ratio Supply currents (each supply) 3035 2011 As for input offset voltage in subgroup A3 except
41、 that the supply voltages are changed by specified amount VCC= specified maximum recommended positive and negative values Inputs and outputs open-circuit Maximum Maximum Subgroup C3 Vibration swept frequency, followed by: Shock and Damp heat, cyclic 1.2.6.8.1 1.2.6.6 1.2.6.5 Values dependent on weig
42、ht Values of peak acceleration and duration 28 cycles None Subgroup C4 (a) Input off-set current Input off-set voltage 3021 3011 ) ) Conditions as for subgroup A3 except Tamb= maximum value Maximum Maximum Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48
43、 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974 6 BSI 02-2000 6 Additional information (see 2.1.8 of BS 9400) The following additional information shall be given as minimum design data: 1) Maximum permissible ripple from power supplies and maximum impedance of power supplies 2) Value of out
44、put bias current or resistor, where appropriate 3) Values of externally connected elements and curves or data indicating their effects e.g. on gain and cut-off frequencies. InspectionBS 9400:1970 reference and conditions of test Limits to be specified at this point Subgroup C4 (b) Input bias current
45、 Input off-set current Input off-set voltage 3020 3021 3011 ) ) ) Conditions as for subgroup A3 except Tamb= minimum value Maximum Maximum Maximum Subgroup C5 Electrical endurance1.2.1 or 1.2.8.1 Duration = 2 000 h minimum Conditions as for subgroup B7 Duration and temperature None None Post-test en
46、d-points for subgroups C3 and C5 Tests, test conditions and limits as for post-test end-points in Group B Subgroup C6 CTR information1.1.11Attributes information for subgroups C3 and C5. Measurements information for IB, IIOS, VIOS and AVOL before and after the test in subgroup C5 on one input and on
47、e output per package (for monolithic circuits) or per chip (for multi-chip circuits) Group D (See Note 2) Subgroup D1 Subgroups D2 and D3 not applicable Dimensions1.2.3As requiredAs required Subgroup D4 Electrical endurance1.2.7 or 1.2.8.1 Duration = 8 000 h minimum Conditions as for subgroup B7 Dur
48、ation and temperature None None Post-test end-points for subgroup D4 Tests, test conditions and limits as for post-test end-points in Group B Subgroup D5 CTR information1.1.11Attributes information for subgroup D4. Measurements information for IB, IIOS, VIOS and AVOL before and after the test in sub
49、group D4 on one input and one output per package (for monolithic circuits) or per chip (for multi-chip circuits) NOTE 1When method 1.2.6.15.1 1) is specified the inspection level should be reduced to S-3. NOTE 2Also see 1.1.10 of BS 9400. NOTE 3The tests in subgroups C4 (a) and C4 (b) may be transferred to subgroups A3 (b) and A3 (c) respectively, the tests shown in subgroup A3 at 25 C to be included in subgroup A3 (a). Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 04:30:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9460:1974