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1、BRITISH STANDARD BS CECC 31101:1981 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed ceramic dielectric capacitors of the barrier layer type (dielectric class 3) Licensed Copy: London South Bank Univers
2、ity, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-1999 ISBN 0 580 35615 9 Amendments issued since publication Amd. No.Date of issueComments 4547March 1984Indicated by a sideline in the margin Licensed Copy: London South Bank U
3、niversity, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-1999i Contents Page National forewordii Forewordiii Text of CECC 311011 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT
4、+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee CECC 31101: “Blank detail specificati
5、on: Fixed ceramic dielectric capacitors of barrier layer type (Dielectric class 3)”. This standard is a harmonized specification within the CECC system. Terminology and conventions The text of the CECC specification has been approved as suitable for publication, without deviation, as a British Stand
6、ard. Some terminology and certain conventions are not identical with those used in British Standards. Attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal
7、 marker. Cross references The British Standard harmonized with CECC 00100 is BS E9000 “Specification for general requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System Part 1: Basic Rules”. The following International Standards a
8、re referred to in the text and for each there is a corresponding British Standard; these are listed below: Scope This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 31100. Detail specification layou
9、t In the event of conflict between the requirements of this specification and the provisions of BS E9000 the latter shall take precedence except that the front page layout will be in accordance with BS 9000 Circular Letter No 15 dated October 1980. A British Standard does not purport to include all
10、the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardCorresponding British Standard CECC 30000:1975BS E9070:1975 Harmonized
11、 system of quality assessment for electronic components: Generic specification for fixed capacitors (Identical) CECC 31100:1981BS CECC 31100:1981 Harmonized system of quality assessment for electronic components. Sectional specification: Fixed ceramic dielectric capacitors of barrier layer type (die
12、lectric class 3) (Identical) IEC 410:1973BS 6001:1972 Sampling plans and procedures for inspection by attributes. (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 to 6 and a back cover
13、. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (
14、c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 ii BSI 10-1999 Contents Page Forewordiii 1Dimensions1 2Specified method of mounting for vibration, shock and bump testing1 3Rating and c
15、haracteristics1 4Related documents2 5Marking2 6Ordering information2 7Qualification approval and quality conformance inspection2 8Certified test records2 Table 11 Table 2 Values of capacitance related to case sizes and rated voltages1 Table 2A Temperature characteristics1 Table 3 Other characteristi
16、cs1 Table 4A Lot by lot inspection (Group A and B)3 Table 4B Periodic tests4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-1999iii Foreword The CENELEC Electronic Components Committe
17、e CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the
18、 specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This blank detail specifi
19、cation has been formally approved by the CECC and has been prepared for those member countries taking part in the System who wish to issue national harmonized specifications for FIXED CERAMIC DIELECTRIC CAPACITORS (CLASS 3). It should be read in conjunction with document CECC 00100: Basic Rules (197
20、4). At the date of printing of this document the member countries of the CECC are Belgium, Denmark, France, Germany, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland and the United Kingdom. Copies of it can be obtained from the addressees shown on the inside cover. Preface This blank det
21、ail specification was prepared by CECC Working Group 3: “Capacitors”. It is one of a series of blank detail specifications for fixed ceramic dielectric capacitors (class 3), all relating to the sectional specification CECC 31100. In accordance with the requirements of document CECC 00100 it is based
22、, wherever possible, on the Publications of the International Electrotechnical Commission. As there are more than nine sectional specifications related to CECC 30000: generic specification, Fixed Capacitors, the CECC Management Committee decided that these extra specifications should be numbered in
23、the series 31100, 31200, 31300 etc . . There is no generic specification numbered 31000. The text of this blank detail specification was circulated to the CECC for voting in the documents listed below and was ratified by the CECC Management Committee for printing as a CECC Specification: DocumentVot
24、ing DateReport on the Voting CECC(Secretariat)829November 1979CECC(Secretariat)891 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 iv BSI 10-1999 Key for page iv The numbers between square br
25、ackets on page iv correspond to to the following indications which should be given: Identification of the harmonized detail specification 1 The name of National Standards Organization under whose authority the detail specification is drafted 2 The CECC Symbol and the number allotted by the CECC Gene
26、ral Secretariat to the completed detail specification 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specification, date of issue and any further information required by the national system. Identification for the capacitor 5 A
27、short description of the type of capacitor 6 Information on typical construction (see examples given on page iv) 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. 8 Quick reference data (see
28、 examples given on page iv) and level of quality assessment 9 Circuit diagram (if applicable). (NATIONAL STANDARDS ORGANIZATION) 1 CECC 31101 XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: (Numbers of national generic and sectional specification) 3 (National number of detail spe
29、cification, date of issue, national type number, if any) 4 DETAIL SPECIFICATION FOR FIXED CERAMIC DIELECTRIC CAPACITORS (CLASS 3)5 TYPICAL CONSTRUCTION: (Examples) tubular/plate/disc single/multilayer molded/dipped/unencapsulated wire/tag/screw terminations radial/axial terminations 6 QUICK REFERENC
30、E DATA: RATED CAPACITANCE RANGE CAPACITANCE TOLERANCE RATED VOLTAGE RANGE CLIMATIC CATEGORY TEMPERATURE CHARACTERISTIC OUTLINE DRAWING7ASSESSMENT LEVEL8 Circuit diagram (if applicable)9 See the relevant Qualified Products List for the availability of components qualified to this detail specification
31、 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-19991 1 Dimensions Table 1 2 Specified method of mounting for vibration, shock and bump testing 3 Ratings and characteristics NOTE 1Inf
32、ormation on the above characteristics may be given in tabular form, if necessary. NOTE 2Additional ratings and characteristics may be given, if applicable. Table 2 Values of capacitance related to case sizes and rated voltages Table 2A Temperature characteristics Table 3 Other characteristics Case s
33、izeDimensions (1) referencemaxLmaxHmaxd tol.(2)(2) (1) Body dimensions should preferably be expressed as maxima but, where necessary, be nominal with tolerance (2) Other important dimensions may be included as additional information. Sub-Class Capacitance range(See Table 2) Capacitance tolerance(s)(
34、See Table 2) Rated voltage(See Table 2) Rated temperature Tangent of loss angle Insulation resistance Voltage proof Temperature characteristic Climatic category Rated capacitance Tolerance (%) Case size reference voltage (smallest)(largest) NOTETable 2 should be considered as an example only because
35、 it may be appropriate to have as many tables as there are voltages. Temperature range Permissible capacitance variation with no voltage appliedwith UR applied . C/ + C+ . % . % + . % . % This table is to be used for defining characteristics which are additional to or tighter than those given in the
36、 sectional specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 2 BSI 10-1999 4 Related documents 5 Marking The following details selected from those listed in 1.4 of CECC 31100 sha
37、ll be given on the capacitor. 6 Ordering information Detail specification number Case size reference Rated capacitance Tolerance on rated capacitance Rated voltage Temperature characteristic Number of components ordered Together with other information to identify a specific size, constructional deta
38、ils, etc. as necessary. An example of ordering information shall be given. 7 Qualification approval and quality conformance inspection For qualification approval test and quality conformance inspection, the test schedule severities and requirements given in the sectional specification, shall apply.
39、In addition Table 4 specifies the tests, severities and requirements that have to be given in the detail specification. NOTEAdditional tests and additional or more severe requirements may also be specified in this table. 8 Certified test records Required/not required. Generic specification:CECC 3000
40、0) (see Preface, p. 1) Sectional specification:CECC 31100) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-19993 Table 4A Lot by lot inspection (Group A and B) Clause number and test D
41、 or ND Conditions of testILAQL % Performance requirements (1)(3)(2)(2)(1) Sub-Group A1NDS42,5 4.2Visual examination Dimensions No visible damage Marking legible See Table 1 Sub-Group A2NDII1,0 4.3 4.4 4.5 4.6 Capacitance Tangent of loss angle Insulation resistance Voltage proof 1 kHz, measuring volt
42、age k 0,1 V 1 kHz, measuring voltage k 0,1 V Measuring voltage UR for 10 V UR 100 V Test point 1a) 1,25 UR Test point 1c) 100 V or 3 UR Within tolerance limits tan $ k 0,1 See Table in 4.5 No breakdown no flashover Sub-Group B1NDS32,5 4.10.2SolderabilityNo preliminary drying Bath method at 235 C or
43、globule method Soldering iron method if others not appropriate Solder globule See detail specification Other method: Good tinning NOTESpecimens having passed the Group B non-destructive tests shall still satisfy the tests of group A. (1) Clause numbers and performance requirements refer to CECC 3110
44、0 (2) Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410 (3) In Table 4A and Table 4B: P = periodicity (in months) n = sample size c = acceptance criterion D = destructive ND = non-destructive Licensed Copy: London South Bank University, London South Bank University
45、, Fri Dec 08 17:02:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31101:1981 4 BSI 10-1999 Table 4B Periodic tests Clause number and test D or ND Condition of testPnc Performance requirements (1)(3)(3)(3)(3)(1) Sub-Group C1aD691 4.9.1 4.9.2 4.9.3 4.9.4 Initial measurements U: Robustness of te
46、rminations Ua1: Tensile Ub: Bending Uc: Torsion (if applicable) Tb: Resistance to soldering heat Final measurements Special preconditioning Capacitance Ub: Method 2 Method 1A or 1B as applicable Immersion time for Method 1A (5 s or 10 s) Visual examination Capacitance No visible damage No visible da
47、mage Capacitance change: See 4.9.4 Sub-Group C1bD6181 4.10.1 4.10.3 4.10.4 4.10.5 4.10.6 Initial measurements Na: Rapid change of temperature Fc: Vibration Ea: Shock or Eb: Bump Final measurements Special preconditioning Capacitance 5 cycles Exposure: 30 min Test method Severity Method of mounting M
48、ethod of mounting Severity Special preconditioning Visual examination Capacitance No visible damage No visible damage Marking legible Capacitance change: 4.10.6 (1) and (3): See page 3 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:43 GMT+00:00 2006, Unco
49、ntrolled Copy, (c) BSI BS CECC 31101:1981 BSI 10-19995 Table 4B Periodic tests Clause number and test D or ND Condition of testPncPerformance requirements (1)(3)(3)(3)(3)(1) Group C1DCombined samples of Sub-Group C1a and C1b 6272 4.11 4.11.1 4.11.2 4.11.3 4.11.4 4.11.5 4.11.6 4.11.7 Climatic sequence Initial measurements Ba: Dry heat Db: Damp heat cyclic, first cycle Aa: Cold M: Low air pressure (if required) Db: Damp heat cyclic, remaining cycles Final measurements Not required Temperature Du