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1、BRITISH STANDARD BS CECC 90302:1986 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Integrated voltage comparators Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:
2、57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 BSI 10-1999 ISBN 0 580 35659 0 Amendments issued since publication Amd. No.Date of issueComments 8296August 1994Indicated by a sideline in the margin Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08
3、 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 BSI 10-1999i Contents Page National forewordii Forewordiii Text of CECC 903021 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 903
4、02:1986 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 90302:1986 “Harmonized system of quality assessment for electronic components. Bl
5、ank detail specification: Integrated voltage comparators as amended by Amendment No. 1 published in 1994. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions ar
6、e not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is currently practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which imp
7、lements CECC 00100 is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 2 “Specification for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the provisions of IEC 147 to which reference is made in
8、the text, and has decided that they are acceptable for use in conjunction with this standard. A related British Standard for IEC 147 is BS 9300 “Semiconductor devices of assessed quality: generic data and methods of test”. Scope. This standard lists the ratings, characteristics and inspection requir
9、ements which shall be included as mandatory requirements in accordance with BS CECC 90300 in any detail specification for these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS
10、 9000 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Internation
11、al StandardsCorresponding British Standards CECC 90000:1982BS CECC 90000:1982 Harmonized system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits (Identical) CECC 90300:1985BS CECC 90300:1985 Harmonized system of quality assessment for electronic
12、components. Sectional specification: Interface monolithic integrated circuits (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 to 10 and a back cover. This standard has been updated (see copyright
13、date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank Universi
14、ty, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 ii BSI 10-1999 Contents Page Forewordiii 1Front page1 2Ratings (Limiting values)3 3Recommended conditions of use and associated characteristics3 4Test conditions and inspection require
15、ments5 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 BSI 10-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committ
16、ee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic comp
17、onents, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those countrie
18、s taking part in the System who wish to issue national harmonized specifications for INTEGRATED VOLTAGE COMPARATORS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this document the member countries of the CECC are Austria, Belgium, Denm
19、ark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Preface This blank detail specification (BDS) was prepared by CECC WG9 “Integrated circuits”. It is based, wherever possible, on the Publications of the International
20、 Electrotechnical Commission and in particular on IEC 147: Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. The text of this BDS was circulated to the CECC for voting in the document indicated below and ratified by the President of the CECC
21、for printing as a CECC specification. It is recognized that the layout proposed cannot be applied to all detail specifications based on this document. For instance, it may be preferable to indicate the limiting values in the form of a table when several similar devices appear in the same detail spec
22、ification. In accordance with the decision of the CECC Management Committee this specification is published initially in English and French. The German text will follow as soon as it has been prepared. DocumentDate of VotingReport on the Voting CECC(Secretariat) 1573October 1984CECC(Secretariat) 167
23、9 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302
24、:1986 BSI 10-19991 1 Front page The front page of the DS shall be laid out as shown on the following page. The numbers between square brackets correspond to the following indications which should be given: Identification of the DS and of the component: 1 The name of the National Standards Organizati
25、on under whose authority the DS is published and, if applicable, the organization from whom the DS is available. 2 The CECC Symbol and the CECC number allotted to the DS by the CECC General Secretariat. 3 The number and issue number of the CECC generic or sectional specification as relevant; also na
26、tional reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any further information required by the national system, together with any amendment numbers. 5 Type number, a short description of the type by: function (for example voltage comparat
27、or with strobe) number of independent circuits per package number and kind of inputs and outputs material and type of construction (silicon, monolithic, multichip, bipolar, MOS) performance, for example high output power, high speed, low power consumption electrostatic sensitivity (where applicable)
28、. 6 Information on typical construction (where applicable) For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC 00200 (QPL) and CECC 00300 (Library List). 7 An outline drawing with main dimensions which are of importance for interchangeability, and/or reference to the a
29、ppropriate national or international document for outlines. Alternatively, this drawing may be given in an appendix to the DS. 8 Quality assessment level(s) 9 Reference data giving information on the most important properties of the component, which allow comparison between the various component typ
30、es intended for the same, or for similar, applications. Identification of the component and supplementary information: Description of the materials for the package (for example, glass, ceramic, metal, plastic) and information relating to the mounting (welding, soldering), lead material and finish. I
31、nside the sketch of the package, the terminal connections to the inputs, outputs or other important points of the circuit shall be identified. This can be shown by a functional block diagram. Description of the numbering of the terminals with the identification of pin number 1. Marking on the device
32、 in accordance with the GS (see 2.5 of CECC 90000). Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 2 BSI 10-1999 Layout for front page of detail specification Licensed Copy: London South Ban
33、k University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 BSI 10-19993 2 Ratings (Limiting values) (Not for inspection purposes) Those apply over the operating temperature range, unless otherwise stated (see SS 90300). 2.1 Maximum (
34、and where appropriate minimum) value of voltage between the reference terminal and each other terminal. 2.2 Any other limiting value(s) of voltage between any specified terminals as appropriate. 3 Recommended conditions of use and associated characteristics (Not for inspection purposes) The followin
35、g characteristics shall apply over the full ambient operating temperature range unless otherwise specified. Where the stated performance of the circuit varies over the ambient operating temperature range the values of the input and output voltages and their associated currents shall be stated at 25
36、C and at the extremes of the operating temperature range. Where it is necessary to use external elements to ensure stable operation of the comparator, the values of the characteristics specified refer to the comparator with such elements connected. 2.3 Maximum continuous output currentIO 2.4 Maximum
37、 continuous internal power dissipation with reference to a derating curve or factor related to the reference point temperature or ambient temperature PD 2.5 Common mode and differential mode input voltagesVIC, VID 2.6 Maximum and minimum ambient or reference point operating temperatureTamb 2.7 Maxim
38、um and minimum storage temperatureTstg 2.8 Any specific mechanical or environmental ratings peculiar to the device 2.9 Any interdependence of limiting conditions 2.10Maximum value of output short-circuit current and duration, where appropriateIOS, tOS CharacteristicSymbol Method (See SS 90300 4.1) G
39、eneral characteristics Power supply currentsISA01 Input characteristics High level input voltage (strobe input, where appropriate) VIHD13 Low level input voltage (strobe input, where appropriate) VILD13 High level input current (strobe input, where appropriate) IIHD13 Low level input current (strobe
40、 input, where appropriate) IILD13 Input impedance (where appropriate)ZIA02 Input off-set voltage (where appropriate)VIOunder consideration Input off-set current (where appropriate)IIOI02 Input bias currentIIBI02 Input off-set voltage temperature coefficient (where appropriate)!VIOunder consideration
41、 Output characteristics High level output voltageVOHD12 Low level output voltageVOLD12 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 4 BSI 10-1999 High level output current (where appropria
42、te)IOHD12 Low level output current (where appropriate)IOLD12 Off-state (Z state) output current (where appropriate)IOZD12 Output short circuit current (where appropriate)IOSD15 Output impedance (where appropriate)ZoA03 Transfer characteristics Differential mode voltage amplification (where appropria
43、te)AVDunder consideration Strobe propagation time for L level to H level output transition (where appropriate) tPLHD05, D06 or D14 Strobe propagation time for H level to L level output transition (where appropriate) tPHLD05, D06 or D14 Strobe propagation time for L level to Z state output transition
44、 (where appropriate) tPLZD05, D06 or D14 Strobe propagation time for H level to Z state output transition (where appropriate) tPHZD05, D06 or D14 Strobe propagation time for Z state to L level output transition (where appropriate) tPZLD05, D06 or D14 Strobe propagation time for Z state to H level ou
45、tput transition (where appropriate) tPZHD05, D06 or D14 Output L level to H level transition time (where appropriate)tTLHD07 or D08 Output H level to L level transition time (where appropriate)tTHLD07 or D08 Output L level to Z state transition time (where appropriate)tTLZD07 or D08 Output H level t
46、o Z state transition time (where appropriate)tTHZD07 or D08 Output Z state to L level transition time (where appropriate)tTZLD07 or D08 Output Z state to H level transition time (where appropriate)tTZHD07 or D08 Delay time (where appropriate)tdA14 Rise time (where appropriate)trA14 Fall time (where
47、appropriate)tfA14 Total response time (where appropriate)ttotA14 Common mode input voltage rangeVICI01 Common mode input triggering voltage (where appropriate)VICTI01 Differential mode input overload recovery time (where appropriate)tordI03 Common mode input overload recovery time (where appropriate
48、)torcI03 Differential input voltage rangeVIDI04 Differential input threshold voltage (where appropriate)VIDTI06 Common mode rejection ratio (where appropriate)kCMRunder consideration Supply voltages rejection ratio (where appropriate)kSVRunder consideration CharacteristicSymbol Method (See SS 90300
49、4.1) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:03:57 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90302:1986 BSI 10-19995 4 Test conditions and inspection requirements See 3.6 of CECC 90000 with the following special requirements: The values and exact test conditions to be used shall be specified as required in the detail specification relevant to a given type, in line with the indications given in CECC 90300 for the releva