《BS-9925-02.0-1987 IEC-60723-3-1985 QC-250200-1985.pdf》由会员分享，可在线阅读，更多相关《BS-9925-02.0-1987 IEC-60723-3-1985 QC-250200-1985.pdf（14页珍藏版）》请在三一文库上搜索。
1、BRITISH STANDARD BS 9925-02.0: 1987 IEC 723-3: 1985 QC 250200: 1985 Harmonized system of quality assessment for electronic components Inductor and transformer cores for telecommunications Part 02.0: Sectional specification: Magnetic oxide cores for broad-band transformers IEC title. Inductor and tra
2、nsformer cores for telecommunications Part 3: Sectional specification: Magnetic oxide cores for broad-band transformers UDC 621.3.042.1:621.318.435 + 621.314:621.39 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) B
3、SI BS 9925-02.0:1987 This British Standard, having been prepared under the direction of the Electronic Components Standards Committee, was published under the authority of the Board of BSI and comes into effect on 31 July 1987 BSI 01-2000 The following BSI references relate to the work on this stand
4、ard: Committee reference ECL/20 Draft for comment 83/28820 DC ISBN 0 580 14056 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee (ECL/-) to Technical Committee ECL/20, upon which the following bo
5、dies were represented: Electronic Components Industry Federation Electronic Engineering Association Ministry of Defence National Supervising Inspectorate Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No.Date of issueComments Licensed Copy
6、: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-02.0:1987 BSI 01-2000 i Contents Page Committees responsibleInside front cover National forewordii Section 1. Scope1 Section 2. General1 2.1Related documents1 2.2Class
7、ification1 Section 3. Quality assessment procedures1 3.1Formation of inspection lots and test methods1 3.2Inspection for qualification approval2 3.3Fixed sample size qualification approval test schedule2 3.4Quality conformance inspection3 Section 4. Additional information3 Section 5. Blank detail sp
8、ecification3 5.1Identification of the specification3 5.2Identification of the core4 5.3Limiting conditions (not for inspection purposes)4 5.4Marking4 5.5Ordering information5 5.6Related documents5 5.7Additional specifications or test details5 5.8Certified test records5 Publications referred toInside
9、 back cover Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-02.0:1987 ii BSI 01-2000 National foreword This Part of BS 9925 has been prepared under the direction of the Electronic Components Standards C
10、ommittee. It is identical with IEC Publication 723-3 (QC 250200) “Inductor and transformer cores for telecommunications. Part 3: Sectional specification: Magnetic oxide cores for broad-band transformers”, published in 1985 by the International Electrotechnical Commission (IEC). This standard is a ha
11、rmonized specification within the IECQ system of quality assessment for electronic components, the basic rules of which are given, in the UK, in BS 9000. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without de
12、viation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references International StandardsCorresponding British Standards BS 2011 Basic environmental testing procedures IEC 68-1:1982Part 1.1:1983 General and guidance (Identical) IEC 68-2-1:1974
13、Part 2.1A:1977 Tests A. Cold (Identical) IEC 68-2-2:1974Part 2.1B:1977 Tests B. Dry heat (Identical) IEC 133:1985BS 4061:1966 Specification for dimensions of pot cores made of ferromagnetic oxides for use in telecommunication and allied electronic equipment (Technically equivalent) IEC 205:1966 plus
14、 supplements 205A (1968) and 205B (1974) BS 6454:1983 Method for calculation of the effective parameters of magnetic piece parts (Identical) BS 5938 Cores for inductors and transformers for telecommunications IEC 367-1:1982Part 1:1984 Methods of measurement (Identical) IEC 367-2:1974 plus supplement
15、 367-2A (1976) Part 2:1980 Guide to the drafting of performance specifications (Identical) IEC 424:1973BS 6786:1986 Guide to the specification of limits for physical imperfections of parts made from magnetic oxides (Identical) IEC 431:1983BS 6555:1984 Specification for dimensions of square cores (RM
16、-cores) made of magnetic oxides and associated parts (Identical) BS 9925 Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications IEC 723-1:1982 (QC 250000) Part 0:1984 Generic specification (Identical) Licensed Copy: London South Bank
17、University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-02.0:1987 BSI 01-2000iii At present there is no corresponding British Standard for IEC Publication 226, which is referred to in the text. The Technical Committee has reviewed the provisio
18、ns of this IEC Publication and has decided that they are acceptable for use in conjunction with this standard. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a Britis
19、h Standard does not of itself confer immunity from legal obligations. International StandardsCorresponding British Standards IEC 723-3-1:1985 (QC 250201) (QC 250202) Parts 02.01 and 02.02:1987 Blank detail specification: Magnetic oxide cores for broad-band transformers. Assessment levels A and B (Id
20、entical) Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, pages 1 to 6, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on t
21、he inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy,
22、(c) BSI BS 9925-02.0:1987 BSI 01-20001 Section 1. Scope This sectional specification lists the characteristics, ratings and also the inspection requirements for magnetic oxide cores of assessed quality forming a substantially closed magnetic circuit intended for broad-band transformers for professio
23、nal and industrial applications, excluding power and tuned transformers. It selects from the generic specification, IEC Publication 723-1, and from the basic specification, IEC Publication 367-1, the appropriate methods of test to be used in detail specifications derived from this specification, in
24、accordance with the corresponding blank detail specification. Section 2. General 2.1 Related documents 2.2 Classification A core is classified by: a) Shape: e.g. pot core, X core, RM core . b) Size: e.g. 18 11, X 22, RM 6 . c) Class or material grade: (combined electromagnetic properties, for exampl
25、e temperature coefficient and losses at given frequencies). Since no systematic classification of the electromagnetic properties is available in the IEC, each detail specification shall clearly define the class of material grade to which it applies. It may also state the appropriate class designatio
26、n. Normally, a detail specification will cover cores of one shape, size and class. Section 3. Quality assessment procedures 3.1 Formation of inspection lots and test methods 3.1.1 Where applicable the tests shall be selected from those given in Section 4 of IEC Publication 723-1. Where additional te
27、sts are needed, they shall be described in the detail specification. 3.1.2 Visual examination and measurement of dimensions shall be carried out either on half cores prior to pairing or on sets (see note). All other tests shall be carried out on sets. (See also Sub-clause 3.4.) NOTEA set is a pair o
28、f core halves. IEC publications. Publications Nos. 68-1 (1982):Basic Environmental Testing Procedures Part 1: General and Guidance. 68-2-1 (1974): Part 2: Tests Tests A: Cold. 68-2-2 (1974): Part 2: Tests Tests B: Dry Heat. 133 (1985):Dimensions of Pot-cores Made of Magnetic Oxides and Associated Pa
29、rts. 205 (1966):Calculation of the Effective Parameters of Magnetic Piece Parts. 226 (1967):Dimensions of Cross Cores (X-cores) Made of Ferromagnetic Oxides and Associated Parts. 367-1 (1982):Cores for Inductors and Transformers for Telecommunications Part 1: Measuring Methods. 367-2 (1974):Part 2:
30、Guides for the Drafting of Performance Specifications. 424 (1973):Guide to the Specification of Limits for Physical Imperfections of Parts Made from Magnetic Oxides. 431 (1983):Dimensions of Square Cores (RM-cores) Made of Magnetic Oxides and Associated Parts. 723-1 (1982):Inductor and Transformer C
31、ores for Telecommunications Part 1: Generic Specification. 723-3-1 (1985):Part 3: Blank Detail Specification: Magnetic Oxide Cores for Broad-band Transformers. Assessment Levels A and B. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Un
32、controlled Copy, (c) BSI BS 9925-02.0:1987 2 BSI 01-2000 3.1.3 The test coils for inductance, and those for loss factor or parallel resistance coefficient measurement shall be fully defined; this may be fulfilled by reference to a national or International Standard (see for example IEC Publication 4
33、31 for standard inductance measuring coils for RM cores). 3.1.4 Cores consisting of more than one part shall be clamped together in accordance with the requirements of Clause 4 of IEC Publication 367-1. The value of the clamping force shall be specified in the detail specification. NOTEWhere it woul
34、d be helpful to include such information, the detail specification may include details of the application of the clamping force (see, for example, the appendix of IEC Publication 367-2). If an inspection lot consists of cores of more than one inductance factor, the number of specimens in the sample
35、of each inductance factor shall be approximately proportional to the number of cores of each AL value in the lot. 3.2 Inspection for qualification approval 3.2.1 When it is desired to obtain qualification approval by adopting the fixed sample size procedure (see Clause 8 of IEC Publication 723-1) us
36、e shall be made of the test schedule given in Sub-clause 3.3 of this specification. The details of the tests are as specified in the quality conformance test schedule (see Sub-clause 3.4). When the blank detail specification contains tests not included in the fixed sample schedule of Sub-clause 3.3,
37、 these shall be added either in the appropriate group or in one or more additional groups, and the total number of specimens (Group 0) shall be adjusted accordingly. 3.2.2 When the detail specification covers more than one inductance factor, the sample for qualification approval shall include approx
38、imately equal quantities of the highest value, the lowest value and a value near the middle of the range for which approval is sought. As a general guide, the sample for each group (1, 2, etc.) for qualification approval shall be equivalent to the corresponding group of the quality conformance test
39、schedule and shall allow acceptance when one defective occurs in the sample. The sample size for group 0 shall be the sum of the sample sizes of the other groups plus two specimens to replace one possible defective in group 0 and one due to mishandling. 3.3 Fixed sample size qualification approval t
40、est schedule The following sample size shall be used for carrying out qualification approval tests. For test conditions and other details see Sub-clause 3.4 of this specification and Table I of the appropriate blank detail specification (as in IEC Publication 723-3-1). Group 028 specimens1 defective
41、 allowed 12.1Visual examination 12.2Marking 12.3Primary dimensions 13.3Inductance factor 13.7Residual and eddy current loss Group 113 specimens1 defective allowed 12.4Secondary dimensions 13.8Hysteresis loss 14.1Compressive strength Group 213 specimens1 defective allowed 13.5Inductance factor at hig
42、h and low temperature 13.12Influence of a static magnetic field (when specified) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-02.0:1987 BSI 01-20003 3.4 Quality conformance inspection The following c
43、haracteristics shall be included as a minimum in all blank detail specifications and for all assessment levels: 3.4.1 Physical a) visual examination; b) marking; c) dimensions (primary and secondary). NOTEPrimary dimensions are the dimensions controlled by the gauge(s) defined in the appropriate IEC
44、 publication, for example, for pot cores: IEC Publication 133. Secondary dimensions are all those dimensions shown in the appropriate IEC publication but not controlled by the gauge(s). 3.4.2 Electrical a) Inductance factor (in nanohenrys) with tolerance (in per cent), or the minimum inductance fact
45、or (in nanohenrys). b) Losses at low flux density: Residual plus eddy current loss at one or more frequencies, depending upon the frequency range of application. For gapped and ungapped sets this may be given in terms of: loss factor or parallel resistance coefficient . Hysteresis loss at one freque
46、ncy. This may be given in terms of: for ungapped sets: hysteresis material constant B; or for gapped and ungapped sets: tangent of loss angle tan h. c) Temperature dependence of the inductance factor Within the operating temperature range the inductance factor shall be within tolerance (see Sub-clau
47、se 13.5 of IEC Publication 723-1). d) Influence of a static magnetic field This test is not mandatory, unless included in the detail specification. 3.4.3 Mechanical a) Compressive strength. Section 4. Additional information Additional information, relating to its application, in the form of curves,
48、graphs, typical values etc., may be included or separately given by the manufacturers. This is supplied for information only and shall not be used for inspection purposes. Section 5. Blank detail specification The following information and requirements shall be included in each detail specification,
49、 together with the required values: 5.1 Identification of the specification The identification of the detail specification shall include: a) the name of the national standards organization under whose authority the detail specification is issued; b) the number of the IEC blank detail specification used; c) the number and issue status of the national generic specification; tan r F+ e - - Rp N2 - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:06:21 GMT+00:00 2006, Uncontrolled Co