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1、BRITISH STANDARD BS CECC 30401 023: 1979 Incorporating Amendment No. 1 Specification for Fixed metallized polyethylene terephthalate film dielectric d.c. capacitors Rectangular insulated non-metallic case, rigid radial terminations Full assessment level UDC 621.319.4.024:621.315.616.96:678.742.066 4
2、16 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 BSI 08-1999 Committee reference ECL/4 ISBN 0580 10976 3 A British Standard does not purport to include all the necessary provisions of a
3、 contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 11 and a back c
4、over. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.Date of issueComments 3894September 1982 Indicated by a sideline in the margin Lice
5、nsed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 BSI 08-1999i Contents Page 1Specified method of mounting for vibration and bump2 2Ratings and characteristics2 3Additional information (not for
6、 inspection purposes)2 4Related documents3 5Marking4 6Ordering information4 7Qualification approval and quality conformance inspection4 8Certified test records4 Table 1 Dimensions1 Table 2 Values of capacitance and voltage related to case size3 Table 3 Insulation resistance3 Table 4 Test schedule5 L
7、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 02
8、3:1979 BSI 08-19991 Table 1 Dimensions ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH BS E9070:1975, BS CECC 30400:1978 MANUFACTURERS TYPE NUMBER See Table 1 below See PD 9002 and CECC 00200 For ordering information see clause 6 Outline and dimensions First angle p
9、rojection (See Table 1 below) All dimensions in millimetres Marking information. See clause 5. FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS TYPICAL CONSTRUCTION: RECTANGULAR INSULATED NON-METALLIC CASE, RIGID RADIAL TERMINATIONS INTENDED FOR PRINTED CIRCUIT APPLICATION
10、S. FULL ASSESSMENT Refer to Qualified Product List PD 9002 and/or CECC 00200 for details of manufacturers approved to this specification. Case sizeX (max.) Y (max.) Z (max.) S + 0.35 0.7 dTypical mass min.nom.max. 1 2 3 4 5 6 7 8 mm 13.5 13.5 19.0 19.0 27.0 27.0 32.0 32.0 mm 10.5 11.5 12.5 15.0 20.0
11、 20.5 23.0 22.5 mm 5.0 6.5 7.0 9.0 10.0 10.5 13.0 13.5 mm 10.16 10.16 15.24 15.24 22.86 22.86 27.94 27.94 mm 0.75 0.75 0.75 0.75 0.75 0.75 0.75 0.75 mm 0.80 0.80 0.80 0.80 0.80 0.80 0.80 0.80 mm 0.88 0.88 0.88 0.88 0.88 0.88 0.88 0.88 g 0.8 1.0 2.0 3.0 4.0 6.0 13.0 13.0 NOTEThe capacitor shall be ca
12、pable of seating firmly on the printed wiring board, and the body moulding shall not seal off the holes through which the capacitor leads pass. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:
13、1979 2 BSI 08-1999 1 Specified method of mounting for vibration and bump For case sizes up to and including 6 g the capacitors shall be pressed down firmly on to a rigid mounting surface and fixed by soldering the leads. For larger case sizes the capacitor shall be mounted in the same way and the bo
14、dy shall be clamped. 2 Ratings and characteristics 3 Additional information (not for inspection purposes) These capacitors have been designed for wide general application in electrical and electronic circuits and are suitable for domestic, commercial and high grade professional use. These capacitors
15、 are not suitable for connection across supply mains. Capacitance range Capacitance tolerances: Standard Special order Rated voltage Category voltage Rated temperature Insulation resistance Tangent of loss angle at 1 kHz Climatic category Vibration severity Duration Bump Solderability Solder bath me
16、thod Resistance to soldering heat Low air pressure See Table 2 10 % (K) 20 % (M), 5 % (J) See Table 2 As rated voltage 85 C see Table 3 CR 1 4F : tan $ u 0.01 CRu 1 4F : tan $ u 0.008 40/085/21 BS 2011-2.1 Fc, Procedure B4, 0.75 mm or 98 m/s2(10 Hz to 500 Hz) 6 h 390 m/s2(40gn) 1 000 bumps 230 C wit
17、h heat screen 260 C 2 kPa (20 mbara) a a1 mbar = 102 N/m2= 100 pa. Typical capacitance change 40 C to + 20 C: 5.0 % as a function of temperature+ 20 C to + 85 C: 3.0 % Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c
18、) BSI BS CECC 30401 023:1979 BSI 08-19993 Table 2 Values of capacitance and voltage related to case size Table 3 Insulation resistance 4 Related documents BS 2011, Basic environmental testing procedures (IEC 68). BS 2488, Schedule of preferred numbers for the resistance of resistors and the capacita
19、nce of capacitors for telecommunication equipment (IEC 63). BS 6001, Sampling procedures and tables for inspection by attributes. BS E9000, General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee System. BS E9070, Harmonized syst
20、em of quality assessment for electronic components : Generic specification : Fixed capacitors. BS CECC 30400, Harmonized system of quality assessment for electronic components : Sectional specification : Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors. PD 9002, BS 9000 co
21、mponent selection guide. CECC 00200, Qualified products list. Capacitance 4F Rated voltage UR 63 V d.c.100 V d.c.250 V d.c.400 V d.c.630 V d.c. 0.01 0.015 0.022 0.033 0.047 0.068 0.1 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.7 6.8 10.0 1 1 1 2 2 3 3 4 4 5 5 6 7 1 1 1 2 2 3 3 4 4 5 5 6 7 8 1 1 1 2 2
22、 3 3 4 5 5 5 7 7 8 1 1 1 2 3 3 4 4 5 5 5 7 8 8 1 2 2 3 4 4 5 5 5 7 8 8 Minimum RC product R = Insulation resistance between the terminations C = Rated capacitance s Minimum insulation resistance between the terminations M7 Minimum insulation resistance between the terminations and case M7 Rated capa
23、citance 0.33 4Fu 0.33 4F Rated voltage 100 Vu 100 V 100 Vu 100 V 10 0005 00030 00015 00030 000 NOTEThe capacitance values are within the E6 series (BS 2488). Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS C
24、ECC 30401 023:1979 4 BSI 08-1999 5 Marking The following information shall be given on the capacitor in accordance with 1.4 of BS CECC 30400: a) rated capacitance; b) rated voltage; c) tolerance on rated capacitance; d) manufacturers code. 6 Ordering information Orders for components complying with
25、the requirements of this specification shall include the following minimum information: a) quantity; b) BS CECC specification number, issue number and date, i.e. BS CECC 30401 023 Issue 1; c) capacitance value and tolerance; d) rated voltage. 7 Qualification approval and quality conformance inspecti
26、on 7.1 For qualification approval test and quality conformance inspection the test schedule, severities and requirements given in the sectional specification BS CECC 30400 apply. 7.2 A complete schedule is given in Table 3. The details in 7.2.1 to 7.2.5 apply. 7.2.1 For qualification testing, see 3.
27、3 of BS CECC 30400, subgroups A1 and A2 are combined together to form group 0. All subgroups of group C are required with numbers of samples and permissible defectives as shown in Table 1 of BS CECC 30400. 7.2.2 The samples required for qualification testing will be in accordance with 3.3.1 of BS CE
28、CC 30400. 7.2.3 Samples submitted to tests marked D shall not be accepted for release under BS E9000. 7.2.4 The requirement for visual examination for intermediate or final measurement is as follows. There shall be no damage that will affect the usability of the capacitor for its intended purpose. 7
29、.2.5 Drying in accordance with 4.2 of BS E9070 is not required. 8 Certified test records Certified test records shall be prepared in accordance with 3.2 of BS CECC 30400. Attributes information shall be given for subgroups C1, C2, C3 and C4 without reference to the parameter with which a defect occu
30、rred. Variables information for the change in capacitance, in the tangent of loss angle, and in the insulation resistance after the endurance test (subgroup C3) and after the charge and discharge tests (subgroup C4). Licensed Copy: London South Bank University, London South Bank University, Fri Dec
31、08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 BSI 08-19995 Table 4 Test schedule Groups A and B Inspection (Lot-by-lot): Full Assessment Level Examination or testD/NDBS CECC 30400 Ref. Test method and severity ILaAQLb Performance requirements GROUP A INSPECTION To be
32、applied on a sampling basis, lot-by-lot (7.2.1) Subgroup A1 Visual examination Marking Dimensions ND 4.2 S42.5See (7.2.4) See clause 5 As Table 1 Subgroup A2 (7.2.1) Voltage proof (test point A1.1) Capacitance Tangent of loss angle Insulation resistance (test point A1.1 only) ND 4.3 4.4 4.5 4.6 1.6U
33、R CR 0.33 4F UR 100 V URu 100 V CRu 0.33 4F UR 100 V URu 100 V II1.0There shall be no breakdown or flashover. Self-healing is permitted. Within the specified selection tolerance CRu 1 4F u 0.008 CR 1 4F u 0.01 RC W 10 000 s RC W5 000 s RinsW 30 000 M7 RinsW 15 000 M7 GROUP B INSPECTION To be applied
34、 on a sampling basis, lot-by-lot Subgroup B1 Solderability ND4.9.2Test Ta, solder bath method with heat screen depth of immersion as in 4.9.2 of BS CECC 30400 3 2.5 3.2.3 of test Ta NOTESee 7.2.1 to 7.2.5 for references shown in parentheses. a IL = Inspection level b AQL = Acceptance quality level L
35、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 6 BSI 08-1999 Table 4 Test schedule Group C Inspection, Periodic Tests (7.2.1): Full Assessment Level Examination or testD/NDBS CECC 30400 R
36、ef. Test method and severityPanbCcPerformance requirements GROUP C INSPECTION To be conducted on a sampling basis plus periodically at the monthly interval shown in column P Subgroup C1 Initial measurements Capacitance Tangent of loss angle D 4.8.1 4.4 4.5 627 2Within the specified selection toleran
37、ce CRu 1 4F; u 0.008 at 1 kHz record reading for information at 10 kHz Subgroup C1(a) Part of sample Robustness of terminations Visual examination Resistance to soldering heat Final measurements Visual examination Capacitance Tangent of loss angle D4.8.2 4.2 4.8.3 4.8.4 4.2 4.4 4.5 Test Ua, Tensile
38、10 N/10 s Test Tb, method 1A 260 C with heat screen 691 See (7.2.4) See (7.2.4) %C u 2 % Increase of tan CR 1 4F; u 0.002 at 1 kHz CRu 1 4F; u 0.003 at 10 kHz NOTESee 7.2.1 to 7.2.5 for references shown in parentheses. a P = periodicity (months). b n = sample size. c C = permissible defectives. Lice
39、nsed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 BSI 08-19997 Table 4 Test schedule Examination or testD/NDBS CECC 30400 Ref. Test method and severityPanbCcPerformance requirements Sub group C
40、1(b) Other part of sample Rapid change of temperature Visual examination Vibration Visual examination Bump Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance D4.9.3 4.2 4.9.4 4.2 4.9.5 4.9.6 4.2 4.4 4.5 4.6 Test Na, 5 cycles of 30 min at 40 C and 30 min at
41、85 C. Period of recovery not less than 1 h Test Fc, procedure B4 10 Hz to 500 Hz. Duration 6 h. For method of mounting, see clause 2 Test Eb, 390 m/s2(40gn) 1 000 bumps. For method of mounting, see clause 2 618 1 See (7.2.4) See (7.2.4) See (7.2.4) %C u 5 % Increase of tan CR 1 4F; u 0.002 at 1 kHz
42、CRu 1 4F; u 0.003 at 10 kHz Within initial limit NOTESee 7.2.1 to 7.2.5 for references shown in parentheses. a P = periodicity (months). b n = sample size. c permissible defectives. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontr
43、olled Copy, (c) BSI BS CECC 30401 023:1979 8 BSI 08-1999 Table 4 Test schedule Examination or testD/NDBS CECC 30400 Ref. Test method and severityPnCPerformance requirements Subgroups C1(a) and C1(b) combined Climatic sequence Dry heat Capacitance Insulation resistance Damp heat, cyclic, first cycle
44、Capacitance Cold Capacitance Low air pressure 4.10 4.10.2 4.4 4.6 4.10.3 4.4 4.10.4 4.4 4.10.5 Test Ba, 16 h. While still at the upper category temperature (85 C) and at the end of the period of high temperature conduct the following tests: Test point A1.1 CR 0.33 4F UR 100 V URu 100 V CR 0.33 4F UR
45、 100 V URu 100 V Test point B1.2 Test Db Test Aa, 2 h. While still at the lower category temperature ( 40 C) and at the end of the period of low temperature the capacitance shall be measured Test M, 20 mbar. The test shall be carried out at a temperature of 15 C to 35 C, duration 1 h. UR to be appli
46、ed, test point A1.1 part of sample and test point B1.2 of other part of sample, during the last 5 min 627 2 %C u 5 % RC W 100 s RC W 50 s RinsW 300 M7 RinsW 150 M7 RinsW 300 M7 Reference value %C u 7 % No breakdown or flashover. Selfhealing is permitted Licensed Copy: London South Bank University, L
47、ondon South Bank University, Fri Dec 08 17:02:55 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30401 023:1979 BSI 08-19999 Table 4 Test schedule Examination or testD/NDBS CECC 30400 Ref. Test method and severityPnCPerformance requirements Subgroups C1(a) and C1(b) combined (contd) Visual examin
48、ation Damp heat, cyclic, remaining cycles Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance 4.2 4.10.6 4.10.7 4.2 4.4 4.5 4.6 Test Db, 1 cycle. UR to be applied, test point A1.1 for 1 min within 15 min after removal See (7.2.4) See (7.2.4) %C 1 4F, 50 % of
49、 the initial limit Subgroup C2 Initial measurements Capacitance Tangent of loss angle Damp heat, steady state Voltage proof Final measurements Visual examination Capacitance Tangent of loss angle D 4.11.1 4.4 4.5 4.11 4.11.2 4.3 4.11.3 4.2 4.4 4.5 Test Ca, 21 days, no voltage applied Ur within 15 min after removal from the chamber. Recovery 1 h to 2 h Within 2 h after recovery 615 1 Within the specified selection tolerance CRu 1 4F u 0.008 at 1 kHz CR 1 4F u 0.01 at 1 kHz No breakdown or flashover, selfhealin