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1、BRITISH STANDARD BS CECC 30801:1993 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Tantalum surface mounting capacitors Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncon
2、trolled Copy, (c) BSI BS CECC 30801:1993 BSI 11-1999 ISBN 0 580 356515 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 BSI 11-1999i Co
3、ntents Page National forewordii Forewordiii Text of CECC 308011 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 ii BSI 11-1999 National foreword This British Standard has been prepared under
4、the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with CECC 30801:1990 “Harmonized system of quality assessment for electronic components. Blank Detail Specification: Tantalum surface mounting capacitors” published by the European Committee for Electrotec
5、hnical Standardization (CENELEC) Electronic Components Committee (CECC). It is a harmonized specification within the CECC system of quality assessment for electronic components. CECC 30801 was prepared by CECC WG3, “Capacitors” and the UK participation in the drafting was provided by Subcommittee EC
6、L/4/4, “Capacitors and electromagnetic interference suppression components for electronic equipment”, under the direction of Technical Committee ECL/4 “Capacitors and resistors for electronic equipment”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall
7、be included as mandatory requirements in accordance with BS CECC 30800:1991 in any detail specifications for this type of capacitor. The British Standard which implements the CECC Rules of Procedure is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 2:1
8、991 “Specification for the national implementation of the CECC system”. Detail specifications. Detail specifications shall comply with the requirements of this Blank Detail specification and BS CECC 00111 “Rule of Procedure 11” Specifications, Part 4:1991. “Regulations for CECC detail specifications
9、”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standar
10、dCorresponding British Standard IEC 410:1973BS 6001 Sampling procedures for inspection by attributes Part 1:1991 Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection (Technically equivalent) CECC 30000:Issue 3:1983 BS CECC 30000:1992 Harmonized system
11、of quality assessment for electronic components. Generic specification: Fixed capacitors (Identical) CECC 30800:Issue 2:1990 BS CECC 30800:1991 Harmonized system of quality assessment for electronic components. Sectional specification: Tantalum surface mounting capacitors (Identical) Summary of page
12、s This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to vi, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the insid
13、e front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 3
14、0801:1993 ii BSI 11-1999 Contents Page Forewordiii 1General data1 2Qualification approval and Inspection requirements3 Table 11 Table 2A1 Table 2B Characteristics at high and low temperature2 Table 2C Impedance at 100 kHz (if required)2 Table 3 Other characteristics3 Table 4A Lot-by-lot inspection (
15、Group A and B)3 Table 4B Periodic tests4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 BSI 11-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member
16、 countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessm
17、ent procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This blank detail specification has been formally approved
18、 by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for Tantalum surface mounting capacitors. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification
19、was prepared by CECC Working Group 3: “Capacitors”. It is a revised version of CECC 30801 (1980). It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC 384-3-1: Blank detail specification: Fixed tantalum chip capacitors. Assessm
20、ent level E (First edition) 1989. The text of this blank detail specification was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. Effective Date: This issue 2 of CECC 30801 shall become effective fo
21、r all new qualification approvals from 1 October 1990 Issue 1 shall remain valid for existing qualification approvals until further notice. DocumentVoting DateReport on the Voting CECC(Secretariat)2277September 1988CECC(Secretariat)2395 Licensed Copy: London South Bank University, London South Bank
22、University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 iv BSI 11-1999 Identification of the detail specification (DS) and the component The first page of the DS should have the layout recommended on page v. The numbers in square brackets correspond to the indic
23、ations to be completed thereunder: 1 The name of the National Standards Organization under whose authority the DS is published and, if applicable, the organization from whom the DS is available. 2 The CECC symbol and the number allotted to the DS by the CECC General Secretariat. 3 The number and iss
24、ue number of the CECC generic and sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any further information required by the national system, together with any amendment numbers. 5 A brief d
25、escription of the component or range of components. 6 Information on typical construction (where applicable). 7 An outline drawing with main dimensions which are of importance for interchangeability, and/or reference to the appropriate national or international document for outlines. Alternatively,
26、this drawing may be given in an annex to the DS, but 7 should always contain an illustration of the general outer appearance of the component. 8 The level(s) of quality assessment covered by the DS. 9 Reference data giving information on the most important properties of the component which allow com
27、parison between the various component types intended for the same, or for similar, applications. For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC 00200 (QPL) and CECC 00300 (Library List). Licensed Copy: London South Bank University, London South Bank University, Fr
28、i Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 BSI 11-1999v 12 4 3 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH: 75 OUTLINE DRAWING (first angle projection):DETAIL SPECIFICATION FOR TANTALUM SURFACE MOUNTING CAPACITOR 6 TYPICAL CO
29、NSTRUCTION (Examples): ASSESSMENT LEVEL E 8 9 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, rated voltage range, climatic category, performance grade Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00
30、200: Qualified Products List. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI vi blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled
31、 Copy, (c) BSI BS CECC 30801:1993 BSI 11-19991 1 General data 1.1 Recommended method of mounting The capacitors are mounted by their terminations. See 1.3.2 of the sectional specification CECC 30800 (Issue 2). 1.2 Dimensions Table 1 1.3 Ratings and characteristics Table 2A Case size reference Dimens
32、ions (in mm) 1whd. . . . . . . . . . . . . . NOTE 1When there is no case size reference, Table 1 may be omitted and the dimensions shall be given in Table 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. Capacitance r
33、ange(See Table 2A) Tolerance on rated capacitance. . . . . Rated voltage(See Table 2A) Category voltage (if applicable)(See Table 2A) Climatic category. . . . . Rated temperature. . . . . Variation of capacitance with temperature (See Table 2B) Tangent of loss angle(See Table 2B) Leakage current(See
34、 Table 2B) Impedance (if required)(See Table 2C) Surge voltage Rated voltage Category voltagea Case sizeCase sizeCase sizeCase size Rated capacitance a If different from the rated voltage. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006,
35、Uncontrolled Copy, (c) BSI BS CECC 30801:1993 2 BSI 11-1999 Table 2B Characteristics at high and low temperature Table 2C Impedance at 100 kHz (if required) 1.4 Related documents 1.5 Marking The marking of the capacitor and of the packing shall be in accordance with the requirements of 1.5 of the se
36、ctional specification CECC 30800 (Issue 2). NOTEThe details of the marking of the component and of packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum
37、information: 1) Rated capacitance 2) Tolerance on rated capacitance 3) Rated voltage (d.c.) 4) Number and issue reference of detail specification and case size reference 5) Packaging (bulk or taped; if taped, according to IEC 286-3) 1.7 Certified test records Required/not required. 1.8 Additional in
38、formation (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. UR (V) CR (4F) Capacitance change (%) Maximum values Tangen
39、t of loss angle (%) Leakage current (4A) TATRTBTA20 CTRTB20 CTR TBa TA: Lower category temperature TB: Upper category temperature TR: Rated temperature a Measured with category voltage Case sizeImpedance (7) Generic specification : CECC 30000 (Issue 3, Amendments 1 to 6) Sectional specification: CEC
40、C 30800 (Issue 2) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 BSI 11-19993 Table 3 Other characteristics 2 Qualification approval and Inspection requirements 2.1 Procedures 2.1.1 For Qual
41、ification Approval the procedures shall be in accordance with 3.4 of the sectional specification CECC 30800 (Issue 2). 2.1.2 For Quality conformance Inspection the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.
42、1 of the sectional specification CECC 30800 (Issue 2). Notes to Table 4A and Table 4B 1) Clause numbers of tests and performance requirements refer to the sectional specification CECC 30800 (Issue 2) 2) D= destructive ND= non destructive P= periodicity (in months) n= number of specimens (sample size
43、) pd= number of permissible defectives (acceptance criterion) IL= inspection level (selected from IEC 410) AQL = acceptable quality level (selected from IEC 410) 3) Not applicable to surface mounting capacitors, which according to their detail specification shall only be mounted on alumina substrate
44、s Table 4A Lot-by-lot inspection (Group A and B) This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification. Clause number and test (1)D or ND (2) Conditions of test (1)ILAQLPerformance requirements (1) (2) SUB-GROUP A1NDS
45、-42,5 % 4.4Visual examination As in 4.4.2 Marking legible, see 1.5 4.4Dimensions (Detail) See Table 1 of the detail specification SUB-GROUP A2NDII1,0 % 4.5.1Leakage currentProtective resistor: 1 000 7k 0,02 CRUR 4A/4F.V or k 4A, whichever is the greater 4.5.2CapacitanceFrequency: . . . Hz Bias . . .
46、 V (if required) Within specified tolerance 4.5.3Tangent of loss angle Frequency: . . . Hzk 0,06 for UR U 10 V k 0,08 for 6,3 V URk 10 V k 0,1 for UR 6,3 V 4.5.4Impedance (if required) Frequency: 100 kHzAs in Table 2C Notes see page 3 Licensed Copy: London South Bank University, London South Bank Un
47、iversity, Fri Dec 08 17:11:52 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30801:1993 4 BSI 11-1999 Table 4A Lot-by-lot inspection (Group A and B) Table 4B Periodic tests Clause number and test (1)D or ND (2) Conditions of test (1)ILAQLPerformance requirements (1) (2) SUB-GROUP B1DS-32,5 % 4.7
48、SolderabilityMethod: . . . 4.18Solvent resistance of the marking (if required) Solvent: Solvent temperature: . . . Method 1 Rubbing material: Cotton wool Recovery: . . . Marking legible 4.7.2Final measurement Visual examinationAs in 4.7.2 Notes see page 3 Clause number and test (1)D or ND (2) Condit
49、ions of test (1)PnpdPerformance requirements (1) (2) SUB-GROUP C1D3121 4.6.1Initial measurements Capacitance Tangent of loss angle 4.6Resistance to soldering heat Method: . . . Duration: . . .s 4.17Component solvent resistance (if required) Solvent: . . . Solvent temperature: . . . Method 2 Recovery: . . . . . . . . . . . . . . . . . 4.6.3Final measurement Visual examinationAs in 4.6.3 Capacitance k . . . % Tangent of loss angletan k . . . SUB-GROUP C2D3121 4.9Substrate bending test (3) Capacitance