BS-CECC-41000-1977.pdf

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1、BRITISH STANDARD BS CECC 41000:1977 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components: Generic specification for potentiometers UDC 621.37/.39:621.317.727.2 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GM

2、T+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 This British Standard, having been prepared under the direction of the Electronic Components Standards Committee, was published under the authority of the Executive Board on 31 August 1977 BSI 04-2000 The following BSI references relate to

3、the work on this standard: Committee reference ECL/4/5 Draft for comment 73/22512 DC ISBN 0 580 09581 9 Cooperating organizations The Electronic Components Standards Committee, under whose supervision this British Standard was prepared, consists of representatives from the following Government depar

4、tments and scientific and industrial organizations: British Electrical and Allied Manufacturers Association Electrical Electronic Telecommunication and Plumbing Unions Electricity Supply Industry in England and Wales* Electronic Components Board Electronic Engineering Association* Ministry of Defenc

5、e* National Supervising Inspectorate* Post Office* Radio Electronic Components Manufacturers Federation* Society of British Aerospace Companies Ltd* Telecommunication Engineering and Manufacturing Association* The Government department and scientific and industrial organizations marked with an aster

6、isk in the above list, together with the following, were directly represented on the committee entrusted with the preparation of this British Standard: British Broadcasting Corporation Amendments issued since publication Amd. No.Date of issueComments 4100November 1982 Indicated by a sideline in the

7、margin Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 BSI 04-2000i Contents Page Cooperating organizationsInside front cover National forewordii Forewordiv Text of CECC 410001 Licensed Copy:

8、 London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 ii BSI 04-2000 National foreword This British Standard has been published under the direction of the Electronic Components Standards Committee. It is identic

9、al with CENELEC Electronic Components Committee (CECC) 41000 “Harmonized system of quality assessment for electronic components: Generic specification for potentiometers”. This standard gives the terminology, quality assessment procedures, and test and measurement conditions applicable to the entire

10、 family of potentiometers. Any sectional specification dealing with a particular sub-family of potentiometers required to be used in conjunction with this standard will select those tests which are considered appropriate to the sub-family, and will also give more detailed information relative to the

11、 sub-family. This standard is a harmonized specification within the CECC system. The existing non-harmonized British Standard, BS 9130 “Potentiometers of assessed quality: Generic data and methods of test”, will eventually be superseded by this standard, but for a period both standards will remain i

12、n force because of current approvals to BS 9130. For the time being, until BS E9000 is published, specifications in the series are subject to the basic rules set down in BS 9000 “General requirements for electronic components of assessed quality”. The British Standards Institutions prescribed layout

13、 of a detail specification is given in Part 2 “Data on generic and detail specifications” of BS 9000. Supplements to the appropriate sectional specification will give pro-formas of detail specifications. Terminology and conventions. The text of the CECC specification has been accepted as suitable fo

14、r publication, without deviation, as a British Standard. Certain terminology and conventions are used, however, that are not strictly appropriate in a British Standard, and attention is particularly drawn to the following. The comma has been used throughout as a decimal marker. In British Standards

15、it is current practice to use a full point (a full stop on the baseline) as the decimal marker. Cross references. The British Standard harmonized with CECC 00100 is BS 9000 “General requirements for electronic components of assessed quality”. IEC 117 substantially agrees with BS 3939 “Graphical symb

16、ols for electrical power, telecommunications and electronic diagrams”. For each of the following references to other International Standards that are given in the text, there is an equivalent British Standard; these are as listed below. Reference to International Standard Equivalent British Standard

17、 ISO 3:1973BS 2045:1965Preferred numbers ISO 1000:1973BS 5555:1976SI units and recommendations for the use of their multiples and of certain other units IEC 27-1:1971BS 1991Letter symbols, signs and abbreviations Part 6:1975 Electrical science and engineering IEC 50BS 4727Glossary of electrotechnica

18、l, power, telecommunications, electronics, lighting and colour terms IEC 62:1974BS 1852:1975Marking codes for values and tolerances of capacitors and resistors Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS

19、 CECC 41000:1977 BSI 04-2000iii NOTEThere are as yet no equivalent British Standards for IEC 115-1, IEC 393-1 and IEC 695-2-2. The committee responsible for this standard has studied these and confirms that, for the purposes of this standard, their technical requirements are acceptable. A British St

20、andard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. IEC 63:1963BS 2488:1966Schedule of preferred numbers

21、for the resistance of resistors and the capacitance of capacitors for telecommunication equipment IEC 68BS 2011Methods for the environmental testing of electronic components and electronic equipment IEC 390:1972BS 5054:1974Dimensions of spindle ends for manually operated electronic components IEC 41

22、0:1973BS 6001:1972Sampling procedures and tables for inspection by attributes CECC 00006:1973BS E9006:1976Harmonized system of quality assessment for electronic components. Basic specification. Environmental test procedures. CECC 00007:1973BS E9007:1975Harmonized system of quality assessment for ele

23、ctronic components. Basic specification: Sampling plans and procedures for inspection by attributes. Reference to International Standard Equivalent British Standard Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, the CECC title page, pages ii to iv, page

24、s 1 to 58 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00

25、2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrol

26、led Copy, (c) BSI BS CECC 41000:1977 ii BSI 04-2000 Contents Page Forewordiv Section 1. Scope Section 2. General 2.1Related documents1 2.2Units, symbols and terminology2 2.3Standard and preferred values9 2.4Marking10 Section 3. Quality assessment procedures 3.1Primary stage of manufacture11 3.2Struc

27、turally similar parts11 3.3Qualification approval procedure11 3.4Quality conformance inspection11 3.5Certified test records11 3.6Delayed delivery12 3.7Alternative test methods12 3.8Release for delivery before the completion of Group B tests12 3.9Unchecked parameters12 Section 4. Test and measurement

28、 procedures 4.1Standard conditions for testing12 4.2Drying13 4.3Visual examination and check of dimensions13 4.4Continuity13 4.5Element resistance13 4.6Terminal resistance14 4.7Attenuation14 4.8Mechanical and electrical travel14 4.9Resistance law15 4.10Matching of resistance law15 4.11Switch contact

29、 resistance15 4.12Voltage proof16 4.13Insulation resistance17 4.14Temperature characteristic of resistance17 4.15Rotational noise18 4.16Starting torque18 4.17Switch torque18 4.18End stop torque18 4.19Locking torque18 4.20Thrust and pull on spindle19 4.21Robustness of terminations20 4.22Sealing21 4.2

30、3Soldering21 4.24Change of temperature22 4.25Vibration22 4.26Bump23 4.27Shock23 4.28Climatic sequence23 4.29Damp heat, steady state25 4.30Mechanical endurance (potentiometers)26 4.31Mechanical endurance (switch) (when fitted)27 4.32Electrical endurance28 4.33Flammability31 Licensed Copy: London Sout

31、h Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 BSI 04-2000iii Page Section 5. Blank detail specification 5.1General32 5.2Identification of the harmonized detail specification32 5.3Identification of the potentiometer3

32、2 5.4Supplementary information32 5.5Test schedule32 Appendix A Proforma for a detail specification for potentiometers of assessed quality33 Appendix B Proforma for a test schedule34 Appendix C35 Appendix D42 Appendix E Measurement of rotational noise (Method A)51 Appendix F Measurement of rotational

33、 noise (Method B)54 Appendix G Preferred dimensions of spindles and bushes for potentiometers54 Figure 15 Figure 26 Figure 36 Figure 46 Figure 56 Figure 6 Conformity8 Figure 7 Linearity8 Figure 8 Spindle Sealed Potentiometers9 Figure 9 Spindle this is defined by the temperature limits of its appropr

34、iate category 2.2.11 upper category temperature (IEC 393-1 Clause 3.7) the upper category temperature is the maximum ambient temperature for which a potentiometer has been designed to operate continuously at that portion of the rated dissipation which is indicated in the category dissipation (See 2.

35、2.14) 2.2.12 lower category temperature (IEC 393-1 Clause 3.8) the lower category temperature is the minimum ambient temperature for which a potentiometer has been designed to operate continuously 2.2.13 rated dissipation (IEC 393-1 Clause 4.9) the maximum allowable dissipation between terminations

36、a and c (see 2.2.24) of a potentiometer at an ambient temperature of 70 C under conditions of the electrical endurance test at 70 C which will result in a change in resistance not greater than that specified for that test NOTEIn practice the dissipation is modified by the following conditions: For h

37、igh values of resistance the limiting element voltage may prevent the rated dissipation being attained. For the dissipation at temperatures other than 70 C, reference should be made to the rating graphs in the relevant detail specification. For situation where only terminations a or b and c are bein

38、g used and the control spindle is set at an angle less than 100 % of the effective electrical travel. In this case the limiting slider current should also be taken into account. 2.2.14 category dissipation (IEC 393-1 Clause 4.10) the category dissipation is a fraction of the rated dissipation exactl

39、y defined in the detail specifications at the upper category temperature, taking account of the derating curve given in the detail specification NOTEThe category dissipation may be zero. 2.2.15 rated voltage (IEC 393-1 Clause 4.11) the rated voltage is that d.c. or a.c. r.m.s. voltage calculated fro

40、m the square root of the product of the rated resistance and the rated dissipation NOTEAt high values of resistance, the rated voltage may not be applicable because of the size and construction of the potentiometer. (see 2.2.9 and 2.2.16). 2.2.16 limiting element voltage (IEC 393-1 Clause 4.12 and 4

41、.13) the limiting element voltage is the maximum d.c. or a.c. r.m.s. voltage which may be applied across the element of a potentiometer where the terms a.c. r.m.s. voltage is used in this specification the peak voltage shall not exceed 1,42 times the r.m.s. value. (see 2.2.9 and 2.2.15) Licensed Cop

42、y: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 4 BSI 04-2000 2.2.17 isolation voltage (IEC 393-1 Clause 4.14) the isolation voltage is the maximum peak voltage under continuous operating conditions whic

43、h may be applied between the potentiometer terminations and other external conducting parts connected together. The value of the isolation voltage shall be not less than 1,42 times the limiting element voltage, at normal air pressure. Under conditions of low air pressure the value of the isolation v

44、oltage will be less and shall be given in the detail specifications 2.2.18 limiting slider current (IEC 393-1 Clause 4.15) the limiting slider current is the maximum current that may be passed between the resistance element and the moving contact. The value shall be stated in the detail specificatio

45、n 2.2.19 temperature characteristic of resistance the temperature characteristic of resistance of a potentiometer is the change in resistance, expressed as a percentage, occurring between two specified ambient temperatures Temperature characteristic of resistancewhere % R is the change in resistance

46、 between the two specified ambient temperatures. R is the resistance value at the reference temperature 2.2.20 temperature coefficient of resistance the temperature coefficient of resistance of a potentiometer is the mean rate of change of resistance occurring between two specified ambient temperatu

47、res it may be expressed either as a percentage, or as parts per million (p.p.m.) per degree Celsius where %t is the algebraic difference, in degrees Celsius, between the reference temperature and the other specified ambient temperature NOTEThe use of this term does not imply any linearity for this f

48、unction, nor should any be assumed. 100R R - -= Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:00:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 41000:1977 BSI 04-20005 A, B, C and D are the test limits for temperature characteristics of resistance at

49、 the upper and lower category temperatures AX and BX represent the assumed limits of percentage change in resistance between + 20 C and lower category temperature CX and DX represent the assumed limits of percentage change in resistance between + 20 C and upper category temperature YZ represents the actual percentage change in resistance of a potentiometer having a non-linear temperature coefficient 2.2.21 terminal resistance (IEC 393-1 Clause 4.16) terminal resistance is the minimum resistance which can be obtained between the terminati

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