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1、BRITISH STANDARD BS CECC 31501:1988 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed ceramic capacitors of dielectric class 2 for electrical shock hazard protection Licensed Copy: London South Bank University, London South Bank Univ
2、ersity, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 BSI 10-1999 ISBN 0 580 35548 9 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolle
3、d Copy, (c) BSI BS CECC 31501:1988 BSI 10-1999i Contents Page National forewordii Forewordii 1General data1 2Inspection requirements2 Table 11 Table 2 Values of capacitance related to tolerances and case sizes1 Table 3 Other characteristics2 Table 4A Lot by lot inspection (Group A and B)3 Table 4B P
4、eriodic tests4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standa
5、rds Committee. It is identical with CENELEC Electronic Components Committee (CECC) 31501:1985: “Harmonized system of quality assessment for electronic components Blank detail specification fixed ceramic capacitors of dielectric class 2, for electrical shock hazard protection”. This standard is a har
6、monized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attent
7、ion is drawn especially to the following: The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC 00100 is BS 9000: “General requirements for a sys
8、tem for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance w
9、ith BS CECC 30100. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take precedence, except that the front page layout shall be in accordance with PD 9004:1986: BS 9000, CECC & IECQ administrative guid
10、e, Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International S
11、tandardCorresponding British Standard CECC 30000:1983BS CECC 30000:1984: Harmonized system of quality assessment for electronic components. Generic specification: fixed capacitors (Identical) CECC 31500:1982BS CECC 31500:1982: Harmonized system of quality assessment for electronic components. Sectio
12、nal specification: fixed ceramic capacitors of dielectric class 2, for electrical shock hazard protection. IEC 410:1973BS 6001 Sampling procedures for inspection by attributes: Part 1:1972: Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection (Technica
13、lly equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 to 7 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in t
14、he amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncon
15、trolled Copy, (c) BSI BS CECC 31501:1988 ii BSI 10-1999 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of
16、 assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced unde
17、r the System are thereby accepted by all member countries without further testing. This blank detail specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for FIXED CERAMIC CAPACI
18、TORS OF DIELECTRIC CLASS 2, FOR ELECTRICAL SHOCK HAZARD PROTECTION. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification was prepared by CECC Working Group 3: “Capacitors”. It is one of a series of blank detail specifications all
19、relating to the sectional specification CECC 31500, Issue 1. It is based, wherever possible, on the Publications of the International Electrotechnical Commission. The text of this blank detail specification was circulated to the CECC for voting in the documents indicated below and was ratified by th
20、e President of the CECC for printing as a CECC Specification. Key for page iii The numbers between square brackets on page iii correspond to the following indications which should be given: Identification of the detail specification DocumentVoting DateReport on the voting CECC (Secretariat) 1574June
21、 1984CECC (Secretariat) 1680 1The name of National Standards Organization under whose authority the detail specification is drafted 2The CECC Symbol and the number allotted by the CECC General Secretariat to the completed detail specification 3The number and issue number of the national generic and
22、sectional specifications 4The national number of the detail specification, date of issue and any further information required by the national system. Identification of the capacitor 5A short description of the type of capacitor 6Information on typical construction (see examples given on page iii) 7O
23、utline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines 8Level of quality assessment 9Quick reference data Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:0
24、1 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 BSI 10-1999iii 1CECC number and mark2 Specification available from: (National Standards Organization) (National number of detail specification, date of issue, National type number, if any 4 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETA
25、IL SPECIFICATION IN ACCORDANCE WITH: (Number of national generic and sectional specification) 3 Outline and dimensions: (first angle projection) 7 DETAIL SPECIFICATION FOR FIXED CERAMIC CAPACITORS OF DIELECTRIC CLASS 2, FOR ELECTRICAL SHOCK HAZARD PROTECTION 5 TYPICAL CONSTRUCTION: (Examples) tubula
26、r/plate/disc single/multilayer insulated/non insulated wire/tag/screw terminations axial/radial terminations intended/not intended for printed circuits 6 Assessment level E8 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, rated voltage: 250 V, climatic category, performance gra
27、de 9 Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified Products List Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv
28、 blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 BSI 10-19991 1 General data 1.1 Recommended method of mounting 1.2 Dimensions Table 1 1.3 Ratings and characteristics NOTEInformation on
29、 the above characteristics may be given in tabular form, if necessary. Table 2 Values of capacitance related to tolerances and case sizes 1.4 Related document 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of 1.4 of CECC 31500, Issue 1. NOTEThe
30、details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: 1) Detail specification number 2) Case siz
31、e reference 3) Rated capacitance 4) Tolerance on rated capacitance 5) Rated voltage Case size reference Dimensions (in mm) ? ?LHd. . . . . . . NOTE 1When there is no case size reference, Table 1 may be omitted and the dimensions shall be given in Table 2, which then becomes Table 1. NOTE 2The dimens
32、ions shall be given as maximum dimensions or as nominal dimensions with a tolerance. Grade Capacitance range(See Table 2) Capacitance tolerance(s)(See Table 2) Rated voltage(See Table 2) Rated temperature Tangent of loss angle Insulation resistance Climatic category Tolerance on rated capacitance 20
33、/+ 80 10/+ 50 20 10 CapacitanceCase sizeCase sizeCase sizeCase sizeCase size Generic specification: CECC 30000 (Issue 3) Sectional specification : CECC 31500 (Issue 1) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c
34、) BSI BS CECC 31501:1988 2 BSI 10-1999 An example of ordering information shall be given in the detail specification. 1.7 Certified test records Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified i
35、n the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table 3 Other characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with CECC 31500, Issue 1. 2.1.2
36、For Quality Conformance Inspection the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of CECC 31500, Issue 1. This table is to be used for defining characteristics which are additional to or tighter than those
37、 given in the sectional specification. Notes to Table 4A and Table 4B NOTE 1Clause numbers of tests and performance requirements refer to CECC 31500, Issue 1. NOTE 2Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. NOTE 3In Table 4A and Table 4B: P = periodicity (
38、in months) n=sample size c=acceptance criterion (permitted number of defectives) D=destructive ND =non-destructive NOTE 4No voltage proof failure allowed. NOTE 5Specimens having passed the Group B non destructive tests shall still satisfy the performance requirements of Group A tests. NOTE 6The deta
39、il specification shall prescribe which test applies. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 BSI 10-19993 Table 4A Lot by lot inspection (Group A and B) Clause number and test (1) D o
40、r ND (3) Conditions of test (1) IL (2) AQL % (2) Performance requirements (1) Sub-Group A1NDS42,5 4.2Visual examination Dimensions To be given in detail spec. Sub-Group A2NDII1,0 4.3 4.4 4.5 4.6 Capacitance Tangent of loss angle Insulation resistance Voltage proof (4) CR 10 000 M 7 No breakdown no f
41、lashover Sub-Group B1NDS32,5 4.8.2Solderability (5) Solder bath: Immersion to withinmm from body with heat shield or globule test or soldering iron, size A, if other method not appropriate Solder bath: good tinning Solder globule See detail specification Notes: (1), (2), (3), (4) and (5): See notes
42、on page 2 2+0,5 0 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988 4 BSI 10-1999 Table 4B Periodic tests Clause number and test (1) D or ND (3) Condition of test (1) P (3) n (3) c (3) Performa
43、nce requirements (1) Sub-Group C1AD661 4.7.1 4.7.2 4.7.3 4.7.4 Initial measurements Robustness of terminations Ua: Tensile Ub: Bending (not applicable to radial terminations for mounting on p.c.b.) Uc: Torsion (not applicable to radial terminations for mounting on p.c.b.) Resistance to soldering hea
44、t Final measurements Forces: 1 N for d k 0,25 mm 2,5 N for 0,25 d k 0,3 Method 2 Method 1A for capacitors for p.c.b. mounting Immersion up to mm from the body Method 1B for other application. Immersion up to 6 0,5 mm from the body Visual examination Capacitance No visible damage, cracking of coating
45、 on wire permitted No visible damage Marking legible Capacitance change k 20 % of initial value Sub-Group C1BD6121 4.8.1 4.8.3 4.8.4 Initial measurements Rapid change of temperature (if required) Vibration (if required) Capacitance 5 cycles Duration of exposure: 30 min Test method, Method of mountin
46、g and severity: See detail specification After the test, visual examination No visible damage Notes (1) and (3): See notes on page 2 3,5+0,5 0 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 31501:1988
47、BSI 10-19995 Table 4B Periodic tests Clause number and test (1) D or ND (3) Condition of test (1) P (3) n (3) c (3) Performance requirements (1) 4.8.5 4.8.6 Shock or Bump (6) Final measurements Mounting and severity: See detail specification Special preconditioning, see 4.1.2 Visual examination Capa
48、citance No visible damage marking legible k 20 % of values of 4.3 Sub-Group C1D6182(4) 4.9 4.9.1 4.9.2 4.9.3 4.9.4 4.9.5 4.9.6 4.9.7 Climatic sequence Initial measurements Dry heat Damp heat, cyclic, test Db, first cycle Cold Low air pressure (if required) Damp heat, cyclic, test Db, remaining cycle
49、s Final measurements Not required Duration: 16 h Temperature: 55 C Duration: 2 h After test: Visual examination Pressure: 85 mbar Duration: 1 to 2 min Temperature: 15 to 35 C Applied voltage: UR during 1 to 2 min at 85 mbar Temperature: 55 C For number of cycles: See 4.21.6 of CECC 30000 Visual examination Capacitance Voltage proof No visible damage No breakdown or flashover No visible damage marking legible k 15 % of initial value As in 4.6 Notes: (1), (3) and (6): See notes on page 2 %C C -