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1、BRITISH STANDARD BS EN 153000:1998 Harmonized system of quality assessment for electronic components Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval) The European Standard EN 153000:1998 has the status of a British Standard ICS 31.080.01 Licensed
2、Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 153000:1998 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on
3、15 July 1998 BSI 05-1999 ISBN 0 580 30206 7 National foreword This British Standard is the English language version of EN 153000:1998 published by the European Electronic Components Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). The UK participation in its
4、 preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informe
5、d; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in th
6、is document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Use
7、rs of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 24 and a b
8、ack cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.DateComments Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 G
9、MT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 153000:1998 BSI 05-1999i Contents Page National forewordInside front cover Foreword2 Text of EN 1530003 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: sheffieldun sheff
10、ieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Fachgrundspezifikation: Druckkontakt-Einzel- Leistungshalbleiterbauelemente (Befhigungsanerkennung) EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 153000 April 1998 ICS 31.080.00 Descriptors: Quality, electronic compone
11、nts, discrete pressure contact power semiconductors English version Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval) This European Standard was approved by CENELEC on 1995-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Re
12、gulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
13、This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC mem
14、bers are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standar
15、dization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 153000:1998 E Li
16、censed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 153000:1998 BSI 05-1999 2 Foreword This European Standard was prepared by CECC Working Group 7 “Rectifier diodes and thyristors”. In the absence of a current chairman or secretary of CECC Work
17、ing Group 7, this specification was submitted to the CECC by the UK ONH under the Single Originator Procedure. It is based whenever possible on the publications of International Electrotechnical Commission (IEC) and in particular on those referred to under “Related Documents”. The text of the draft
18、was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 153000 on 1995-11-28. The following dates were fixed: Contents Page 1General3 2Quality assessment procedures5 3Test and measurement procedures (general guidance)8 Annex A General inspection requirements for rectifier
19、diodes and thyristors14 Annex B Additional electrical test methods17 Annex C Screening20 Annex D Dimensions23 Annex E Direction of applied forces for mechanical tests23 Figure 1 Test arrangement for reverse-bias test of bipolar transistor13 Figure B.1 Test set-up for verifying second breakdown curre
20、nt rating ISB17 Figure B.2 Test set-up for verifying the collector-emitter sustaining voltage VCEO SUS of a transistor19 Figure B.3 Current-voltage cycle for Method T-01119 Figure D.1 Double-sided button device23 Figure D.2 Stud mounted device23 Figure E.1 Axes defining the direction of applied forc
21、e: button devices24 Figure E.2 Axes defining the direction of applied force: cylindrical devices24 Table C.1 Screening sequences21 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement(dop) 1998-11-01 latest date by whi
22、ch the national standards conflicting with the EN have to be withdrawn(dow) 1998-11-01 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 153000:1998 BSI 05-19993 1 General 1.1 Scope This document applies to discrete pressure contact power s
23、emiconductor devices namely rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies. The document does not apply to stacks or assemblies made with these encapsulated components. 1.2 Related documents CECC 00 007, Basic specification: Sampl
24、ing plans and procedures for inspection attributes. CECC 00 111, RP 11: Specifications. EN 100114-1, Rule of procedure Quality Assessment Procedures Part 1: CECC requirements for the approval of an organization. EN 100114-2, Part 2: CECC requirements for the qualification approval, the release for d
25、elivery and the validity of release of electronic components. IEC 60027, Letters symbols to be used in electrical technology (several parts). IEC 60050, International Electrotechnical Vocabulary. IEC 60068, Basic environmental testing procedures, namely. IEC 60068-1, Part 1: General. IEC 60068-2-2,
26、Dry heat: Test Ba. IEC 60068-2-6, Vibration (sinusoidal): Test Fc. IEC 60068-2-14, Change of temperature: Tests Na, Nb and Nc. IEC 60068-2-17, Sealing: Tests Qc, Qk and Ql. IEC 60148, Letter symbols for semiconductor devices and integrated microcircuits. IEC 60191, Mechanical standardization of semi
27、conductor devices (several parts). IEC 60410, Sampling plans and procedures for inspection of attributes (see also CECC 00 007). IEC 60617, Graphical symbols for diagrams. IEC 60747-2, Semiconductor devices and integrated circuits Part 2: Rectifier diodes. IEC 60747-6, Semiconductor devices and inte
28、grated circuits Part 6: Thyristors. ISO 497, Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers. ISO 1000, SI units and recommendations for the use of their multiples and of certain other units. ISO/R 2015, Numbering of weeks1). 1.3 U
29、nits, symbols and terminology Units, graphical symbols, letter symbols and terminology shall, whenever possible, be taken from the following documents: IEC 60027, Letter symbols to be used in electrical technology. IEC 60050, International electrotechnical vocabulary. IEC 60617, Graphical symbols fo
30、r diagrams. ISO 1000, SI units and recommendations for the use of their multiples and of certain other units. Any other units, symbols and terminology peculiar to one of the components covered by a generic specification, shall be taken from the relevant IEC or ISO documents, listed under “Related do
31、cuments”. 1.4 Standard and preferred values Ratings and characteristics shall be chosen from IEC 60747-2 and IEC 60747-6 at the time of producing the Detail Specification in conjunction with the customer requirements. 1) superseded by ISO 8601:1988: Data elements and interchange formats information
32、interchange Representation of dates and times Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 153000:1998 4 BSI 05-1999 1.5 Marking of component and package The following shall be marked on the device, in the following order of precedence
33、, as space permits. All the information, except the terminal marking, shall appear on the primary pack used as initial protection or wrapping for delivery: In addition, the primary pack shall be marked with the detail specification reference, followed by the letter defining the level of quality asse
34、ssment (Annex A) and, if applicable, by the letter identifying the screening sequence (Annex C). Example: EN 153 002-000 F-C. The detail specification shall prescribe the information actually marked on the device. 1.5.1 Terminal identification The terminals shall be identified in at least one of the
35、 following ways: in accordance with the specified outline or base drawing; in accordance with one of the methods given in 2.5.1.1, 2.5.1.2 or 2.5.1.3; as specified in the detail specification. 1.5.1.1 Diodes Polarity of diodes shall be clearly indicated by one or more of the following methods: the r
36、ectifier arrow graphical symbol pointing towards the cathode; a colour code as follows: Red shall be used for the cathode. Black shall be used for the anode. 1.5.1.2 Transistors When so specified in the detail specification, transistor terminals shall be identified by the following colour code: Four
37、th terminal if present: if connected to collector, emitter or base: the relevant colour of this electrode; if connected to anything else (for instance a shield): uncoded. When it is appropriate to identify only one terminal, the collector shall be marked. 1.5.1.3 Thyristors The thyristors terminals
38、shall be indicated by one of the following methods: The thyristor graphical symbol with the arrow directed towards the cathode terminal. A colour code as follows: 1.5.2 Type designation The type designation shall be given in letters and figures. a) Terminal identification(1.5.1) b) Type designation(
39、1.5.2) c) Date code(1.5.4) and/or: factory identification code or manufacturers name or trade-mark(1.5.3) d) Mark of Conformity unless a Certificate of Conformity is used Collector terminalRed Emitter terminalBlue Base terminalYellow Cathode terminal(s)Red; and/or Anode terminal(s)Blue (or black) Ga
40、te terminal(s)Yellow (or white). Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 153000:1998 BSI 05-19995 1.5.3 Manufacturers name or trade-name Where the certificate of conformity enables traceability to a manufacturers factory, the manu
41、facturers name or trade-name is sufficient. In all other cases, the factory identification code shall be used. 1.5.4 Date code system The date code system is as ISO/R 2015 for the week, preceded by the last two digits of the year (example: 9245 45th week of 1992). 1.6 Subcontracting Subcontracting w
42、ithin the rules of EN 100114-2. subclause 1.2 is not permitted. 1.7 Validity of release Release is valid for a period of 2 years. See 2.3.5 for the requirements for subsequent delivery. 2 Quality assessment procedures 2.1 General The quality assessment tests are subdivided into Group A, Group B test
43、s which are performed on each lot. Group C tests which are performed periodically and Group D tests which are performed for design proving only. The following CECC ongoing product assessment procedure is designed to produce consistent high reliability power semiconductor devices and enable a manufac
44、turer once approved (see EN 100114-1) to claim “Qualification Approval”. 2.1.1 Manufacturing and system control The company shall be audited to ensure that quality and manufacturing control systems are in place, based on EN 100114-1, which incorporates the requirements of EN ISO 9000. 2.1.2 Primary
45、stage of manufacture The primary stage for bipolar semiconductor devices is the first process which changes the monocrystalline semiconductor material from being wholly P-type or wholly N-type. 2.1.3 Definition of a production lot Unless otherwise stated, a production or inspection lot (hereinafter
46、referred to as “lot”) shall consist of devices having structurally similar design, manufactured on the same production line, and normally assembled during a maximum of 6 weeks. (Maximum lot size 500 pieces). 2.1.4 Structurally similar components The crucial criterion for grouping of types of devices
47、 as structurally similar is that the differences between the various types have no influence on the results of the test for which the group has been formed. Rotation within the group shall be performed to ensure all types are tested. 2.2 Qualification approval procedures New product ranges shall be
48、subject to groups A, B, C and D testing prior to approval being given. Approval shall consist of a review of the test data by the Chief Inspector and subsequent authorisation by him of approved status for that product range. Potential customers shall have this information made available to them on r
49、equest as a Test Report. The Test Report shall consist of a listing of tests performed, conditions of testing, sample sizes and results of individual measurements before and after each test. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:25 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 153000:1998 6 BSI 05-1999 2.3 Quality conformance inspection requirements Quality conformance inspection shall be based on samples taken from each lot of structurally similar product (see 2.1.4). Where no product