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1、BRITISH STANDARD BS 9625:1983 Blank detail specification for Quartz crystal oscillators of assessed quality Full assessment level Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-1999 ISBN 0
2、580 34156 9 Foreword This British Standard, which has been prepared under the direction of the Electronic Components Standards Committee, is the blank detail specification for quartz crystal oscillators in the BS 9000 system of standards for electronic components. This standard revises and combines
3、the following standard rules for the preparation of detail specifications. a) BS 9621:1979 Rules for the preparation of detail specifications for simple packaged crystal oscillators (SPXO). Full assessment level. b) BS 9623:1979 Rules for the preparation of detail specifications for temperature comp
4、ensated crystal oscillators (TXCO). Full assessment level. c) BS 9624:1979 Rules for the preparation of detail specifications for oven temperature controlled crystal oscillators (OXCO). Full assessment level. These superseded standards are withdrawn. A British Standard does not purport to include al
5、l the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and
6、 ii, pages 1 to 10, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.DateComments Licensed Copy: Lo
7、ndon South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-1999i Contents Page ForewordInside front cover 0Introduction1 1Scope1 2Detail specification1 3Ratings4 4Characteristics4 5Marking4 6Related documents4 7Orderin
8、g information4 8Certified test records4 9Additional information4 10Inspection requirements4 Publications referred toInside back cover Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: Lond
9、on South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-19991 0 Introduction This British Standard should be read and used in conjunction with Section 2 of BS 9620:1975 “Quartz crystal oscillators of assessed quality:
10、 generic data and methods of test”, which gives the general rules for the preparation of detail specifications for quartz crystal oscillators. The object of all general procedures given in Section 2 of BS 9620:1975 is to ensure that detail specifications for quartz crystal oscillators are broadly si
11、milar as regards their subject matter and presentation. 1 Scope This British Standard lists the ratings, characteristics, inspection requirements and supplementary information for quartz crystal oscillators which are to be included as minimum mandatory requirements, in accordance with the general pr
12、ocedures given in Section 2 of BS 9620:1975, in any detail specification for these devices. A complete detail specification, is therefore, a combination of the requirements of both documents. Its purpose is to describe fully the particular quartz crystal oscillator so that the detail specification c
13、an be used for contractual purposes in the procurement of quartz crystal oscillators, for acceptance test purposes and for circuit design and equipment maintenance purposes. 2 Detail specification The blank detail specification which follows, when completed as appropriate (indicated by an asterisk*)
14、 will form the relevant detail specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 2 blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 200
15、6, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-19993 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH BS 9620:1975 MANUFACTURERS TYPE NUMBER SEE PD 9002 For ordering information see clause 7. Outline and dimensions Third Angle Projection OUTLINE DRAWING WITH OVERA
16、LL MAIN DIMENSIONS OR ALTERNATIVELY INCLUDE A REFERENCE TO AN ATTACHED APPENDIX.a WHERE NO STANDARD OUTLINE EXISTS DETAIL DRAWINGS SHALL BE GIVEN IN THE FORM OF AN APPENDIX. All dimensions in mm For marking information see clause 5 QUARTZ CRYSTAL OSCILLATORS OF ASSESSED QUALITY NOMINAL FREQUENCYa DE
17、SCRIPTION OF COMPONENTa INCLUDING OSCILLATOR TYPE, METHOD OF CONSTRUCTION AND OF SEALING. FULL ASSESSMENT a To be completed by the specification writer. Refer to Qualified Products List PD 9002 for details of manufacturers approved to this specification. Licensed Copy: London South Bank University,
18、London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 4 BSI 12-1999 3 Ratings See 2.1.5 of BS 9620:1975.1) 4 Characteristics See 2.1.6 of BS 9620:1975 Characteristics shall be given at + 25 C 2 C unless otherwise stated.1) 5 Marking See 1.1.6 of BS
19、 9620:1975.1) 6 Related documents See 1.1.2 of BS 9620:1975.1) 7 Ordering information The following information shall be given:1) a) quantity; b) BS detail specification number, issue number and date; c) nominal frequency; d) manufacturers type number; e) full description of additional requirements.
20、 An example of the ordering information shall be given in the detail specification. 8 Certified test records Certified test records shall be prepared in accordance with 2.3 of BS 9620:1975. 9 Additional information (Not for inspection purposes) See 2.1.8 of BS 9620:1975. 10 Inspection requirements T
21、he inspection levels and AQLs to be quoted for groups A, B, C and D in the detail specification shall be as stated in the inspection requirements of this standard. Samples subjected to tests marked D shall not be acceptable for release under BS 9000. (See 20.2 of BS 9000-1.) The conditions and gener
22、al precautions shall be as stated in 1.2.4 of BS 9620:1975 unless otherwise stated in the detail specification. 1) To be completed by the specification writer. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS
23、 9625:1983 BSI 12-19995 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of test ILAQLPerformance requirements BS 9620:1975 reference unless otherwise stated. See note 1 Group A To be conducted on a sampling basis lot by lot. A0 test carried out prior to the formation of inspection
24、 lots. Subgroups A1, A3, A4 and A5 are not applicable. Subgroup A0 Visual test A Sealing test A (Applicable to sealed units only) Output frequency at reference temperature Frequency adjustment (Where applicable) ND 1.2.2.1 1.2.6.2.1 1.2.4.5 1.2.4.8 100 % 1.2.2.1 1.2.6.2.1 Frequency tolerance(s)a Min
25、. or min. and max. frequency change with respect to reference dataa Subgroup A2 Frequency at specified temperatures (Not applicable to SPXO devices unless required by detail specification) Oscillator output voltage Oscillator output waveform (Where specified) Oscillator input power (Where applicable
26、) ND 1.2.4.6.1 (For TCXO devices temp. intervals shall not exceed 10 C) 1.2.4.10.1 or 1.2.4.10.5 (As applicable) 1.2.4.10.4 1.2.4.4.1 I2.5 % Frequency tolerance(s)a Limits as specifieda Waveform as specifieda Maximum powera a To be completed by the specification writer. Licensed Copy: London South B
27、ank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 6 BSI 12-1999 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of test ILAQLPerformance requirements BS 9620:1975 reference unless otherwise stated. See note 1
28、Subgroup A2 Oven input power (Where applicable) Tests 1.2.4.4.1 and 1.2.4.4.2 are combined when a common power supply is used 1.2.4.4.2Max. power at switch ona Max. power after stabilizationa Group B To be conducted on a sampling basis lot by lot. Subgroups B2, B3, B4, B6, B7 and B8 are not applicab
29、le. Subgroup B1 Dimensions test A ND 1.2.3.1 I4.0 % As shown in detail specification Subgroup B5 Sealing test B (Applicable only to sealed units when non-encapsulated crystals are used and also to hermetically sealed units) ND 1.2.6.2.2 S-41.5 % Maximum leak ratea Group C To be conducted at three-mo
30、nthly intervals. Subgroup C4 is not applicable. Subgroup C1 Dimensions test B ND 1.2.3.2 I4.0 % As shown in detail specification Subgroup C2 Frequency change as a function of load Frequency change as a function of supply voltage(s) Frequency at specified temperatures (Applicable to SPXO devices only
31、) ND 1.2.4.7.1 1.2.4.7.2 1.2.4.6.1 S-44.0 % Max. frequency changea Max. frequency changea Frequency tolerance(s)a NOTEAs an alternative to specifying individual requirements of the tests in this subgroup two or more tests can be combined and the results expressed cumulatively. a To be completed by t
32、he specification writer. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-19997 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of test ILAQLPerformance requirements BS 962
33、0:1975 reference unless otherwise stated. See note 1 Subgroup C3 Reject devices or dummy samples may be used for these tests Solderability Tensile and thrust test on terminations Flexibility of wire terminations Torque test (for screw thread terminations only) Sealing test A (Applicable to sealed un
34、its only) Visual test B D 1.2.6.3.2 1.2.6.1.1 1.2.6.1.2 (3 bends) 1.2.6.1.3 1.2.6.2.1 1.2.2.2 I4.0 % 1.2.6.3.2 1.2.6.2.1 1.2.2.2 Subgroup C5 Ageing ND 1.2.7.1 S-34.0 % 1.2.7.1a Subgroup C6 CTR Information1.1.11Measurements information for Subgroup C5 Group D To be conducted at three-yearly intervals
35、. Subgroup D1 is not applicable. Subgroup D2 Stabilization time (For oven temperature controlled units only) ND 1.2.4.7.4 I4.0 % Maximum time to achieve specified operating temperature limitsa a To be completed by the specification writer. Licensed Copy: London South Bank University, London South Ba
36、nk University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 8 BSI 12-1999 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of test ILAQLPerformance requirements BS 9620:1975 reference unless otherwise stated. See note 1 Subgroup D3(i) Initial inspecti
37、on Output frequency at reference temperature Bump Vibration Shock Final inspection Visual test A Output frequency at reference temperature D 1.2.4.5 1.2.6.5 1.2.6.6.1 1.2.6.7 1.2.2.1 1.2.4.5 I4.0 % Record measurements 1.2.2.1 Maximum permissible frequency change and/or maximum frequency deviation fr
38、om nominala Subgroup D3(ii) (Applicable to sealed units only) Initial inspection Output frequency at reference temperature Climatic sequence Final inspection Visual test B Sealing test A Output frequency at reference temperature Oscillator output voltage D 1.2.4.5 1.2.6.10 1.2.2.2 1.2.6.2.1 1.2.4.5
39、1.2.4.10.1 or 1.2.4.10.5 (As applicable) I4.0 % Record measurements 1.2.2.2 1.2.6.2.1 Maximum permissible frequency change and/or maximum frequency deviation from nominala Limits as specifieda a To be completed by the specification writer. Licensed Copy: London South Bank University, London South Ba
40、nk University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-19999 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of test ILAQLPerformance requirements BS 9620:1975 reference unless otherwise stated. See note 1 Subgroup D3(iii) (Applicable to
41、sealed units only) Initial inspection Output frequency at reference temperature Damp heat steady state D 1.2.4.5 1.2.6.11 I4.0 % Record measurements Final inspection Visual test B Sealing test A Output frequency at reference temperature Oscillator output voltage 1.2.2.2 1.2.6.2.1 1.2.4.5 1.2.4.10.1
42、or 1.2.4.10.5 (As applicable) 1.2.2.2 1.2.6.2.1 Maximum permissible frequency change and/or maximum frequency deviation from nominala Limits as specifieda Subgroup D4 Total frequency excursion Oscillator output voltage at temperature extremes Oven input power at temperature extremes (For OCXO units
43、only) ND 1.2.4.6.2 1.2.4.10.1 or 1.2.4.10.5 (As applicable) 1.2.4.4.2 I4.0 % Frequency tolerance(s)a Limits as specifieda Maximum power at switch ona Maximum power after stabilizationa Subgroup D5 Initial inspection Output frequency at reference temperature Shelf life ND 1.2.4.5 1.2.7.2 I4.0 % Recor
44、d measurements a To be completed by the specification writer. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 10 BSI 12-1999 InspectionD or ND See note 2 BS 9620:1975 reference and conditions of te
45、st ILAQLPerformance requirements BS 9620:1975 reference unless otherwise stated. See note 1 Subgroup D5 Final inspection Output frequency at reference temperature 1.2.4.5Maximum permissible frequency change and/or maximum frequency deviation from nominala Subgroup D6 CTR information1.1.11Measurement
46、s information for subgroup D5 NOTE 1Inspection levels (ILS) and Acceptable Quality Levels (AQLS) are selected from BS 6001. NOTE 2In this table D = Destructive tests ND = Non-destructive tests. a To be completed by the specification writer. Licensed Copy: London South Bank University, London South B
47、ank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BSI 12-1999 Publications referred to See clause 1.1.2. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:22:31 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9625:1983 BS
48、I 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsible for preparing British Standards. It presents the UK view on standards in Europe and at the international level. It is incorporated by Royal Charter. Revisions British Standards a
49、re updated by amendment or revision. Users of British Standards should make sure that they possess the latest amendments or editions. It is the constant aim of BSI to improve the quality of our products and services. We would be grateful if anyone finding an inaccuracy or ambiguity while using this British Standard would inform the Secretary of the technical committee responsible, the identity of which can be found on the inside front cover. Tel: 020 8996 9000. Fax: 020 8996 7400. BSI offers members an individual updating service called PLUS which ensures t