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1、BRITISH STANDARD BS EN 150010:1993 Incorporating Amendment Nos. 0 and 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Ambient rated thyristors The European Standard EN 150010:1991 has the status of a British Standard Licensed Copy: she
2、ffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 150010:1993 BSI 05-2000 ISBN 0 580 34925 X/3 Amendments issued since publication Amd. No.Date of issueComments 4354June 1983 7591February 1993Indicated by a sideline in the margin Licensed Copy: sheffieldu
3、n sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 150010:1993 BSI 05-2000i Contents Page National forewordii Forewordiv Text of CECC 500101 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 150010:19
4、93 ii BSI 05-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) CECC 50010 “Harmonized system of quality assessment for electronic components. Blank d
5、etail specification: Ambient-rated thyristors”. This standard is a harmonized specification within the CECC system. The equivalent non-harmonized British Standard in the BS 9300 series will eventually be superseded by this standard but, for a period, both standards will continue to exist. In 1991 th
6、e CENELEC Electronic Components Committee (CECC) accepted CECC 50010:1982 as European Standard EN 150010:1991. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventio
7、ns are not identical with those used in British Standards; attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Stan
8、dard harmonized with CECC 00100 is BS 9000 “General requirements for electronic components of assessed quality”. Scope This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 50000 in any detail specifi
9、cation for these devices. Detail specification layout The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS 9000 Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a co
10、ntract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardCorresponding British Standard IEC 191-2:1966BS 3934:1965 Dimensions of semiconductor devices (Technic
11、ally equivalent) CECC 50000:1980BS CECC 50000:1981 Harmonized system of quality assessment for electronic components: Generic specification: Discrete semiconductor devices (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pa
12、ge 2, the CECC title page, pages ii to vi, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:1
13、8:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 150010 December 1991 UDC: Descriptors: Quality, electronic components, thyristors English version Blank Detail Specification: Ambient-rated thyristors Spcification Particulire Cadre: Thyristors tempr
14、ature ambiante spcifie Vordruck fr Bauartspezifikation: Umgebungsbezogene Thyristoren This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 25 November 1991. The text of this standard consists of the text of CECC 50010 Issue 3 1982 of the corresponding CECC Spe
15、cification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be o
16、btained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notif
17、ied to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerlan
18、d, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektr
19、otechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyright reserved to CENELEC members Ref. No. EN 150010:1991 E Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 2 blank Licensed Copy: sheffieldun sheffieldun,
20、 na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii BSI 05-2000 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS
21、CECC 150010:1983 BSI 05-2000iii Contents Page Forewordiv 1Mechanical description1 2Electrical application1 3Levels of quality assessment1 4Limiting values1 4.1Voltage1 4.2Current1 4.3Gate ratings2 4.4Temperature2 5Electrical characteristics3 5.1On-state voltage3 5.2Reverse avalanche breakdown voltag
22、e3 5.3Reverse current3 5.4Recovered charge3 5.5Off-state current3 5.6Holding current3 5.7Latching current3 5.8Gate trigger current3 5.9Gate trigger voltage3 5.10 Gate non-trigger voltage3 5.11 Critical rate of rise of off-state voltage3 6Marking3 7Ordering information3 8Test conditions and quality a
23、ssessment4 8.1Test conditions4 8.2Quality assessment4 9Additional information8 Figure 1 Current derating curve for a thyristor2 Table A5 Table B6 Table C7 Table D8 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 150010:1983 iv BSI 05
24、-2000 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to
25、facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member co
26、untries without further testing. This document has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for AMBIENT RATED THYRISTORS. It should be read in conjunction with document CECC 00100: Bas
27、ic Rules (1974). Preface This blank detail specification was prepared by CECC Working Group 7: “RECTIFIER DIODES AND THYRISTORS”. It is one of a series of blank detail specifications for discrete semiconductor devices, based on the generic specification CECC 50000. This Issue 3 supersedes Issue 1 of
28、 1977 and Issue 2 of 1980, the most important changes being: 1) the addition of Sub-Group A2a to check non-operative devices, which became obligatory in all existing detail specifications on 1 January 1981. 2) the addition of requirements for controlled avalanche diodes. 3) the addition of clauses 6
29、, 7 and 9. Implementation All qualifications approved to Issue 1 and Issue 2 remain technically valid, as well as all detail specifications prepared in accordance with Issue 1 and Issue 2 even if they are not completely in line with items 2) and 3) above. However, all detail specifications issued in
30、 accordance with Issue 1 before 1 January 1981 shall be amended to conform with item 1) and their issue number raised by one using any suitable means. Issue 1 and Issue 2 will be withdrawn on 1 January 1983 Lay-out It is recognized that the lay-out proposed cannot be applied to all detail specificat
31、ions based on this document. For instance, it may be preferrable to indicate the limiting values in the form of a table when several similar devices appear in the same detail specification. Voting The text of this revised blank detail specification was circulated to the CECC for voting in the docume
32、nt indicated below, and was ratified by the President of the CECC for printing as a CECC Specification: DocumentVoting dateReport on the Voting CECC(Secretariat)924February 1980CECC(Secretariat)1018 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c
33、) BSI BS CECC 150010:1983 BSI 05-2000v Key for page 1 The numbers in square brackets on page 1 correspond to the following indications which shall be given: Identification of the detail specification Identification of the component 1The name of the National Standards Organization under whose authori
34、ty the detail specification (DS) is published and, if applicable, the organization from whom the DS is available. 2The CECC symbol and the number allotted to the DS by the CECC General Secretariat 3The number and issue number of the CECC generic or sectional specification as relevant; also national
35、reference if different. 4If different from the CECC number, the national number of the detail specification, date of issue and any further information required by the national system, together with any amendment numbers. 5A short description of the type of component. 6Information on typical construc
36、tion (where applicable). 7Outline drawing and/or reference to the relevant document for outlines. 8Application or group of applications covered and quality assessment levels. 9Reference data on the most important properties, to allow comparison between the various component types. For 5 and 6 the te
37、xt given should be suitable for an entry in CECC 00200 or CECC 00300. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI vi blank Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC
38、 150010:1983 BSI 05-20001 SPECIFICATION AVAILABLE FROM1Page:CECC 500102 of:Issue 3 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: 34 DETAIL SPECIFICATION FOR AMBIENT RATED THYRISTORS5 Type number(s): Structurally similar devices:(if appropriate) CONSTRUCTION6 Semiconductor material: Si
39、licon Encapsulation material: Metal/glass; metal/ceramic, plastic, other 1 Mechanical description 7 2 Electrical application 8 Outline references:Low power controlled rectification etc. Code A from IEC 191-2: National: OR: Base and case references: Codes B and C from IEC 191-2: National: AND/OR: Out
40、line drawing 3 Levels of quality assessment Marking:see CECC 50000 2.5F L Terminal identification:see CECC 50000 2.5.1 4 Limiting values (Absolute maximum rating system) 9 These apply over the operating temperature range, unless otherwise stated. The following ratings shall be given. 4.1Voltage: Any
41、 qualification such as time, frequency, temperature, mounting method etc. shall be stated. 4.1.1Crest working reverse voltageVRWM 4.1.2Crest working off-state voltageVDWM 4.1.3Repetitive peak reverse voltageVRRM 4.1.4Repetitive peak off-state voltageVDRM 4.1.5Non-repetitive peak reverse voltageVRSM
42、4.1.6Non-repetitive peak off-state voltageVDSM 4.1.7Continuous (DC) reverse voltage (if applicable)VR 4.1.8Continuous (DC) off-state voltage (if applicable)VD 4.2Current: Any qualification such as time, frequency, temperature, mounting method etc. shall be stated. 4.2.1Mean on-state current at the b
43、reakpoint temperature (see Figure 1) IT(AV)max. In single phase circuits, sinusoidal 180 conduction angle with resistive load 4.2.2Repetitive peak on-state current (if applicable)ITRM 4.2.3Continuous (direct) on-state current (if applicable)IT See the current Qualified Products List for availability
44、 of components qualified under this detail specification. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 150010:1983 2 BSI 05-2000 Figure 1 Current derating curve for a thyristor 4.2.4Surge (non-repetitive) on-state currentITSM The
45、surge (non-repetitive) on-state current corresponds to the maximum current permissible for a half sine-wave (10 ms at 50 Hz) without reapplication of reverse voltage. The surge (non-repetitive) current rating corresponds to the maximum current applied after continuous operation at the rated maximum
46、value of the mean on-state current. It is assumed that loss of gate control may occur. 4.2.5Critical rate of rise of on-state currentdi/dt 4.3Gate ratings: Any qualification such as time, frequency, temperature, mounting methode etc. shall be stated. 4.3.1Peak forward gate voltage (if applicable)VFG
47、M Anode positive with respect to cathode 4.3.2Peak forward gate voltage (if applicable)VFGN Anode negative with respect to cathode 4.3.3Peak reverse gate voltageVRGM 4.3.4Peak forward gate current (if applicable)IFGM 4.3.5Peak gate power dissipationPGM 4.3.6Average gate power dissipationPG(AV) 4.4Te
48、mperature 4.4.1Ambient temperatureTamb(max.) Maximum ambient temperature for which the voltage ratings are specified in 4.1 and 4.3 4.4.2Virtual junction temperature (if required) Minimum and maximum value of the junction temperature for which the voltage and current ratings specified in 4.1, 4.2 an
49、d 4.3 apply 4.4.3Storage temperature T vj()max. min. Tstgmax. min. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:18:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 150010:1983 BSI 05-20003 5 Electrical characteristics (See8 for inspection.) The following characteristics shall be given at Tamb = 25 C, unless otherwise stated. 5.1On-state voltage Maximum value at the peak current corresponding to the rated maximum mean on-state current IT(AV)max.VTM 5.2Reverse avalanche breakdown vol