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1、BRITISH STANDARD BS EN 169200:1996 Harmonized system of quality assessment for electronic components Sectional specification: Quartz crystal controlled oscillators (qualification approval) The European Standard EN 169200:1995 has the status of a British Standard ICS 29.300:31.140 Licensed Copy: shef
2、fieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169200:1996 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15 June 19
3、96 BSI 01-2000 The following BSI references relate to the work on this standard: Committee reference EPL/49 Draft for comment 93/204309 DC ISBN 0 580 25600 6 Committees responsible for this British Standard The preparation of this British Standard was entrusted to Technical Committee EPL/49, Piezoel
4、ectric devices for frequency control and selection, upon which the following bodies were represented: Federation of the Electronics Industry Institute of Electrical Engineers Institute of Physics Ministry of Defence National Supervising Inspectorate (BSI-PC) Amendments issued since publication Amd.
5、No.DateComments Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169200:1996 BSI 01-2000i Contents Page Committees responsibleInside front cover National forewordii Foreword2 Text of EN 1692003 List of referencesInside back cover Licens
6、ed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169200:1996 ii BSI 01-2000 National foreword This British Standard has been prepared by Technical Committee EPL/49 and is the English language version of EN 169200:1995 Sectional Specification:
7、 Quartz crystal controlled oscillators (Qualification approval), published by the European Electronic Components Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). A British Standard does not purport to include all the necessary provisions of a contract. Users
8、 of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references Publication referred toCorresponding British Standard IEC 68BS EN 60068 Environmental testing BS 2011 Environmental test
9、ing EN 169000:1992BS EN 169000:1993 Generic specification: Quartz crystal controlled oscillators Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 14, an inside back cover and a back cover. This standard has been updated (see
10、 copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 169200 J
11、uly 1995 Descriptors: Quality, electronic components, quartz crystal controlled oscillators English version Sectional Specification: Quartz crystal controlled oscillators (Qualification approval) Spcification intermdiaire: Oscillateurs pilots par Quartz (Homologation) Rahmenspezifikation: Quarzoszil
12、latoren (Bauartanerkennung) This European Standard was approved by CENELEC on 1993-11-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-dat
13、e lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under
14、the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Lux
15、embourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brus
16、sels 1995 Copyright reserved to CENELEC members. Ref. No. EN 169200:1995 E Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169200:1995 2 BSI 01-2000 Foreword This European Standard was prepared by Working Group CLC/TC CECC/WG 17. The text
17、 of the draft based on document CECC(Secretariat)3325 was submitted to the formal vote; together with the voting report, circulated as document CECC(Secretariat)3455, it was approved as EN 169200 on 1993-11-01. The following dates were fixed: Contents Page Foreword2 Section 1. Scope3 Section 2. Gene
18、ral, preferred ratings and guidance on detail specifications3 2.1Related documents3 2.2Preferred ratings and characteristics3 2.3Information to be prescribed in detail specifications3 Section 3. Quality assurance procedures3 3.1Eligibility for qualification approval3 3.2Structural similarity4 3.3Cer
19、tified test records4 3.4Qualification approval4 3.5Quality conformance inspection4 Annex A Test schedule for qualification approval9 Annex B Ageing test13 Table 1 Sampling plan together with numbers of permissible defectives for Qualification Approval tests5 Table 2 Lot-by-lot tests7 Table 3 Periodi
20、c Tests8 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement(dop) 1996-01-31 latest date by which the national standards conflicting with the EN have to be withdrawn(dow) 1997-01-31 Licensed Copy: sheffieldun sheffiel
21、dun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169200:1995 BSI 01-20003 Section 1. Scope This sectional specification applies to quartz crystal controlled oscillators whose quality is assessed on the basis of qualification approval. It prescribes the preferred ratings and
22、 characteristics, with the appropriate tests and measuring methods contained in the generic specification EN 169000, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators. Section 2. General, preferred ratings and guidance on det
23、ail specifications 2.1 Related Documents IEC 68, Basic environmental testing procedures. EN 169000, Generic specification: Quartz crystal controlled oscillators. NOTEThe above references apply to the current editions except for IEC 68 for which the referred edition and the applicable test clauses of
24、 EN 169000 shall be used. 2.2 Preferred ratings and characteristics The values given in detail specifications shall preferably be selected from those stated in 2.4 of the generic specification EN 169000. 2.3 Information to be prescribed in detail specifications Guidance on the preparation of detail
25、specifications shall be derived from the blank detail specification. Each detail specification shall state all the tests and measurements required for inspection. This shall, as a minimum, include the relevant tests given in the blank detail specification, with methods and severities. The following
26、information shall be given in each detail specification. 2.3.1 Outline drawing and dimensions The detail specification shall include a dimensioned drawing of the crystal controlled oscillator and/or a reference to an appropriate International Standard to permit easy recognition and to provide inform
27、ation for dimensioning and gauging procedures. The dimensions shall include the overall dimensions of the body of the component and the size and spacing of the terminations. All dimensions shall be in mm. Terminal connections shall be identified for all enclosures. This information may be given in m
28、ore detail in an annex. 2.3.2 Mounting of the component The detail specification shall define any assembly restrictions on the use of the crystal controlled oscillator. Where these restrictions apply special mounting fixtures may be required for the bump, shock, vibration and acceleration tests. Suc
29、h fixtures shall be described in the detail specification. Where no special mounting fixtures are indicated then the above tests shall be carried out as specified in section 4 of EN 169000. 2.3.3 Severities for environmental tests The detail specification shall state the method of testing and the ap
30、propriate severities selected from Section 4 of EN 169000. 2.3.4 Marking The detail specification shall state the required marking on the crystal controlled oscillator and on the primary package in accordance with 2.5 of EN 169000. 2.3.5 Ordering information The detail specification shall prescribe
31、that the following information is required when ordering a crystal controlled oscillator. 1) Quantity 2) Detail specification number, issue number and date and where applicable 3) Nominal frequency expressed in kHz or MHz 4) Enclosure type 5) Frequency tolerance(s) and operating temperature range 6)
32、 Full description of any additional requirements. 2.3.6 Additional information (not for inspection purposes) The detail specification may include information which is not normally required to be verified by the inspection procedure, such as circuit diagrams, curves, drawings and notes needed for cla
33、rification. Section 3. Quality assurance procedures 3.1 Eligibility for qualification approval Prior to making an application for qualification approval a manufacturer shall first obtain manufacturers inspection approval in accordance with CECC 00114-I. Licensed Copy: sheffieldun sheffieldun, na, Fr
34、i Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169200:1995 4 BSI 01-2000 The primary stage of manufacture shall be as defined in 3.1 of the generic specification EN 169000. 3.2 Structural similarity Structural similarity exists where a range of quartz crystal controlled oscillators
35、covered by a single detail specification and having similar electrical characteristics, incorporate the same materials and method of sealing the enclosure. 3.3 Certified test records Certified test records shall comply with 3.11 of EN 169000. They shall be made available when prescribed in the detai
36、l specification and when requested by the customer. 3.4 Qualification approval The procedures for qualification approval testing are defined in 3.7 of the generic specification EN 169000. Qualification approval may be obtained either by using a fixed sample drawn from current production (see 3.4.1),
37、 or on the basis of lot-by-lot tests on three inspection lots with periodic tests on a sample taken from at least one of these lots (see 3.4.2). 3.4.1 Fixed sample size procedure for initial approval The manufacturer shall produce test evidence to show conformance to the requirements of the test sch
38、edule given in Table 1 of this specification. Table 1 gives the number of samples to be tested in each group or subgroup together with the permissible number of defectives for qualification approval tests. If additional groups are introduced into the test schedule the number of specimens required fo
39、r Group “0” shall be increased by the same number as that required for the additional groups. The complete series of tests given in Table 1 and Annex A, which together form the fixed sample size test schedule, are required for the qualification approval of quartz crystal controlled oscillators cover
40、ed by one detail specification. The tests in each group shall be carried out in the order given. The whole sample shall be subjected to the tests of Group “0” and then divided for the other groups. “One defective” is counted when a quartz crystal controlled oscillator has not satisfied the whole or
41、a part of the tests of a group. 3.4.2 Lot-by-lot procedure for initial approval The manufacturer shall produce test evidence to show conformance to the requirements of Table 2 and Table 3 and the detail specification. Tests in each group shall be carried out in the given order. A minimum of three in
42、spection lots, taken in the shortest possible period, shall be subjected to the tests given in Table 2 and a sample taken from at least one of these lots shall be subjected to the periodic tests given in Table 3. When additional groups are introduced into the test schedule the number of specimens sh
43、all be increased by the same number as that required for the additional groups. “One defective” is counted when a quartz crystal controlled oscillator has not satisfied the whole or a part of the tests of a group. 3.4.3 Approval For both procedures 3.4.1 and 3.4.2 approval may be granted when the nu
44、mber of defectives does not exceed the specified number of permitted defectives for each group provided the total number of defectives allowed is not exceeded. The maintenance of approval shall be in accordance with 1.7 of CECC 00114-II. 3.5 Quality conformance inspection Quality conformance inspect
45、ion shall be carried out in accordance with 2.3 of CECC 00114-II. The blank detail specification shall prescribe the minimum test schedule which shall be included in each detail specification for quality conformance inspection. 3.5.1 Formation of inspection lots 1) Groups A and B inspection These te
46、sts shall be carried out on a lot-by-lot basis according to Table 2 of this specification. The inspection lot shall consist of structurally similar quartz crystal controlled oscillators formed from current production. 2) Group C inspection These tests shall be carried out periodically according to T
47、able 3 of this specification. The samples shall be representative of the current production over the specified periods. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169200:1995 BSI 01-20005 Table 1 Sampling plan together with numbers o
48、f permissible defectives for Qualification Approval tests Group Number Clause number of EN 169000 and TestSample size Permissible defectives Per GroupTotal for Groups 1 to 8 04.3.1 4.6.2 4.5.4 4.5.5(1) 4.5.11 4.5.23 Visual test A Sealing Output frequency at reference temperature Frequency at specifi
49、ed temperatures Frequency adjustment (as applicable) Frequency modulation characteristics (as applicable) 650 14.4.2 4.5.13 or 4.5.14 4.5.15 or 4.5.16 4.5.3(1) 4.5.3(3) or 4.5.3(2) Dimensions Test B Oscillator output Voltage Oscillator output waveform Oscillator input power Oven input power (OCXO only) Oven and Oscillator input power (OCXO only) 81 24.5.6 4.5.7 4.5.10 Frequency load coefficient Frequency voltage coefficient Stabilization time (OCXO only) 81 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:03 GMT+00:00 2006, Uncontrolled Co