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1、BRITISH STANDARD Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides ICS 33.100.10; 33.100.20 BS EN 61000-4-20:2003 Incorporating amendment no. 1 The European Standard EN 61000-4-20:2003, incor
2、porating amendment A1:2007, has the status of a British Standard ? Licensed Copy: London South Bank University, London South Bank University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI BS EN 61000-4-20:2003 National foreword The UK participation in its preparation was entrusted b
3、y Technical Committee GEL/210, EMC Policy, to Subcommittee GEL/210/12, EMC Basic and generic standards. A list of organizations represented on this subcommittee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users
4、 are responsible for its correct application. Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 16 July 2003 BSI 2007 Amendments issued since publication Amd. No.
5、 DateComments 1734528 September 2007 This British Standard is the UK implementation of EN 61000-4-20:2003, incorporating amendment A1:2007. It is identical with IEC 61000-4-20:2003, incorporating amendment 1:2006. The start and finish of text introduced or altered by amendment is indicated in the te
6、xt by tags !“. Tags indicating changes to IEC text carry the number of the IEC amendment. For example, text altered by IEC amendment 1 is indicated by !“. See national foreword ISBN 978 0 580 60122 4 Licensed Copy: London South Bank University, London South Bank University, Fri Oct 05 02:36:20 GMT+0
7、0:00 2007, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD EN 61000-4-20 NORME EUROPENNE EUROPISCHE NORM April 2003 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue d
8、e Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-20:2003 E ICS 33.100.10; 33.100.20 English version Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emi
9、ssion and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2003) Compatibilit lectromagntique (CEM) Partie 4-20: Techniques dessai et de mesure Essais dmission et dimmunit dans les guides donde TEM (CEI 61000-4-20:2003) Elektromagnetische Vertrglichkeit (EMV) Teil 4-20
10、: Prf- und Messverfahren - Messung der Straussendung und Strfestigkeit in transversal- elektromagnetischen (TEM-) Wellenleitern (IEC 61000-4-20:2003) This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stip
11、ulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standa
12、rd exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the nationa
13、l electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. +A1 June 2007 Licensed Copy: London South Bank Un
14、iversity, London South Bank University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI EN 60010-4-022:300 - - 2 Foreword The text of document CIS/A/419/FDIS, future edition 1 of IEC 61000-4-20, prepared by CISPR SC A, Radio-interference measurements and statistical methods, in cooper
15、ation with SC 77B, High frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-20 on 2003-04-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by
16、publication of an identical national standard or by endorsement (dop) 2004-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2006-04-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “informative“ are given f
17、or information only. In this standard, annexes A, B, C and ZA are normative and annexes D and E are informative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61000-4-20:2003 was approved by CENELEC as a European Standard without any modification
18、. In the official version, for Bibliography, the following notes have to be added for the standards indicated: CISPR 14 NOTE Harmonized in EN 55014 series (not modified). CISPR 20 NOTE Harmonized as EN 55020:2002 (not modified). IEC 61000-2-9 NOTE Harmonized as EN 61000-2-9:1996 (not modified). _ Fo
19、reword to amendment A1 The text of document 77B/520/FDIS, future amendment 1 to IEC 61000-4-20:2003, prepared by SC 77B, High frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 61000-4-20:
20、2003 on 2007-06-01. The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-03-01 latest date by which the national standards conflicting with the amendment have to be wit
21、hdrawn (dow) 2010-06-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of amendment 1:2006 to the International Standard IEC 61000-4-20:2003 was approved by CENELEC as an amendment to the European Standard without any modification. In the Bibliography, the following notes have to
22、be added for the standards indicated: IEC 61000-4-3 NOTE Harmonized as EN 61000-4-3:2006 (not modified). CISPR 16-4-2 NOTE Harmonized as EN 55016-4-2:2004 (not modified). _ BSI 2007 EN 61000-4-20:2003 Page 2 Licensed Copy: London South Bank University, London South Bank University, Fri Oct 05 02:36:
23、20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI CONTENTS INTRODUCTION.5 1 Scope and object6 2 Normative references .6 3 Definitions and abbreviations7 3.1 Definitions.7 3.2 Abbreviations 10 4 General 10 5 TEM waveguide requirements.11 5.1 General requirements for the use of TEM waveguides.11 5.2 Speci
24、al requirements for certain types of TEM waveguides .13 5.3 Measurement uncertainty considerations.14 6 Overview of EUT Types14 6.1 Small EUT.14 6.2 Large EUT.14 Annex A (normative) Emission testing in TEM waveguides.15 Annex B (normative) Immunity testing in TEM waveguides.37 Annex C (normative) HE
25、MP transient testing in TEM waveguides 44 Annex D (informative) TEM waveguide characterization.52 Annex E (informative) Standards including TEM waveguides .59 Annex ZA (normative) Normative references to international publications with their Bibliography63 Figure A.1 Routing the exit cable to the co
26、rner at the ortho-angle and the lower edge of the test volume .27 Figure A.2 Basic ortho-axis positioner or manipulator 28 Figure A.3 Three orthogonal axis-rotation positions for emission measurements29 Figure A.4 Canonical 12-face/axis orientations for a typical EUT30 Figure A.5 Open-area test site
27、 geometry31 Figure A.6 Two-port TEM cell (symmetric septum) .32 Figure A.7 One-port TEM cell (asymmetric septum) .33 Figure A.8 Stripline (two plates).34 Figure A.9 Stripline (four plates, balanced feeding)36 BSI 2007 corresponding European publications.61 EN 61000-4-20:2003 Page 3 Licensed Copy: Lo
28、ndon South Bank University, London South Bank University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI Figure B.1 Example of test set-up for single-polarization TEM waveguides 42 Figure B.2 Uniform area calibration points in TEM waveguide43 Figure C.1 Frequency domain spectral magn
29、itude between 100 kHz and 300 MHz 51 Figure D.1 Simplest waveguide (no TEM wave!) 58 Figure D.2 Waveguides for TEM propagation.58 Figure D.3 Polarization vector58 Figure D.4 Transmission line model for TEM propagation 58 Figure D.5 One- and two-port TEM waveguides .58 Table B.1 Uniform area calibrat
30、ion points.39 Table B.2 Test levels .40 Table C.1 Radiated immunity test levels defined in the present standard .51 BSI 2007 EN 61000-4-20:2003 Page 4 Licensed Copy: London South Bank University, London South Bank University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI INTRODUCTIO
31、N IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Li
32、mits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and d
33、evices Part 6: Generic Standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards, Technical Specifications or Technical Reports, some of which have already been published as sections. Others will be published with the part number
34、followed by a dash and a second number identifying the subdivision (example: 61000-6-1). BSI 2007 EN 61000-4-20:2003 Page 5 Licensed Copy: London South Bank University, London South Bank University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI ELECTROMAGNETIC COMPATIBILITY (EMC) Pa
35、rt 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides 1 Scope and object This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (
36、TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguid
37、e type. The object of this standard is to describe TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; TEM waveguide validation methods for EMC measurements; the EUT (i.e. EUT cabinet and cabling) definition; test set-ups, procedures, and requirements for radi
38、ated emission testing in TEM waveguides and test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited appli
39、es. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 161: Electro- magnetic compatibility IEC 60068-1, Environmental testing Part 1: General and guidance. BSI 2007 IEC 610
40、00-2-11, Electromagnetic compatibility (EMC) Part 2-11: Environment Classi- fication of HEMP environments. Basic EMC publication NOTE Test methods are defined in this standard for measuring the effects of electromagnetic radiation on equipment and the electromagnetic emissions from equipment concern
41、ed. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate repeatability of results at various test facilitie
42、s for qualitative analysis of effects. This standard does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testi
43、ng, product committees should select emission limits and test methods in consultation with CISPR. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard de
44、scribes test methods that are separate from those of IEC 61000-4-3. These other distinct test methods may be used when so specified by product committees, in consultation with CISPR and TC 77. Text deleted!“ “ ! EN 61000-4-20:2003 Page 6 Licensed Copy: London South Bank University, London South Bank
45、 University, Fri Oct 05 02:36:20 GMT+00:00 2007, Uncontrolled Copy, (c) BSI IEC/TR 61000-4-32, Electromagnetic compatibility (EMC) Part 4-32: Testing and measure- ment techniques HEMP simulator compendium IEC/TR 61000-5-3, Electromagnetic compatibility (EMC) Part 5-3: Installation and mitigation gui
46、delines HEMP protection concepts. Basic EMC publication CISPR 22, Information technology equipment Radio disturbance characteristics Limits and methods of measurement 3 Definitions and abbreviations 3.1 Definitions For the purposes of this part of IEC 61000, the definitions given in IEC 60050(161) (
47、IEV), as well as the following, apply. 3.1.1 transverse electromagnetic (TEM) mode waveguide mode in which the components of the electric and magnetic fields in the propagation direction are much less than the primary field components across any transverse cross-section 3.1.2 TEM waveguide open or c
48、losed transmission line system, in which a wave is propagating in the transverse electromagnetic mode to produce a specified field for testing purposes 3.1.3 TEM cell enclosed TEM waveguide, often a rectangular coaxial line, in which a wave is propagated in the transverse electromagnetic mode to pro
49、duce a specific field for testing purposes. The outer conductor completely encloses the inner conductor 3.1.4 two-port TEM waveguide TEM waveguide with input/output measurement ports at both ends BSI 2007 IEC 61000-4-23, Electromagnetic compatibility (EMC) Part 4-23: Testing and measurement techniques Test methods for protective devices for