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1、BRITISH STANDARD BS EN 61000-4-15:1998 IEC 61000-4-15:1997 Incorporating Amendment No. 1 Electromagnetic compatibility (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications The European Standard EN 61000-4-15:1998, with the incorporation of amendment A
2、1:2003, has the status of a British Standard ICS 33.100.20 ? BS EN 61000-4-15:1998 This British Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes into effect on 15 July 1998 BSI 6 November 2003
3、ISBN 0 580 30061 7 National foreword This British Standard is the English language version of EN 61000-4-15:1998. It is identical with IEC 61000-4-15:1997, Edition 1.1 which comprises Edition 1:1997 consolidated by the incorporation of amendment 1:2003. The UK participation in its preparation was en
4、trusted by Technical Committee GEL/210, Electromagnetic compatibility, to Subcommittee GEL/210/8, EMC Low frequency phenomena, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or pr
5、oposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this subcommittee can be obtained on request to its secretary. Cross-references The British Standards which implement
6、these international or European publications may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all
7、 the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 25 an
8、d a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Sidelining in this document indicates the most recent changes by amendment. Amendments issued since publication Amd. No. DateComments 146546 November 2003Indicated by a sideline EUROPEAN
9、STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61000-4-15 April 1998 + A1 April 2003 ICS 33.100.20 Descriptors: Electromagnetic compatibility, tests, type testing: tests, measuring techniques, measuring instruments, flicker meters, design, performance evaluation, specifications English version Electrom
10、agnetic compatibility (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications (includes amendment A1:2003) (IEC 61000-4-15:1997 + A1:2003) Compatibilit lectromagntique (CEM) Partie 4-15: Techniques dessai et de mesure Flickermtre Spcifications fonctionne
11、lles et de conception (inclut lamendement A1:2003) (CEI 61000-4-15:1997 + A1:2003) Elektromagnetische Vertrglichkeit (EMV) Teil 4-15: Prf- und Meverfahren Flickermeter Funktionsbeschreibung und Auslegungsspezifikation (enthlt nderung A1:2003) (IEC 61000-4-15:1997 + A1:2003) This European Standard wa
12、s approved by CENELEC on 1998-04-01; amendment A1 was approved by CENELEC on 2003-03-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date
13、 lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under t
14、he responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Icel
15、and, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Sec
16、retariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-15:1998 + A1:2003 E EN 16000-4-:519189 ISB 6 mevoNbre 3002 2 Foreword The text of document 77A/180/FDIS, future edition 1 of
17、IEC 61000-4-15, prepared by SC 77A, Low-frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-15 on 1998-04-01. The following dates were fixed: Annexes designated “normative” are part of the body of
18、the standard. In this standard, Annex A and Annex ZA are normative. Annex ZA has been added by CENELEC. Endorsement notice The text of the International Standard IEC 61000-4-15:1997 was approved by CENELEC as a European Standard without any modification. Foreword to amendment A1 The text of document
19、 77A/389/FDIS, future amendment 1 to IEC 61000-4-15:1997, prepared by SC 77A, Low-frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 61000-4-15:1998 on 2003-03-01. The following dates were
20、 fixed: Annexes designated “normative” are part of the body of the standard. In this standard, Annex ZA is normative. Annex ZA has been added by CENELEC. Endorsement notice The text of amendment 1:2003 to the International Standard IEC 61000-4-15:1997 was approved by CENELEC as an amendment to the E
21、uropean Standard without any modification. latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement(dop) 1999-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn(dow) 2001-01-01 l
22、atest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement(dop) 2003-12-01 latest date by which the national standards conflicting with the amendment have to be withdrawn(dow) 2006-03-01 Page 2 EN 61000415:1998 -00016-
23、43002:1A+7991:CEI 51 3 CONTENTS FOREWORD 5 INTRODUCTION 4 7 1 Scope and object . 5 2 Normative references. 5 3 Description of the instrument. 6 3.1 General . 6 3.2 Block 1 Input voltage adaptor and calibration checking circuit 6 3.3 Block 2 Square law demodulator . 7 3.4 Blocks 3 and 4 Weighting fil
24、ters, squaring and smoothing 7 3.5 Block 5 On-line statistical analysis. 7 3.6 Outputs 8 4 Specification . 9 4.1 Analogue response 9 4.2 Input transformer .10 4.3 Voltage adaptor .11 4.4 Internal generator for calibration checking11 4.5 Squaring demodulator11 4.6 Weighting filters.11 4.7 Overall res
25、ponse from input to output of block 3.12 4.8 Range selector.12 4.9 Squaring multiplier and sliding mean filter 13 4.10 General statistical analysis procedure 13 4.11 Temperature and humidity operating range of the instrument14 5 Performance testing14 6 Type test and calibration specifications .15 6.
26、1 General .15 6.2 Insulation and electromagnetic compatibility tests (provisional).15 6.3 Climatic tests.16 Annex A (normative) Techniques to improve accuracy of flicker evaluation21 Annex B (informative) Meaning of V/V and number of voltage changes .23 goilbiBryhpa 52 Fiugr 1 e Fnucgaid lanoitrma f
27、o CEI filckermeter91 FiugraB 2 esic ullistrfo noita it ehtme-ta-level mohted02 Firug1.B e ceRtralugna c egatlovegnah V/V zH 8,8 ,% 04 =c 6,71 ,segnahs/cedno 54 TroN 1 elbamzilaf decilkermrete ressnopf eor sisunf egatlov ladiolcusnoitaut (itupn reegatlov evital flucnoitaut V/V fro fo tinu eno eprcyti
28、libitpe 5 tuptuo ta) 9 TroN 2 elbamzilaf decilkremrete rsesnopf ero rcetralugna f egatlovlcusnoitaut (itupn reegatlov evital flucnoitaut V/V fro fo tinu eno eprcytilibitpe 5 tuptuo ta) 9 TsegnaR 3 elba fo ragatlov tupni dete1.0 T4 elba noitaleRsteb pihweht nee regna selectro seulav dna snesslevel no
29、ita 31 T5 elba Test sepcificnoita fro filckermrete classifire .0 TnI 6 elbaset noitalusts fro op dna tupniwre sylppu cennocoitn71 TI 7 elbammytinu assessmet tnests ele otctromcitenga etnirfernece81 TidnI 8 elbacitave vseula fro ap ehtrameters fo almps.12 Page 3 EN 61000415:1998 61000-4-15 IEC:1997+A
30、1:2003 3 TNOCENTS OFWERODR 5 NITROCUDTION 4 7 1 Scbo dna epoject . 5 2 Normaitve referneces. 5 3 Decsrfo noitpi ni ehtstrumnet. 6 1.3 Generla . 6 2.3 Bolck rotpada egatlov tupnI 1 dna cbilarnoita cehckign circiut 6 3.3 Bolck auqS 2rwal e edmrotaludo . 7 4.3 Bolcks 4 dna 3 Wgnithgie fetlirs, sauqrdna
31、 gni smnihtoog 7 5.3 Bolck 5 On-enil stitasitclana laysis. 7 6.3 Otuptus 8 4 Sepcificnoita . 9 1.4 Aeugolan resnopse 9 2.4 t tupnIrnasformre .01 3.4 Vrotpada egatlo .11 4.4 etnIreneg lanrrota for cabilranoit cehcking11 5.4 Sauqred gnimotaludor11 6.4 Wgnithgie fetlirs.11 7.4 Oevrlla resnopse frmo fo
32、tuptuo ot tupni olbck 3.12 8.4 Regna seelcotr.21 9.4 Sauqrgni mreilpitlu dna sgnidil mnae fretli 31 01.4 Generla stitasitclana layssi procudere 41 11.4 Temeprutaruh dna emytidi eporgnita rfo egna ni ehtstrumnet41 5 Performnacet esnitg41 6 Tyet epsdna t cbilarnoita sepcificsnoita .51 1.6 Generla .51
33、2.6 Insele dna noitaluctromcitenga comytilibitap etsts (privosilano).51 3.6 Cilmcita etsts.61 xennA A (onrm)evita Tecseuqinh i otmpra evoccuracy fo filckre oitaulaven21 Annex B (informative) Meaning of V/V and number of voltage changes .23 Bibliography 25 Figure 1 Functional diagram of IEC flickerme
34、ter19 Figure 2 Basic illustration of the time-at-level method20 Figure B.1 Rectangular voltage change V/V = 40 %, 8,8 Hz, 17,6 changes/second 23 Table 1 Normalized flickermeter response for sinusoidal voltage fluctuations (input relative voltage fluctuation V/V for one unit of perceptibility at outp
35、ut 5) 9 Table 2 Normalized flickermeter response for rectangular voltage fluctuations (input relative voltage fluctuation V/V for one unit of perceptibility at output 5)10 Table 3 Ranges of rated input voltage.10 Table 4 Relationship between the range selector values and sensation levels 13 Table 5
36、Test specification for flickermeter classifier 14 Table 6 Insulation tests for input and power supply connection17 Table 7 Immunity assessment tests to electromagnetic interference17 Table 8 Indicative values for the parameters of lamps.12 3 egaP 8991:51400016 NE nnAex ( Dronma)evit nUwadetn mesisis
37、no fo rrada systmes sdohteM fo msaerumestne dna rriuqeer desustl 75 nnAex i( EfnromavitefreP )mrocnac ecehks ne gnirudvimnort latneestnig 36 Annex ZA (normative) Normative references to international publications with their corresponding European publications. 24 -00016-43002:1A+7991:CEI 51 7 INTROD
38、UCTION IEC 61000-4 is a part of the IEC 61000 series, according to the following structure: Part 1:General General consideration (introduction, fundamental principles) Definitions, terminology Part 2:Environment Description of the environment Classification of the environment Compatibility levels Pa
39、rt 3:Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4:Testing and measurement techniques Measurement techniques Testing techniques Part 5:Installation and mitigation guidelines Installation guidelines Mitigation methods
40、and devices Part 6:Generic standards Part 9:Miscellaneous Each part is further subdivided into sections which are to be published either as International Standards or as technical reports. These sections of IEC 61000-4 will be published in chronological order and numbered accordingly. Page 4 EN 6100
41、0415:1998 -00016-43002:1A+7991:CEI 51 9 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4: Testing and measurement techniques Section 15: Flickermeter Functional and design specifications 1 Scope and object This section of IEC 61000-4 gives a functional and design specification for flicker measuring appara
42、tus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with
43、this standard. This section is based partly on work by the “Disturbances” Working Group of the International Union for Electroheat (UIE), partly on work of the IEEE, and partly on work within IEC itself. The flickermeter specifications in this section relate only to measurements of 230 V, 50 Hz inpu
44、ts and 120 V, 60 Hz inputs; specifications for other voltages and other frequencies are under consideration. The object of this section is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit value
45、s of flicker severity. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC
46、 60068-2-1:1990, Environmental testing Part 2: Tests Tests A: Cold IEC 60068-2-2:1974, Environmental testing Part 2: Tests Tests B: Dry heat IEC 60068-2-3:1969, Environmental testing Part 2: Tests Test Ca: Damp heat, steady state IEC 60068-2-14:1984, Environmental testing Part 2: Tests Test N: Chang
47、e of temperature IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 2: Electrostatic discharge immunity test IEC 61000-4-3:1995, Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 3: Radiated, radio-frequency
48、, electromagnetic field immunity test IEC 61000-4-4:1995, Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 4: Electrical fast transient/burst immunity test Page 5 EN 61000415:1998 -00016-43002:1A+7991:CEI 51 11 IEC 61000-4-5:1995, Electromagnetic compatibility (
49、EMC) Part 4: Testing and measurement techniques Section 5: Surge immunity test IEC 61000-4-6:1996, Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 6: Immunity to conducted disturbances induced by radio-frequency fields IEC 61000-4-8:1993, Electromagnetic compatibility (EMC)