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1、BRITISH STANDARD BS ISO/IEC 10373-6:2001 +A5:2007 Identification cards Test methods Part 6: Proximity cards ICS 35.240.15 ? Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:
2、09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- BS ISO/IEC 10373-6:2001+A5:2007 This British Standard was published under the authority of the Standards Committee and comes into effect on 15 August 2001 BSI 2008 ISBN 978 0 580 62458 2 National foreword This British St
3、andard is the UK implementation of ISO/IEC 10373-6:2001+A5:2007. It supersedes BS ISO/IEC 10373-6:2001, which is withdrawn. ISO/IEC amendments 1:2007, 2:2003, 3:2006, 4:2006 and 5:2007 are appended in National Annex NA due to the technical content of these amendments. The UK participation in its pre
4、paration was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible f
5、or its correct application. Compliance with a British Standard cannot confer immunity from legal obligations. Amendments/corrigenda issued since publication DateComments 30 June 2008Addition of National Annex NA, implementing ISO/IEC amendments 1:2007, 2:2003, 3:2006, 4:2006 and 5:2007 Copyright Bri
6、tish Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- Reference number ISO/IEC 10373-6:2001(E) INTERNATIONAL ST
7、ANDARD ISO/IEC 10373-6 First edition 2001-05-15 Identification cards Test methods Part 6: Proximity cards Cartes didentification Mthodes dessai Partie 6: Cartes de proximit BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled C
8、opy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- ii Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=J
9、apan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- iii ContentsPage Forewordv 1Scope 1 2Normative references1 3Terms and definitions, abbreviations and symbols.2 3.1Terms and definitions .2 3.2Abbreviations and symbols2 4Default it
10、ems applicable to the test methods.3 4.1Test environment.3 4.2Pre-conditioning 3 4.3Default tolerance3 4.4Spurious Inductance .3 4.5Total measurement uncertainty .3 5Static electricity test3 5.1Apparatus.3 5.2Procedure.4 5.3Test report4 6Test apparatus and test circuits.5 6.1Calibration coil.5 6.1.1
11、Size of the Calibration coil card.5 6.1.2Thickness and material of the Calibration coil card 5 6.1.3Coil characteristics5 6.2Test PCD assembly6 6.2.1Test PCD antenna6 6.2.2Sense coils.6 6.2.3Assembly of Test PCD 7 6.3Reference PICCs7 6.3.1Reference PICC for Hmin, Hmaxand PCD power.7 6.3.2Reference P
12、ICC for load modulation test7 6.3.3Dimensions of the Reference PICCs8 6.3.4Thickness of the Reference PICCs board .8 6.3.5Coil characteristics8 6.4Digital sampling oscilloscope8 7Functional test - PICC .8 7.1Purpose.8 7.2Test procedure.8 7.3Test report9 8Functional test - PCD 9 8.1PCD field strength
13、9 8.1.1Purpose.9 8.1.2Test procedure.9 8.1.3Test report10 8.2Power transfer PCD to PICC.10 8.2.1Purpose.10 8.2.2Test procedure.10 8.2.3Test report10 8.3Modulation index and waveform10 8.3.1Purpose.10 8.3.2Test procedure.10 BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provi
14、ded by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- iv 8.3.3Test report 10 8.4Load modulation reception (informative only) .11 8.4.1Purpose.1
15、1 8.4.2Test procedure.11 Annex A (normative) Test PCD Antenna.12 A.1Test PCD Antenna layout including impedance matching network.12 A.2Impedance matching network 14 Annex B (informative) Test PCD Antenna tuning.15 Annex C (normative) Sense coil 17 C.1Sense coil layout17 C.2Sense coil assembly18 Anne
16、x D (normative) Reference PICC for field and power measurements.19 Annex E (informative) Reference PICC for load modulation test.20 Annex F (informative) Program for the evaluation of the spectrum.21 BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under licens
17、e with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- v Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
18、Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity
19、. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives
20、, Part 3. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval b
21、y at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this part of ISO/IEC 10373 may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. International Standard IS
22、O/IEC 10373-6 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Identification cards and related devices. ISO/IEC 10373 consists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics tests
23、 Part 2: Cards with magnetic stripes Part 3: Integrated circuit(s) cards with contacts and related interface devices Part 4: Close-coupled cards Part 5: Optical memory cards Part 6: Proximity cards Part 7: Vicinity cards Annexes A, C and D form a normative part of this part of ISO/IEC 10373. Annexes
24、 B, E and F are for information only. BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted witho
25、ut license from IHS -,-,- blank Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- 1 Identifica
26、tion cards Test methods Part 6: Proximity cards 1Scope This International Standard defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which may be ISO/IEC 7810 or one
27、or more of the supplementary standards that define the information storage technologies employed in identification cards applications. NOTE 1Criteria for acceptability do not form part of this International Standard but will be found in the International Standards mentioned above. NOTE 2Test methods
28、 described in this International Standard are intended to be performed separately. A given card is not required to pass through all the tests sequentially. This part of ISO/IEC 10373 deals with test methods which are specific to contactless integrated circuit(s) card technology (Proximity cards). IS
29、O/IEC 10373-1, General characteristics, deals with test methods which are common to one or more ICC technologies and other parts deal with other technology-specific tests. Unless otherwise specified, the tests in this part of ISO/IEC 10373 shall be applied exclusively to Proximity cards defined in I
30、SO/IEC 14443-1 and ISO/IEC 14443-2. 2Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of ISO 10373. For dated references, subsequent amendments to, or revisions of, any of these publications do not app
31、ly. However, parties to agreements based on this part of ISO 10373 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of ISO a
32、nd IEC maintain registers of currently valid International Standards. ISO/IEC 7810:1995, Identification cards Physical characteristics. ISO/IEC 14443-1, Identification cards Contactless integrated circuit(s) cards Proximity cards Part 1: Physical characteristics. ISO/IEC 14443-2, Identification card
33、s Contactless integrated circuit(s) cards Proximity cards Part 2: Radio frequency power and signal interface. ISO/IEC 14443-3, Identification cards Contactless integrated circuit(s) cards Proximity cards Part 3: Initialization and anticollision. IEC 61000-4-2: 1995, Electromagnetic compatibility (EM
34、C) Part 4: Testing and measurement techniques Section 2: Electrostatic discharge immunity test. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, 1993, Guide to the Expression of Uncertainty in Measurement (Gum). BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under l
35、icense with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 3Terms and definitions, abbreviations and symbols For the purposes of this part of ISO/IEC 10373, the fol
36、lowing terms and definitions and abbreviations apply. 3.1Terms and definitions 3.1.1 base standard standard which the test method is used to verify conformance to 3.1.2 testably functional surviving the action of some potentially destructive influence to the extent that any integrated circuit(s) pre
37、sent in the card continues to show a response1)as defined in ISO/IEC 14443-3 which conforms to the base standard NOTEIf other technologies exist on the same card they shall be testably functional in accordance with their respective standard. 3.1.3 test method method for testing characteristics of id
38、entification cards for the purpose of confirming their compliance with International Standards 3.2Abbreviations and symbols DUTDevice under test ESDElectrostatic Discharge fcFrequency of the operating field fsFrequency of the subcarrier HmaxMaximum fieldstrength of the PCD antenna field HminMinimum
39、fieldstrength of the PCD antenna field PCDProximity Coupling Device PICCProximity Card 1)This International Standard does not define any test to establish the complete functioning of integrated circuit(s) cards. The test methods require only that the minimum functionality (testably functional) be ve
40、rified. This may, in appropriate circumstances, be supplemented by further, application specific functionality criteria which are not available in the general case. BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Lice
41、nsee=Boeing Co/5910770001, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- 3 4Default items applicable to the test methods 4.1Test environment Unless otherwise specified, testing shall take place in an environment of tempe
42、rature 23 ?C?3 ?C (73 ?F?5 ?F) and of relative humidity 40 % to 60 %. 4.2Pre-conditioning Where pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned to the test environment for a period of 24 h before testing. 4.3Default tolerance Unless otherwi
43、se specified, a default tolerance of?5 % shall be applied to the quantity values given to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 4.4Spurious Inductance Resistors and capacitors should have negligibl
44、e inductance. 4.5Total measurement uncertainty The total measurement uncertainty for each quantity determined by these test methods shall be stated in the test report. Basic information is given in Gum, 1993. 5Static electricity test The purpose of this test is to check the behaviour of the card IC
45、in relation to electrostatic discharge (ESD) exposure in the test sample. The card under test is exposed to a simulated electrostatic discharge (ESD, human body model) and its basic operation checked following the exposure. 0,5 mm thick insulating support PICC Discharge tip ESD gun Horizontal coupli
46、ng conductive plane on wooden table, standing on ground reference plane Figure 1 ESD test circuit 5.1Apparatus Refer to IEC 61000-4-2:1995. BS ISO/IEC 10373-6:2001+A5:2007 Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Licensee=Boeing Co/5910770001
47、, User=Japan, IHS Not for Resale, 10/17/2008 23:09:55 MDTNo reproduction or networking permitted without license from IHS -,-,- 4 a)Main specifications of the ESD generator ?energy storage capacitance: 150 pF?10 % ?discharge resistance: 330 Ohm?10 % ?charging resistance: between 50 MOhm and 100 MOhm ?rise time: 0,7 to 1 ns b)Selected specifications from the optional items ?type of equipment: table top equipment ?discharge method: direct and contact discharge to the equipment under test ?discharge electrodes of the ESD generator: Round tip probe of 8 mm diameter (to avoid breaking t