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1、BRITISH STANDARD CONFIRMED JUNE 1999 BS QC 3004001:1984 IEC 384-2-1: 1982 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification: Fixed metallized polyethylene terep
2、hthalate film dielectric dc capacitors Assessment level E Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-2000 ISBN 0 580 34858 X Amendments issued since publication Amd. No.Date of is
3、sueComments 5948September 1988 Indicated by a sideline in the margin Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-2000i Contents Page National forewordii Introduction1 Section 1. Ge
4、neral data 1.1Recommended method(s) of mounting2 1.2Dimensions2 1.3Ratings and characteristics2 1.4Related documents3 1.5Marking3 1.6Ordering information3 1.7Certified records of released lots3 1.8Additional information3 1.9Additional or increased severities or requirements to those specified in the
5、 generic and/or sectional specification3 Section 2. Inspection requirements 2.1Procedures4 Table I2 Table II Values of capacitance and of voltage related to case sizes3 Table III Other characteristics3 Table IV4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17
6、:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication 384-2-1 (QC 300401): “Fixed capacitors
7、 for use in electronic equipment. Blank detail specification: Fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Assessment level E” published by the International Electrotechnical Commission (IEC). Terminology and conventions. The text of the International Standard has bee
8、n approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard which implements IEC Publications QC 001001:1986 and QC 001002:1986 is BS 9000: “Gen
9、eral requirements for a system for electronic components of assessed quality”: Part 3:1987 “Specification for national implementation of the IECQ basic rules and rules of procedure”. In adopting the IEC text as a National Standard it has been noted that there is an omission from boxes 2 and 4 of the
10、 specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IEC TC 40 Secretariat and the specification number has been inserted where necessary in this standard. Scope. This standard lists the ratings, characteristics and
11、inspection requirements which shall be included as mandatory requirements in accordance with BS QC 300400. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take precedence except that the front page la
12、yout will be in accordance with PD 9004:1986 “BS 9000, CECC and IECQ UK administrative guide” Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a
13、British Standard does not of itself confer immunity from legal obligations. International StandardsCorresponding British Standards IEC 384-1:1982 (QC 300000:1982) BS QC 300000:1983 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment: Ge
14、neric specification (Identical) IEC 384-2:1982 (QC 300400:1982) BS QC 300400:1983 Sectional specification: Fixed capacitors (Identical) IEC 410:1973BS 6001: “Sampling procedures for inspection by attributes”: Part 1:1972: “Specification for sampling plans indexed by acceptable quality level (AQL) fo
15、r lot-by-lot inspection” Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the in
16、side front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-20001 Introduction Blank detail specification A Blank Detail Specification is a supplementary document to the Sectiona
17、l Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with IEC specifications nor shall they be so described. In the preparation of detail s
18、pecifications the content of Sub-clause 1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “Internat
19、ional Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue n
20、umber of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short description of the type of capacitor. 6 Information on typical construction (when applicable). NOTEWhen the capacitor is not designed for use in printed b
21、oard applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an
22、 appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification. Sub-clause 3.4.4. This implies that one blank detail specification may b
23、e used in combination with several assessment levels provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor types. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 1
24、7:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 2 BSI 04-2000 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publication 384-2) 1.2 Dimensions Table I 1.3 Ratings and characteristics Capacitance range (see Table II) T
25、olerance on rated capacitance Rated voltage (see Table II) Category voltage (if applicable) (see Table II) Climatic category Rated temperature 1 IEC 384-2-1-XXX QC 300401-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 384-2-1 QC 300401 4 3 FIXED METALLIZED POLYETHYLENE-TEREP
26、HTHALATE FILM DIELECTRIC D.C. CAPACITORS 5 Outline drawing (see Table I) (First angle projection) 7 6 Assessment level(s):-E Performance grade: 8 (Other shapes are permitted within the dimensions given) Information on the availability of components qualified to this detail specification are given in
27、 the Qualified Products List. 9 Case size reference Dimensions (in millimetres or inches and millimetres) LHd. . . . . . . . NOTE 1When there is no case size reference, Table I may be omitted and the dimensions shall be given in Table II, which then becomes Table I. NOTE 2The dimensions shall be giv
28、en as maximum dimensions or as nominal dimensions with a tolerance. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-20003 Maximum a.c. voltage (if applicable) Maximum pulse load Tangen
29、t of loss angle Insulation resistance Maximum dissipation Table II Values of capacitance and of voltage related to case sizes 1.4 Related documents 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of IEC Publication 384-2, Sub-clause 1.6. NOTEThe
30、details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) Tolerance on rate
31、d capacitance. c) Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. 1.7 Certified records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those
32、specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table III Other characteristics Rated voltage Category voltagea Case sizeCase sizeCase sizeCase size Rated capacitance (in nF and or 4F) a If different from the ra
33、ted voltage. Generic specification:IEC Publication 384-1:1982: Fixed Capacitors for Use in Electronic Equipment, Part 1: Generic Specification. Sectional specification: IEC Publication 384-2:1982: Part 2: Sectional Specification: Fixed Metallized Polyethylene-terephthalate Film Dielectric D.C. Capac
34、itors. This table is to be used for defining characteristics which are additional to or more severe than those given in the sectional specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001
35、:1984 4 BSI 04-2000 Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with the Sectional Specification, IEC Publication 384-2, Sub-clause 3.4. 2.1.2 For Quality Conformance Inspection the test schedule (Table IV) includes samplin
36、g, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.5.1 of the Sectional Specification. Table IV NOTE 1Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication 384-2 and Section 1 of this speci
37、fication. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p=periodicity (in months) n=sample size c=acceptance criterion (permitted number of defectives) D=destructive ND=non-destructive IL=inspe
38、ction level IEC Publication 410 AQL=acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQL Performance requirements (see Note 1) (see Note 2) Group A inspection (lot-by-lot) Sub-group A1NDS-42.5 % 4.1 Visual examination 4.1 Dimensions (gauging)
39、 As in 4.1 Legible marking and as specified in 1.5 of this specification As specified in Table I of this specification Sub-group A2NDII1.0 % 4.2.2 Capacitance 4.2.3 Tangent of loss angle 4.2.1 Voltage proof (Test A) 4.2.4 Insulation resistance (Test A) Within specified tolerance As in 4.2.3.2 No bre
40、akdown or flashover As in 4.2.4.2 Group B inspection (lot-by-lot) Sub-group B1DS-32.5 % 4.5 SolderabilityWithout ageing Method: . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . s, as applicable Licensed Copy: London South Bank U
41、niversity, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-20005 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance require
42、ments (see Note 1) pnc Group C inspection (periodic) Sub-group C1A Part of sample of Sub-group C1 D691 4.1 Dimensions (detail) 4.3.1 Initial measurements 4.3 Robustness of terminations 4.4 Resistance to soldering heat 4.4.2 Final measurements Capacitance Tangent of loss angle: For CR 1 4F: at1 kHz C
43、Rk 1 4F: at 10 kHz Visual examination Method: Visual examination Capacitance Tangent of loss angle See detail specification No visible damage No visible damage Legible marking k 2 % of the value measured initially Increase of tan : k 0.003 C k 1 4F Grade 1 k 0.002 C 1 4F Grade 1 k 0.005 C k 1 4F Gra
44、de 2 k 0.003 C 1 4F Grade 2 compared to values measured in 4.3.1 Sub-group C1B Other part of sample of Sub-group C1 D6181 4.6.1 Initial measurements 4.6 Rapid change of temperature Capacitance Tangent of loss angle: For CR 1 4F: at1 kHz CRk 1 4F: at 10 kHz A = Lower category temperature B = Upper ca
45、tegory temperature Five cycles Duration t = 30 min Visual examinationNo visible damage %C C - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 6 BSI 04-2000 Table IV Sub-clause number and Test
46、 (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc 4.7 Vibration 4.7.2 Final inspection 4.8 Bump (or shock, see 4.9) 4.9 Shock (or bump, see 4.8) 4.8.3 or 4.9.3 Final measurements Method of mounting:
47、 see 1.1 of this specification Procedure B4 Frequency range: . Hz to . Hz Amplitude 0.75 mm or acceleration 98 m/s2 (whichever is the less severe) Total duration: 6 h Visual examination Method of mounting: see 1.1 of this specification Number of bumps: . Acceleration: . m/s2 Duration of pulse: . ms
48、Method of mounting: see 1.1 of this specification Acceleration: . m/s2 Duration of pulse: . ms Visual examination Capacitance Tangent of loss angle Insulation resistance No visible damage No visible damage k 5 % of the value measured in 4.6.1 Increase of tan : k 0.003 C k 1 4F Grade 1 k 0.002 C 1 4F
49、 Grade 1 k 0.005 C k 1 4F Grade 2 k 0.003 C 1 4F Grade 2 compared to values measured in 4.6.1 U 50 % of the values in 4.2.4.2 Sub-group C1 Combined sample of specimens of Sub-groups C1A and C1B D6272 4.10 Climatic sequence 4.10.2 Dry heatTemperature: upper category temperature Duration: 16 h %C C - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:01:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 3004001:1984 BSI 04-20007 Table IV Sub-clause number and