ECA-535ABAB-1987.pdf

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1、m v) m v l a ui DETAIL SPECIFICATION Fixed Tantalum Capacitors With Non-Solid Electrolyte And Porous Anode EIA-535ABAB MAY 1987 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT Copyright Electronic Components, Assemblies +,-lo%, +,-208 (see Table I I ) (see Table II) 55/125/21 +85 C Variatio

2、n of Capacitance With Temperature (see Table II) Tangent Of Loss Angle (see Table 11) Leakage Current (see Table 11) Impedance (see Table 11) Reverse Voltage O ( N o reversal of voltage permitted) Copyright Electronic Components, Assemblies hall be measured i t each s t e p Leakage current Capacitan

3、ce Tangent of loss angle ;tep 2: Lower (-55 C) category temperature Capacitance Tangent of loss angle Impedance Step 3: Rated temperature (+85 C) Leakage Capacitance Current G U r Tangent of loss angle Step 4: Upper category temperature (+i25 C) Leakage Capacitance Current ? U c Tangent of loss angl

4、e i-3 !.5% - For use as - reference value - Table 2 N o t applicable Table 2 Table 2 Table 2 Table 2 Table 2 Table 2 Table 2 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale,

5、 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAB 7 = 3234b00 0073995 9 EIA-535ABAB QC300202/USO002 Page 12 TABLE I V (continued) Clause number and T e s t (see Note 1) D or ND Conditions of test (see Note 1) Sample s i z e and c r i t e r i

6、 o n of accept- a b i l i t y (see N o t e 3) Performance requiriment c (see Note i) Sub-group C1A P a r t of sample of Sub-group C1 4.3.1 I n i t i a l measurement 4.3 Robustness of terminations 4.4 Resistance to soldering heat 4.4.2 Final measurements Capacitance T e s t U a Force = 10N Special Be

7、nd Visual Test (4.3.3) Examination Method: Solder Bath T e s t Tb, Method 1 A ( 1 0 +,-1s i m m e r - sion t i m e ) Visual Examin- a t i o n 6 1 e- N o t more than 1 defective for Subgroups CIA and Sub-group C1B Other p a r t of sample 4 . 6 . 1 I n i t i a l measurement 4.6 Rapid change of tempera

8、ture D Capacitance BA = Lower category temperature (-55 C ) BB = Upper category 6 18 1 N o v i s i b l e damage and no leakage of e l e c t r o l y t e No visible damage and no leakage of e l e c t r o l y t e Legible marking C13 combined- Copyright Electronic Components, Assemblies & Materials Asso

9、ciation Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAB 87 323i.1600 O073996 O O EI A- S 3 5ABAB QC300202/USO002 Page 13 TABLE I V (

10、Sub-group C1B - continued) 4.6.3 Final measurements 4.7 Vibration 4.7.2 Final measurements 4.9 Shock 4.9.2 Final measurements temperaturc (+125 C) 30 cycles Duration t = 30 minutes Leakage current Capacitance Tangent of l o s s angle Method of Mounting: see 1.1 of t h i s specification Procedure B4

11、Frequency Range 1 0 to 2000Hz Amplitude: 0.75 mm or acceler- a t i o n 209, whichever is less severe Total Duration: 6 h Visual Examination Method of Mounting: see 1.1 of t h i s spec i f i c a t i o n Acceleration: 981 m / s / s Duration of pulse: 6 m s Rated Voltage applied Visual examination p- ,

12、- 1.25 t i m e s T ble 2 :Cf-Ci) /Ci: +,o 10% of value measured i n 4.6.1 e- .,- 1.15 t i m e s Table 2 go visible damage and no leakage of e l e c t r o l y t e ! i o v i s i b l e damage and no leakage of e l e c t r o l y t e Copyright Electronic Components, Assemblies & Materials Association Pro

13、vided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- TABLE I V (continued) Sub-group C 1 Combined sample of specimens of Sub- groups C1A and C1B 4.10 C l

14、i m a t i c sequence 4.10.1 I n i t i a l measurement 4.10.2 Dry IIeat 4.10.3 Damp heat, c y c l i c , test D b , f i r s t cycle 4.10.4 Cold 4.10.5 Low air pressure Capacitance Temperature: Upper category temperature (+125 C) Duration: 16 h Visual examination Severity b: 55 C Temperature: Lower cat

15、egory temperature Duration: 2 h (-55 Cl Visual examinat ion A i r Fressure: 8 . 5 kPa Temperature: 15 t o 35 c Duration: 5 min. L a s t Minute of test: UR !7 1 JO v i s i b l e damage and no leakage of e l e c t r o l y t e !JO v i s i b l e damage and no leakage of e l e c t r o l y t e Copyright E

16、lectronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAB 87 m 3234600 0073998 4 m EI

17、A-535ABAB QC300202/US0002 Page 15 TABLE IV (Sub-group C1B - continued) 4.10.5.3 Intermediate measurement 4.10.6 Damp heat, c y c l i c , test Db, remaining cycles 4.10.7 Sealing 4.10.8 Final measurements Visual examination Severity b: 55 C 5 cycles NO voltage applied N o t applicable Visual examinat

18、ion Leakage current Capacitance Tangent o angle *3ss r J o breakdown, flash-over or harnful de- formation of the case !?o v i s i b l e damage and no leakage of e l e c t r o l y t e Legible marking Table 2 (Cf-Ci)/Ci: +,- 5% of value measured i n 4.10.1 and +,- 8% o value measured i n 4.3.1 o r 4.6

19、.1 as applicable Table 2 Sub-group C2 4.11 Damp heat, steady state 4.11.1 I n i t i a l measurement 4.11.2 Final measurements D Duration:Si days Capacitance 1 Visual examination I 3 3 1 N o v i s i b l e damage and no leakage of e l e c t r o l y t e Legible marking Table 2 Copyright Electronic Comp

20、onents, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAB 87 W 3234600 O073999 b EIA-5 3 5ABAB QC30

21、0202/USO002 Page 16 TABLE I V (Sub-group C2 - continued) Capacitance Tangent of loss angle insulation resistance of t h e external insulation Voltage proof of t h e external insula t i o n Sub-group C3 4.12 Endurance 4.12.1 I n i t i a l measurement 4.12.3 Final measurements Duration: 2000 h 1 2 u n

22、 i t s a t +125 C, U c 1 2 u n i t s a t +85 C, U r Recovery: 16 h Capacitance Visual examination Leakage current Capacitance Tangent of loss angle 24 m (Cf-Ci)/Ci: +,- 53 of value measured i n 4 . 1 1 . 1 1.15 times Table 2 ,= 100M ohms No breakdown or flashover 1 Xeference Va .ue ! i o v i s i b l

23、 e Legible marking damage Table 2 (Cf-Ci)/Ci: ,= 108 of value measured i n 4.12.1 Table 2 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduc

24、tion or networking permitted without license from IHS -,-,- Clause number and T e s t (see N o t e 1) ND Conditions of test (see Note 1) Sample s i z e and c r i t e r i o n of accept- a b i l i t y (see Note 3 ) - P I “ I Performance requirements (see Note 1) Sub-group C4A 4.13 Surge 4.13.1 I n i t

25、 i a l measurement 4.13.3 Final measurements EIA 535ABAB 87 W 3234b00 00740011 7 EIA-535ABAB QC300202/USO002 Page 17 Number of cycles: 1000 3 u n i t s a t 125 C 3 units at 85 C Protective resistor: 1000 ohms +,-lo% Duration of charge: 30 s Duration of dis- charge: 5 min 30 s Capacitance I Leakage c

26、urrent Tangent of loss angle I Visual examination - Not more than 1 defective for Subgroups 12 C4A 1 Xeference Value Table 2 (Cf-Ci)/Ci: ,= 108 of value measure5 i n 4 . 1 3 , l ,= 1.3 times Table 2 No v i s i b l e damage and no leakage of electrolyte and C4B combined- Copyright Electronic Componen

27、ts, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535ABAB 87 3234600 007400L 9 EIA-5 35ABAB QC300202/US

28、O002 Page 18 TABLE I V (continued) Clause number and T e s t (see Note 1) D o r ND Conditions of test (see Note 1) Camp1 e s i z e and c r i t e r i o n of accept- a b i l i t y (see N o t e 3 ) - PI4 c Performance requirement s (see Note 1) Sub-group C4B 4.14 Reverse voltage ( i f required) D N o t

29、 applicable 12 6 1 Sub-group C5 4.15 Characteristics at high and low tempera t u r e discharge ( i f required ) 4.16 Charge and l6 I N o t applicable T e s t made i n Group B2 N o t applicable 15 1 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:48:24 MDTNo reproduction or networking permitted without license from IHS -,-,-

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