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1、 EIA STANDARD TP-55A CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CONTACTS, CONNECTORS AND SOCKETS (Revision of EIA-364-55) EIA-364-55A MAY 2008 ANSI/EIA-364-55A-2008 Approved: May 19, 2008 EIA-364-55A EIA Standards Electronic Components Association Copyright Electronic Components, Assemblies & Mat
2、erials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through el
3、iminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not
4、in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used
5、 either domestically or internationally. Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopt
6、ing the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Stan
7、dard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its u
8、se. (From Standards Proposal No. 5089-A formulated under the cognizance of the CE-2.0 National Connector Standards Committee). Published by: ELECTRONIC COMPONENTS ASSOCIATION 2008 EIA Standards and Technology Department 2500 Wilson Boulevard Suite 310 Arlington, VA 22201 PRICE: Please call: Global E
9、ngineering Documents, USA and Canada (1-800-854-7179) http:/ All rights reserved Printed in U.S.A. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networ
10、king permitted without license from IHS -,-,- Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- PLEASE!
11、 DONT VIOLATE THE LAW! This document is copyrighted by the EIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: Global Engineering Documents 15 Inverness Way
12、East Englewood, CO 80112-5704 or call USA and Canada (1-800-854-7179), International (303-397-7956) Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or netwo
13、rking permitted without license from IHS -,-,- Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- CONTEN
14、TS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources . 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 3.2 Preparation 1 4 Test procedure . 3 5 Details to be specified . 5 6 Test documentation . 6 Table 1 Measurement intervals 4 2 Test current conditions 4 3 Cycle conditions . 5
15、i Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- (This page left blank) ii Copyright Electronic Comp
16、onents, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-364-55A Page 1 TEST PROCEDURE No. 55A CURRENT CYCLING TEST PROCEDURE FOR E
17、LECTRICAL CONTACTS, CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 5089, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-RS-364-55.) 1 Introduction 1.1 Scope This standard establishes test methods to determine the current
18、 cycling characteristics of mated electrical contacts, connectors and sockets using, but not limited to, crimp, press-fit contacts, insulation displacement contact (IDC) terminations, soldered or mechanically attached termination techniques. 2 Test resources 2.1 Equipment 2.1.1 Ammeter accurate to 1
19、% full scale or equivalent. 2.1.2 Power supply (ac or dc) capable of delivering the required test current. 2.1.3 Timer capable of controlling test cycle periods with 1 minute. 3 Test specimen 3.1 Description A test specimen shall consist of, but not be limited to, a mating pair of contacts such as a
20、 pin and a socket, mating hermaphroditic contacts, or a printed circuit board (PCB) pad, applicable devices and its mating contacts. Unless otherwise specified in the referencing document, contacts shall be tested assembled to their connector housing. Copyright Electronic Components, Assemblies & Ma
21、terials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-364-55A Page 2 3.2 Preparation 3.2.1 Unassembled and unmounted contacts When specified in the ref
22、erencing document, loose piece contacts or mated contact pairs with separable contact interfaces shall be mounted in a manner that avoids any physical disturbance during the current cycling or measurement routine. Support fixtures, if required, shall be arranged to avoid heat sinking the specimens.
23、Mating orientation and depth, if applicable, shall be within the design limits. 3.2.2 Assembled connectors Assembled connectors or sockets shall be tested mounted to printed circuit boards or other support systems as applicable. Mounting shall be achieved by the normal features provided by their des
24、ign. Unless otherwise specified in the referencing document, all contacts within the connector configuration that are designated for power, shall be tested by creating a series circuit. 3.2.3 Crimp and IDC terminated contacts Crimp and IDC terminations shall be terminated to their applicable conduct
25、ors for which they are designed by using appropriate tooling (crimp tools, cable assembly tools, etc.). If applicable, the contacts to be tested shall be crimped per applicable specifications on each end of appropriate test conductors. This enables the wiring of the test assembly into a series circu
26、it without additional soldering or splicing. 3.2.4 Contacts with solder terminations Unless otherwise specified in the referencing document, contacts or connectors with solder terminations shall be prepared by use of one of the following methods: 3.2.4.1 Printed circuit board applications Connectors
27、 or contacts shall be terminated to printed circuit boards. Traces on the boards shall interconnect appropriate contacts that in a mated state create a series circuit. 3.2.4.2 Discrete wire applications A jumper system shall be used to interconnect applicable contacts creating a series circuit. 3.2.
28、5 Press-fit contacts Unless otherwise specified in the referencing document, contacts or connectors with press fit contacts terminations shall be tested on a printed circuit board with interconnecting traces (see 3.2.4.1). Unless otherwise specified in the referencing document, no soldering on the t
29、ermination, test board trace, or plated thru holes shall be allowed. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license
30、 from IHS -,-,- EIA-364-55A Page 3 3.2.6 Terminations Unless otherwise specified in the referencing document, contacts or connectors mechanically attached shall be terminated in accordance with the test sponsors instructions. 3.2.7 Spacing 3.2.7.1 Unless otherwise specified in the referencing docume
31、nt, when multiple specimens are being tested, the interconnecting jumper, if used, shall not exceed a 30 C temperature rise or be greater than the test specimen temperature rise when measured at the midpoint of the jumper interconnecting the specimens. 3.2.7.2 Spacing between all specimens shall not
32、 allow mutual heating from one specimen to the other. This shall be the minimum spacing. Maximum spacing shall be at the option of the testing agency. 3.2.8 Thermocouple and/or voltage drop connections When specified, placement of the connections shall be in accordance with the referencing document
33、or by agreement between qualifying agency and laboratory including any special instructions. 3.2.9 Cleaning Unless otherwise specified in the referencing document, contacts tested with lubricants shall not be cleaned. Localized cleaning may be performed if the cleaning does not contact the lubricate
34、d areas. Cleaning unlubricated samples shall be allowed either locally or in total. 4 Test procedure 4.1 Voltage drop or resistance When specified in the referencing document, voltage drop or contact resistance measurements shall be performed in accordance with EIA-364-06. The voltage probes shall b
35、e placed as specified in the referencing document. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- EI
36、A-364-55A Page 4 4.2 Temperature rise and/or resistance measurements Measurement intervals shall be selected from one of the interval conditions indicated in table 1, unless otherwise specified in the referencing document. Table 1 Measurement intervals Interval condition Interval Number of measureme
37、nts per day 1 Every 12 hours 2 hours 2 2 7 hours 1 hour 2 3 (See 4.2.2) As specified in the referencing document 4.2.1 Measurements may be performed with automatic measuring systems or manually at the discretion of the testing agency. 4.2.2 Interval condition 3 shall be at the option of the qualifyi
38、ng agency. 4.3 The wired specimens shall be mounted in a manner to allow free air circulation around each specimen, and to minimize conduction of heat from specimens and surrounding equipment. The distance between each specimen shall be constant. The test area shall be free of drafts or varying temp
39、erature gradients that could affect the temperature of the specimens. 4.4 The wired specimen(s) shall be connected to a power supply capable of supplying the test current specified. Where series interconnections are not practical, individual power sources shall be used. 4.5 Determine the test curren
40、t for the current cycling test from table 2, or as specified in the referencing document. Table 2 - Test current conditions Test condition Test current, % rated current A 100 B 125 C 150 D 200 E (See note) NOTE The test current for test condition E shall be 20%, 30%, etc of the rated current as spec
41、ified in the referencing document. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-364-55A Page 5
42、 4.6 Energize and subject the test specimens to a current cycling test of 500 cycles, unless otherwise specified in the referencing document. Each cycle shall consist of one of the test cycle conditions specified in table 3, unless otherwise specified in the referencing document. Table 3 Cycle condi
43、tions Cycle time, minutes Test method On Off 1 5 5 2 15 15 3 30 15 4 45 15 5 (See 4.7) (See 4.7) 4.7 Unless otherwise specified in the referencing document, cycle condition 5 (power on / power off) shall be established when thermal stabilization is established plus 10 minutes minimum after achieving
44、 stabilization at the power on and power off steps. 4.8 Unless otherwise specified in the referencing document, the number of cycles shall be performed in a continuous manner. Power disruption that may interrupt the test shall be noted and recorded in the test report. 5 Details to be specified The f
45、ollowing details shall be specified in the referencing document: 5.1 Test specimen preparation, if special preparation is required 5.2 Number of specimens to be tested 5.3 Preconditioning or special environments 5.4 Initial or intervals and final measurements 5.5 Test current condition and actual te
46、st current value, see table 2 5.6 Cycle conditions 5.7 Number of cycles 5.8 Designation if contact is to be tested in or out of the connector housing 5.9 Length of conductor between contacts, if other than specified 5.10 Voltage probe placement when voltage drop is specified 5.11 Thermocouple placem
47、ent when temperature measurements are specified. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=Boeing Co/5910770001 Not for Resale, 07/25/2008 03:17:09 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-
48、364-55A Page 6 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description and wiring configuration 6.3 Test equipment used, and date of last and next calibration 6.4 Values and observations 6.5 Name of operat