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1、ANSU EIA- 580AA00-1991 APPFIOMD: Novirlnr i, 1981 O O U U O CD v) I w 0 IA S P ECI FI CATI ON Blank Detail Specification for Fixed Metallized Polyethylene- Terephthalate Film Dielectric Chip Capacitors for Direct Current - Encapsulated EIA-580AA00 DECEMBER 1991 ELECTRONIC IN DUSTRIES ASSOCIATION ENG
2、INEERING DEPARTMENT Aooroved kor Use In I . The NECQ Svstem Copyright Electronic Components, Assemblies , Ct D 3 12 1 4.6 Resistance to soldering heat 4.6.1 Initial measurements 4.6.2 Test conditions 4.6.3 Final measurements Capacitance Method: 1 Visual examination conditions, see 4.2.1 No signs of
3、damage such as cracks. Capacitance - A c 13% of C value measured in 4.6.1 Subaroup C2 D 3 12 1 4.5 Bond Strength Capacitance (with A c 510% of of the end board in bent position) C value face plating measured in 4.3.2 Visual examination No visible damage. Subaroux, C3 D 4.1 Mounting 66 (See Note 4 )
4、4.2.1 Visual examination 4.3.2 Capacitance 4.3.3 Tangent of loss angle At 1 kHz and 10 kHz for all capacitance values. 4.3.4 insulation resistance No visible damage. A c 12% of C value measured in Subgroup A2. As in 4 . 3 . 3 ( R e f e r e n c e values for final measurements in Subgroups C3.1, C3.3
5、and C3.4). See 1.3 of t Detail Specification. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 02:55:42 MDTNo reproduction or networking permitted without license
6、 from IHS -,-,- E I A 5 8 O A A O O 91 M 3234600 O 0 7 8 9 2 4 O EIA-580AA00 Page 9 SubarouD C3.1 D 4.4 Adhesion Subclause number D or Conditions AQL Performance IL requirements (See Note 1) (See Note 1) (See Note 2 ) (See Note 1) % and test ND of test 6 27 1 After mounting (see 4.1) force of 5 N ap
7、plied for 10 f 1 s . 4.4.3 Intermediate inspection 4.8 Rapid change of temperature 4.8.1 Initial measurements 4.8.2 Test conditions 0 4.8.3 Intermediate inspection 4.9 Climatic sequence 4.9.1 Initial measurements 4.9.2 Dry heat 4.9.3 Damp heat, cyclic, first cycle 4.9.4 Cold 4.9.5 Damp heat, cyclic,
8、 remaining cycles 4.9.6 Final measurements Visual examination Not required, see subgroup C3. 5 cycles TA = 1.c.t. T, = u.c.t. Exposure time: 30 min. visual examination Not required, see Subgroup C3. Upper category temp. Duration: 16 H Lower category temp. Duration: 2 H Within 15 min. after removal f
9、rom test chamber U, to be applied for 1 min. Visual examination No visible damage. No visible damage. No visible damage. Legible marking. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie No
10、t for Resale, 03/30/2007 02:55:42 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-580AA00 Page 10 E I A 5 8 O A A O O 91 W 3234600 0078925 2 i Subclause number D or Conditions IL AQL Performance and test ND of test % requirements (See Note 1) (See Note 1) (See Note 2 )
11、(See Note 1) Subaroup C3.1 continued Capacitance Tangent of loss angle at 10 kHz Insulation A c 15% - C compared to values measured in subgroup C3 Increase of tan - 10 .O05 compared to values measured in Subgroup C3 resistance 250% of limits in 4.3.4 Subarour, C3.2 D 6 15 1 4.10 Damp heat, 4.10.1 In
12、itial steady state measurements 4.10.2 Final measurements Not required, see Subgroup C3 Visual examination No visible damage. Capacitance Tangent of loss angle at 10 kHz insulation resistance - A c 15% C compared to values measured in Subgroup c3 Increase of tan - ,0.005 compared to values measured
13、in Subgroup C3 150% of 1.3 limit in this Detail Specification Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 02:55:42 MDTNo reproduction or networking permitted
14、 without license from IHS -,-,- EIA 580AA00 91 = 3234600 0078926 4 I EIA-58AA00 Page 11 0 Subclause number D or Conditions IL AQL Performance requirements (See Note 1) (See Note 1) (See Note 2) (See Note 1) % and test ND of test 15 1 D 3 Cubarom C3.3 4.11 Endurance 4.11.1 Initial measurements 4.11.2
15、 Test conditions 4.11.5 Final measurements Not required, see Subgroup C3. See 4.11.2 (2000 hrs 85 1.25 U , , 4.11.3 and 4.11.4 Visual examination capacitance Tangent of loss angle at 10 kHz for C I 1.0 uF Insulation resistance No visible damage. Legible marking. A C I 5 % C compared to values measur
16、ed in Subgroup C3. - Increase of tan - 50.003 C I 1 uF 1 50% of 1.3 limit in this Detail Specification. SubcrrouD C3.4 D 6 91 4.12 Charge and Discharge 4.12.1 Initial Not required, see measurements Subgroup C3 4.12.2 Test conditions 10,000 cycles 4.12.3 Final Capacitance measurements Tangent of loss
17、 angle at 10 kHz C , I 1 uF Insulation resistance A C I 3 % - C compared to values measured in Subgroup C3. Increase of tan uF compared to values measured in subgroup C3. - 5 0.003 C I 1 250% of limit in 1.3 of this Detail Spec Copyright Electronic Components, Assemblies & Materials Association Prov
18、ided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 02:55:42 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 580AA00 91 3234600 0078727 b = EIA STANDARD AND SPECIFICATION NUMBERING STAN DARD A document tha
19、t establishes engineering and technical requirements for processes, procedures, practices and methods that have been decreed by authority or adopted by consensus. Standards may also be established for selection, application and design criteria for material. Standards and other documents not in the s
20、pecification format use only the EIA basic numbering system as follows: IA-1 23 Original Standard EIA-123-1 Addendum to Original Standard EIA-123-A First Revision of original Standard incorpcrating all Addenda SPECIFICATION A document prepared specifically to facilitate procurement which clearly and
21、 accurately describes the essential technical requirements for purchased material. Procedures necessary to determine that the requirements for the purchased material covered by the specification have been met shall also be referenced or included. EIA Specifications use the following system: E j A 1
22、3 Standard Prefix for all Numbers Standard or Generic Specification Sectional Specification Designator Blank Detail Specification Designator Detail Specification Designator A - EIA 123 EIA 123A EIA 123AA EIA 1 2 3 W EIA 123OOAA is a Generic Specification is a Sectional Specification is a Blank Detai
23、l Specification is a Detail Specification is a Detail Specification for which no Sectional or Blank Detail Specification was issued. NOTES: 1. Some older specifications may not have been converted to this numbering system. 2. See EP-11 “Guide for the Preparation of Specification Using IECQ-System Format, for more detail. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 02:55:42 MDTNo reproduction or networking permitted without license from IHS -,-,-