ECA-EIA-364-22B-2000.pdf

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1、EIA364.22 ADOPTION NOTICE EIA364.22, “Simulated Life Test Procedure for Electrical ConnectorsIl, was adopted on 29-JUN-O1 for use by the Department of Defense (DoD). Proposed changes by DoD activities must be submitted to the DoD Adopting Activity: Defense Supply Center Columbus, P.O. Box 3990, Attn

2、: DSCC-VAI, Columbus, OH 43216-5000. Copies of this document may be purchased from the Electronic Industries Alliance, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201. http:/www.eia.org EIA364.22 should be used instead of MIL-STD-1344, method 1015. Custodians: Army - CR Navy - AS

3、Air Force - 11 DLA - CC Adopting Activity: DLA - CC (Project 5935-4312-003) Reviewer Activities: Army - AV, MI FSC 5935 DISTRIBUTION STATEMENT A: Approved for public release; distribution is unlimited. Copyright Electronic Components, Assemblies maintain for 11 hours. 4.1.1.2 Raise chamber condition

4、 to 39 “C f 3 “C (100 “F f 5 OF), 80% f 5% relative humidity to be accomplished over 1 hour period; maintain conditions for 11 hours. 4.1.1.3 Return to initial specimen condition (room temperature), with drop accomplished over a 1 hour period. 4.1.2 Group II, see table 1 4.1.2.1 Initial chamber cond

5、itions to the specified limit of T, f 3 “C ( f 5 O F ) with uncontrolled humidity; maintain for 10 hours. 4.1.2.2 Drop chamber conditions to the same applicable limit of T, f 3 “C ( f 5 OF), with uncontrolled humidity; drop to be accomplished over a 2-hour period; maintain condition for 1 O hours. 4

6、.1.2.3 Return to initial specimen condition (room temperature with rise accomplished over a 2 hour period. 4.1.3 After each group completed one cycle as described above, the specimens are unmated, remated, and switched so that group I1 goes through the group I cycle and group I goes through group II

7、 cycle. This provides a 48-hour cycle fore each group. The transfer of specimens shall be accomplished within the first hour of the first phase of each cycle. Provisions shall be made to remove power from the connectors while they are unmated and remated. Copyright Electronic Components, Assemblies

8、maintain for 1 1 hours. 4.2.1.2 Within 1 hour change chamber conditions to 38 “C f 3 “C (100 “F f 5 O F ) , 80% f 5% relative humidity; maintain for 11 hours. 4.2.1.3 Withm 1 hour, return to initial conditions. 4.2.2 Group11 4.2.2.1 Initial chamber conditions 74 “C f 3 “C (165 “F f 5 OF), humidity u

9、ncontrolled. 4.2.2.2 With 2 hours, change to -55 “C f 3 “C (-67 “F f 5 OF), humidity uncontrolled; maintain for 10 hours. 4.2.3 G-roupIII 4.2.3.1 Mount specimens, for vibration, in plane specified. 4.2.3.2 Vibrate as specified in continuous cycles for a duration of 24 hours. 4.2.4 After each group o

10、f specimens has completed the 24-hour phase, they shall be rotated and tested to the next higher phase (group I goes to group II, group II goes to group III, group III goes to group I). This is continued until each group of specimens has been through each group of tests for a total of a 72-hour cycl

11、e. Each connector shall be unmated and remated during the transfer from group to group. Provisions shall be made to remove power from the connectors while they are unmated and remated. 4.3 Test condition C, aircraft The test specimens shall be placed in a sealed chamber of such size that can readily

12、 be attached to a vibrator table. The wiring of the connectors, see 3.2.2, between the load and the connector, and between the source and the connector shall be such as to maintain the sealed condition of the chamber. The chamber conditions shall provide the following cycle: 4.3.1 Reduce chamber pre

13、ssure to 4.39 x lo3 Pa f 0.68 x lo3 Pa (1.3 inches of mercury f 0.2 inch of mercury). Maintain for 8 hours. Copyright Electronic Components, Assemblies maintain for 10 hours. 4.4.2 Within 1 hour change chamber conditions to 49 “C f 3 “C (120 “F f 5 OF), 80% f 5% relative humidity; maintain for the r

14、emainder of a 1 O hour period. 4.4.3 Immediately upon completion of 4.4.2 remove specimens and submerge immediately in synthetic ocean water, (see ASTM D 1141-52) at room temperature. (Specimens shall be removed as soon as entire connector has passed beneath the surface). 4.4.4 Within 1/2 hour from

15、completion of 4.4.2, place specimens in a chamber -55 “C f 3 “C (-67 “F * 5 OF), maintain for 2 hours. 4.4.5 The test specimens shall carry the load specified in 3.2.5 through 4.4.1, 4.4.2 and 4.4.4 of this cycle. At the end of the cycle, connectors shall be allowed to warm to room temperature and s

16、hall be unmated and remated. This provides a 23 hour cycle. Provisions shall be made to remove power from connectors while they are unmated and remated. 4.5 Test condition E, underwater The test specimens initially at room temperature shall be divided into two groups and subjected to the following c

17、ycles: 4.5.1 Group1 4.5.1.1 Initial chamber conditions 21 “C f 3 “C (70 “F f 5 OF), 50% 4 5% relative humidity; maintain for 10 hours. 4.5.1.2 Within 1 hour change chamber conditions to 49 “C f 3 “C (120 “F f 5 OF), 80% f 5% relative humidity; maintain for the remainder of a 1 O hour period. 4.5.1.3

18、 With 1/2 hour place specimens in a chamber at -55 “C f 3 “C (-67F f 5 OF), maintain for the remainder of a 4 hour period. Copyright Electronic Components, Assemblies see table 2; maintain for 23 hours. 4.5.2.2 Remove specimens fi-om pressure vessel and allow 1 hour for air drying. 4.5.3 After each

19、group has completed one cycle as described above, the group II specimens are unmated, remated and switched so group I specimens go through group II test and group I i specimens go through group I tests to provide a 48 hour cycle. The transfer of specimens shall be accomplished within the first hour

20、of the first phase of each group. Provisions shall be provided to remove power from connectors while they are unmated and remated. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Number of specimens to be tested 5.2 Conductor size, if not matched t

21、o the contact size; see 3.2.3 5.3 Wire type and configuration; see 3.2.3 5.4 Operating voltage and rated current; see 3.2.5 5.5 Number of unit cycles required; see 3.1 6 5.6 Related test condition to be tested to; see 4.1,4.2,4.3,4.4 and 4.5 5.7 Temperature limits, where applicable; see table 1 and

22、4.1.2 5.8 Pressure limits; where applicable; see table 2 and 4.5 2.1 5.9 Vibration mounting and test condition, where applicable: see 4.2.3 and 4.3.3 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Win

23、g, Bernie Not for Resale, 03/30/2007 19:54:26 MDTNo reproduction or networking permitted without license from IHS -,-,- 3234b00 Ob44215 4T2 e ELA-364-22B Page 7 6 Documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.

24、2 Specimen description, including fixturing if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and date of test Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under lice

25、nse with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 19:54:26 MDTNo reproduction or networking permitted without license from IHS -,-,- . Signature: m 323410 O W Z L 339 m EIA Document Improvement Proposal Date: If in the review or use of this document, a pote

26、ntial change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Industries Alliance Engineering Department - Publications Office 2500 Wilson Blvd. Arlington, VA 22201 FAX: (703) 907-7501 Document No. Submitters Nam

27、e: Document Title: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: 0 At next revision: 0 Problem Area: a. Clause Number and/or Drawing: b. Recommended Changes: c. ReasotRationale for Recommendation: Additional Remarks: FOR EIA USE ONLY Responsible Committee: Chairman: Date com

28、ments forwarded to Committee Chairman: Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 19:54:26 MDTNo reproduction or networking permitted without license from IHS -,-,-

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