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1、, O O O O O o ANWEIA-700C000-1996 Approved: December 16, 1996 EIA S P EC I FI CATI ON Sectional Specification for Circular Multicontact Connectors of Assessed Quality (for frequencies essentially below 3 MHz) EIA-700C000 JANUARY 1997 ELECTRON IC INDUSTRI ES ASSOCIATION ENGINEERING DEPARTMENT Copyrig
2、ht Electronic Components, Assemblies the tolerances stated shall include wear. 6 - Characteristics 6.1 - Climatic category The appropriate climatic categories, which determines performance level (PL), shall be selected from the preferred categories listed in 2.4 of this Sectional Specification. 6.2
3、-Electrical The following information shall be included: a) creepage and clearance distances, b) c) d) e) proof voltage under specified conditions, current-canying capacity under specified conditions, initial contact resistance under specified conditions, initial insulation resistance under specifie
4、d conditions, 7 - Test schedule The basic rules laid down in 4.4 of this sectional specification shall be followed. Where a detailed specification covers a group of relate connectors, the t e s t s and requirements for all of these connectors should be presented in one common set of _ _ tables relat
5、ed to the test schedule if possible. 8 - Qualification approval testing The details may be presented in a separate table as in table la and table lb of the on 5.1.2, or they may be included in the test schedules of section 3, Testing, of this sectional specification. 9 - Quality conformance inspecti
6、on Details of quality conformance inspection shall be in accordance with 5.2 andor 5.3 of this sectionai specification. Details are presented in tables 3% lot-by-lot tests and 3b, periodic tests. 15 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license wit
7、h ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:05:45 MDTNo reproduction or networking permitted without license from IHS -,-,- TABLE 3A LOT BY LOT INSPECTION TESTS (QUALITY CONFORMANCE) Visual examination Mating force Low-level contact Contact resistance (1)
8、 Unmating force Dielectric withstanding voltage resistance (1) (when specified) CONTACTS ONLY Visual Contact insertion and removal 18 13 23 06 18 20 18 05 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, Use
9、r=Wing, Bernie Not for Resale, 03/29/2007 23:05:45 MDTNo reproduction or networking permitted without license from IHS -,-,- - 700C000-ENGL 1777 3234b00 0580212 878 = EM-700C000 TABLE 3B - ZERO DEFECT SAMPLING PLAN 1-8 9 - 15 16 - 25 26 - 50 51 - 90 91 - 150 151 - 280 281 - 500 501 - 1200 1201 - 320
10、0 3201 - 10,000 10,001 - 35,000 Au 13 13 13 13 13 20 29 34 42 50 60 Note - Marking shaii not be included in the failure count providec error in marking can be corrected or unit can be remarked in the case of incorrect, aegible, or smudged marking. 17 Copyright Electronic Components, Assemblies & Mat
11、erials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:05:45 MDTNo reproduction or networking permitted without license from IHS -,-,- -700COOO-ENGL 1997 m 323Lib00 0580233 70Li m Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/29/2007 23:05:45 MDTNo reproduction or networking permitted without license from IHS -,-,-