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1、T I: 1 E I A 535BAAA 87 m 3234600 0074138 3 m a a 2 ln ci) l n I a iTi I MAY 1987 DETAIL SPEC I F CAT I ON Fixed Tantalum Chip Capacitor Style 1 Protected-Standard Capacitance Range EIA-535BAAA ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT Copyright Electronic Components, Assemblies *01 *
2、 C r * U r UA or 0 5 UA whichever is greater. Example: 1 uF 35 WVDC 25 C DCL = .O1 x 1.0 x 35 = 0.35 UA Since 0;35 is less than 0.5 uF the l i m i t is 0.25 UA f o r t h i s rating. b) When measured at +85 C a t rated voltage ( U r ) the DC Leakage shall not exceed 10 times the l i m i t a t 20 C. c
3、 ) When measured a t +125 C a t upper category voltage ( U c ) the DC Leakage shall not exceed 12.5 t i m e s the l i m i t a t 20 C. Copyright Electronic Components, Assemblies TABLE III Copyright Electronic Components, Assemblies O INSPECTION REQUIREMENTS: 2 . 1 PROCEDURES : 2.1.1 For Qualificatio
4、n Approval the procedures shall be in accordance with the Sectional Specification, IEC Publication 384-3 (QC300800), Sub-clause 3.4. 2 . 1 . 2 For Quality Conformance Inspection the test schedule (Table IV) includes sampling, periodicity, severities and requirements.# by Subclause 3.5.1 of the Secti
5、onal Specification. The formation of inspection lots is covered TABLE I V Notes 1 - Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication 384-13 (QC300800) and Section One of this specification: 2 - Inspection levels and AQLs are selected from
6、 IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. Copyright Electronic Components, Assemblies 4 Visual Examination 4Y4 Dimensions Sub-Group A2 4.5.1 Leakage Current 4 . 5 2 Capacitance 425.3 Tangent of Loss Angle GROUP B INSPECTION Sub-Group B1 4.7 Solderability 4.71.
7、2 Final D Conditions Or of T e s t I L AQL ND (See Note 1) (See Note 2) - (Lot-by-Lot) ND S-4 2 : 5 % ND II 1;0% Protective Resistance: 1000 Ohms Frequency: 120 Hz Frequency: 120 Hz ( Lot-by-Lot ) D Method 1 s-3 2.5% Visual Measurements Examination Performance Requirements (See Note 1) A s i n 4.4.2
8、 Legible Mark- ing and as Specified i n 1.5 of t h i s Specification As Specified i n Table I of this Spec. 1.3 herein Within Speci- fied Tolerance Table I I B As i n 4.7 Good Tinning as Evidenced by Free Flow- ing of the Solder w i t h Wetting of the Terminations Copyright Electronic Components, As
9、semblies 5 Damp H e a t , Cyclic, T e s t Db, Remaining Cycles 4.11.6 Final Measurements Sub-Group C 3 2 4.12 Damp Heat Steady State 4212.1 I n i t i a l Measurement 4-12.2 Final Measurement D Recovery: 1 t o 2 h Visual Examination Leakage Current Capacitance Tangent of Loss Angle Recovery : 1 t o 2
10、 h Capacitance Visual Examination Leakage Current Capacitance Tangent of Loss Angle 6 91 N o Visible Damage Legible Mark- ing 1 : 3 herein Change = 10% of Value Measured i n 4 :11.1 = 1:2 t i m e s i n i t i a l l i m i t N o Visible Damage Legible Marking 123 herein Change = 10% of Value Measured i
11、 n 4.012.1 = 1.2 t i m e s i n i t i a l l i m i t Copyright Electronic Components, Assemblies .15ii1 I n i t i a l Mea sureme n t 4 A S . 2 Final Measurement D 3 Duration: 2000 h Ambient Temp, 85 C - Applied Voltage: U r Recovery : 1 t o 2 h Capacitance Visual Examination Leakage Current Capacitanc
12、e Tangent of L o s s Angle Sub-Group C3.14 D 6 4.13 Characteristics The capacitors a t High and LOW Temperature ed a t each s h a l l be Measur- Temperature Step Step 1: 20 C - Leakage Current I I I Capacitance Tangent of L o s s Angle - 41 15 1 N o V i s i b l e Damage Legible Marking = 2 t i m e s
13、 i n i t i a l l i m i t Change = 10% of Value Measured i n 4:15.1 = 1.25 times i n i t i a l l i m i t For U s e As Reference Value Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for
14、 Resale, 03/30/2007 00:23:28 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535BAAA 87 m 3234600 0074354 i m D Conditions Clause Number and or of T e s t T e s t (See Note 1) ND (See Note i) Step 2: a t -55 Capacitance EEA-535BAAA QC300801/USO001 Page 13 Sample Size
15、Q Criterion Acceptability Requirements (See Note 3) (See Note 1) of Performance nn c Tangent of Loss Angle Step 3: 20 C Leakage Current Capacitance Tangent of Loss Angle Ste? 4: 85 C Leakage Current Capacitance Tangent of Loss Angle Step 5: 125 C Leakage Current Capacitance Tangent of Loss Angle Tab
16、le I I B 1.3 herein Change = +,-5% of Value Measured i n Step 1 Table I I B 1.3 herein Table I I B Table I I B 1.3 herein Table I I B Table I I B Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, B
17、ernie Not for Resale, 03/30/2007 00:23:28 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A 535BAAA 87 3234600 0074355 3 = EI A-5 3 5 B M QC3008Ol-USOOO1 Page 14 Clause Number and T e s t (See Note 1) Sub-Group C3.5A 4.15.1 I n i t i a l 4-14 Surge Measurement 4.15.2 Fi
18、nal Mea sur ement Sub-Grow C3 .35B 4.16 Reverse Voltage Sample Size & Criterion D Conditions of or of T e s t Acceptability IJD (See Note 1) (See Note 3) pn c - Step 6: 20 C Leakage Current Capacitance Tangent of Loss Angle - 12 6 1 D Capacitance Number of Cycles: 1000 Temp: 85 C V o l tage : Table
19、III Protect ive Resistor: 33 ohms + , 5 % Duration of Change: 30 s Duration of Discharge: 5 min 30 s Leakage Current Capacitance Tangent of Loss Angle N o t Applicable a Performance Requirements (See Note i) As i n Step 3 1.3 herein Change = 10% of Value Measured i n Step 6 of 4.13 Table I I B Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:23:28 MDTNo reproduction or networking permitted without license from IHS -,-,-