GEIA-RB9-1971.pdf

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1、RELIABILITY BULLETIN No. 9 * Failure Mode and Effect Analyses NOVEMBER 1971 Prepared by the Ge41 Cmnmftteu on Reliabilitv Engrteerng Department ELECTRONIC INDUSTRIES ASSOCIATION 2001 Eye Street, N.W., Washington, D.C. 20006 Copyright Government Electronics ie basis for grouping the various part falu

2、re modes. e 3 Comparison of Techniques Neither approach stands out as the singular or most appropri- ate technique that should always be the one t h a t is used. Each has certain advantages o r strong points which, i n con- Junction with the purpose o r objective of a particular analysis effort, est

3、ablish the basis for selecting on6 i n preference O 5 - Copyright Government Electronics ;on e f fe ctiveness . The qualitative This is most apropos when an effort-is being put forth Also chen the On the other hand when the analysis Copyright Government Electronics t h i s w i l l influence the leve

4、l(s) of assembly t o be analyzed by FMEA. b. Other analyses t o be performed, i . e , , r e l i a b i l i t y prediction, safety analysis, thermal analysis, maintainability analysis; it is important that F M E A studles interface effectively with these. A s a project evolves and information becomes

5、available, these analyses ought t o tend towards a single Integrated effort. 8 Copyright Government Electronics ion V Procedural Elements A specific FMEA form has not been recommended as n o one form is applicable t o all programs. can be developed using the thirteen elements, defined i n this secti

6、on. 1, Hardware Identification The first step i n conducting the analysis and documenting the result is t o clearly identify the hardware being discussed. Included i n the hardware identification are items such as name, drawing number, manufacturer, and identure level (i .e. system, subsystem, equip

7、ment, part, material). Hardware identification is of paramount importance i n the Part or Bottom-Up Technique where a Piece-Part FMEA is being conducted. This level of analysis is usually performed: A form for a specific program a. A t the final stage of design on all hardware when contractually req

8、uired. b. On hardware deemed c r i t i c a l t o system performance or safety. c. On hardware involving new application of design principles where the state-of-the-art is being extended, This form of analysis is mo.re costly and t i m e consuming from both an analytical and a documentation viewpoint

9、 than the Top- Down Technique. More levels of effect must normally be con- sidered before reaching the htghest or mission level, It does however insure that no c r i t i c a l single failure modes are overlooked A block diagram is useful. i n describing hardware interrelations, facilitating the anal

10、ysis and reducing the documentation re- quired. system o r equipment; In a diagram of an equipmen: each block may represent a component and i n the component block diagram each block would typically represent a piece part. The diagram should make clear the relationship of .each block t o the others;

11、 inputs and outputs should be labeled as t o nature and magnitude. If convenient, each block can be labeled and designated by an item number for use i n completing a Failure Mode and Effect Analysis form. Examples of Block Diagrams are shown i n Figure 3. In a diagram of a system each block represen

12、ts a sub- 0 li Copyright Government Electronics (amount by which rate in column 8 exceeds that in column 9 ) . Calculate quotient of itemts estimated failure rate improvement (column 10) and estimated change cost (column 7) t o obtain a cost measure of estimated item reliability improvement . Calcul

13、ate estimated improvement in failure rate for subsystem that incorporates thfs item. (This calculation will ordinarily require prior synthesis of a subsystem reliability mathematical model that quantitatively relates Subsystem reliability improvement to that of the item, the latter as estimated in c

14、olumn 10.) Calculate quotient of subsystems estimated failure rate improvement (column 12) and estimated change cost (column 7) t o obtaln a cost measure of estimated subsystem reliability improvement. measure would be to compare column 7, Total net savings in operating and maintenance costs over-th

15、e planned operational life span of the equipment to ascertain net savfngs (or net increase in costs) over the operational life span. 9 . Failure Detection Frequently, consideration of provisions for detection of specific failure modes is involved in the conduct of %“EA, including reaction time requi

16、red to institute corrective action, 20 Copyright Government Electronics fault trees and logic diagrams are described below. The inclusion of relation- ships such as these should not be overlooked. Frequently a conservative approximation of them in a fault tree plzovides an acceptable solution, a. Co

17、nditional dependency between events. The probability of one event occurring changes if another event takes place, Copyright Government Electronics imes .the most signfficant contribution made by a FNEA is gn inereaaed awareness of the interaction between factors, associated with both faults and norm

18、al operation, rathep than the calculated probabilities as such. A s a developmental effort evolves, it is suggested that a chart of recommended improvements and associated corrective actions (C/A) be maintained. One possible format is shown in Figure 6. The left side would be statements and recommen

19、dations by the organization carrying out the FMEA to the responsible design areas. The right side would be the response of the design groups. This might be in two steps: 1) C/A proposed by a designer or design group. 2) C/A implemented, which would be the result of review and possible modification o

20、f the proposed C/A by project management and 9ta incorporation into the design. Copyright Government Electronics and if in a particular design an item is a problem,the appropriate corrective action becomes immediately evident. While it is obvious that the two approaches lead to a different organizat

21、ion of information,the basic information reported remains essentially the same though the detail varies depending on the method employed. Rather than developing a specific form for reporting, the elements that are most often significant have been identified in Section V. . The user of.this manual ca

22、n develop a form, if desirable, based upon his specific analysis pattern. It is often worthwhile to establish partial reports which contain the significant findings and recommendations.,. These reports would receive wider circulation than the more detBiled reports. The distribution of detailed infor

23、mation could be limited to the system, design, and quality engineering personnel responsible and their immediate management with copies to mmufacturing when appropriate, Information should be transmitted as soon as possible since the objective is to move the corrective action as early in the program

24、 as possible. Formal transmittal of reports can follow if desirable. - 29 - Copyright Government Electronics & Information Technology Association Provided by IHS under license with GEIA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 23:55:40 MDTNo reproduction or net

25、working permitted without license from IHS -,-,- E I A R B 7 1 3234600 000b411 7 M E It is advisabLe t o develop a measure of effctLveness of FMEA activity based upon impementation of actiorrs recommended and to establish follow-up to assure that a recommended action is closed out (either implemente

26、d or a conscious decision made to discard the recommendation). The measure of effectiveness is Intended for use by the organization performing the FMEA task and should be used bg them to improve performance agalnst measurable oriteria consistent with the FMEA objective. - 30 - Copyright Government E

27、lectronics & Information Technology Association Provided by IHS under license with GEIA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 23:55:40 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA R B 73 W 3234600 0006432 9 9 P s Section VI1

28、o Bibliography References listed below dealing with FMEA and related subjects provide information on specific FMEA techniques and their application. 1. EIA Safety Engineering Bulletin #3, System Safety 2. Analytical Techniques. EIA Reliability Engineering Bulletin #4, Reliability Quantification. 3.

29、ARNZEN, Harry E., Grumman Aircraft Engineering Corp., Bethpage, N. Y., “Failure Mode and Effect . Analysis: A Powerful Engineering Tool for Component and System Optimization,“ Annual Reliability and Maintainability Conference, 5th, New York, N. Y., July 18-20, 1955, P- 355-371- 4, RYLAND, Harvey G.,

30、 ARINC Research Corp., Huntsville, Ala., “Identification of Critical Elements as a Criterion for System Desfgn Trade- O f f s , “ Annual Reliability and Maintainability Conference, 5th, New York, N. Y., July 18-20, 1965, P . 372-3790 5. DYE, Robert R., Northrop Corp., Norair Div., Systems Reliabilit

31、y Branch, Hawthorne, Calif., llIdent.fication and Classification of Modes of Failure in Aeronautical Equipment“, IEEE Transactions on Aerospace, Vol. AS-2, April 1964, p * 535-542. 6 . WALKER, Harley E., Sandia Corp., Components Reliability Div., Albuquerque, N. Mex., “Reliability Assessment and Dor

32、mant Storage,“ . American Society for Quality Control, Annual Technical Conference, 21st, Chicago, Il., May 31-June 2, 1967, Transactions, p. 543-552. 7. KIANG, T. David, 12 p. ref. Presented at the 21st Ann. Tech. Conf., ASQC, Chicago, 31 May-2.June 1967. “Failure Modes and Effects Analysis“. Copyr

33、ight Government Electronics & Information Technology Association Provided by IHS under license with GEIA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 23:55:40 MDTNo reproduction or networking permitted without license from IHS -,-,- E I A R B 71 W 3234b00 000b413 O

34、 8. 9. 10. 11. 12. 13 * 14. 15 PLYER, Charles H. and William F. Wood, Martin Marietta Corp., Friendship International Airport, Md., llBuilding in Reliability,“ Annals of Reliability and Maintainability, Volume 6, pe 369-373, July 17-19, 1967. JORDAN, J. R. and R. L. Buchanan, McDonnell Douglas Corp.

35、, Missile and Space Systems Div., Santa MonicaJ Calif., “System Safeey - A Quantitative Fallout From Reliability Analysis,“ Annuals of Reliability and Maintainability, Vol. 6, p. 653-660, July 17-19? 1967. MORRIS, Brooks T., California Institute of Technology, Jet Propulsion Laboratory, Pasadena, Ca

36、lif., “Spacecraft Life for Deep Space Exploration,“ Annals of Assurance Sciences, Jan. 16-18, 1958, p. 298-302, GREENE, K., and T. J. Cunningham, Radio Corp. of America, Defense Electronic Products, Astro- electronics Div., Engineering Reliability Group, Princeton, N. J., “Failure Mode Effects, and

37、Criticality Analysis,“ Annals of Assurance Sciences, Jan, 16-18, 1968, p . 374-384. Aerospace Recommended Practice, New York., N, Y., Society of Automotive Engineeras. Inc., 1967, 12 p . ARP 926, “Design Analysis Procedure for Failure Mode, Effects and Criticality Analysis (FMECA ) . DONNELLY, Patri

38、ck P., Boeing Co., Houston, Texas, “An Overview - Reliability and the Computer,“ Evaluation Engineering, vol. 7, May/June 1968, ARNZEN, Harry E., Grumman Aircraft Engineering Corp., Bethpage, N. Y,? “Failure Mode and Effect Analysis: An Add t o Interpretation of Critical Elements in System Design,“

39、Transactions of i967 Spring Product Assurance Conference and Technical Exhibit, p. 93-109. SMITH, J. S. and J. Vaccaro, USAF Systems Command, Research and .Technology Div., Rome Air Development Center, Griffiss AFB, N. Y., llFailure Mechanlsms and Device Reliability,1f Annual Reliability Physics Sym

40、posium, 6th, November 6-8, 1967, p, 1-9. p. 10. Copyright Government Electronics & Information Technology Association Provided by IHS under license with GEIA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 23:55:40 MDTNo reproduction or networking permitted without li

41、cense from IHS -,-,- E I A RB9 71 = 3234600 OOObqL4 2 = 16. 17 18. 20. 21. 22. 23,. BURGESS, John A., Westinghouse Astronuclear Laboratory, Pittsburgh, Pa., “Spotting Trouble . Before it Happens,“ Machine Design, September 17, 1970 WALL, W. F. and 5. T. Mash, Lockheed Georgia Co., “An Onboard Malfun

42、ction Detection/Analysis System,“ Vol, 1, Proceedings of Symposium on Long-Life Hard- ware, March 1969. RUSSELL, Bentley, General Electric Co., Practical Benefits of Reliability Analysis for Long-Life Design,11 Vol, 1, Proceedings of Symposium on Long-Life Hardware, March 1969. EAGLE, Kenneth, Boein

43、g Co., “Fault Trees and Reliability Analysis Comparison, i969 Annual Symposium on Reliability. CROSETTI, Pauland R. A. Bruce, “Commercial Application of Fault Tree Analysis,“ 1970 Ninth Reliability and Main- tainability Conference. OLIVETO, F. E, RCA,-“Failure Mode,Analysis,l RCA Quality Assurance,

44、i969 Issue. WILSON, M., General Electric Co. , “Failure Modes and Effects Analysis Guide,“ GE TIS No. 61SD520, April 1966. “Criteria for Minuteman Failure Modes and Effects Analysis,“ Department of the Air Force, Space and Missile Systems Organization, SAMSO Exhibit 67-22, January 19, 1968. . - 33 - Copyright Government Electronics & Information Technology Association Provided by IHS under license with GEIA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 23:55:40 MDTNo reproduction or networking permitted without license from IHS -,-,-

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