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1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC Premire dition First edition 1995-01 Mesure des paramtres des rsonateurs quartz - Partie 6: Mesure de la dpendance du niveau dexcitation (DNE) Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) Numro
2、 de rfrence Reference number CEMEC 444-6: 1995 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without license from IHS -,-,-
3、Numros des publications Depuis le ler janvier 1997, les publications de la CE! sont numrotes a partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent
4、respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CE1 est constamment revu par la CE1 afin quil reflete ltat actuel de la
5、 technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs i des questions ltude et des travaux en c-Urs entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publica
6、tions tablies, se trouvent dans les documents ci- dessous: Site web de la CEI“ Catalogue des publications de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne)* Bufietin de la CE1 Disponible la fois JU site web. de la CEI et comme priodique imprim Terminologie, symboles graphique
7、s et I ittraux En ce qui concerne ia terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulaire Electro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes d sage gnra4 approuvs par la CEI, le lecteur consulters la CE1 60027: Symboles littrau
8、x a utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles. et la CE1 60617: Symboles graphiques pour schmas. Voir adresse lesite web sur la page de titre. Numbering As from 1 January 1997 all IEC publication
9、s are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incor- porating amendment
10、 1 and the base publication incorporating amendments 1 and 2. Validity o f this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the pu
11、blication is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogu
12、e of IEC publications Published yearly with regular updates (On-line catalogue)* Available both at the IEC web site and as a printed periodical IEC Bulletin Terminology, graphical and letter symbols For general terminology, readers are referred to IEC 60050: International Electrotechnical Vocabulary
13、 (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 60417: Graphical symbols for use on equipment. Index, survey and compilation o f the single sheets
14、and IEC 60617: Graphical symbols for diagrams. * See web site address on title page. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking per
15、mitted without license from IHS -,-,- NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 444-6 Premire dition First edition 1995-01 Mesure des paramtres des rsonateurs quartz - Partie 6: Mesure de la dpendance du niveau dexcitation (DNE) Measurement of quartz crystal unit parameters - Part 6: Measu
16、rement of drive level dependence (DLD) 6 3 CE1 1995 Droits de reproduction rservs - Copyright - all rights reserved Aucune partie de any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International. governmental and non-governmental organization
17、s liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. The formal decisions or agreements of the IEC on technical mat
18、ters, prepared by technical committees on which all the National Committees having a special interest therein are represented, express, as nearly as possible, an international consensus of opinion on the subjects dealt with. They have the form of recommendations for international use published in th
19、e form of standards, technical reports or guides and they are accepted by the National Committees in that sense. In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and re
20、gional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. International Standard IEC 444-6 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and sel
21、ection. It forms part 6 of a series of publications dealing with the measurement of quartz crystal unit parameters. Part 1 : Basic method for the measurement of resonance frequency and resonance resist- ance of quartz crystal units by zero phase technique in a n-network, is issued as IEC 444-1 (seco
22、nd edition, 1986). Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units, is issued as IEC 444-2 (1980). Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a .rc-network with compensati
23、on of the parallel capacitance Co, is issued as IEC 444-3 (1986). Part 4: Method for the measurement of the load resonance frequency fi, load resonance resistance R, and the calculation of other derived values of quartz crystal units, up to 30 MHz, is issued as IEC 444-4 (1988). Copyright Internatio
24、nal Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without license from IHS -,-,- - 6 - 444-6 O CE111 995 DIS La partie 5: Mthode de mesure des dispo
25、sitifs pizolectriques pour la dtermination des paramtres lectriques quivalents, utilisant des analyseurs automatiques de rseaux et correction des erreurs, sera publie comme CE1 444-5. Rapport de vote Le texte de cette norme est issu des documents suivants: I 49(BC)273 I 491284lRVD Le rapport de vote
26、 indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Lannexe A fait partie intgrante de cette norme. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bern
27、ie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without license from IHS -,-,- 444-6 O IEC:1995 DIS - 7 - Report on voting I Part 5: Reference method of the measurement of crystal units, using automatic network analyzer techniques for the determination of equivalent
28、 electrical parameters, will be issued as IEC 444-5. The text of this standard is based on the following documents: I 49(C0)273 I 49/284/RVD I Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annex A forms an integral
29、 part of this standard. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without license from IHS -,-,- - 8 - 444-6 O CE111 995
30、 INTRODUCTION Le niveau dexcitation (exprim comme la puissance/la tension ou le courant passant par le rsonateur quartz) force le rsonateur produire des oscillations mcaniques au moyen de leffet pizolectrique. Dans ce processus, le travail dacclration est converti en nergie cintique et lastique, et
31、les pertes de puissance en chaleur. La dernire con- version est due au frottement interne et externe du rsonateur quartz. Les pertes de frottement dpendent de la vitesse des masses vibrantes et elles augmen- tent lorsque loscillation nest plus linaire ou lorsque les vitesses critiques, les lon- gati
32、ons ou dformations, excursions ou acclrations sont atteintes dans le rsonateur quartz ou sur ses surfaces et points de montage (voir lannexe A). Cela provoque des changements de la rsistance et de la frquence, ainsi que des changements addition- nels, du fait que ces paramtres dpendent de la temprat
33、ure. A des niveaux dexcitation levs), (par exemple suprieurs 1 mW ou 1 mA pour les rsonateurs quartz de coupe AT) des changements sont observs sur tous les rsonateurs quartz et ils peuvent provoquer des changements irrversibles de lamplitude et de la frquence. Toute augmentation additionnelle du niv
34、eau dexcitation peut dtruire le rsonateur. A part cet effet, des changements de la frquence et de la rsistance sont observs dans quelques rsonateurs quartz (par exemple infrieurs 1 pW ou 50 pA pour les rsonateurs quartz de coupe AT) des niveaux dexcitation bas Dans ce cas, lorsque le gain de boucle
35、nest pas suffisant, le dmarrage des oscillations est difficile. Dans les filtres quartz, laffaiblissement de transmission et londulation changeront. De plus, le couplage entre le mode de vibration spcifi et les autres modes (par exemple du rsonateur lui-mme, du montage, et du gaz de remplissage) dpe
36、nd aussi du niveau dexcitation. En raison des caractristiques de temprature de ces modes diffrents, ces couplages contribueront des changements de la frquence et de la rsistance du mode spcifi dans les gammes troites de tempratures. Ces changements augmentent avec llvation du niveau dexcitation. Cep
37、endant, cet effet ne sera pas considr dans cette partie de la CE1 444. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without
38、 license from IHS -,-,- 444-6 O IEC:1995 - 9 - INTRODUCTION The drive level (expressed as power/voltage across or current through the crystal unit) forces the resonator to produce mechanical oscillations by way of piezoelectric effect. In this process, the acceleration work is converted to kinetic a
39、nd elastic energy and the power loss to heat. The latter conversion is due to the inner and outer friction of the quartz resonator. The frictional losses depend on the velocity of the vibrating masses and increase when the oscillation is no longer linear or when critical velocities, elongations or s
40、trains, excursions or accelerations are attained in the quartz resonator or at its surfaces and mounting points (see annex A). This causes changes in resistance and frequency, as well as further changes due to the temperature dependence of these parameters. At “high“ drive levels (e.g. above 1 mW or
41、 1 mA for AT-cut crystal units) changes are observed by all crystal units and these also can result in irreversible amplitude and frequency changes. Any further increase of the drive level may destroy the resonator. Apart from this effect, changes in frequency and resistance are observed at “low“ dr
42、ive levels in some crystal units, e.g. below 1 pW or 50 pA for AT-cut crystal units). In this case, if the loop gain is not sufficient, the start-up of the oscillation is difficult. In crystal filters the transducer attenuation and ripple will change. Furthermore, the coupling between a specified mo
43、de of vibration and other modes (e.g. of the resonator itself, the mounting and the back-fill gas) also depends on the level of drive. Due to the differing temperature response of these modes, these couplings give rise to changes of frequency and resistance of the specified mode within narrow temper
44、ature ranges. These changes increase with increasing drive level. However, this effect will not be considered further in this part of IEC 444. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale
45、, 03/10/2007 02:26:03 MSTNo reproduction or networking permitted without license from IHS -,-,- 444-6 O CEI:1995 - 10 - MESURE DES PARAMTRES DES RSONATEURS QUARTZ - Partie 6: Mesure de la dpendance du niveau dexcitation (DNE) 1 Gnralits 1 .1 Domaine dapplication La prsente partie de la CE1 444 sappl
46、ique aux mesures de la dpendance du niveau dexcitation (DNE) des rsonateurs quartz. Deux mthodes dessai sont traites. La mthode A, base sur la mthode du rseau en x conformment la CE1 444-1, peut tre utilise dans la gamme des frquences complte couverte par la prsente partie de la CE1 444. La mthode B
47、, mthode doscillateur, est adapte pour la mesure des rsonateurs quartz sur le mode fondamental en grandes sries avec des conditions de mesure fixes. 1.2 Rfrences normatives Les documents normatifs suivants contiennent des dispositions qui, par suite de la rfrence qui y est faite, constituent des dis
48、positions valables pour la prsente partie de la CE1 444. Au moment de la publication, les ditions indiques taient en vigueur. Tout document normatif est sujet rvision et les parties prenantes aux accords fonds sur la prsente partie de la CE1 444 sont invites rechercher la possibilit dappliquer les ditions les plus rcentes des documents normatifs