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1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 61 304 Premire dition First edition 1994-05 Instrumentation nuclaire - Ensembles de comptage scintillation liquide - Contrle du fonctionnement Nuclear instrumentation - Liquid -sc i n t i I I at i on cou n t i n g sys tems - Performance ve ri f cat
2、 ion Numro de rfrence Reference number CEMEC 61304: 1994 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo reproduction or networking permitted without license from
3、IHS -,-,- Numros des publications Numbering Depuis le ler janvier 1997, les publications de la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1
4、 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et ia publication de base incorporant les amendements 1 et 2. Validit de la presente publication Le contenu technique des publications de la CE1 est constamment revu par la CE1 afin quil reflet
5、e ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tabli cette publication, ainsi que ia
6、liste des publications tablies, se trouvent dans les documents ci- dessous: 0 o (Site web de la CEI* Catalogue des publications de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne)* 0 Bulletin de la CE1 Disponible la fois au site web) de la CEI et comme priodique imprim Terminol
7、ogie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulaire Electro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le lecteur consultera la CE1
8、60027: Symboles littraux 2 utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CE1 60617: Symboles graphiques pour schmas. * Voir adresse 4 t e web, sur la page de titre As from 1 January 1997 all I
9、EC publications are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incor- pora
10、ting amendment 1 and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmat
11、ion of the publication is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: O IEC web
12、 site* O Catalogue of IEC pub!ications Published yearly with regular updates (On-line catalogue) * O IEC Bulletin Available both at the IEC web site* and as a printed periodical Terminology, graphical and letter symbols For general terminology, readers are referred to I E C 6 O O 5 O : International
13、 Electrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology3 IEC 60417: Graphical symbols for use on equipment. Index, survey and compil
14、ation of the single sheets and IEC 60617: Graphical symbols for diagrams. * See web site address on title page. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo rep
15、roduction or networking permitted without license from IHS -,-,- NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 61 304 Premire dition First edition 1994-05 Instrumentation nuclaire - Ensembles de comptage scintillation liquide - Contrle du fonctionnement Nuclear instrumentation - Li q u id -sc
16、i n t i I I at i on cou n t i n g systems - Performance verification O IEC 1994 Droits de reproduction rservs - Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni No part of this publication may be reproduced or utilized in utilise sous quelque forme que ce
17、soit et par aucun any form or by any means, electronic or mechanical, procd, lectronique ou mcanique, y compris la photo- including photocopying and microfilm, without permission in copie et les microfilms, sans raccord crit de lditeur. writing from the publisher. International Electrotechnical Comm
18、ission Telefax: +41 22 919 0300 3, rue de Varemb Geneva, Switzerland IEC web site http: /www.iec.ch e-mail: inmailiec.ch S CODE PRIX PRICE CODE Pour prix, voir catalogue en vigueur For price. see current catalogue Commission Electrotechnique Internationale International Electrotechnical Commission M
19、ew Bet R + B E R. . A.2 Mesures Le compteur est rgl pour 3H, conformment aux recommandations du fabricant et dix mesures de 1 min sont effectues. Aprs chaque mesure, lchantillon est retir de la chambre de mesure, puis replac (afin de contrler la reproductibilit du positionnement de Ichantillonnement
20、 par rapport au photomultiplicateur). A.3 Rsultats et calculs Soit Ni le nombre de chocs accumuls pendant une mesure de 60 s et soit n = 10 le nombre de mesures. Les rsultats des 10 mesures et les carts par rapport la valeur moyenne sont indiqus dans le tableau A.l. A.3.1 Equation 7 Calcul de la val
21、eur moyenne -1” 503 480 N = - Ni= = 50 348 chocs n i=i 10 A.3.2 Equation 2 Calcul de lcart-type estim pour une distribution de Poisson: = B and R + B z R. A.2 Measurements The counter is set according to the manufacturers recommendations for 3H, and ten 1 min counts are taken. After each measurement
22、, the sample is removed from the sample chamber and then replaced (to test the reproducibility of positioning of the sample relative to the photomultiplier tubes). A.3 Results and calculations Let Ni be the number of counts accumulated in a 60 s count and let n = 10 be the number of determinations.
23、The results for the 10 determinations and the deviations from the mean are shown in table A.l. A.3.1 Equation 1 Calculation of the mean value N: -1“ 503 480 N = - C N: = = 50 348 counts I n i =1 10 A.3.2 Equation 2 Calculation of the estimated standard deviation for a Poisson distribution: = 6 =/503
24、48 = 224 counts From N and $ the relative standard deviation RSD is calculated: A (3 224 N RSD = - 100% =- 100 / o = 0,44 Yo 50 348 - Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2
25、007 00:03:33 MSTNo reproduction or networking permitted without license from IHS -,-,- - 3 4 - A.3.3 Equation 3 1304 0 CEI:1994 Calcul de lcart-type observ pour la distribution mesure: il n 1 ln 2 = 263chocs s = l -l x ( N : - N ) - 2 I = 9 S ETRobs = - 100% = N 263 50 348 100 % = 0,52 % - A.3.4 Equ
26、ation 4 La valeur de X2: 1“ 621 686 X 2 = N-12 = = 12.3 (4) 50 348 I N =I A.4 Dcision sur les performances du systme de comptage base sur des statistiques: le test du x2 Le test du x2 est une mthode utile pour dtecter un comportement non statistique. La distribution des x2 est connue et ses valeurs
27、existent sous forme de tableaux. Le tableau A.2, qui donne les valeurs de x2, indique les valeurs de rejet en fonction des diff- rents niveaux de confiance correspondant au nombre de mesures. Une probabilit comprise entre 0,05 et 0,95 est considre comme une indication du bon fonctionnement probable
28、du systme de comptage. Le X2 observ est de 12,3, ce qui pour n = 10 est compris entre les pourcentages de 16,9 et 3,3 indiqus dans le tableau A.2. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Re
29、sale, 03/10/2007 00:03:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 1304 0 IEC:1994 - 35 - A.3.3 Equation 3 Calculation of the observed standard deviation for the measured distribution: 1 12 s = - 1“ (Ni-“)2 = ./-6 = 263counts n-1 i=l S SDobs = 100% = 263 100 30 = 0,5
30、2 9 0 N 50 348 A.3.4 Equation 4 The X2 value: 621 686 1“ N i=l 50 348 = 12,3 - 2 2 X = = C (Ni-N) = (4) A.4 Decision on counting system performance based upon statistical observations: the x2 test The x2 test is a useful method for the detection of non-statistical behaviour. The distribu- tion of x2
31、 is known, and its values have been tabulated. Table A.2, listing the x2 values, shows the rejection values for various levels of significance as determined by the number of measurements. Probabilities between 0,05 and 0,95 are considered to indicate that the counting system i s probably performing
32、satisfactorily. The observed X2 is 12,3, which is within the percentage point values of 16,9 and 3,3 indicated in table A.2 for n = 10. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10
33、/2007 00:03:33 MSTNo reproduction or networking permitted without license from IHS -,-,- - 36 - 1304CEI:1994 Tableau A.l - Rsultat de 10 mesures et cart moyen Mesure 1 2 3 4 5 6 7 8 9 10 Ni chocs 50 386 50 819 50 564 50 482 60 277 50 233 50 365 50 375 49 820 50 159 n XNi = 503480 i-1 (Ni - 7) chocs
34、38 471 216 134 -71 -1 15 17 27 -528 -1 89 (Ni -7) chocs2 1444 221 841 46 656 17956 5 041 13 225 289 729 278 784 35 721 (Ni - )= 621 686 i l NOTE -Les statistiques de cette distribution sont calcules en utilisant les quations (1) (4) de 5.2.2.4. Tableau A.2 - Valeurs de x2 Nombre de mesures 3 4 5 6 7
35、 8 9 10 1 1 12 13 14 15 1 6 17 18 19 20 0,020 0,115 0,297 0,554 0,872 1,239 1,616 2,088 2,558 3,053 3,571 4,107 4,660 5,229 5,812 6,408 7,015 7,633 0,103 0,352 0,711 1,145 1,635 2,167 2,733 3,325 3,940 4,565 5.226 5,892 6,571 7,261 7,962 8,672 9,390 10,117 0,90 0.21 1 0,584 1,064 1,610 2.204 2.833 3
36、,490 4,168 4,865 5,578 6,304 7,042 7,790 8,547 9,312 10,085 10,875 11,651 Probabilit 050 1,386 2,366 3,357 4,351 5,348 6,346 7,344 8,343 9,342 10,341 11,340 12,340 13,339 14,339 15,338 16,338 17,338 18,338 0,lO 4.605 6,251 7,778 9,236 10,645 12,017 13,362 14,684 15,987 17,275 18,549 19,812 21,064 22
37、.307 23.542 24,769 25,989 27,204 0,05 5,991 7,815 9,488 1 1,070 12,592 14,067 15,507 16,919 18,307 19,675 21,026 22,362 23,685 24,996 26,296 27,587 28,869 30,144 0,01 9,210 11,345 13,277 15,086 16,812 18,475 20,090 21,666 23,209 24,725 26,217 27,688 29,141 30,578 32,000 33,409 34,805 36,191 NOTE - D
38、ans lexemple donn, il y a seulement 5 Yo de chances pour que le x2 mesure soit infrieur 3,325. De mme, il y a seulement 5 Yo de chances quil soit suprieur 16,919. Puisque la valeur mesure est de 12.3, nous en avons conclu que lensemble tait oprationnel. Copyright International Electrotechnical Commi
39、ssion Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo reproduction or networking permitted without license from IHS -,-,- 1304 0 IEC:1994 -37- 0.10 Table A.l - Result of 10 determinations and deviations from the mea
40、n 0.05 0,01 Determination 0,95 1 2 3 4 5 6 7 8 9 10 0.90 50 386 50 819 50 564 50 482 60 277 50 233 50 365 50 375 49 820 50 159 n ENi = 503480 ill 38 471 216 134 -71 -1 1 5 17 27 -528 -1 89 - N) counts2 1444 221 841 46 656 1 7 956 5 041 13 225 289 729 278 784 35 721 n x ( N i - )= 621 686 i-1 NOTE -T
41、he statistics of this distribution are calculated using equations (1) to (4) of 5.2.2.4. Number of deter- minations 3 4 5 6 7 8 9 10 1 1 12 13 14 15 16 17 18 19 20 Table A.2 - x2 values 0 9 0,020 0,115 0.297 0.554 0,872 1,239 1,616 2,088 2,558 3,053 3,571 4,107 4,660 5,229 5,812 6,408 7,015 7,633 0,
42、103 0.352 0-71 1 1,145 1,635 2,167 2,733 3.325 3,940 4,565 5,226 5,892 6,571 7,261 7,962 8,672 9,390 10,117 0,211 0,584 1,064 1,610 2,204 2,833 3,490 4,168 4,865 5,578 6,304 7,042 7,790 8,547 9,312 10,085 10,875 11,651 Probability 0.50 1,386 2.366 3,357 4,351 5,348 6.346 7,344 8,343 9,342 10,341 1 1
43、,340 12,340 13,339 14,339 15,338 16,338 17,338 18,338 4,605 6,251 7,778 9,236 10,645 12,017 13,362 14,684 15,987 17,275 18,549 19,812 21,064 22,307 23,542 24.769 25,989 27,204 5,991 7,815 9.488 1 1,070 12,592 14,067 15,507 16,919 18,307 19,675 21,026 22,362 23,685 24,996 26,296 27,587 28,869 30,144
44、9.210 11,345 13,277 15,086 16,812 18,475 20,090 21,666 23,209 24,725 26,217 27,688 29,141 30,578 32.000 33,409 34,805 36,191 NOTE - In the exampie given, there is only a 5 O h chance that the measured x2 value would be less than 3,325. Similarly, there is only a 5 Yo chance that it would be greater
45、than 16.919. Since the measured value is 12,3, we concluded that the system is in control. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo reproduction or networki
46、ng permitted without license from IHS -,-,- a , YD C 2 Q) EI Q) - 2 CI E O o Q) r o h - 38 - 1304 0 CEI:1994 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo reprod
47、uction or networking permitted without license from IHS -,-,- 1304 0 IEC:1994 - 39 - z a z s c 2 u) 01 C o u) C .- c c c z 2 c u) c - L o - ca Q? .2 E = 3 m - c m .- o - a c c m o c O o . .- 24C-i C O o a C J= o Q .- p! - m c $ 2 B 8 p .- L c O u) 2 2 E c C 8 Copyright International Electrotechnical
48、 Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 00:03:33 MSTNo reproduction or networking permitted without license from IHS -,-,- - 40 - 1304 0 CEI:1994 Annexe C (informative) Proprits physiques des scintillateurs liquides et exigences vis-