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1、IEEE Std 1573-2003 IEEE Standards 1573 TM IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA 31 March 2004 IEEE Power Electro
2、nics Society Sponsored by the Standards Committee IEEE Standards Print: SH95146 PDF: SS95146 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduct
3、ion or networking permitted without license from IHS -,-,- Recognized as anIEEE Std 1573TM-2003 American National Standard (ANSI) IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance Sponsor Standards Committee of the IEEE Power Electronics Soc
4、iety Approved 11 September 2003 IEEE-SA Standards Board Approved 11 February 2004 American National Standards Institute Abstract:A technical basis for implementation of electronic power subsystems is provided in this recommended practice. It is intended for electronic systems engineers and integrato
5、rs, electronic power subsystem designers and integrators, as well as power element manufacturers and suppliers. It addresses system-level issues in element or subsystem integration, adaptation, and accommodation. It also defi nes system-level interface parameters, test methods, and test conditions.
6、It provides for a systems engineering approach to acquisition, adaptation, and inte- gration of electronic power subsystems, facilitates and promotes a modular approach to element or subsystem integration, and enables effective communication between the end users of power electronics and their manuf
7、acturers or suppliers. Keywords:adaptation, commercial or military electronic power distribution, electronic power subsystem, integrators, interaction, logistics, power electronics, power supply, specifi cation, specifi cation language, system interface Copyright The Institute of Electrical and Elec
8、tronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New Y
9、ork, NY 10016-5997, USA Copyright ? 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 March 2004. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent 1 978 750 8400. Permission to photocopy portions of any ind
10、ividual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31
11、MDTNo reproduction or networking permitted without license from IHS -,-,- Introduction (This introduction is not part of IEEE Std 1573-2003, IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance.) Electronic power subsystems are integral to elec
12、tronic systems. They perform the tasks of power processing, management, and distribution to all user-level electronics. Clear defi nition and precise understanding of system-level performance parameters are crucial in building commonalties among diff erent users of electronic power elements. Additio
13、nally, system-level understanding of the available electronic power elements or subsystems is the cornerstone to their successful adaptation and integration. IEEE Std 1573-2003 facilitates implementation of electronic power subsystems. This recommended practice provides specifi cation language at a
14、system-level. It also provides for system-level adaptation and accommodation of commercially available elements or subsystems for specifi c applications. System-level adaptation and accommodation approaches are provided for use of such elements or subsystems in applications other than those for whic
15、h they were marketed. IEEE Std 1573-2003 is a companion to IEEE Std 1515TM-2000, IEEE Recommended Practice for Electronic Power Subsystems: Parameter Defi nitions, Test Conditions, and Test Methods.aWhile IEEE Std 1515-2000 defi nes the parameters commonly used in specifying power electronic element
16、s, IEEE Std 1573-2003 focuses on system-level parameters used to enhance eff ective element adaptation and integration in developing a subsystem. IEEE Std 1573-2003 provides for a systems engineering approach to acquisition, adaptation, and integration of electronic power subsystems. This recommende
17、d practice facilitates and promotes a modular approach to element or subsystem integration, and enables eff ective communication between the end users of power electronics and their manufacturers or suppliers. It is intended for general users as well as for users for whom performance and logistics a
18、re paramount to achieve subsystem availability and aff ordability. This recommended practice is intended for use by system engineers, designers, integrators, and manufacturers of power electronic elements. It allows for and promotes eff ective user-manufacturer cooperation to facilitate element or s
19、ubsystem specifi cation, acquisition, adaptation, and integration with the performance and logistics predictability and integrity required by todays demanding applications. It will also be useful for engineers and graduate students who are just entering the fi eld of electronic power systems, since
20、many of the parameters are seldom discussed comprehensively in university courses or in professional educational seminars. ivCopyright ? 2004 IEEE. All rights reserved. aInformation on references can be found in Clause 2. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided
21、 by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking permitted without license from IHS -,-,- Participants The preparation of this recommended practice was accomplished by the IEEE Working Group on Electron
22、ic Power Specifi cation (1573). At the time this recommended practice was completed, the Working Group had the following the membership: F. Dong Tan, Chair Carlos Gonzalez, Secretary Rich BuckAnthony F. LavianoJoe Ortiz Dave CooperChristian LazaroviciErnie Parker Rick EddinsYan-Fei LiuMichael K. Per
23、kins Ernest FierhellerGlen LoganGeorge Schoneman William A. HannaEd MabeMarvin Soraya George KaelinKen MartindaleWai L. Tam Bryan KelloggIshaque S. MehdiJoe Ullmany Harry LamberthBruce Wright yThe working group was saddened by the sudden loss of Mr. Joe Ullman, who contributed heavily in helping us
24、to defi ne the scope of this document. The following members of the balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Roy W. AlexanderRonald HotchkissYan-Fei Liu Thomas BlairGeorge KaelinCharles Ngethe Steve FreelandPhilip Krei
25、nCameron Smallwood Carlos GonzalesJih-Sheng LaiF. Dong Tan Thomas HabetlerHarry LamberthJim Walker William A. HannaAnthony F. LavianoZhenxue Xu When the IEEE-SA Standards Board approved this recommended practice on 11 September 2003, it had the following membership: Don Wright, Chair Howard M. Frazi
26、er, Vice Chair Judith Gorman, Secretary H. Stephen BergerDonald N. HeirmanDaleep C. Mohla Joseph A. BruderLaura HitchcockWilliam J. Moylan Bob DavisRichard H. HulettPaul Nikolich Richard DeBlasioAnant Kumar JainGray S. Robinson Julian Forster*Lowell G. JohnsonMalcolm V. Thaden Toshio FukudaJoseph L.
27、 Koepfinger*Geoffrey O. Thompson Arnold M. GreenspanThomas J. McGreenDoug Topping Raymond HapemanSteve M. MillsHoward L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Savou
28、la Amanatidis IEEE Standards Managing Editor Copyright ? 2004 IEEE. All rights reserved.v Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction
29、 or networking permitted without license from IHS -,-,- Contents 1.Overview. 1 1.1Scope 1 1.2Purpose 1 1.3Organization of this recommended practice 2 2.References 3 3. Defi nitions, abbreviations, acronyms, and symbols. 3 3.1 Defi nitions 3 3.2Abbreviations, acronyms, and symbols. 4 4.Element-level
30、parameters . 6 4.1Set point voltage accuracy. 7 4.2Maximum power dissipation 7 4.3Contact resistance 7 4.4Input undervoltage protection. 7 4.5Input overvoltage protection . 8 4.6Overtemperature shutdown 9 4.7Reverse voltage protection.10 4.8Turn-on time11 4.9Regulation, combined11 4.10 Regulation ef
31、f ects due to aging12 4.11Lightning12 4.12Surge 12 4.13Sag12 5.Electronic power subsystems12 5.1 Interface defi nition.13 5.2 Requirements defi nition.16 5.3Architectural considerations 17 5.4System interaction22 6.Electrical interface parameters.23 6.1Status monitoring.23 6.2Supervisory control23 v
32、iCopyright ? 2004 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking permitted without license from
33、 IHS -,-,- 6.3Built-in-test24 6.4Electromagnetic compatibility/electromagnetic interference.24 7.Mechanical interface parameters27 7.1Packaging27 7.2Center of gravity.29 7.3Cooling or thermal energy dissipation process.29 8.Environmental interface parameters 31 8.1Thermal.31 8.2Resistance to contami
34、nants 32 8.3Sand and dust.32 8.4Explosive atmosphere .33 8.5Acoustics.34 8.6Radiation34 9. System eff ectiveness interface parameters 37 9.1 Qualifi cation requirements37 9.2Quality assurance38 9.3Acceptance testing 38 9.4Compliance information.38 9.5Logistics38 9.6 Confi guration management 39 9.7O
35、bsolescence.40 9.8Discontinuance .40 9.9 Production line certifi cation40 9.10Warranty.40 10.System integration40 10.1System interaction.40 10.2Protection and sensing44 10.3Output sequencing and clamping .46 10.4Supervisory/status monitoring, control, and software implementation47 10.5System reliabi
36、lity.49 10.6Logistics52 Copyright ? 2004 IEEE. All rights reserved.vii Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking perm
37、itted without license from IHS -,-,- 11.System adaptation 52 11.1Electrical interface adaptations. 53 11.2Mechanical interface adaptation. 70 11.3Environmental interface adaptation . 72 11.4 System eff ectiveness interface adaptation. 79 11.5Adaptation analysis techniques 85 Annex A (informative) Bi
38、bliography . 86 Annex B (informative) Performance 89 Annex C (informative) Parameter index 98 Annex D (informative) Radiation environments. 104 viiiCopyright ? 2004 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEE
39、ELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance 1. Overview 1.1 Scope This recomm
40、ended practice provides a technical basis for implementation of electronic power subsystems. It is intended for electronic systems engineers and integrators, electronic power subsystem designers and integrators, as well as power element manufacturers and suppliers. It addresses system- level issues
41、in element or subsystem integration, adaptation, and accommodation. It also defi nes system interface parameters, test methods, and test conditions. This recommended practice applies to acdc and dcdc electronic power subsystems. The range of electronic power subsystems includes those with dc, single
42、-phase, and three-phase inputs, having power levels from a fraction of a watt up to 20kW. The voltage range is 600V and below at a frequency or frequencies of dc 1kHz. Internal operating frequencies within elements or subsystems may be much higher than 1kHz. This recommended practice may be used out
43、side the range where applicable. This recommended practice builds on and supplements IEEE Std 1515-2000.1 1.2 Purpose The purpose of this recommended practice is threefold: a)To provide a systems engineering approach to acquisition, adaptation, and integration of electronic power subsystems. b)To fa
44、cilitate and promote a modular approach to element or subsystem integration. c) To enable eff ective communication between the end users of power electronics and their manufacturers or suppliers. Copyright ? 2004 IEEE. All rights reserved.1 1Information on references can be found in Clause 2. Copyri
45、ght The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:31 MDTNo reproduction or networking permitted without license from IHS -,-,- 1.3 Organization of this recommended pra
46、ctice This recommended practice is organized into eleven clauses and four annexes. Clause 1 is an overview of the scope, purpose, and organization of this recommended practice. Clause 2 lists the references that should be consulted when using this recommended practice. Clause 3 identifi es defi niti
47、ons and acronyms used throughout the text of this recommended practice. Clause 4 contains parameters that are at element level. These parameters can be added to IEEE Std 1515-2000 upon its revision. Clause 5 identifi es essential considerations for designing and implementing electronic power subsyst
48、ems in the areas of requirements defi nition, architectural considerations, and system interaction. Four interfaces are defi ned: electrical interface, mechanical interface, environmental interface, and system eff ectiveness interface. Clause 6 identifi es electrical interface parameters related to electrical interactions between elements, or between an element and its higher level subsystem, including parameter defi nitions, test methods, and test conditions. Clause 7 presents mechanical inter