《IEEE-1623-2004.pdf》由会员分享，可在线阅读，更多相关《IEEE-1623-2004.pdf（25页珍藏版）》请在三一文库上搜索。
1、IEEE Std 1623-2004 IEEE Standards 1623 TM IEEE Guide for the Functional Specification of Medium Voltage (1 kV35 kV) Electronic Shunt Devices for Dynamic Voltage Compensation 3 Park Avenue, New York, NY 10016-5997, USA IEEE Power Engineering Society Sponsored by the Substations Committee IEEE Standar
2、ds 11 May 2005 Print: SH95322 PDF: SS95322 -,-,- Recognized as an American National Standard (ANSI) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2005 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserve
3、d. Published 11 May 2005. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention i
4、s called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the exist- ence or validity of any patent rights in connection therewith. The IEEE shall not be responsib
5、le for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal valid- ity or scope of those patents that are brought to its attention. iii Copyright 2005 IEEE. All rights reserved. Introduction Several utilities are experimenting with el
6、ectronic devices to reduce voltage fluctuations. Industrial customers with sensitive loads are installing different electronic devices to mitigate voltage fluctuations. A significant number of these devices are installed every year. Most of these devices are bought using specifications provided by v
7、arious manufacturers. Technical literature describes the operation of specific devices and provides results of computer simulations to prove the effectiveness of the devices. However, no document defines the technical data that has to be collected and used for the specification of a new device. The
8、working group collected specifications from different manufacturers and utilities. These documents have been combined together to define a comprehensive method for the specification of future devices. This guide is not a tutorial. The application of its content to prepare a specification requires te
9、chnical knowledge and understanding. Each user should modify the material to meet with user specific conditions. This guide does not include all topics necessary for every application and does not address the commercial aspect of the specifications. Notice to users Errata Errata, if any, for this an
10、d all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading
11、/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection
12、 therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. This introduction is not par
13、t of IEEE Std 1623-2004, IEEE Guide for the Functional Specification of Medium Voltage (1 kV35 kV) Electronic Shunt Devices for Dynamic Voltage Compensation. -,-,- iv Copyright 2005 IEEE. All rights reserved. Participants At the time this guide was completed, the Power Electronics Equipment Working
14、Group had the following membership: George G. Karady, Chair Neil Woodley, Vice Chair The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 15 No
15、vember 2004, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan Cookson, N
16、IST Representative Jennie Steinhagen IEEE Standards Project Editor Stephan Arnold Hubert Bilodeau Jacques Brochu Tom Cease Jeff Fleeman Brian Gemmell Chris Horwill William O. Kramer Thomas W. LaRose Stig Nilsson Duane Torgerson Terry Treasure John Schwarzenberger Ronald Sharp Teruo Yoshino William A
17、ckerman Hubert Bilodeau Michael Bio Thomas Blair William Brumsickle Tommy Cooper Luis Coronado R. Daubert Matthew Davis Frank Denbrock Dr. Guru Dutt Dhingra Paul Drum Amir El-Sheikh Ahmed Elneweihi Gary Engmann Edward Horgan Jr. George Karady Mark Kempker Joseph L. Koepfinger Thomas LaRose Stephen R
18、. Lambert Wayne Litzenberger Fortin Marcel Frank Mayle Mark McGranaghan G. Michel Georges Montillet John Randolph Paulo Ribeiro Michael Roberts Devki Sharma James E. Smith Shigeru Tanabe Eric Udren Raul Velazquez Hemant Vora Kenneth White James Wilson Chuck Adams Stephen Berger Mark D. Bowman Joseph
19、 A. Bruder Bob Davis Roberto de Marca Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Hermann Koch Thomas J. McGean Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson F
20、rank Stone Malcolm V. Thaden Doug Topping Joe D. Watson -,-,- Contents 1. Overview 1 1.1 Scope. 1 1.2 Purpose 1 1.3 Application 1 2. Normative References 2 3. Definitions 3 4. System description 3 5. Project description 5 6. Scope of supply and schedule. 7 6.1 Scope of supply and warranty 7 6.2 Equi
21、pment, material, and services furnished by the user or its agent 7 6.3 Schedule 8 7. User furnished site and environmental data 8 8. Power system characteristics 8 9. Shunt compensation device characteristics 9 9.1 Rating 9 9.2 Losses 10 9.3 Harmonic performance 10 9.4 Audible noise. 10 9.5 Electrom
22、agnetic interference (telephone and radio) 10 9.6 Cooling and ventilation 11 9.7 Enclosures 12 10. Reliability, availability and maintenance 13 11. Control and diagnostics 13 12. Protection 14 13. Insulation and grounding 15 14. Safety and signs 15 15. Lead time 15 16. Installation and spare parts.
23、15 17. Equipment testing and system commissioning. 16 18. Quality assurance 16 19. Contractual generalities 16 Annex A (informative) Bibliography. 17 -,-,- v Copyright 2005 IEEE. All rights reserved. -,-,- IEEE Guide for the Functional Specification of Medium Voltage (1 kV35 kV) Electronic Shunt Dev
24、ices for Dynamic Voltage Compensation 1. 1.1 1.2 1.3 Overview Scope This document provides general guidelines for the preparation of a functional specification for solid-state electronic shunt devices used mainly for compensation of voltage fluctuation. The guide covers devices rated to medium volta
25、ge (1 kV35 kV). This device contains in general: an inverter, rectifier or dc converter, energy storage device, and coupling transformer. The device typically is connected in parallel with the network using a coupling transformer. Normally this device is not designed for flicker compensation. If fli
26、cker compensation is needed, the specification has to be modified, and the manufacturer has to design the device for flicker compensation. In order to interface these devices with the network, additional equipment should be provided, including current and potential transformers, bypass and isolation
27、 breakers, disconnect switches and three-phase low- voltage service for auxiliary power. Purpose This guide includes technical clauses describing the users requirements, including operation methods and environmental conditions. It specifies basic requirements of solid-state electronic shunt devices
28、used for compensation of voltage fluctuations by injection of reactive power. Application This guide should be considered as a general-purpose source and does not include all details needed for specific applications. Likewise, because the electronic device is typically designed to address a specific
29、 application, not every part of this guide may be applicable. The user of this guide should evaluate how and to what extent each clause applies to the development of a specific device specification. 1 Copyright 2005 IEEE. All rights reserved. -,-,- IEEE Std 1623-2004 Functional Specification of Medi
30、um Voltage Electronic Shunt Devices for Dynamic Voltage Compensation The required environmental and electrical system information at the location of the device appears in Clause 7 and Clause 8 of this guide. 2. Normative references The following referenced documents are indispensable for the applica
31、tion of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. Accredited Standards Committee C2, National Electrical Safety Code (NESC).1 ANSI Std C37.06, American N
32、ational Standard for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisPreferred Ratings and Related Required Capabilities.2 IEEE Std 80, IEEE Guide for Safety in AC Substation Grounding. 3,4 IEEE Std 139, IEEE Recommended Practice for the Measurement of Radio Frequency Emission f
33、rom Industrial, Scientific, and Medical (ISM) Equipment Installed on Users Premises. IEEE Std 141, IEEE Recommended Practice for Electric Power Distribution for Industrial Plants (Red Book). IEEE Std 493 IEEE Recommended Practice for the Design of Reliable Industrial and Commercial Power Systems (Go
34、ld Book). IEEE Std 519, IEEE Recommended Practices and Requirements for Harmonic Control in Electrical Power Systems. IEEE Std 693, IEEE Recommended Practice for Seismic Design of Substations. IEEE Std 1031, IEEE Guide for the Functional Specification of Transmission Static VAR Compensators. IEEE St
35、d 1100, IEEE Recommended Practice for Powering and Grounding Electronic Equipment (IEEE Emerald Book). IEEE Std 1159, IEEE Recommended Practice for Monitoring Electric Power Quality. IEEE Std 1250, IEEE Guide for Service to Equipment Sensitive to Momentary Voltage Disturbances. IEEE Std C37.30, IEEE
36、 Standard Requirements for High-Voltage Switches. IEEE Std C37.90.1, IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus. IEEE Std C37.100, IEEE Standard Definitions for Power Switchgear. IEEE Std C57.12.00, IEEE Standard Gen
37、eral Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers. 1 The NESC is available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 2 ANSI publications are available from the Sales Dep
38、artment, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 3 IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 4 T
39、he IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 2 Copyright 2005 IEEE. All rights reserved. -,-,- IEEE Std 1623-2004 Functional Specification of Medium Voltage Electronic Shunt Devices for Dynamic Voltage Compensa
40、tion IEEE Std C57.12.90, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regulating Transformers. IEEE Std C57.13, IEEE Standard Requirements for Instrument Transformers. IEEE Std C57.16, IEEE Standard Requirements, Terminology, and Test Code for Dry-Type Air-Core Series-Connect
41、ed Reactors. IEEE Std C57.21, IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA. IEEE Std C62.11, IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits ( 1 kV). NFPA 70, National Electrical Code (NEC).5 SEMI F47-0200 Specification for Semicond
42、uctor Processing Equipment Voltage Sag Immunity.6 3. 4. Definitions For the purposes of this guide, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standards B17, should be referenced for terms not defined in this clause. 3.1 voltage sag: A short duration decrease of
43、the rms voltage value, at the power frequency. Typical values are between 0.1 and 0.9 pu, at the power frequency, for 0.5120 cycles in duration. (IEEE Std 1250) NOTEThe International Electrotechnical Commission (IEC) terminology is voltage dip.8 3.2 voltage swell: A short duration increase of the rm
44、s voltage value, at the power frequency, typical values are between 0.5120 cycles in duration. (IEEE Std 1250) 3.3 voltage flicker: A slow, low frequency modulation of the sinusoidal voltage of the load or supply. 3.4 two-quadrant control: An inverter control algorithm, which makes the inverter capa
45、ble of accepting or delivering power between the dc bus and the line. (NASA-Kennedy Space Center, Technique OPS-7, AC - Variable Frequency Drive Systems). A shunt device using this control absorbs or generates reactive power. 3.5 four-quadrant control: An inverter control algorithm, which allows rea
46、l and reactive power (watts and vars) to be independently delivered to or extracted from a load. A shunt device, using this control generates or absorbs both real and reactive power. System description The solid-state electronic shunt device is a power electronic primary power delivery (distribution
47、) system element that is connected in parallel with a primary power delivery circuit typically via a coupling transformer. The device will supply reactive power to, as well as absorb reactive power from, the power delivery system, either to regulate voltage to a set point value or inject reactive po
48、wer as specified by the 5 The NEC is published by the National Fire Protection Association, Batterymarch Park, Quincy, MA 02269, USA (http:/ www.nfpa.org). Copies are also available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 6 SEMI documents can be obtained from Semiconductor Equipment and Materials International, 3081 Zanker Road, San Jose, CA 95134 USA (http:/wps2a.semi.org/wps/portal). 7 The numbers in brackets correspond to those of the biblio