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1、IEEE Std 98-2002 (Revision of IEEE Std 98-1984) IEEE Standards 98 TM IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-599
2、7, USA 31 May 2002 IEEE Electrical Insulation Society Sponsored by the Standards Coordinating Committee 4 on Thermal Rating IEEE Standards Print: SH94991 PDF: SS94991 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2002 by the Institu
3、te of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2002. Printed in the United States of America. Print: ISBN 0-7381-3277-2 SH94991 PDF: ISBN 0-7381-3278-0 SS94991 No part of this publication may be reproduced in any form, in an electronic retrieval system or othe
4、rwise, without the prior written permission of the publisher. IEEE Std 98-2002 (Revision of IEEE Std 98-1984 ) IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials Sponsor Standards Coordinating Committee 4 on Thermal Rating of the
5、IEEE Electrical Insulation Society Approved 13 May 2002 IEEE-SA Standards Board Abstract: Principles for the development of test procedures to evaluate the thermal endurance of solid electrical insulating materials in air are given in this standard. Keywords: diagnostic test, relative temperature in
6、dex, temperature index, thermal capability, thermal endurance IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus develop- ment proc
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22、er covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducti
23、ng inquiries into the legal validity or scope of those patents that are brought to its attention. -,-,- Copyright 2002 IEEE. All rights reserved. iii IEEE-SA Trademark Usage/Compliance Statement Proper usage of the trademark IEEE Std 98-2002 is mandatory and is to be followed in all references of th
24、e Standard. The mark IEEE is the registered trademark of the Institute of Electrical and Electronics Engi- neers, Inc., and must be used in bold type. It is to appear with the registered trademark symbol “” the fi rst time “ IEEE ” appears in the text. The use of “IEEE Std 98-2002” should include th
25、e trademark symbol “TM” (e.g., IEEE Std 98-2002 ) at least the fi rst time it is used in text, unless the number of the standard is also trademark registered (e.g., 98 ), then the symbol “” must be used. It is not permissible to use the standard number alone or with “ IEEE ” to indicate conformance
26、or compliance with the associated standard. The user of the Standard should contact the Manager, Standards Licensing and Contracts for information concerning issues regarding indicating product compliance with an IEEE standard. To represent that a product has been designed to meet an IEEE standard,
27、it is permissible to state that “the product has been engineered, designed or manufactured with the intent to meet the requirements of IEEE Std 98-2002 .” However, it is not permissible to state or refer to a product as “98 compliant,” “98 certifi ed,” “ IEEE 98 conformant,” “ IEEE 98 certifi ed,” o
28、r the like, unless the user has obtained a Certifi cation License from the IEEE. -,-,- iv Copyright 2002 IEEE. All rights reserved. Introduction (This introduction is not part of IEEE Std 98-2002, IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Insulating Mat
29、erials.) IEEE Std 98-1984 refl ected many of the concepts incorporated in IEC 60216-1974 while maintaining many of the practical considerations from the initial IEEE Std 98-1972. IEEE Std 98-2002 updates IEEE Std 98-1984 to incorporate additional changes in the IEC 60216 stan- dards and to introduce
30、 the Fixed Time Frame Method (FTFM) of sampling for the thermal evaluation of materials. Participants The revision to this standard was prepared by a working group of Standards Coordinating Committee 4 (SCC 4). Working group members were: S. J. Watson, Chair At the time this document was approved, t
31、he IEEE Standards Coordinating Committee 4 on Thermal Rating had the following membership: P. A. Payne, Chair R. J. Mayschak , Secretary The following persons were designated by SCC 4 as the balloting committee that approved this document for submission to the IEEE Standards Board. Balloters may hav
32、e voted for approval, disapproval, or abstention. R. J. MayschakP. A. Payne E. J. Van Vooren L. B. Wagenaar E. A. Boulter G. I. Duncan S. L. Dyrnes A. M. Iversen K. N. Mathes E. J. Van Vooren L. B. Wagenaar S. J. Watson R. F. Weddleton M. Winkeler E. A. Boulter J. L. Corkran G. I. Duncan F. J. Grysz
33、kiewicz A. M. Iversen R. P. Marek T. V. Oommen P. A. Payne L. W. Pierce L. B. Wagenaar Copyright 2002 IEEE. All rights reserved. v When the IEEE-SA Standards Board approved this standard on 13 May 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vice Chair Judith Gorman,
34、 Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Andrew D. Ickowicz IEEE Standards Project Editor Sid Bennett H. Stephen Berger Clyde R. Camp Richard DeBlasio Harold E. Epste
35、in Julian Forster* Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfi nger* Peter H. Lips Nader Mehravari Daleep C. Mohla William J. Moylan Malcolm V. Thaden Geoffrey O. Thompson Howard L. Wolfman Don Wright -,-,
36、- vi Copyright 2002 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 1 2.References 2 3.Definitions 2 4.General considerations. 3 4.1 Results of thermal endurance tests. 3 4.2 End-point criteria. 3 4.3 Test procedures and conditions 3 4.4 Variability 3 5.Use of thermal evaluation data 4 6.
37、Experimental procedure guidelines 4 6.1 Selection of test methods. 4 6.2 Selection of end-points 5 6.3 Preparation of test specimens. 5 6.4 Number of test specimens 5 6.5 Establishment of initial property value 6 6.6 Temperature exposures and times 6 6.7 Aging ovens. 6 6.8 Procedure for aging 7 7.Ev
38、aluation 8 7.1 Numerical analysis of thermal aging data 8 7.2 Times/temperatures to end-point criterion. 8 7.3 Extrapolation of the data 9 7.4 Determination of temperature index (TI). 10 7.5 Test report 11 Annex A (normative)Fixed time frame method (FTFM) of sampling. 12 Annex B (normative)Fixed tem
39、perature method of sampling 14 Annex C (informative)Bibliography. 16 -,-,- Copyright 2002 IEEE. All rights reserved. 1 IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials 1. Overview 1.1 Scope This standard gives principles for the
40、 development of test procedures to evaluate the thermal endurance of solid electrical insulating materials in air. The results of accelerated thermal endurance tests, which are con- ducted according to prescribed procedures, shall be used to establish temperature indexes (TIs) for insulating materia
41、ls. Thermal endurance tests and TIs can be used to provide relative comparisons between the thermal capability of new materials and older, more established materials. TIs, while giving guidance on materials, should not in themselves be taken to predict the relationship between temperature and life o
42、f an insulation material in service. Thermal endurance tests provide a means for determining the rate at which important properties of insulat- ing materials deteriorate irreversibly as a function of temperature and time. Such tests and the TIs derived from them can aid in selecting insulating mater
43、ials for use in electrical equipment operating under a wide variety of service conditions. The test procedures covered by this standard apply to solid insulating materials, including processed compo- sitions of raw materials, before they are fabricated into insulating structures identifi ed with spe
44、cifi c parts of electric equipment. Tests for specifi c types of insulating materials, such as wire enamel, varnish, sheet, tape, etc., are not within the scope of this standard; procedures should be developed for each specifi c type. The mechanical, chemical, and electrical properties of the materi
45、als when new should be evaluated separately by test methods not within the scope of thermal endurance test procedures. The properties so determined may indicate that one or more, or combinations of these, will be the limiting factor in a particular application rather than thermal endurance. These pr
46、ocedures may not apply to the aging characteristics of dielectric fl uids or of porous materials impregnated with dielectric fl uids. -,-,- IEEE Std 98-2002 TM IEEE STANDARD FOR THE PREPARATION OF TEST PROCEDURES FOR THE 2 Copyright 2002 IEEE. All rights reserved. A distinction between material test
47、s and tests to evaluate the performance of insulation systems is necessary because the details of the particular use of a material may not be known to its manufacturer. NOTEGeneral principles for designating the thermal capability of insulating systems are given in IEEE Std 1-2000 B4 1 . See also IE
48、EE Std 99-1980 B5 and IEC 60611-1978 B2. 2. References This standard shall be used in conjunction with the following publications. When the following standards are superceded by an approved revision, the revision shall apply. ASTM D5374-93 (1999), Standard Test Methods for Forced-Convection Laborato
49、ry Ovens for Evaluation of Electrical Insulation. 2 ASTM D5423-1993 (1999), Standard Specifi cation for Forced-Convection Laboratory Ovens for Evaluation of Electrical Insulation IEC 60216-2 (1990-06), Guide for the Determination of Thermal Endurance Properties of Electrical Insulat- ing Materials. Part 2: Choice of Test Criteria. 3 IEEE Std 101-1