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1、ANSI N42.44-2008 American National Standard for the Performance of Checkpoint Cabinet X-Ray Imaging Security Systems IEEE 3 Park Avenue New York, NY 10016-5997, USA 4 November 2008 Accredited by the American National Standards Institute Sponsored by the National Committee on Radiation Instrumentatio
2、n, N42 N42.44 Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not fo
3、r Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engin
4、eers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- ANSI N42.44-2008 American National Standard for the Performance of Checkpoint Cabinet X-Ray Imaging Securi
5、ty Systems Sponsor National Committee on Radiation Instrumentation, N42 Accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 4 August 2008 American National Standards Institute Authorized licensed use limited to: IHS Ste
6、phanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or netwo
7、rking permitted without license from IHS -,-,- Abstract: This document establishes standards for the technical performance of cabinet x-ray imaging systems used for screening at security checkpoints and other inspection venues. Keywords: cabinet x-ray, checkpoint, minimum performance The Institute o
8、f Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 4 November 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. P
9、atent +1-978-750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restricti
10、ons apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- Introduction This introduction is no
11、t part of ANSI N42.44-2008, American National Standard for the Performance of Checkpoint Cabinet X-Ray Imaging Security Systems. This standard is the responsibility of the Accredited American Standards Committee on Radiation Instrumentation, N42. The standard was approved by the N42 letter ballot of
12、 March 2008July 2008. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible fo
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17、s been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standard
18、s development process, visit the IEEE-SA web site at http:/standards.ieee.org. v Copyright 2008 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical an
19、d Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- Errata Errata, if any, for this and all other standards can be accessed at the followin
20、g URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called
21、to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifyin
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23、are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi C
24、opyright 2008 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP M
25、onitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- Participants At the time it approved this standard, the Accredited Standards Committee on Radiation Instrumentation, N42, had the following membership: Michael P. Unterw
26、eger, Chair Louis Costrell, Deputy Chair William Ash, Administrative Secretary Organization Represented.Name of Representative Bartlett Services .Morgan Cox Canberra Markku Koskelo Chew, M.H .Jack M. Selby Commerce Dept, U.S. NIST Michael P. Unterweger Louis Costrell (Alt.) Consultant Frank X. Masse
27、 Department of Homeland Security .Peter Shebell Entergy-ANO .Ron Schwartz Health Physics Society .Sandy Perle IEEE Louis Costrell .Anthony Spurgin (Alt.) .Michael P. Unterweger (Alt.) International Medcom Don Sythe Lawrence Berkeley National Lab .Edward J. Lampo Lawrence Livermore National Lab .Gary
28、 Johnson NASA, GSFC . R. Sachidananda Babu Nuclear Regulatory Commission Cynthia Jones Nuclear Standards Unlimited .Al N. Tschaeche Oak Ridge National Laboratory .Peter J. Chiaro, Jr. .Charles Britton (Alt.) ORTEC Ronald M. Keyser Pacific Northwest National Laboratory .Richard Kouzes Swinth Associat
29、es .Kenneth L. Swinth U.S. Army Edward Groeber U.S. Nuclear Regulatory CommissionCynthia G. Jones Members-At-Large .Ernesto Corte .Joseph C. McDonald .Paul L. Phelps .Joseph Stencel .Lee J. Wagner vii Copyright 2008 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus
30、. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitte
31、d without license from IHS -,-,- viii Copyright 2008 IEEE. All rights reserved. At the time this standard was completed, Subcommittee N42.HSI had the following membership: Morgan Cox, Co-Chair Michael P. Unterweger, Co-Chair Paul Bailey Peter J. Chairo, Jr. David Gilliam Mark Hoover Cynthia G. Jones
32、 Ronald Keyser Richard Kouzes Joseph C. McDonald Leticia Pibida Brian Rees Peter Shebell David Trombino At the time this standard was completed, the ANSI N42.44 Working Group had the following membership: Mike Barrientos, Chair Douglas Smith, Vice Chair Steve Brown Frank Cerra Todd Conway Andy Danci
33、sin Peter Edelstein Richard Eilbert John Ely Jack Fenwick Gordon Gillerman Kurt Fischer Scott Kravis James Lamers Art Mario Paul Mongeon Ed Ocker Harry Pak Fred Roder John Santos Stephen Seltzer Peter Stacey Doug Yatsuhashi Orie Zaklad Authorized licensed use limited to: IHS Stephanie Dejesus. Downl
34、oaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted witho
35、ut license from IHS -,-,- Contents 1. Overview 1 1.1 Scope. 2 1.2 Purpose 3 2. Normative references 3 3. Definitions 4 4. General considerations . 5 4.1 Special word usage 5 4.2 Environmental factors 5 4.3 Radiological safety 6 4.4 Electrical and mechanical safety 6 4.5 Electromagnetic compatibility
36、. 6 4.6 Limitation of x-ray exposure to photographic film 8 5. Imaging-performance evaluation procedures . 9 5.1 Imaging-performance test object. 9 5.2 Imaging-performance test procedure. 9 5.3 Imaging-performance evaluation considerations. 10 6. Minimum acceptable imaging performance. 10 Annex A (i
37、nformative) Test reports . 12 Annex B (informative) Human-factors engineering considerations. 17 ix Copyright 2008 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institu
38、te of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without license from IHS -,-,- Authorized licensed use limited to: IHS Stephanie Dejesus. Downloade
39、d on December 3, 2008 at 12:51 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 02/01/2009 01:22:12 MSTNo reproduction or networking permitted without l
40、icense from IHS -,-,- American National Standard for the Performance of Checkpoint Cabinet X-Ray Imaging Security Systems IMPORTANT NOTICE: This standard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible
41、 for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be
42、 found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview Numerous measures of imaging performance for x-ray screening systems ha
43、ve been defined over the past several years. For example, penetration, spatial resolution, and wire gauge diameter are well-known and frequently used measures for defining an x-ray systems imaging performance. ASTM F792-011 establishes nine tests to determine the performance levels of an x-ray syste
44、m. These tests have been widely accepted by the x-ray screening community, both manufacturers and users, and are adopted in this standard. This document establishes minimum performance requirements for the nine tests of the ASTM F792-01 test method as applied to checkpoint cabinet x-ray systems. A w
45、ell-defined test method and a set of minimum acceptable image-quality standards will provide value to both users and manufacturers of these x-ray imaging security systems. Manufacturers will have a better understanding of the needs, wants, and expectations of the user community and a clearer understanding of the minimum set of imaging goals. It is understood that some users will require image-quality standards higher than the minimum performance required in this standard. Additionally, this sta