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1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61000-4-24 Premire dition First edition 1997-02 Numro de rfrence Reference number CEI/IEC 61000-4-24: 1997 Compatibilit lectromagntique (CEM) Partie 4: Techniques dessai et de mesure Section 24: Mthodes dessais pour les dispositifs de protection po
2、ur perturbations conduites IEMN-HA Publication fondamentale en CEM Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 24: Test methods for protective devices for HEMP conducted disturbance Basic EMC publication Copyright International Electrotechnical Commission P
3、rovided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,- Validit de la prsente publication Le contenu technique des publications de la CEI est cons- tamment
4、revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfirmation de la publication sont disponibles auprs du Bureau Central de la CEI. Les renseignements relatifs ces rvisions, ltablis- sement des ditions rvises et aux amendements peuvent tre obtenu
5、s auprs des Comits nationaux de la CEI et dans les documents ci-dessous: Bulletin de la CEI Annuaire de la CEI Publi annuellement Catalogue des publications de la CEI Publi annuellement et mis jour rgulirement Terminologie En ce qui concerne la terminologie gnrale, le lecteur se reportera la CEI 50:
6、 Vocabulaire Electrotechnique Inter- national (VEI), qui se prsente sous forme de chapitres spars traitant chacun dun sujet dfini. Des dtails complets sur le VEI peuvent tre obtenus sur demande. Voir galement le dictionnaire multilingue de la CEI. Les termes et dfinitions figurant dans la prsente pu
7、bli- cation ont t soit tirs du VEI, soit spcifiquement approuvs aux fins de cette publication. Symboles graphiques et littraux Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le lecteur consultera: la CEI 27: Symboles littraux utiliser en lectrotec
8、hnique; la CEI 417: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles; la CEI 617: Symboles graphiques pour schmas; et pour les appareils lectromdicaux, la CEI 878: Symboles graphiques pour quipements lectriques en pratique mdicale. Les symboles e
9、t signes contenus dans la prsente publi- cation ont t soit tirs de la CEI 27, de la CEI 417, de la CEI 617 et/ou de la CEI 878, soit spcifiquement approuvs aux fins de cette publication. Publications de la CEI tablies par le mme comit dtudes Lattention du lecteur est attire sur les listes figurant l
10、a fin de cette publication, qui numrent les publications de la CEI prpares par le comit dtudes qui a tabli la prsente publication. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technolo
11、gy. Information relating to the date of the reconfirmation of the publication is available from the IEC Central Office. Information on the revision work, the issue of revised editions and amendments may be obtained from IEC National Committees and from the following IEC sources: IEC Bulletin IEC Yea
12、rbook Published yearly Catalogue of IEC publications Published yearly with regular updates Terminology For general terminology, readers are referred to IEC 50: International Electrotechnical Vocabulary (IEV), which is issued in the form of separate chapters each dealing with a specific field. Full d
13、etails of the IEV will be supplied on request. See also the IEC Multilingual Dictionary. The terms and definitions contained in the present publi- cation have either been taken from the IEV or have been specifically approved for the purpose of this publication. Graphical and letter symbols For graph
14、ical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications: IEC 27: Letter symbols to be used in electrical technology; IEC 417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets; IEC 617: Graphical sy
15、mbols for diagrams; and for medical electrical equipment, IEC 878: Graphical symbols for electromedical equipment in medical practice. The symbols and signs contained in the present publication have either been taken from IEC 27, IEC 417, IEC 617 and/or IEC 878, or have been specifically approved fo
16、r the purpose of this publication. IEC publications prepared by the same technical committee The attention of readers is drawn to the end pages of this publication which list the IEC publications issued by the technical committee which has prepared the present publication. Copyright International El
17、ectrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,- NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61000-4-24 Premire di
18、tion First edition 1997-02 Compatibilit lectromagntique (CEM) Partie 4: Techniques dessai et de mesure Section 24: Mthodes dessais pour les dispositifs de protection pour perturbations conduites IEMN-HA Publication fondamentale en CEM Electromagnetic compatibility (EMC) Part 4: Testing and measureme
19、nt techniques Section 24: Test methods for protective devices for HEMP conducted disturbance Basic EMC publication L Pour prix, voir catalogue en vigueur For price, see current catalogue CODE PRIX PRICE CODE IEC 1997 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cett
20、e publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or me
21、chanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission3, rue de Varemb Geneva, Switzerland Telefax: +41 22 919 0300e-mail: inmailiec.ch IEC web site http: /www.iec.ch Commission Electrotechnique Internationale Inter
22、national Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 61000-4-
23、24 CEI:1997 SOMMAIRE Pages AVANT-PROPOS4 INTRODUCTION.6 Articles 1 Domaine dapplication8 2 Rfrences normatives 8 3 Dfinitions.8 4 Mthodes dessai des dispositifs de protection pour perturbations conduites .8 4.1 Gnralits.8 4.2 Configuration dessai10 4.3 Gnrateur dimpulsions10 4.4 Ligne dmission 12 4.
24、5 Dispositifs/support dessai12 4.5.1 Gnralits .12 4.5.2 Dispositifs de type A .12 4.5.3 Dispositifs de type B .12 4.6 Charge .14 4.7 Oscilloscope.16 4.8 Procdure dessai 16 4.8.1 Rglage du gnrateur dimpulsions16 4.8.2 Procdures de vrification16 4.8.3 Essai.18 4.8.4 Dernier examen du DEE.18 4.9 Rfrenc
25、e la prsente norme .18 Annexe A Bibliographie 20 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,
26、- 61000-4-24 IEC:1997 3 CONTENTS Page FOREWORD.5 INTRODUCTION.7 Clause 1Scope .9 2 Normative references.9 3 Definitions.9 4 Test methods for protective devices for conducted disturbance9 4.1 General 9 4.2 Test set-up.11 4.3 Pulse generator11 4.4 Launching line13 4.5 Test fixture .13 4.5.1 General.13
27、 4.5.2 Type A fixtures13 4.5.3 Type B fixtures13 4.6 Termination15 4.7 Oscilloscope.17 4.8 Test procedure.17 4.8.1 Adjustment of the pulse generator17 4.8.2 Verification procedures.17 4.8.3 Test.19 4.8.4 Final examination of the DUT.19 4.9 Referring to this standard.19 Annex A Bibliography .21 Copyr
28、ight International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 61000-4-24 CEI:1997 COMMISSION LECTROTECHNIQUE INT
29、ERNATIONALE _ COMPATIBILIT LECTROMAGNTIQUE (CEM) Partie 4: Techniques dessai et de mesure Section 24: Mthodes dessai pour les dispositifs de protection pour perturbations conduites IEMN-HA Publication fondamentale en CEM AVANT-PROPOS 1)La CEI (Commission Electrotechnique Internationale) est une orga
30、nisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI
31、, entre autres activits, publie des Normes Internationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, particip
32、ent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2)Les dcisions ou accords officiels de la CEI concernant les questions techniques, reprsentent, dans la mesure du possib
33、le un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3)Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, rapports techniques ou guides et agrs comme tels
34、 par les Comits nationaux. 4)Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes nationales et rgionales. Toute divergence entre la norme CE
35、I et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5)La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un matriel est dclar conforme lune de ses normes. 6)Lattention est a
36、ttire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence. La N
37、orme internationale CEI 61000-4-24 a t tablie par le sous-comit 77C: Immunit limpulsion lectromagntique nuclaire haute altitude (HEMP), du comit dtudes 77 de la CEI: Compatibilit lectromagntique. Elle constitue la section 24 de la partie 4 de la norme CEI 61000. Elle a le statut de publication fonda
38、mentale en CEM en accord avec le Guide 107 de la CEI. Le texte de cette norme est issu des documents suivants: FDISRapport de vote 77C/37/FDIS77C/40/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Lannexe A est don
39、ne uniquement titre dinformation. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 08:08:19 MSTNo reproduction or networking permitted without license from IHS -,-,- 61000-4-24 IE
40、C:1997 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4: Testing and measurement techniques Section 24: Test methods for protective devices for HEMP conducted disturbance Basic EMC publication FOREWORD 1)The IEC (International Electrotechnical Commission) is a
41、 worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition t
42、o other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising wit
43、h the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2)The formal decisions or agreements of the IEC on technical matters express
44、, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3)The documents produced have the form of recommendations for international use and are published in the form of standard
45、s, technical reports or guides and they are accepted by the National Committees in that sense. 4)In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards
46、. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its s
47、tandards. 6)Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-24 has been prepared by subcommittee 77C: Immunity to high-altitude nuclear electromagnetic pulse (HEMP), of IEC technical committee 77: Electro- magnetic compatibility. It forms section 24 of part 4 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. The text of this standard is based