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1、IEEE Std 1671-2006 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML I E E E 3 Park Avenue New York, NY 10016-5997, USA 15 December 2006 IEEE Standards Coordinating Committee 20 Sponsored by the IEEE Standards Coord
2、inating Committee 20 on Test and Diagnosis for Electric Systems IEEE Std 1671 TM-2006 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Elec
3、tronic Systems (SCC20) Approved 15 September 2006 IEEE-SA Standards Board Abstract: This trial-use standard specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), usng the eXtensi
4、ble Markup Language (XML). Keywords: Automatic Test Equipment (ATE), Automatic Test Markup Language (ATML), ATML instance document, automatic test system (ATS), XML Schema _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the
5、Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 15 December 2006. Printed in the United States of America. IVI is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom us
6、e can also be obtained through the Copyright Clearance Center. -,-,- Introduction This introduction is not part of IEEE Std 1671, IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML. The benefits of using standards in
7、 test-related applications have long been recognized. The scope for standardization extends from low-level standards associated with test instrument control to high-level standards associated with specifying tests in an implementation-independent manner. In the 1960s, Aeronautical Radio, Incorporate
8、d (ARINC) started the development of the Abbreviated Test Language for Avionics Systems. In 1976, management of the ATLAS Standard was passed to the IEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect its broader field of applications. Within the IEEE, dev
9、elopment of ATLAS and ATLAS-related standards was vested in an ad hoc committee, which later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid- 1980s, SCC20 broadened the scope of its activities to embrace other standards projects related to test and diagnosis, including Automa
10、tic Test Program Generation (ATPG), Test Equipment Description Language (TEDL), Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), A Broad Based Environment for Test (ABBET), Software Interface to Maintenance Information and Collection Analysis (SIMICA), Receiver/
11、Fixture Interface (RFI), Signal and Test Definition (STD), and Automatic Test Markup Language (ATML). This standard provides the framework for a family of standards providing specifications for test-related applications and environments. This family specifies language-independent elements within a w
12、ide variety of test environments, including built-in test (BIT) systems, automatic test systems (ATS), and manual test environments. Each of these interfaces is specified in the form of a XML schema. XML schemas define the basic information required within any test application and provide a vehicle
13、for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML components standards, within the ATML framework, define the particular
14、 requirements within the test environment. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations C
15、urrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. iv Copyright 2006 IEEE. All rights reserved. -,-,- Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by p
16、atent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standa
17、rd or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Publication of this trial-use standard for comment and criticism has been approved by the IEEE. Trial-Use standards are effective for 24 months from the date of publication. Comments f
18、or revision will be accepted for 18 months after publication. Suggestions for revision should be directed to the Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, and should be received no later than . It is expected that following the 24-month period, this
19、 trial-use standard, revised and balloted as necessary, shall be submitted to the IEEE-SAStandards Board for approval as a full-use standard. v Copyright 2006 IEEE. All rights reserved. Participants At the time this trial-use standard was completed, the Test Information Integration (TII) Subcommitte
20、e had the following membership: Chris Gorringe, Co-Chair Mike Seavey, Co-Chair Hakan Akgun Anthony Alwardt Jack Amsell David Barton Keith Beard Michael Bodkin Malcolm Brown Antonius Bunsen Darryl Busch Carl Byington Giampiero Casalegno Steve Cmiel Kevin Coggins Matt Cornish Bernard Dathy Timothy Dav
21、is David Droste James Dumser Tamara Einspanjer William Eklow Keith Ellis Leo Errico Oscar Fandino Jennifer Fetherman Ken Finklea Melissa Ford Robert Fox Brit Frank Thomas Gaudette Thomas Gauntner Scott Gearhart George Geathers Anthony Geneva William E. Gerstein Sudipto Ghoshal Gerald Goldemund Arnol
22、d Greenspan Kyle Gupton Arthur Hann Michelle Harris Michael Harrison Robert Hayes Alicia Helton Hans Hopf Ashley M. Hulme Ivor Isaacs Anand Jain Patrick Kalgren John Knowles Guy Larcom Phillip Liang Jay Lindsey Teresa P. Lopes Kenneth Lynch Michael Malesich David Mills Scott Misha Mukund U. Modi Ion
23、 A. Neag Angela Nielson Steven ODonnell Leslie A. Orlidge Stephen A. Osella Dan Pleasant Hugh Pritchett John E. Ralph Narayanan Ramachandran Rabindranath Raul Peter Richardson Robert A. Robinson David A. Rohacek John Rosenwald William Ross Paul Salopek Edward Sanchez Thomas Sarfi Howard Savage David
24、 Sharone John W. Sheppard Henry Silcock Roger J. Sowada Joseph J. Stanco Michael Stora Walter Struppler Ronald G. Taylor Siow-khiang Tech Hael Thibeault David Thomas Kirk Thompson Vincent Tume Joerg Urban Brian Vestyck David Walihermfechtel Timothy Wilmering Vernon Woodward vi Copyright 2006 IEEE. A
25、ll rights reserved. The following members of the balloting committee voted on this trial-use standard. Balloters may have voted for approval, disapproval, or abstention. Ali Al Awazi William A. Byrd Danila Chernetsov Keith Chow Ryon K. Coleman Tommy P. Cooper Thomas J. Dineen James Dumser Heiko Ehre
26、nberg Tamara Einspanjer Andrew C. Fieldsend William B. Frank Ignacio Marin Garcia Thomas Gaudette William E. Gerstein Chris C. Gorringe Randall C. Groves Werner Hoelzl Dennis Horwitz Ashley M. Hulme Anand Jain Alan G. Jensen Piotr Karocki Mark J. Knight John Knowles Yeou Song Lee Adam W. Ley Teresa
27、P. Lopes G. L. Luri Mark F. Mcgranaghan Gary L. Michel Scott Misha William J. Mitchell Mukund U. Modi Ion A. Neag Jay J. Nemeth-Johannes Michael S. Newman Charles Kamithi Negethe Leslie A. Orlidge Stephen A. Osella Donald M. Parker Ulrich Pohl Vikram Punj John E. Ralph Gordon D. Robinson Robert A. R
28、obinson David A. Rohacek Randall M. Safier Bartien Sayogo Thomas Schossig Mike Seavey John W. Sheppard Roger J. Sowada Jospeh J. Stanco Walter Struppler Ronald G. Taylor Vincent J. Tume Srinivasa R. Vemuru Oren Yuen When the IEEE-SA Standards Board approved this trial-use standard on 15 September 20
29、06, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johns
30、on Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards
31、 Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Don Messina IEEE Standards Project Editor William Ash IEEE Standards Program Manager, Technical Program Development vii Copyright 2006 IEEE. All rights reserved. Contents
32、 1. Overview 1 1.1 Scope. 1 1.2 Purpose 1 1.3 Application 2 1.4 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 3 3.1 Definitions. 3 3.2 Acronyms and abbreviations . 5 4. Automatic Test Markup Language. 6 4.1 Background 6 4.2 Purpose 6 4.
33、3 ATML and the product life cycle 6 4.4 ATML framework . 9 4.5 Specification techniques 11 4.6 ATML component standards. 13 4.7 XML schema names and locations 15 5. Conformance 16 6. Extensibility 16 Annex A (normative) XML schema style guidelines. 17 Annex B (normative) ATML common element schemas.
34、 25 Annex C (informative) Architecture examples. 78 Annex D (informative) Glossary 84 Annex E (informative) Bibliography 87 viii Copyright 2006 IEEE. All rights reserved. IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information vi
35、a XML 1. 1.1 1.2 Overview The family of Automatic Test Markup Language (ATML) standards is being developed under the guidance of the Test Information Integration (TII) subcommittee of the IEEE Standards Coordinating Committee 20 (SCC20) to serve as standards for product test. The ATML family of stan
36、dards specifies a comprehensive environment for integrating design data, test strategies and requirements, test procedures, test results management, and test system implementations. The family of ATML standards includes reference to IEEE Std 1232TM (AI-ESTATE), IEEE P1636TM (SIMICA), IEEE Std 1522TM
37、 (Testability and Diagnosability Characteristics and Metrics), and IEEE Std 1641TM (STD). These referenced IEEE standards are therefore part of the ATML family.1 Scope ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information inclu
38、des test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards. Purpose The purpose of ATML is to support test program, test asset, and Unit Under Test
39、 (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidan
40、ce for usage of the ATML family of standards. 1 Information on references can be found in Clause 2. 1 Copyright 2006 IEEE. All rights reserved. IEEE 1671-2006 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML 1.3 1.
41、3.1 1.4 Application This trial-use standard provides an overview of the ATML family of standards for developing the following: a) ATML-conformant systems. b) Design data for use in test. c) ATML environment for tools. d) Shared usage of maintenance data and the results of testing. Users Anticipated
42、users of the ATML family of standards include the following: a) UUT developers. b) UUT maintainers. c) Test Program Set (TPS) developers. d) TPS maintainers. e) Automatic Test Equipment (ATE) system developers. f) ATE system maintainers. g) Test instrument developers. h) Developers of ATML-based too
43、ls and systems. i) Developers of prime mission equipment that use the supported UUT as a component. Conventions used within this document This trial-use standard presents an overview (background and purpose) of ATML, how ATML applies to the life cycle of a product, and defines the ATML framework. Th
44、is trial-use standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of definitions, except for those portions quoted from standards, the following precedence shall be observed: (1) Clause 3, (2) Annex E, and (3) The Authoritative Dictionary of IEEE Standards Ter
45、ms B3.2 For clarity, portions of IEEE Std 1232, IEEE Std 1522, IEEE P1636, and IEEE Std 1641 have been repeated within this trial-use standard. In the event of revision to these standards, the current, approved version of that IEEE standard takes precedence. 2 The numbers in brackets correspond to t
46、hose of the bibliography in Annex E. 2 Copyright 2006 IEEE. All rights reserved. IEEE 1671-2006 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML 3 Copyright 2006 IEEE. All rights reserved. 2. Normative references T
47、he following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEEE P1636TM (Draft 0.2), IEEE Stand
48、ard for Software Interface to Maintenance Information and Collection Analysis (SIMICA). 3, 4, 5 IEEE Std 1232TM -2002, IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE). IEEE Std 1522TM -2004, IEEE Trial-Use Standard for Testability and Diagnosab
49、ility Characteristics and Metrics. IEEE Std 1641TM -2004, IEEE Standard for Signal and Test Definition (STD). 3. Definitions, acronyms, and abbreviations 3.1 Definitions For the purposes of this trial-use standard, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standards Terms B3 should be referenced for terms not defined in this clause. In the event a term is explicitly redefined, or further defined in an ATML comp