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1、IEEE Std 1302-2008 (Revision of IEEE Std 1302-1998) IEEE Guide for the Electromagnetic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz IEEE 3 Park Avenue New York, NY 10016-5997, USA 9 February 2009 IEEE Electromagnetic Compatibility Society Sponsored by the Standards D
2、evelopment Committee 1302 TM Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1
3、111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and
4、Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std 1302-2008 (Revision of IEEE Std 1302-1998) IEEE Guide for the Electromagnetic Ch
5、aracterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 10 November 2008 IEEE-SA Standards Board Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23
6、, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS
7、 -,-,- Abstract: Information to assist users of gaskets in evaluating gasket measurement techniques to determine which exhibit the properties critical to the intended application, to highlight limitations and sources of error of the competing measurement techniques, and to provide a basis for compar
8、ing the techniques is provided in this guide. Emphasis is placed on those measurement techniques that have been adopted through incorporation into standards, both commercial and military, or that have been used extensively. Keywords: aperture transmission, electromagnetic shielding, EMI gaskets, mea
9、surement techniques, reverberation chamber, shielding effectiveness, stirred mode, transfer impedance The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2009 by the Institute of Electrical and Electronics Engineers, Inc. All rights reser
10、ved. Published 9 February 2009. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorize
11、d licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 0
12、4:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- Introduction This introduction is not part of IEEE Std 1302-2008, IEEE Guide for the Electromagnetic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz. An EMI gasket is a conductive material
13、 used to improve the electrical bonding between metallic parts of an electronic chassis, equipment enclosure, or electromagnetic shield. A wide variety of materials and techniques is used to produce EMI gaskets. The effectiveness of gaskets in the closing of seams and joints is dependent upon the pr
14、operties of the gasket and the method of installation. Several techniques are available to measure the electromagnetic properties of EMI gaskets. Unfortunately, measurement results are often inconsistent between techniques. This guide provides guidance on the use of recognized techniques for the ele
15、ctromagnetic performance characterization of EMI gaskets. It does not recommend one technique over another. It is recognized that some or all of the “alternative” techniques may, at some time in the future, become widely accepted and practiced. At such time, the guide will be revised to reflect thei
16、r adoption. It is also recognized that efforts are currently underway to revise the measurement techniques currently covered in this guide. These revisions will be included in future updates of this document. The theory of gasket behavior given in this guide is highly simplified and is intended to i
17、llustrate primary principles only. For a greater understanding of the electromagnetic interactions occurring in a gasketed joint, the reader is advised to consult the many excellent mathematical treatments in books and papers available through the IEEE and other technical publishers. Notice to users
18、 Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the appli
19、cable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety
20、of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self- regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users
21、, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, iv Copyrig
22、ht 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monito
23、ring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- v Copyright 2009 IEEE. All rights reserved. corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together wit
24、h any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/stan
25、dards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the
26、 following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention i
27、s called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identif
28、ying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreemen
29、ts are reasonable or non- discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Par
30、ticipants At the time this guide was completed, the Electromagnetic Characterization of Conductive Gaskets Working Group had the following membership: Johan Catrysse, Chair Christian Brull Joseph E. Butler, Jr. Chris Cook Johan Deschacht Fumi Enolo Gary Fenical Steve Frierson Harry Fuerhaupter Dave
31、Garagnani Michael O. Hatfield William Hoge Shane Hudak George M. Kunkel Ross Livington Michael Oliver Joe Rowan Robert Welch Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical
32、 and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- The following members of the individual balloting committee voted on this guide. Bal
33、loters may have voted for approval, disapproval, or abstention. Jacob Ben Ary David Baron Michael Brown Johan A Catrysse F A Denbrock Carlo Donati Randall Groves Edward Hare David Hess Werner Hoelzl Daniel Hoolihan Sergiu Iordanescu Efthymios Karabetsos Arthur Light Jon Martens Gary Michel Michael S
34、. Newman Cam Posani John Vergis Barry Wallen When the IEEE-SA Standards Board approved this guide on 10 November 2008, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeBlasio Andy Drozd Mark
35、Epstein Alexander Gelman William Goldbach Arnie Greenspan Ken Hanus Jim Hughes Richard Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ron Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sahazizian Malcolm Thaden Howard Wolfman Don Wright
36、 *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael Janezic, NIST Representative Lisa Perry IEEE Standards Project Editor Bill Ash IEEE Standards Program Manager, Technical Program Development vi Copyright 2009
37、IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/111
38、1111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- Contents 1. Overview 1 1.1 Background 1 1.2 Scope . 2 1.3 Purpose 2 2. Normative references 3 3. Acronyms and abbreviations clause . 3 4. Factors affecting gasket performance . 4 5.
39、Gasket measurement techniques . 6 6. Standardized gasket measuring techniques. 7 6.1 Transfer impedanceSAE ARP 1705-2006 (Rev. A) 7 6.2 Relative aperture transmission . 10 7. Alternative techniques, derived from standardized methods 13 7.1 General 13 7.2 Effective transmission aperture . 13 7.3 Slot
40、 aperture . 14 7.4 (Nested) reverberation chambers . 15 8. Alternative, non-standardized methods 18 8.1 General 18 8.2 Far-field TEM-t fixture 18 8.3 Near-field H-t fixture . 20 8.4 DC resistance measurement . 21 9. Selecting a gasket measurement technique . 21 9.1 General 21 9.2 Measurement referen
41、ce 21 9.3 Sample configuration . 22 9.4 Frequency range 22 9.5 Dynamic range . 23 9.6 Other considerations 24 10. Repeatability and measurement uncertainty . 24 10.1 Repeatability 24 10.2 Measurement uncertainty . 25 vii Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: I
42、HS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction o
43、r networking permitted without license from IHS -,-,- viii Copyright 2009 IEEE. All rights reserved. 11. Test plan . 26 11.1 General 26 11.2 Test plan parameters to be defined 26 11.3 Calibration . 26 11.4 Reference level and dynamic range . 26 12. Technical report 27 12.1 General 27 12.2 Status let
44、ter 27 12.3 Full test report 27 Annex A (normative) Summary of measuring techniques for gasket . 29 Annex B (normative) Introduction to the electromagnetic behavior of gasketed joints . 31 Annex C (informative) Detailed tabulation of standardized aperture transmission methods . 37 Annex D (informati
45、ve) Some in-depth discussion on the use of reverberation chambers 40 Annex E (informative) Test methods for on-board gasket applications . 42 Annex F (informative) Bibliography 45 Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 23, 2009 at 09:26 from IEEE Xplore. Re
46、strictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 04:30:59 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Guide for the Electromag
47、netic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz IMPORTANT NOTICE: This standard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, s
48、ecurity, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/discla