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1、 The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1997 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1997. Printed in the United States of America. ISBN 1-55937-915-4 No part of th
2、is publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 993-1997 IEEE Standard for Test Equipment Description Language (TEDL) Sponsor The TEDL Subcommittee of Standards Coordinating Committee 20 App
3、roved 20 March 1997 IEEE Standards Board Abstract: A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be u
4、sed to describe instrumentation in non-ATLAS environments. Keywords: adaptation model, ATE, Automatic Test Equipment, ATLAS, configuration model, de- vice model, TEDL, Test Equipment Description Language IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinat- in
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15、y that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents f
16、or which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. iii Introduction This introduction is not a part of IEEE Std 993-1997, IEEE Standard for Test Equipment Description Lan- guage (TEDL
17、). The purpose of the Test Equipment Description Language (TEDL) is to provide a means of producing a standardized description of the equipment on which Automatic Test Equipment (ATE) independent test pro- grams such as Abbreviated Test Language for All Systems (ATLAS) and A Broad-Based Environment
18、for Test (ABBET) programs are to be implemented. This makes visible the underlying decisions affecting the actual implementation and performance of the ATE independent test program, thereby improving the ability to transport test programs from one ATE to another. The implementation of ATLAS test pro
19、grams on ATE has traditionally been a difcult process. ATE-specic constraints such as Input/Output pins, interfacing circuitry, system level accuracies, device capabilities, and timing, are imposed by the unique software implementations of each ATE integrator/developer. Therefore, it has been virtua
20、lly impossible to move an ATLAS test program from one ATE to another with any assurance of compatible or similar results. The ATLAS language was created with the goal of being test equipment independent, with the intentions of being able to generate a test program once, being able to use it on a var
21、iety of test equipment; and to have a usable standard industry test language. Since IEEE Std 1226.2-1993, IEEE ABBET Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET) is based on ATLAS, it also has this test equipment independent goa
22、l. Therefore, subsequent references to ATLAS shall be understood to refer to ABBET as well. The unit under test (UUT) orientation of ATLAS test programs has left many implementation problems open to resolution by each ATE integrator/developer. As a result, the implemented ATLAS language semantics ha
23、ve become confused and the meaning of the language has become ambiguous. This ambiguity has restricted the ATLAS portability. Further, these implementation decisions have typically been buried in the proprietary software of each integrator and hence cannot be corroborated by ATLAS test program devel
24、opers. TEDL does not attempt to specify the underlying software system that supports and controls the ATE. This innovative process is left to the ATE integrator/developer. TEDL standardizes the human-readable language used to describe the ATE and test program adapters. Although anyone involved in au
25、tomated instrumentation may benet from the material contained in this document, this standard is specically intended for: a)ATE integrators/developers using ATLAS, namely: 1)IEEE Std 716-1995, IEEE Standard Test Language for All SystemsCommon Abbreviated Test Language for All Systems (C/ATLAS) 2)ARI
26、NC Specication 626-3-1995, Standard ATLAS Language for Modular Test b)ATLAS/ABBET Test Program Set developers c)System software suppliers d)ATE integrators/developers using ABBET, i.e., IEEE Std 1226.2-1993, IEEE ABBET Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad
27、-Based Environment for Test (ABBET). iv This standard was prepared by the Test Equipment Description Language Subcommittee of IEEE SCC 20. At the time this standard was completed, the TEDL Subcommittee had the following membership: Michael Blair, Chair Other individuals who contributed review and co
28、mments are: The following persons were on the balloting committee: Jack Cross Brit Frank Ira Lieberman James Nagy William Reeves David Roggendorff Jay Romania Roger Williams G. Adam J. Barbier L. Bianchi A. Bridges R. Brooks T. Campbell E. Cashar R. Churcher J. Cottrell G. Darnell B. Dinklage B. Dug
29、as K. Ellis H. Ey A. Greenspan W. Grifn A. Hann J. Hanna G. Hardenburg D. Hart R. Hayes L. Haynes J. Heiser R. Hillman G. Hinkle G. Jenkins L. Larsson J. Leuthe P. Lord M. Martin G. Matysek R. McGarvey H. McGuckin J. Mills C. Morris D. Morris D. Nichols H. Obermeier C. Oliverio J. Pfalz J. Pouilly N
30、. Ramachandran M. Ray J. Reeder R. Rolfe A. Sanson M. Seavey L. Shombert W. Simpson P. Smith J. Stanco W. Taylor M. Thullen R. Weger D. Weiss K. Wilkinson G. Wright W. Young J. Zeigler J. Pfalz J. Pouilly N. Ramachandran M. Ray J. Reeder W. Reeves D. Roggendorff R. Rolfe J. Romania A. Sanson M. Seav
31、ey L. Shombert W. Simpson P. Smith J. Stanco D. Stinson W. Taylor V. Terpstra M. Thullen R. Weger D. Weiss K. Wilkinson R. Williams G. Wright W. Young J. Zeigler G. Hardenburg D. Hart R. Hayes L. Haynes J. Heiser R. Hillman G. Hinkle G. Jenkins S. Karlovic H. Kaunzinger L. Larsson J. Leuthe I. Liebe
32、rman P. Lord M. Martin G. Matysek R. McGarvey H. McGuckin J. Mills C. Morris D. Morris J. Nagy D. Nichols H. Obermeier C. Oliverio G. Adam J. Barbier J. Barkley L. Bianchi M. Blair I. Bordignon A. Bridges R. Brooks T. Campbell E. Cashar S. Chapman P. Chassard R. Churcher F. Conforti J. Cottrell J. C
33、ross G. Darnell B. Dinklage B. Dugas K. Ellis H. Ey B. Frank A. Greenspan W. Grifn A. Hann J. Hanna v When the IEEE Standards Board approved this standard on 20 March 1997, it had the following membership: Donald C. Loughry, Chair Richard J. Holleman, Vice Chair Andrew G. Salem, Secretary *Member Em
34、eritus Also included are the following nonvoting IEEE Standards Board liaisons: Satish K. Aggarwal Alan H. Cookson Kim Breitfelder IEEE Standards Project Editor Clyde R. Camp Stephen L. Diamond Harold E. Epstein Donald C. Fleckenstein Jay Forster* Thomas F. Garrity Donald N. Heirman Jim Isaak Ben C.
35、 Johnson Lowell Johnson Robert Kennelly E. G. Al Kiener Joseph L. Koepnger* Stephen R. Lambert Lawrence V. McCall L. Bruce McClung Marco W. Migliaro Louis-Franois Pau Gerald H. Peterson John W. Pope Jose R. Ramos Ronald H. Reimer Ingo Rsch John S. Ryan Chee Kiow Tan Howard L. Wolfman vi Contents 1.O
36、verview 1 1.1 Scope 1 1.2 Purpose. 1 1.3 Application. 1 1.4 Relationship to other documents 2 2.References 2 3.Terminology. 3 3.1 Definitions 3 3.2 Acronyms. 4 3.3 TEDL reserved words 4 4.TEDL overview . 10 4.1 TEDL objectives 10 4.2 TEDL description. 10 5.Interface to the ATLAS test program 15 5.1
37、Introduction 15 5.2 ATLAS-to-TEDL correspondence. 15 5.3 Extensibility. 15 5.4 Examples 15 6.Adaptation model (AM). 19 6.1 General description 19 6.2 Relationship to other models . 19 6.3 Adaptation model language (AML). 19 6.4 AML rules 21 7.Configuration model (CM) 22 7.1 General description 22 7.
38、2 Relationship to other models . 22 7.3 Configuration model language (CML) 22 7.4 CML rules 23 8.Device model (DM). 24 8.1 General description 24 8.2 Relationship to other models . 24 8.3 Device model language (DML).24 8.4 DML rules 26 Annex A (normative) Complete formal syntax of TEDL 27 A.1TEDL fo
39、rmal syntax27 A.2TEDL syntax diagrams 44 Authorized licensed use limited to: IEEE Xplore. Downloaded on December 3, 2008 at 07:03 from IEEE Xplore. Restrictions apply. vii Annex B (informative) Examples 55 B.1Annex overview. 55 B.2ATLAS test program 55 B.3ATE schematic. 58 B.4Adapter schematic 59 B.
40、5TEDL models. 60 1 IEEE Standard for Test Equipment Description Language (TEDL) 1. Overview 1.1 Scope This standard is intended to apply principally to Automatic Test Equipment (ATE) applications using Abbre- viated Test Language for All Sytems (ATLAS) test programs. The standard may also apply to A
41、TE applica- tions using non-ATLAS test programs. 1.2 Purpose The purpose of this standard is to provide a denition of a Test Equipment Description Language (TEDL). The denition consists of syntax and semantic rules for the language together with examples of its use. 1.3 Application A TEDL model is a
42、 mechanism for describing the conguration and capability of a specic ATE (and adapter) and for facilitating the implementation of unit under test (UUT) orientated test programs on the ATE. Specically it describes: a)The devices included in an ATE and the devices included in an adapter. b)How these d
43、evices are interconnected within the ATE and within the adapter. c)What interfaces exist between the test station controller and the devices as well as between the devices and an external connection. d)The capabilities of the ATE devices and how these devices are programmed to provide the desired te
44、st functions. TEDL is not intended to be a programming language. It is intended that it be used to establish a data struc- ture representing the ATE and adapter. Some of its data elements may be dynamic, requiring processing as the state of the system changes. The TEDL model lls the information gap
45、between the ATLAS test program and the physical instrumentation. Compliance to this standard does not remove user responsibility for system compatibility at either the appli- cation or physical communication level. Although it is the intent of this standard to simplify the system inte- gration, the
46、user must be familiar with the characteristics of all the system components in order to congure an optimum ATE. Authorized licensed use limited to: IEEE Xplore. Downloaded on December 3, 2008 at 07:03 from IEEE Xplore. Restrictions apply. IEEE Std 993-1997IEEE STANDARD FOR TEST EQUIPMENT 2 1.4 Relat
47、ionship to other documents a) IEEE Std 716-1995 and ARINC Specication 626-3-1995 . The companion standards IEEE Std 716- 1995 and ARINC Specication 626-3-1995 dene the ATLAS test language that is used to write ATLAS test programs. TEDL provides all test system information necessary to perform automa
48、tic and manual resource allocation for ATLAS test programs. b) Test resource control standards. A test resource control standard denes the physical, electrical, and logical aspects of the control interface between the test station controller and an instrument. The fol- lowing control interfaces are
49、supported by TEDL and are described in 3.3: 488.1 488.2 Ethernet RS-232 VXI c) IEEE Std 1226.2-1993 . This standard species Ada packages that dene general purpose test sup- port services and data types needed to complete the denition and implementation/application of the other IEEE ABBET component standards. 2. References This standard shall be used in conjunction with the following publications. When the following standards are superseded by an approved revision, the revision will be considered for incorporation into this standard. ARINC S