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1、IEEE Std 1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL) I E E E 3 Park Avenue New York, NY 10016-5997, USA 5 April 2006 IEEE Computer Society Sponsored by the Test Technology Standards Committee Copyright The Institute of Electrical and
2、Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provid
3、ed by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE Std 1450.6-2005 IEEE Standard Test Interface Language
4、(STIL) for Digital Test Vector DataCore Test Language (CTL) Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 29 December 2005 American National Standards Institute Approved 17 November 2005 IEEE-SA Standards Board Copyright The Institute of Electrical and Electronics
5、 Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY
6、 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 5 April 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any indi- vidual
7、 standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with
8、respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its a
9、ttention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- ivCopyright 2006 IEEE. A
10、ll rights reserved. Introduction CTL started as a language in the IEEE Std 1500TM-2005 standardization activity for core test. This activity provided a representation mechanism for test information that exchanges hands between a core provider and the system integrator. Thus, the language had a chart
11、er to provide a mechanism for reuse of test patterns and information that allows for successful design for test and automatic test pattern generator activities on the SoC. As part of IEEE Std 1500-2005, CTL was designed to represent details about the IEEE 1500 wrapper. As CTL and the wrapper technol
12、ogy matured, it became apparent that the two activities should be separated into two standard documents. As a result of this decision, CTL, the language, became IEEE Std 1450.6 activity, and the information model for cores that uses CTL remained in IEEE Std 1500-2005. Notice to users Errata Errata,
13、if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standar
14、ds.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent r
15、ights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participa
16、nts The following is a list of participants in the CTL Working Group: Rohit Kapur, Chair When the CTL Working Group approved this standard, it had the following short-term membership: Mike Collins Douglas Kay Brion KellerMaurice Lousberg Paul Reuter Bill ChownYuhai Ma This introduction is not part o
17、f IEEE Std 1450.6-2005, IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL). Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21
18、/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2006 IEEE. All rights reserved.v The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention: When the IEEE-SA
19、Standards Board approved this standard on 17 November 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Agga
20、rwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Jennie M. Steinhagen IEEE Standards Project Editor Ken-ichi Anzou Luis Basto Sudipta Bhawmik Dwayne Burek Chen-Huan Chiang Keith Chow Bill Chown Antonio M. Cicu Luis Cordova Jason Doege Geir Eide Grady
21、 Giles Alan Hales Peter Harrod Mitsuaki Ishikawa Rohit Kapur Jake Karrfalt Douglas Kay Brion Keller Adam Ley Dennis Lia Maurice Lousberg Yuhai Ma Ryan Madron Erik Jan Marinissen Denis Martin Gregory Maston Yinghua Min Mehdi Mohtashemi James Monzel Narayanan Murugesan Benoit Nadeau-Dostie Charles Nge
22、the Jim OReilly Adam Osseiran Klaus Rapf Paul Reuter Mike Ricchetti Gordon Robinson Gil Shultz Douglas E. Sprague Tony Taylor Tom Waayers Gregg Wilder T. W. Williams Li Zhang Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond H
23、apeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman Copyright The Institute of Electrical
24、and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- viCopyright 2006 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Ge
25、neral. 1 1.2 SoC flow 2 1.3 Scope 4 1.4 Purpose. 4 1.5 Limitations of this standard . 4 1.6 Structure of this standard. 5 2.Normative references. 5 3.Definitions, acronyms, and abbreviations 6 3.1 Definitions . 6 3.2 Acronyms and abbreviations . 6 4.CTL orientation and capabilities tutorial. 7 4.1 I
26、ntroduction 7 4.2 CTL for design configurations. 8 4.3 CTL for structural information 16 4.4 CTL for test pattern information 21 4.5 Beyond the examples. 26 5.Extensions to IEEE Std 1450-1999 and IEEE Std 1450.1-2005 . 27 5.1 STIL name spaces and name resolution 27 5.2 Optional statements of IEEE St
27、d 1450-1999. 27 5.3 Restricting the usage of SignalGroup and variable names 27 5.4 Additional reserved words. 28 5.5 STIL statementextensions to IEEE Std 1450-1999, Clause 8 . 28 5.6 Extensions to IEEE Std 1450-1999, 17.1 and 23.1 29 5.7 Extensions associated with the LockStep construct of Clause 13
28、 of IEEE Std 1450.1-2005 32 6.Design hierarchycores 36 6.1 CoreType block and CoreInstance statement 36 6.2 CoreType block syntax descriptions 36 6.3 CoreType block code example 37 7.Cell expression (cellref_expr) 38 8.Environment blockextensions to IEEE Std 1450.1-2005, Clause 17 39 8.1 General. 39
29、 8.2 Definition of FileReference keywords. 39 8.3 Example of Environment block FileReference syntax 43 8.4 Extension to NameMaps 43 8.5 Extension to the inheritance of environment statements. 44 9.CTLMode block. 45 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS
30、 under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2006 IEEE. All rights reserved.vii 9.1 General. 45 9.2 CTLMode syntax. 45 9.3 CTLMode blocksyntax description
31、s 47 9.4 CTLMode block syntax example. 53 10.CTLModeInternal block 56 10.1 General. 56 10.2 Internal syntax 56 10.3 Internal block syntax descriptions . 60 10.4 Internal BlockSyntax examples. 76 11.CTLModeScanInternal block 79 11.1 General. 79 11.2 ScanInternal syntax 79 11.3 ScanInternal block synt
32、ax descriptions 81 11.4 ScanInternal block syntax example . 81 12.CTLModeCoreInternal block 83 12.1 General. 83 12.2 CoreInternal syntax 83 12.3 CoreInternal block syntax descriptions 84 12.4 CoreInternal block syntax examples 84 13.CTLModeRelation Block 85 13.1 General. 85 13.2 Relation syntax 85 1
33、3.3 Relation block syntax descriptions 85 13.4 Relation block syntax example 87 14.CTLModeScanRelation block . 89 14.1 General. 89 14.2 ScanRelation syntax. 89 14.3 ScanRelation block syntax descriptions 89 15.CTLModeExternal block. 89 15.1 General. 89 15.2 External statement syntax 90 15.3 External
34、 block syntax descriptions 90 15.4 External block syntax example 93 16.CTLModePatternInformation block 93 16.1 PatternInformation syntax 93 16.2 PatternInformation block syntax descriptions . 96 16.3 PatternInformation block syntax example. 104 Index . 109 Copyright The Institute of Electrical and E
35、lectronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provide
36、d by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2006 IEEE. All rights reserved.1 IEEE Standard Test Interface Language (STIL) for Digital Test Vector
37、 DataCore Test Language (CTL) 1. Overview 1.1 General The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the lar
38、ger design is commonly called a core and the larger design is commonly called the SoC. The core is a design provided by a core provider, and the task of incorporating the sub-design into the SoC is called Core System Integration. CTL is a language designed to be the transfer mechanism of test knowle
39、dge between a core provider and a system integrator to allow for interoperability between the producer and the consumer of the information. It facilitates the reuse of test patterns provided for a core for application from the SoC boundary. Although the language is general (the limitations of CTL ar
40、e listed in 1.5) and can be used in many different ways, this standard is focused on the use of CTL for SoC designs. Thus, CTL allows for a)Representation of design constructs and characteristics that are needed to be made visible by the core provider. b)Representation of test patterns that are to b
41、e reused for cores in an SoC test flow. CTL provides the language for communication of test information. An adjacent IEEE standard activity (IEEE Std 1500TM-2005)1 defines the information requirements of the core provider that are required to be represented in CTL. As a result of this relationship w
42、ith IEEE Std 1500-2005, CTL has some constructs that 1For information on references, see Clause 2. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo rep
43、roduction or networking permitted without license from IHS -,-,- IEEE Std 1450.6-2005IEEE STANDARD TEST INTERFACE LANGUAGE (STIL) FOR 2Copyright 2006 IEEE. All rights reserved are there to support IEEE Std 1500-2005s informational requirements for wrapped and unwrapped cores. In an SoC flow (where c
44、ores are reused in SoCs), CTL represents all of the test information about the core such that the core can be successfully embedded in the SoC from a test perspective. CTL is a language that provides the information about the structures in the core that are to be reused at the next level of integrat
45、ion. Test reuse is also about the reuse of test patterns. As a result, CTL allows for the description of reusable test patterns (portable tests). CTL leverages existing standard representations. The CTL language is the union of the syntax defined in IEEE Std 1450TM-1999, IEEE Std 1450.1TM-2005, IEEE
46、 Std 1450.2TM-2002, and this standard. CTL extends the definitions defined in IEEE Std 1450-1999 and IEEE Std 1450.1-2005 with extensions and exceptions defined in this standard. The reader is assumed to have knowledge of these standards, and their associated content is not repeated or explained in
47、this standard. CTL has the following characteristics to support the SoC test: a)CTL can describe constructs to handle a wide variety of cores. b)CTL does not limit the test methodologies of the core provider. c)CTL can describe IEEE Std 1500-2005 wrapped and unwrapped cores. (Refer to the associated
48、 standard for details.) 1)Unwrapped cores can be described in CTL to aid in the creation of the wrapper. 2)Wrapped cores can be described in CTL to allow for the reuse of the wrapper in the integrated SoC. 2)CTL describes the patterns of the wrapped or unwrapped core such that modifications can be made to the core for application from the SoC boundary. CTL handles this variety of needs by providing a test mode structure