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1、The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2000 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 21 July 2000. Printed in the United States of America. Print: ISBN 0-7381-1968-7 SH9482
2、6 PDF: ISBN 0-7381-1969-5 SS94826 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1538-2000 (R2005) IEEE Guide for Determination of Maximum Winding Temperature Rise in Liquid-Fi
3、lled Transformers Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 21 June 2000 Reaffirmed 6 December 2005 IEEE-SA Standards Board Abstract: Provides guidance for determining the hottest-spot temperature in distribution and power transformers built in accordance with IEE
4、E Std C57.12.00-2000. Describes the important criteria to be evaluated by an thermal model that can accurately predict the hottest-spot temperatures in a transformer. Provides guidance for performing temperature-rise tests with direct measurement of the hottest-spot temperatures, and explains the im
5、portance of developing an accurate thermal mod- el to properly locate the temperature sensors. Keywords: distribution transformer, hottest-spot temperature, power transformers. temperature- rise test, thermal model IEEE Standards documents are developed within the IEEE Societies and the Standards Co
6、ordinat- ing Committees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subjec
7、t within the Institute as well as those activities outside of IEEE that have expressed an inter- est in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measu
8、re, purchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of
9、the standard. Every IEEE Standard is sub- jected to review at least every fi ve years for revision or reaffi rmation. When a document is more than fi ve years old and has not been reaffi rmed, it is reasonable to conclude that its contents, although still of some value, do not wholly refl ect the pr
10、esent state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affi liation with IEEE. Suggestions for changes in documents should be in
11、the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specifi c applications. When the need for interpretations is brought to the attention of IEEE, the
12、Institute will initiate action to prepare appropriate responses. Since IEEE Standards rep- resent a consensus of all concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societ
13、ies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Stan
14、dards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA IEEE is the sole entity that may authorize the use of certifi cation marks, trademarks, or other desig- nations to indicate compliance with the materials set forth herein. Authorization to photocopy portions of any individual stan
15、dard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Dri
16、ve, Danvers, MA 01923 USA; Note: Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection
17、therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. -,-,- Copyright 2000 IEEE. All rights reserved. iii Introducti
18、on (This introduction is not part of IEEE Std 1538-2000, IEEE Guide for Determination of Maximum Winding Temperature Rise in Liquid-Filled Transformers.) It is required by IEEE Std C57.12.00-1993 that the hottest-spot temperature rise not exceed 80 C. The hottest-spot temperature rise at rated load
19、is a necessary parameter for determining the loading capability of all transformers. Since there was no approved test or calculation method to demonstrate compliance with the IEEE standard, an IEEE Working Group on Hottest-Spot Temperature Rise Determination in Liquid-Filled Transformers was formed
20、to develop this guide. This guide provides information to determine the maximum (hottest-spot) temperature rise by calculation and testing. Modern computer technology permits calculation of hottest-spot temperature. Most manufactur- ers use computers for their design calculations, and it is reasonab
21、le to incorporate a thermal subroutine into the programs that would calculate hottest-spot temperature rises. Current personal computers have capabili- ties that were present only in mainframe computers decades ago. Fiber-optic temperature sensors now per- mit direct measurement of the temperature o
22、f a specifi c point. By prior analysis of the winding, the sensor can be placed to read the maximum winding temperature. For distribution transformers, thermal testing may be conducted using embedded thermocouples. This guide applies to liquid-fi lled power, network, and distribution transformers ma
23、nufactured in accordance with IEEE Std C57.12.00-1993. Although thermal gradients may be low in properly designed small (1025 kVA) distribution transformers, the thermal gradients may not be low in the wide range of transformers classifi ed as distribution transformers, which may extend in range to
24、5000 kVA. IEEE standards documents are classifi ed as a) Standards: documents with mandatory requirements. b) Recommended practices: documents in which procedures and positions preferred by the IEEE are presented. c) Guides: documents in which alternative approaches to good practice are suggested bu
25、t no clear-cut recommendations are made. This document is classifi ed as a guide. Documents with mandatory requirements such as standards use the verb shall whereas the other documents use the word should . This practice is followed in this guide unless the requirements are mandatory in IEEE Std C57
26、.12.00-1993. Mandatory requirements taken from IEEE Std C57.12.00-1993 are enclosed in quotation marks. iv Copyright 2000 IEEE. All rights reserved. This guide was produced by the IEEE Working Group on Hottest-Spot Temperature Rise Determination for Liquid-Immersed Transformers. At the time the guid
27、e was approved, it had the following membership: D. W. Platts , Chair The following members of the balloting committee voted on this standard: D. Aho J. Artega R. L. Barker M. F. Barnes B. L. Beaster P. Bisbee W. E. Boettger D. J. Cash J. M. Christini D. Chu R. M. Del Vecchio D. J. Fallon P. T. Fegh
28、ali S. Foss D. L. Galloway A. Ghafourian D. F. Goodwin R. L. Grubb A. C. Hall E. Hanique K. R. Highton J. Hunt V. C. Jhonsa S. R. Lindgren M. C. Loveless A. C. McCain S. E. Michael H. R. Moore D. E. Orten L. W. Pierce R. L. Plaster H. W. Shertukde H. J. Sim J. W. Smith S. C. Tuli F. N. Weffer R. J.
29、Whearty C. Wickersham S.H. Aguirre Dennis J. Allan Raymond Allustiarti Glenn Andersen Jim Antweiler Jacques Aubin Peter M. Balma Ron L. Barker Mike Barnes A. Bartek William H. Bartley Martin Baur B. L. Beaster Edward A. Bertolini Enrique Betancourt Thomas E. Blackburn, III William E Boettger Alain B
30、olliger John D. Borst Donald J. Cash B. Chiu Peter W. Clarke John N. Davis Bob Del Vecchio Dieter Dohnal J. C. Duart Fred E. Elliott Reto H. Fausch Michael A. Franchek J. D. Fyvie Dudley L. Galloway Harry D. Gianakouros Donald A. Gillies Richard D. Graham Robert L. Grunert Michael E. Haas Ernst Hani
31、que N. Wayne Hansen Kenneth S. Hanus James H. Harlow Robert H. Hartgrove R. R. Hayes William R. Henning George E. Henry Keith R. Highton R. Hollingsworth Philip J. Hopkinson James D. Huddleston, III John O. Hunt Rowland I. James Virendra Jhonsa Charles W. Johnson Lars-Erik Juhlin Joseph J. Kelly Vla
32、dimir Khalin Lawrence A. Kirchner Brian Klaponski Neil J. Kranich Barin Kumar Stephen R. Lambert J. P. Lazar Singson Lee Mark Loveless Larry A. Lowdermilk Donald L. Lowe Thomas Lundquist Joe D. MacDonald Don MacMillan William A. Maguire John W. Matthews Nigel P. McQuin Charles Patrick McShane Joe Me
33、lanson Sam Michael C. Kent Miller Gary N. Miller Harold R. Moore Daniel H. Mulkey R. J. Musil Shantanu Nandi E. T. Norton Paul E. Orehek Klaus Papp B. K. Patel Dhiru S. Patel Wesley F. Patterson Jesse M. Patton Mark D. Perkins Linden W. Pierce Paul Pillitteri R. Leon Plaster Donald W. Platts Bertran
34、d Poulin G. Preininger George J. Reitter J. C. Riboud John R. Rossetti Vallamkonda Sankar Subhas Sarkar Rick Sawyer Pat Scully Dilipkumar Shah Hyeong Jin Sim James E. Smith Jerry W. Smith Stephen D. Smith Tarkeshwar Singh Steven L. Snyder Ronald J. Stahara Craig L. Stiegemeier Ron W. Stoner Richard
35、E. Sullivan John C. Sullivan Thomas P. Traub Al Traut Subhash C. Tuli Joseph J. Vaschak Robert A. Veitch Loren B. Wagenaar Barry H. Ward Joe D. Watson Robert Whearty Christopher Wickersham A. L. Wilks B. Scott Wilson William G. Wimmer -,-,- Copyright 2000 IEEE. All rights reserved. v When the IEEE-S
36、A Standards Board approved this standard on 21 June 2000, it had the following membership: Donald N. Heirman, Chair James T. Carlo, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Donald
37、R. Volzka, TAB Representative Noelle D. Humenick IEEE Standards Project Editor Satish K. Aggarwal Mark D. Bowman Gary R. Engmann Harold E. Epstein H. Landis Floyd Jay Forster* Howard M. Frazier Ruben D. Garzon James H. Gurney Richard J. Holleman Lowell G. Johnson Robert J. Kennelly Joseph L. Koepfi
38、nger* Peter H. Lips L. Bruce McClung Daleep C. Mohla James W. Moore Robert F. Munzner Ronald C. Petersen Gerald H. Peterson John B. Posey Gary S. Robinson Akio Tojo Donald W. Zipse -,-,- vi Copyright 2000 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.References 2 3.De
39、finitions 2 4.Test methods 4 4.1 Direct measurement by fiber optic detectors. 4 4.2 Direct measurement by thermocouples 4 4.3 Prototype test data 5 4.4 Test windings. 5 5.Mathematical models to predict temperature distributions and hottest-spot rises. 5 5.1 Fundamentals. 5 5.2 Radiator or heat excha
40、nger heat transfer . 6 5.3 Fluid flow within the winding 6 5.4 Fluid flow between heat exchangers and winding. 6 5.5 Loss distribution. 6 5.6 Conduction heat transfer 6 5.7 Considerations for core-form power transformers. 6 5.8 Considerations for distribution and small power transformers 8 6.Determi
41、nation of hottest-spot rise from production thermal tests without direct measurement of hottest-spot temperature 10 7.Documentation and acceptance criteria. 11 Annex A (informative) Bibliography on experimental testing to predict or confirm transformer thermal performance 12 Annex B (informative) Bi
42、bliography on modeling of transformer thermal performance. 15 Annex C (informative) Determination of hottest-spot rise from tests without direct measurement . 19 Copyright 2000 IEEE. All rights reserved. 1 IEEE Guide for Determination of Maximum Winding Temperature Rise in Liquid-Filled Transformers
43、 1. Overview 1.1 Scope This guide provides guidance for developing mathematical models and test programs to determine the steady state maximum (hottest-spot) and average winding temperature rise over ambient for all liquid-immersed distribution, power, network, and regulating transformers manufactur
44、ed in accordance with IEEE Std C57.12.00-2000. 1 1.2 Purpose IEEE Std C57.12.00-2000, subclause 5.11.1.1, states, “the maximum (hottest-spot) winding temperature rise above ambient temperature shall be determined by either a) Direct measurement during a thermal test in accordance with IEEE Std C57.1
45、2.90-1999. A suffi cient number of direct reading sensors should be used at expected locations of the maximum temperature rise as indicated by prior testing or loss and heat transfer calculations. b)Direct measurement on an exact duplicate transformer design per a). c)Calculations of the temperature
46、s throughout each active winding and all leads. The calculation method shall be based on fundamental loss and heat transfer principles and substantiated by tests on production or prototype transformers or windings.” This guide describes recommendations for a manufacturers test program or mathematica
47、l model to demon- strate compliance with the above requirements. 1 Information on references can be found in Clause 2. -,-,- IEEE Std 1538-2000IEEE GUIDE FOR DETERMINATION OF MAXIMUM WINDING 2 Copyright 2000 IEEE. All rights reserved. 2. References This guide should be used in conjunction with the f
48、ollowing publications. When the following publications are superseded by an approved revision, the revision should apply. IEEE Std C57.12.00-2000, IEEE Standard General Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers. 2 IEEE Std C57.12.80-1978 (Reaff 1992), IEEE Sta
49、ndard Terminology for Power and Distribution Transformers. IEEE Std C57.12.90-1999, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regu- lating Transformers and IEEE Guide for Short-Circuit Testing of Distribution and Power Transformers. 3. Defi nitions 3.1 average winding temperature rise: The arithmetic difference between the average winding temperature and the ambient temperature as determ