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1、IEEE Std 802.16/Conformance03-2004 (Conformance to IEEE Std 802.16-2001 as amended by IEEE Std 802.16a-2003 and IEEE Std 802.16c-2002) IEEE Standards 802.16 TM Conformance IEEE Standard for Conformance to IEEE 802.16 Part 3: Radio Conformance Tests (RCT) for 1066 GHz WirelessMAN-SC Air Interface 3 P
2、ark Avenue, New York, NY 10016-5997, USA IEEE Computer Society and the IEEE Microwave Theory and Techniques Society Sponsored by the LAN/MAN Standards Committee IEEE Standards 25 June 2004 Print: SH95239 PDF: SS95239 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by I
3、HS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std 802.16/Conformance03-2004 (Conformance to IEEE Std 802.16-2001 as amended by IEEE Std 802.16a-2003 and I
4、EEE Std 802.16c-2002 IEEE Standard for Conformance to IEEE 802.16 Part 3: Radio Conformance Tests (RCT) for 1066 GHz WirelessMAN-SC Air Interface Sponsors LAN/MAN Standards Committee of the IEEE Computer Society and the IEEE Microwave Theory and Techniques Society Approved 12 May 2004 IEEE-SA Standa
5、rds Board Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Ele
6、ctrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 25 June 2004. Printed in the United States of America. IEEE, 802, and WirelessMAN are registered trademarks
7、 in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matte
8、r covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conductin
9、g inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo r
10、eproduction or networking permitted without license from IHS -,-,- ivCopyright 2004 IEEE. All rights reserved. Introduction This is the third of a set of standards specifying test methods for demonstrating conformance to IEEE Standard 802.16. It represents the Radio Conformance Tests (RCT) for confo
11、rmance specification of base stations and subscriber stations based upon the WirelessMAN-SC (1066 GHz) air interface specified in IEEE Standard 802.16. The work was developed within the IEEE 802.16 Working Group beginning in March 2003. Patents Attention is called to the possibility that implementat
12、ion of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license
13、 may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Conformance test methodology The multipart conformance test documents for IEEE Standard 802.16 are identified by “IEEE Standard 802.16/ConformanceXX”.
14、 For example, the first part of the conformance specification for IEEE 802.16 is designated “IEEE Standard 802.16/Conformance01”. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.
15、html. Users are encouraged to check this URL for errata periodically Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. (This introduction is not a part of IEEE Std 802.16/Conformance03-2004, IEEE Standard for Confo
16、rmance to IEEE Standard 802.16 Part 3: Radio Conformance Tests (RCT) for 1066 GHz WirelessMAN-SC Air Interface.) Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008
17、03:18:59 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2004 IEEE. All rights reserved.v Participants This document was developed by the IEEE 802.16 Working Group on Broadband Wireless Access, which is responsible for Wireless Metropolitan Area Network (WirelessM
18、AN) Standards: IEEE 802.16 Working Group Officers Roger B. Marks, Chair Kenneth Stanwood, Vice Chair Dean Chang, Secretary Primary development was carried out by the Working Groups Task Group C: Task Group C Officers Kenneth Stanwood, Chair Lars Lindh, Technical Editor The following members of the I
19、EEE 802.16 Working Group on Broadband Wireless Access participated in the Working Group Letter Ballot in which the draft of this standard was approved: The following individual members of the balloting committee voted on this standard. Balloters may have voted for approval or disapproval, or abstain
20、ing. Aditya Agrawal Gordon Antonello Reza Arefi Eli Avivi Dean Chang Naftali Chayat Rmi Chayer Stephen Dick Brian Edmonston Brian Eidson Henry Eilts Carl Eklund Marc Engels Avraham Freedman G. Jack Garrison Marianna Goldhammer Zion Hadad David Johnston Panyuh Joo Tal Kaitz Phil Kelly Ofer Kelman Bri
21、an Kiernan Itzik Kitroser Changhoi Koo Jonathan Labs Yigal Leiba Barry Lewis Lingjie Li John Liebetreu Lars Lindh Hui-Ling Lou Roger B. Marks Russell McKown Andrew Middleton Ronald Murias Robert Nelson Kamlesh Rath Gene Robinson Yossi Segal James Simkins Kenneth Stanwood Carl Stevenson Yoshihiro Suz
22、uki Shawn Taylor David Trinkwon Rainer Ullmann Nico van Waes Eyal Verbin Lei Wang Philip Whitehead Vladimir Yanover John Barnett Harry Bims Naftali Chayat Aik Chindapol Todor Cooklev Dr. Guru Dutt Dhingra Thomas Dineen Dr. Sourav Dutta Avraham Freedman Theodore Georgantas Andrew Germano Zion Hadad R
23、aj Jain Efthymios Karabetsos Kevin Karcz Stuart Kerry Brian Kiernan Christina Lim Randolph Little Gregory Luri Roger Marks Kevin Marquess Russell McKown Ingolf Meier George Miao Yinghua Min Michael Newman Charles Ngethe Roger Pandanda Subbu Ponnuswamy Vikram Punj Eugene Robinson Yoram Solomon Kennet
24、h Stanwood Carl Stevenson Scott Valcourt Stanley Wang Hung-yu Wei Menzo Wentink Oren Yuen Surong Zeng Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MD
25、TNo reproduction or networking permitted without license from IHS -,-,- viCopyright 2004 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 12 May 2004, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member E
26、meritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan Cookson, NIST Representative Michelle Turner IEEE Standards Project Editor Chuck Adams H. Stephen Berger Mark D. Bowman Joseph A. Brude
27、r Bob Davis Roberto de Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Hermann Koch Thomas J. McGean Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson Frank Stone Malc
28、olm V. Thaden Doug Topping Joe D. Watson Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo reproduction or networking permitted without license from
29、 IHS -,-,- Copyright 2004 IEEE. All rights reserved.vii CONTENTS 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.References 2 3.Definitions and Abbreviations. 2 3.1 Definitions . 2 3.2 Abbreviations. 2 4.Measurement System. 3 4.1 General Requirements 3 4.2 Test Conditions 4 4.2.1Test Under Normal Environm
30、ental Conditions. 4 4.2.2Testing Under Extreme Environmental Conditions. 4 5.Required Tests . 5 6.Test Procedures 6 6.1 Tests for the Subscriber Station. 7 6.1.1RS Outer Code t = 10 / BCC - Frame Control TP/SS/PHYDL/FC/CA000 7 6.1.1.1Test Setup 7 6.1.1.2Test Procedure . 7 6.1.2RS Outer Code Other Bu
31、rsts TP/SS/PHYDL/RS/CA000-001 8 6.1.2.1Test Setup 8 6.1.2.2Test Procedure . 8 6.1.3Fixed Codeword Operation TP/SS/PHYDL/FCO/CA000 9 6.1.3.1Test Setup 9 6.1.3.2Test Procedure . 9 6.1.4Shortened Last Codeword Operation TP/SS/PHYDL/SC/CA000 10 6.1.4.1Test Setup 10 6.1.4.2Test Procedure . 10 6.1.5Burst
32、Preamble TP/SS/PHYDL/BP/CA000 11 6.1.5.1Test Setup 11 6.1.5.2Test Procedure . 11 6.1.6Modulation TP/SS/PHYDL/M/CA000-002 12 6.1.6.1Test Setup 12 6.1.6.2Test Procedure . 12 6.1.7RS Outer Code - Information Block Length TP/SS/PHYDL/IBL/CA000 12 6.1.7.1Test Setup 12 6.1.7.2Test Procedure . 13 6.1.8Rand
33、omization with Programmable seed TP/SS/PHYUL/RPS/CA000 13 6.1.8.1Test Setup 13 6.1.8.2Test Procedure . 14 6.1.9RS Outer Coder - Initial Ranging TP/SS/PHYUL/IR/CA000. 15 6.1.9.1Test Setup 15 6.1.9.2Test Procedure . 15 6.1.10 RS Outer Code Other Bursts TP/SS/PHYUL/RS/CA000 . 16 6.1.10.1 Test Setup 16
34、Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo reproduction or networking permitted without license from IHS -,-,- viiiCopyright 2004 IEEE. All r
35、ights reserved. 6.1.10.2 Test Procedure . 16 6.1.11 Fixed Codeword Operation TP/SS/PHYUL/FCO/CA000 17 6.1.11.1 Test Setup 17 6.1.11.2 Test Procedure . 17 6.1.12 Shortened Last Codeword Operation TP/SS/PHYUL/SC/CA000 18 6.1.12.1 Test Setup 18 6.1.12.2 Test Procedure . 18 6.1.13 BCC Inner Code TP/SS/P
36、HYUL/BCC/CA000. 19 6.1.13.1 Test Setup 19 6.1.13.2 Test Procedure . 19 6.1.14 Burst Preamble TP/SS/PHYUL/BP/CA000 20 6.1.14.1 Test Setup 20 6.1.14.2 Test Procedure . 20 6.1.15 Modulation TP/SS/PHYUL/M/CA000-002 21 6.1.15.1 Test Setup 21 6.1.15.2 Test Procedure . 21 6.1.16 RS Outer Code - Information
37、 Block Length TP/SS/PHYUL/IBL/CA000 22 6.1.16.1 Test Setup 22 6.1.16.2 Test Procedure . 22 6.1.17 Tx Dynamic Range TP/SS/PHYMP/TDR/CA000 23 6.1.17.1 Test Setup 23 6.1.17.2 Test Procedure . 23 6.1.18 Rx Dynamic Range TP/SS/PHYMP/RDR/CA000 24 6.1.18.1 Test Setup 24 6.1.18.2 Test Procedure . 24 6.1.19
38、Tx Power Level at Maximum Power Level Setting TP/SS/PHYMP/TXP/CA000. 25 6.1.19.1 Test Setup 25 6.1.19.2 Test Procedure . 25 6.1.20 Tx Power Level Adjustment Step Accuracy TP/SS/PHYMP/ASA/CA000-004 26 6.1.20.1 Test Setup 26 6.1.20.2 Test Procedure . 26 6.1.21 Symbol Timing Accuracy TP/SS/PHYMP/STA/CA
39、000-001. 27 6.1.21.1 Test Setup 27 6.1.21.2 Test Procedure . 27 6.1.22 Tx Burst Timing TP/SS/PHYMP/BT/CA000 28 6.1.22.1 Test Setup 28 6.1.22.2 Test Procedure . 28 6.1.23 Carrier Frequency TP/SS/PHYMP/CF/CA000 . 29 6.1.23.1 Test Setup 29 6.1.23.2 Test Procedure . 29 6.1.24 Spectral Mask TP/SS/PHYMP/S
40、M/CA000. 30 6.1.24.1 Test Setup 30 6.1.24.2 Test Procedure . 30 6.1.25 Ramp Up / Down Time TP/SS/PHYMP/RUD/CA000 . 31 6.1.25.1 Test Setup 31 6.1.25.2 Test Procedure . 31 6.1.26 Output Noise Power Spectral Density When Tx is not Transmitting TP/SS/PHYMP/ON/CA00. 32 6.1.26.1 Test Setup 32 6.1.26.2 Tes
41、t Procedure . 32 6.1.27 Modulation Accuracy TP/SS/PHYMP/MA/CA000-004. 33 6.1.27.1 Test Setup 33 6.1.27.2 Test Procedure . 33 6.1.28 BER Performance Threshold TP/SS/PHYMP/BER/CA000-006 34 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELice
42、nsee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 03:18:59 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2004 IEEE. All rights reserved.ix 6.1.28.1 Test Setup 34 6.1.28.2 Test Procedure . 34 6.1.29 Transition Time From Tx to Rx and From R
43、x to Tx TP/SS/PHYMP/TT/CA000-001. 35 6.1.29.1 Test Setup 35 6.1.29.2 Test Procedure . 35 6.1.30 1st Adjacent Channel Interference TP/SS/PHYMP/1AC/CA000-011 36 6.1.30.1 Test Setup 36 6.1.30.2 Test Procedure . 36 6.1.31 2nd Adjacent Channel Interference TP/SS/PHYMP/2AC/CA000-011. 37 6.1.31.1 Test Setu
44、p 37 6.1.31.2 Test Procedure . 38 6.1.32 Tx Power Level Absolute Accuracy TP/SS/PHYMP/PAA/CA000 39 6.1.32.1 Test Setup 39 6.1.32.2 Test Procedure . 39 6.2 Tests for the Base Station 40 6.2.1RS Outer Code t = 10 / BCC - Frame Control TP/BS/PHYDL/FC/CA000 40 6.2.1.1Test Setup 40 6.2.1.2Test Procedure
45、. 40 6.2.2RS Outer Code Other Bursts TP/BS/PHYDL/RS/CA000. 41 6.2.2.1Test Setup 41 6.2.2.2Test Procedure . 41 6.2.3Fixed Codeword Operation TP/BS/PHYDL/FCO/CA000 42 6.2.3.1Test Setup 42 6.2.3.2Test Procedure . 42 6.2.4Shortened Last Codeword Operation TP/BS/PHYDL/SC/CA000 43 6.2.4.1Test Setup 43 6.2
46、.4.2Test Procedure . 43 6.2.5Burst Preamble TP/BS/PHYDL/BP/CA000 44 6.2.5.1Test Setup 44 6.2.5.2Test Procedure . 44 6.2.6Modulation TP/BS/PHYDL/M/CA000-002 45 6.2.6.1Test Setup 45 6.2.6.2Test Procedure . 45 6.2.7RS Outer Code - Information Block Length TP/BS/PHYDL/IBL/CA000 . 46 6.2.7.1Test Setup 46
47、 6.2.7.2Test Procedure . 46 6.2.8Randomization with Programmable Seed TP/BS/PHYUL/RPS/CA000. 47 6.2.8.1Test Setup 47 6.2.8.2Test Procedure . 47 6.2.9RS Outer Code - Initial ranging TP/BS/PHYUL/IR/CA000. 48 6.2.9.1Test Setup 48 6.2.9.2Test Procedure . 48 6.2.10 RS Outer Code Other Bursts TP/BS/PHYUL/
48、RS/CA000-001 49 6.2.10.1 Test Setup 49 6.2.10.2 Test Procedure . 49 6.2.11 Fixed Codeword Operation TP/BS/PHYUL/FCO/CA000 50 6.2.11.1 Test Setup 50 6.2.11.2 Test Procedure . 50 6.2.12 Shortened Last Codeword Operation TP/BS/PHYUL/SC/CA000 51 6.2.12.1 Test Setup 51 6.2.12.2 Test Procedure . 51 6.2.13 BCC Inner Code TP/BS/PHYUL/BCC/CA000. 52 6.2.13.1 Test Setup 52 6.2.13.2 Test Procedure . 52 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELic