IEC-61298-3-2008.pdf

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1、 IEC 61298-3 Edition 2.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Process measurement and control devices General methods and procedures for evaluating performance Part 3: Tests for the effects of influence quantities Dispositifs de mesure et de commande de processus Mthodes et procdures

2、gnrales dvaluation des performances Partie 3: Essais pour la dtermination des effets des grandeurs dinfluence IEC 61298-3:2008 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:12:01 MSTNo reproductio

3、n or networking permitted without license from IHS -,-,- THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, i

4、ncluding photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address bel

5、ow or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie e

6、t les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI

7、 de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrica

8、l, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. ? Catalogue of IEC publications: www.iec.ch/se

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12、t us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies appare

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15、 nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. ? Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 term

16、es et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. ? Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette

17、publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2

18、009 19:12:01 MSTNo reproduction or networking permitted without license from IHS -,-,- IEC 61298-3 Edition 2.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Process measurement and control devices General methods and procedures for evaluating performance Part 3: Tests for the effects of influe

19、nce quantities Dispositifs de mesure et de commande de processus Mthodes et procdures gnrales dvaluation des performances Partie 3: Essais pour la dtermination des effets des grandeurs dinfluence INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE U ICS 25.040.40 PRI

20、CE CODE CODE PRIX ISBN 2-8318-1003-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Res

21、ale, 01/29/2009 19:12:01 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 61298-3 IEC:2008 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references .7 3 Terms and definitions .8 4 General considerations.9 4.1 Criteria9 4.2 General procedures.10 4.3 General EMC r

22、equirements .10 5 Ambient temperature effects.11 5.1 Criteria11 5.2 Test procedure11 6 Ambient relative humidity effects 12 7 Vibration.12 7.1 General considerations12 7.2 Initial resonance search 14 7.3 Endurance conditioning by sweeping.14 7.4 Final resonance search .14 7.5 Final measurements14 8

23、Shock, drop and topple.14 9 Mounting position .15 10 Over-range.15 11 Output load effects .16 11.1 Electrical output 16 11.2 Pneumatic output 16 12 Power supply16 12.1 Supply voltage and frequency variations.16 12.2 Transient supply voltage effects .17 12.3 Supply voltage depression17 12.4 Short-ter

24、m supply voltage interruptions.18 12.5 Fast transient/burst immunity requirements.19 12.6 Surge immunity requirements .19 12.7 Reverse supply voltage protection (d.c. devices) 20 12.8 Supply pressure variations20 12.9 Supply pressure interruptions .20 12.10 Conducted radio frequency requirements21 1

25、3 Superimposed voltages 21 13.1 Line to earth voltages21 13.2 Line to line voltages (series mode) 21 13.3 Earthing 21 14 Harmonic distortion effects .21 15 Magnetic field effects22 16 Electromagnetic field immunity test 23 17 Electrostatic discharge .24 Copyright International Electrotechnical Commi

26、ssion Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:12:01 MSTNo reproduction or networking permitted without license from IHS -,-,- 61298-3 IEC:2008 3 18 Effect of open-circuited and short-circuited input 25 19 Effect of open-circuited and short-ci

27、rcuited output 25 20 Effects of process medium conditions.25 20.1 Temperature of process fluid.25 20.2 Flow of process fluid through the device26 20.3 Static line pressure effect26 21 Atmospheric pressure effects .27 22 Flow of purge gas through the device .27 23 Accelerated operational life test27

28、24 Operational long-term drift test (optional) .27 Bibliography29 Figure 1 Arrangement for supply voltage depression or interruption tests.18 Figure 2 Arrangement for harmonic distortion effects test 22 Figure 3 Examples of application of the test field .23 Figure 4 Test set-up of the effects of sta

29、tic pressure26 Figure 5 Time schedule of input changes and changes of ambient temperature .28 Table 1 Ambient temperature test ranges.11 Table 2 Vibration test levels.13 Table 3 Power supply classes (IEC 60654-2) .17 Table 4 Power supply commutations-interruptions (IEC 60654-2).18 Table 5 Burst char

30、acteristics (IEC 61326-1).19 Table 6 Surge characteristics (IEC 61326-1)20 Table 7 Conducted RF characteristics (IEC 61326-1).21 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:12:01 MSTNo reproduct

31、ion or networking permitted without license from IHS -,-,- 4 61298-3 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION PROCESS MEASUREMENT AND CONTROL DEVICES GENERAL METHODS AND PROCEDURES FOR EVALUATING PERFORMANCE Part 3: Tests for the effects of influence quantities FOREWORD 1) The Internationa

32、l Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic f

33、ields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any

34、IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardi

35、zation (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has repres

36、entation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC

37、cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publica

38、tions. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an I

39、EC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal inju

40、ry, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references c

41、ited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identif

42、ying any or all such patent rights. International Standard IEC 61298-3 has been prepared by sub-committee 65B: Devices and process analysis, of IEC technical committee 65: Industrial-process measurement, control and automation. This second edition cancels and replaces the first edition published in

43、1998. This second edition constitutes a technical revision. This edition is a general revision with respect to the previous edition and does not include any significant changes (see Introduction). Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boei

44、ng Co/5910770001 Not for Resale, 01/29/2009 19:12:01 MSTNo reproduction or networking permitted without license from IHS -,-,- 61298-3 IEC:2008 5 The text of this standard is based on the following documents: FDIS Report on voting 65B/687/FDIS 65B/695/RVD Full information on the voting for the appro

45、val of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61298 series, under the general title Process measurement and control devices General methods an

46、d procedures for evaluating performance, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publicatio

47、n. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 19:12:01 MSTNo reproduction or networking per

48、mitted without license from IHS -,-,- 6 61298-3 IEC:2008 INTRODUCTION This standard is not intended as a substitute for existing standards, but is rather intended as a reference document for any future standard developed within the IEC, or other standards organizations, concerning the evaluation of process instrumentation. Any revision of existing standards should take this standard into

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