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1、 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2001 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 9 March 2001. Printed in the United States of America. Print: ISBN 0-7381-2734-5 SH949
2、07 PDF: ISBN 0-7381-2735-3 SS94907 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std C57.12.91-2001 (Revision of IEEE Std C57.12.91-1995) IEEE Standard Test Code for Dry-Type Dist
3、ribution and Power Transformers Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 9 January 2001 IEEE-SA Standards Board Abstract: Methods for performing tests specified in IEEE Std C57.12.01-1998 and other referenced standards applicable to dry-type distribution and powe
4、r transformers are described. This standard is intended for use as a basis for performance, safety, and the proper testing of dry-type distribution and power transformers. This standard applies to all dry-type transformers except instrument transformers, step-voltage and induction voltage regulators
5、, arc furnace transformers, rectifier transformers, specialty transformers, and mine transformers. Keywords: dry-type transformer, power transformer Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/997254
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19、n. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:55:10 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2001 IEEE. All rights
20、 reserved. iii Introduction (This introduction is not a part of IEEE Std C57.12.91-2001, IEEE Standard Test Code for Dry-Type Distribution and Power Transformers.) This revision of IEEE Std C57.12.91-1995 changes Clause 9 only to include the associated leads or bus bar during the measurement of load
21、 loss and the measurement of impedance voltage. The working group, as promised after publication of the 1995 revision, reviewed Subclause10.8 on insula- tion power-factor tests. It is the consensus of the working group that the clause should not be changed from the 1979 revision. Hottest-spot temper
22、ature rise is a performance parameter to be met by the manufacturer to conform to IEEE Std C57.12.01-1998. It is not economically practical to measure hottest-spot temperature rise on the primary and secondary windings of all dry-type transformers. Conformance to average temperature rise limits in I
23、EEE Std C57.12.01-1998 does not automatically assure that hottest-spot temperature rise limits are met, due to the wide range of sizes of transformers covered by IEEE Std C57.12.01-1998. A reduction of average winding temperature rise below the limits may be required to meet hottest-spot temperature
24、 rise limits. Since the publication of IEEE Std C57.12.91-1995, IEEE Std C57.134-2000, IEEE Guide for Determination of Hottest Spot Temperature in Dry Type Transformers has been developed. This guide describes methodologies for determining the steady state winding hottest spot temperature in dry-typ
25、e distribution and power transformers. This standard is a voluntary consensus standard. Its use may become mandatory only when required by a duly constituted legal authority, or when specifi ed in a contractual relationship. To meet specialized needs and to allow innovation, specifi c changes are pe
26、rmissible when mutually determined by the user and the pro- ducer, provided such changes do no violate existing laws, and are considered technically adequate for the function intended. Participants The following is a list of participants in the Working Group. Kal Alout David A. Barnard Max A. Cambre
27、 Frank Croft Derek Foster Michael E. Haas N. Wayne Hansen Roger R. Hayes Robert H. Hollister Philip J. Hopkinson Mike Iman Charles W. Johnson, Jr. Anthony J. Jonnatti Sheldon P. Kennedy Charles E. Kirsch Alexander D. Kline Tim D. Lewis Don Macmillan Richard Marek Michael Mitelman W. E. Morehart Nige
28、l P. McQuin Mark Norton Wesley F. Patterson, Jr. Oskars Petersons Guy Pregent Richard L. Provost Jeewan L. Puri Dilip R. Purohit Mangesh Y. Rajadhyakaha Subhas Sarkar Wes W. Schwartz Ibrahim Shteyh R. William Simpson, Jr. Tarkeshwar Singh John C. Sullivan Vis Thenappan Copyright The Institute of Ele
29、ctrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:55:10 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright 2001 IEEE. All rights reserved. The following perso
30、ns were on the balloting committee: The fi nal conditions for approval of this standard were met on 9 January 2001. This standard was condition- ally approved by the IEEE-SA Standards Board on 7 December 2000, with the following membership: Donald N. Heirman, Chair James T. Carlo, Vice Chair Judith
31、Gorman, Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Donald R. Volzka, TAB Representative Noelle D. Humenick IEEE Standards Project Editor S. H. Aguirre Dennis J. Allan Jim Antweiler Jacques Aubin Donald E. Aye
32、rs Peter M. Balma Ron L. Barker David A. Barnard Mike Barnes A. Bartek Martin Baur Edward A. Bertolini Thomas E. Blackburn, III Alain Bolliger Max A. Cambre Peter W. Clarke Jerry L. Corkran John C. Crouse F. David Robert C. Degeneff Dieter Dohnal Paul R. Drum Donald G. Dunn D. J. Fallon Bruce I. For
33、syth Richard D. Graham Robert L. Grunert Michael E. Haas Ernst Hanique N. Wayne Hansen Keith R. Highton Philip J. Hopkinson James D. Huddleston, III John S. Hurst Mike Iman Charles W. Johnson, Jr. Anthony J. Jonnatti Lars-Erik Juhlin Sheldon P. Kennedy John G. Lackey Stephen R. Lambert J. P. Lazar T
34、im D. Lewis Donald L. Lowe Thomas Lundquist William A. Maguire John W. Matthews Nigel P. McQuin Joe Melanson Gary L. Michel Art Molden Harold R. Moore William H. Mutschler, Jr Paul E. Orehek B. K. Patel Wesley F. Patterson, Jr. Paulette A. Payne Carlos O. Peixoto Linden W. Pierce Paul Pillitteri Don
35、ald W. Platts Jeewan L. Puri Dilip R. Purohit E. Purra Peter G. Risse Mark Rivers John R. Rossetti Vallamkonda Sankar Subhas Sarkar Michael Schacker Wes W. Schwartz Pat Scully Hyeong Jin Sim R. William Simpson, Jr. Tarkeshwar Singh James E. Smith Ronald J. Stahara Frank Stevens Ron W. Stoner Richard
36、 E. Sullivan John C. Sullivan Thomas P. Traub Edger R. Trummer Subhash C. Tuli John Vandermaar Robert A. Veitch B. Scott Wilson William G. Wimmer Satish K. Aggarwal Mark D. Bowman Gary R. Engmann Harold E. Epstein H. Landis Floyd Jay Forster* Howard M. Frazier Ruben D. Garzon James H. Gurney Richard
37、 J. Holleman Lowell G. Johnson Robert J. Kennelly Joseph L. Koepfi nger* Peter H. Lips L. Bruce McClung Daleep C. Mohla James W. Moore Robert F. Munzner Ronald C. Petersen Gerald H. Peterson John B. Posey Gary S. Robinson Akio Tojo Donald W. Zipse Copyright The Institute of Electrical and Electronic
38、s Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:55:10 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2001 IEEE. All rights reserved. v Contents 1.Scope 1 1.1 Purpose. 1 1.2 Word
39、 usage 1 2.References 1 3.Definitions 3 4.General. 3 4.1 Test definitions. 3 4.2 Test requirements. 3 4.3 Test sequence. 3 4.4 Instrumentation 3 5.Resistance measurements. 4 5.1 General. 4 5.2 Determination of cold temperature 4 5.3 Conversion of resistance measurements 4 5.4 Resistance measurement
40、methods 5 6.Polarity and phase-relation tests 6 6.1 Subtractive and additive polarity. 7 6.2 Polarity testssingle-phase transformers 8 6.3 Polarity and phase-relation testspolyphase transformers. 9 7.Ratio tests. 12 7.1 General. 12 7.2 Tolerances for ratio 13 7.3 Ratio test methods 13 8.No-load loss
41、es and excitation current 16 8.1 General. 16 8.2 No-load loss test. 16 8.3 Waveform correction of no-load losses. 19 8.4 Determination of excitation (no-load) current. 19 9.Load losses and impedance voltage. 20 9.1 General. 20 9.2 Factors affecting the values of load losses and impedance voltage. 20
42、 9.3 Tests for measuring load losses and impedance voltage . 21 9.4 Calculation of load losses and impedance voltage from test data . 27 9.5 Zero-phase-sequence impedance. 29 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Te
43、chnical Standards 1/9972545001 Not for Resale, 04/21/2007 11:55:10 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2001 IEEE. All rights reserved. vi 10.Dielectric tests 32 10.1Factory dielectric tests. 32 10.2Dielectric tests in the field. 33 10.3Applied-voltage
44、tests . 33 10.4Induced-voltage tests . 34 10.5Impulse tests. 35 10.6Impulse tests on transformer neutrals 37 10.7Detection of failure during impulse test. 38 10.8Insulation-power-factor tests . 39 10.9Insulation-resistance tests 40 10.10 Partial discharge tests. 41 11.Temperature test. 41 11.1 Gener
45、al . 41 11.2 Ambient temperature measurements 42 11.3 Surface temperature measurements 42 11.4 Cold-resistance measurements. 42 11.5 Hot-resistance measurement. 43 11.6 Calculation of average winding temperature rise. 43 11.7 Correction factors. 44 11.8 Temperature rise test loading methods. 46 12.S
46、hort-circuit tests. 52 12.1 Scope 52 12.2 Short-circuit testing techniques 52 12.3 Test requirements. 58 12.4 Test procedure 58 12.5 Failure detection techniques. 62 12.6 Analysis of test results and visual inspection. 63 12.7 Proof of satisfactory performance 66 12.8 Required information for transf
47、ormer short-circuit test reports. 67 13.Audible sound-level measurements. 67 13.1 General . 67 13.2 Instrumentation. 67 13.3 Test conditions . 68 13.4 Microphone positions. 69 13.5 Sound level measurements. 69 13.6 Optional-frequency analysis measurements. 70 14.Mechanical design tests. 71 14.1 Comp
48、onents involved in lifting or moving 71 14.2 Tests of sealed dry-type transformers 71 15.Calculated data. 72 15.1 Reference temperature 72 15.2 Total losses. 72 15.3 Efficiency . 72 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=
49、NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:55:10 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2001 IEEE. All rights reserved. vii 15.4 Voltage regulation 72 16.Minimum information to be included in certified test data . 73 16.1 Order data. 73 16.2 Rating da