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1、 Reference number ISO 17526:2003(E) ISO 2003 INTERNATIONAL STANDARD ISO 17526 First edition 2003-06-15 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers Optique et instruments doptique Lasers et quipements associs aux lasers Dure de vie des lasers Copyright Interna
2、tional Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) PDF disclaimer This PDF file may contain embed
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5、ere optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO 2003 All rights reserved. Unless otherwise speci
6、fied, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ca
7、se postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2003 All rights reserved Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standa
8、rds 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) ISO 2003 All rights reserved iii Contents Page Forewordiv Introduction v 1 Scope1 2 Normative references .1 3 Terms and definitions.1 3.1 Modes of operatio
9、n.1 3.2 Operating conditions2 3.3 Lifetime related terms.3 3.4 Types and classification.5 3.5 Others.5 4 Symbols and abbreviated terms6 4.1 Symbols .6 4.2 Abbreviated terms.6 5 Test methods.6 5.1 General.6 5.2 Selection of lasers for lifetime testing7 5.3 Lifetime test in APPC- and ACC-mode .7 5.4 L
10、ifetime test at APC-mode .7 5.5 Lifetime tests at limited aperture.8 6 Evaluation and extrapolation.8 7 Test report10 Bibliography .12 Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/
11、2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) iv ISO 2003 All rights reserved Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparin
12、g International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liai
13、son with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of t
14、echnical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is d
15、rawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 17526 was prepared by Technical Committee ISO/TC 172, Optics and optical instruments, Subcommittee SC 9, Electr
16、o-optical systems. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) ISO 2003 A
17、ll rights reserved v Introduction There are many different types of lasers with very different attributes and very different areas of application; not all types of lasers can be treated by the same means and measures to characterize and specify their longterm behaviour and lifetime. This Internation
18、al Standard covers many types of laser, but not all methods and procedures can be applied to all types. There are lasers, primarily laser diodes in the lower power range, which are produced in large quantities and which allow the performance of lifetime tests on large quantities to gain results on a
19、 statistically significant level. In this case and if more than approximately 50 lasers are used for testing, lifetime predictions using informative annex B of IEC 61751:1998, may be applied alternatively to this International Standard. High-power lasers are manufactured in low quantities and lifeti
20、me tests cannot be carried out on statistically significant sample sizes. There are types of laser of which the main components cannot be repaired, e.g. sealed-tube gas lasers or semiconductor lasers. There are others that can easily be repaired, e.g. CO2 lasers. The former class may be characterize
21、d by “lifetime”, the latter more appropriately characterized by “meantime to failure”. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking p
22、ermitted without license from IHS -,-,- Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- INTERNA
23、TIONAL STANDARD ISO 17526:2003(E) ISO 2003 All rights reserved 1 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers 1 Scope This International Standard covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predi
24、ct the longterm behaviour of various types of lasers. This International Standard defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including dio
25、de lasers except those used in telecommunications. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including
26、any amendments) applies. ISO 11145:2001, Optics and optical instruments Lasers and laser-related equipment Vocabulary and symbols ISO 11554:2003, Optics and optical instruments Lasers and laser-related equipment Test methods for laser beam power, energy and temporal characteristics IEC 60050-191:199
27、0, International Electrotechnical Vocabulary. Chapter 191: Dependability and quality of service IEC 61703:2001, Mathematical expressions for reliability, availability, maintainability and maintenance support terms 3 Terms and definitions For the purposes of this document, the terms and definitions g
28、iven in ISO 11145 and the following apply. NOTE For simplicity, in all following parts of this International Standard the term “power” refers to cw or repetitive-cw mode, whereas “energy“ refers to pulse and quasi-cw mode. 3.1 Modes of operation NOTE 1 The following modes of operation define the tem
29、poral and pulsed characteristics of the laser. NOTE 2 There might be modes of operation that are not covered by the subsequent classification. These modes should be described in detail in the test report. 3.1.1 cw-mode mode where the laser emits radiation continuously over periods of time longer tha
30、n or equal to 0,25 s Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) 2 ISO 20
31、03 All rights reserved 3.1.2 repetitive cw-mode mode in which the laser is operated in cw-mode but repetitively switched on and off more than once per minute 3.1.3 pulsed mode mode in which the laser delivers its energy in the form of a single pulse or a train of pulses NOTE 1 The duration of a puls
32、e is shorter than 0,25 s. NOTE 2 The subsequently defined modes of operation (3.1.4 to 3.1.7) are special cases of pulsed mode. 3.1.4 pulse train mode mode in which the laser emits at least 100 subsequent radiation pulses (pulse duration 10 5 % to 10 % 5 10 5 % 7 The extrapolation to achieve lifetim
33、e data is only valid for those lasers that reach a constant (variation u 10 %) degradation rate during the test duration, so that a linear fit is reasonable. All other lasers need to perform the complete time span to achieve a lifetime result. Copyright International Organization for Standardization
34、 Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) 10 ISO 2003 All rights reserved 7 Test report The test results shall be recorded and
35、shall include the following information. Additionally, the test report shall be accompanied by test plots similar to Figure 1. a) General information: 1) test has been performed in accordance with ISO 17526:2003; 2) date of test; 3) name and address of test organization; 4) name of individual perfor
36、ming the test; b) Information concerning the tested laser: 1) laser type; 2) manufacturer; 3) manufacturers model designation; 4) serial number; c) Test conditions: 1) laser wavelength(s) tested at temperature in K (diode laser cooling fluid) (only applicable for diode lasers) 2) operating mode (cw
37、or pulsed) 3) laser parameter settings (those which are applicable): i) output power or energy; ii) current or energy input; iii) pulse energy; iv) pulse duration; v) pulse repetition rate; 4) mode structure; 5) polarization; 6) environmental conditions; d) Information concerning testing and evaluat
38、ion: 1) test method used; 2) detector and sampling system; i) response time of the detector system (if pertinent); ii) trigger delay of sampling (if pertinent); iii) measuring time interval (if pertinent); Copyright International Organization for Standardization Provided by IHS under license with IS
39、O Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) ISO 2003 All rights reserved 11 3) beam forming optics and attenuating method; i) type of attenuator; ii) type of beam spli
40、tter; iii) type of focusing element; 4) other optical components and devices used for the test (polarizer, monochromator, etc.); 5) other relevant parameters or characteristics of the test which have to be chosen (aperture setting, reference plane, reference axis, laboratory system); e) Test results
41、: (Lifetime plots similar to Figure 1 should be included in the test report.) Number of sudden failures: test time elapsed before failure(s): .h Interruption due to maintenance: time of interruption:.h description of maintenance: type of extrapolation and coefficients, if a non-linear extrapolation
42、is used. APPC-/ACC-mode: Total degradation during test period : (P)t: .W standard deviation:.% Final degradation rate: mean value P/t:.W/h standard deviation:.% percentage parameter :. % lifetime: mean value ACCEOL, or APPCEOL,.h standard deviation: h APC-mode: Total degradation during test period :
43、 (I)t: .A standard deviation:.% Final degradation rate: mean value I/t:.A/h standard deviation:.% percentage parameter :. % lifetime: mean value APCEOL,: . h standard deviation:.h Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical
44、Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 17526:2003(E) 12 ISO 2003 All rights reserved Bibliography 1 DORSCH F. and DAIMINGER F.X., Aging test of high-power diode lasers as a basis for an international li
45、fetime standard, SPIE proc. Vol. 2870, pp. 381-389, Quebec 1996 2 DAIMINGER F.X., DORSCH F. and HEINEMANN ST., Aging properties of AlGaAs/GaAs high power diode lasers, SPIE proc. Vol. 3244, pp. 587-595, Boulder, CO 1997 3 ISO 2859 (parts 0 to 4), Sampling procedures for inspection by attributes 4 IS
46、O 11252, Lasers and laser-related equipment Laser device Minimum requirements for documentation 5 ISO 16269-7, Statistical interpretation of data Part 7: Median Estimation and confidence intervals 6 IEC 60319, Presentation and specification of reliability data for electronic components 7 IEC 60410,
47、Sampling plans and procedures for inspection by attributes 8 IEC 61040, Power and energy measuring detectors, instruments and equipment for laser radiation 9 IEC 61751, Laser modules used for telecommunication Reliability assessment Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 21:04:51 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee