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1、Reference number ISO 15579:2000(E) ISO 2000 INTERNATIONAL STANDARD ISO 15579 First edition 2000-06-01 Metallic materials Tensile testing at low temperature Matriaux mtalliques Essai de traction basse temprature Copyright International Organization for Standardization Provided by IHS under license wi
2、th ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 15579:2000(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may
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5、 file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO 2000 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any f
6、orm or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 ? CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 734
7、 10 79 E-mail copyrightiso.ch Web www.iso.ch Printed in Switzerland ii ISO 2000 All rights reserved Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or
8、 networking permitted without license from IHS -,-,- ISO 15579:2000(E) ISO 2000 All rights reservediii ContentsPage Foreword.iv Introduction.v 1Scope 1 2Normative references1 3Terms and definitions .1 4Symbols and designations.4 5Principle4 6Apparatus.5 7Test piece .6 8Testing conditions.6 9Procedur
9、e.7 10Test report9 Annex A (informative) Examples for test pieces for tensile testing at low temperatures .12 Bibliography14 Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03
10、:02 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 15579:2000(E) iv ISO 2000 All rights reserved Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing Internat
11、ional Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with I
12、SO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3. Draft International Standard
13、s adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this International Standard may be
14、 the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. International Standard ISO 15579 was prepared by Technical Committee ISO/TC 164,Mechanical testing of materials, Subcommittee SC 1,Uniaxial testing. Annex A of this International Standard
15、is for information only. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 15579:2000(E) ISO
16、2000 All rights reservedv Introduction It was decided, at the ISO/TC 164/SC 1 meeting of 29th February and 1st March 1996, to define test rate by the strain rate of the parallel length of the test piece. The values taken into account correspond to testing steel products. If this International Standa
17、rd is used for testing non-ferrous metallic materials, it should be verified that the test and rate values apply. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo r
18、eproduction or networking permitted without license from IHS -,-,- Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or networking permitted without lic
19、ense from IHS -,-,- INTERNATIONAL STANDARDISO 15579:2000(E) ISO 2000 All rights reserved1 Metallic materials Tensile testing at low temperature 1Scope This International Standard specifies the method of tensile testing of metallic materials at temperatures between ? 10 C and ? 196 C and defines the
20、mechanical properties which can be determined. 2Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this International Standard. For dated references, subsequent amendments to, or revisions of, any of these publica
21、tions do not apply. However, parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to appl
22、ies. Members of ISO and IEC maintain registers of currently valid International Standards. ISO 7500-1,Metallic materials Verification of static uniaxial testing machines Part 1: Tension/compression testing machines Verification and calibration of the force measuring system. ISO 9513,Metallic materia
23、ls Calibration of extensometers used in uniaxial testing. 3Terms and definitions For the purposes of this International Standard, the following terms and definitions apply. 3.1 gauge length L length of the cylindrical or prismatic portion of the test piece on which elongation shall be measured NOTEI
24、n particular, a distinction is made between the lengths defined in 3.1.1 and 3.1.2. 3.1.1 original gauge length Lo gauge length before application of force measured at ambient temperature 3.1.2 final gauge length Lu gauge length after fracture of the test piece (see 9.3) measured at ambient temperat
25、ure 3.2 parallel length Lc length of the parallel portion of the reduced section of the test piece Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or
26、networking permitted without license from IHS -,-,- ISO 15579:2000(E) 2 ISO 2000 All rights reserved 3.3 extensometer gauge length Le length of the parallel portion of the test piece used for the measurement of elongation by means of an extensometer NOTEThis length may differ from Loand has a value
27、greater than b or d (see Table 1) but less than Lc. 3.4 elongation increase in the original gauge length (Lo) at any moment during the test 3.5 percentage elongation elongation expressed as a percentage of the original gauge length (Lo) 3.6 percentage permanent elongation increase in the original ga
28、uge length of a test piece after removal of a specified stress (see 3.13), expressed as a percentage of the original gauge length (Lo) 3.7 percentage elongation after fracture A permanent elongation of the original gauge length after fracture (Lu? Lo), expressed as a percentage of the original gauge
29、 length (Lo) NOTEIn the case of proportional test pieces, only if the original gauge length is other than o S5,65 1) where Sois the original cross-sectional area of the parallel length should the symbol A be supplemented by an index indicating the coefficient of proportionality used, e.g.: A11,3? pe
30、rcentage elongation of a gauge length (Lo) of o S11,3. In the case of non-proportional test pieces, the symbol A should be supplemented by an index indicating the original gauge length used, expressed in millimetres, e.g.: A80 mm? percentage elongation of a gauge length (Lo) of 80 mm. 3.8 percentage
31、 total elongation at fracture At total elongation (elastic elongation plus plastic elongation) of the gauge length at the moment of fracture expressed as a percentage of the original gauge length (Lo) 3.9 extension increase in the extensometer gauge length (Le) at a given moment of the test 1) ? o 4
32、 5= o 5,65 S S Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 15579:2000(E) ISO 2000 All r
33、ights reserved3 3.10 percentage permanent extension increase in the extensometer gauge length, after removal from the test piece of a specified stress, expressed as a percentage of the extensometer gauge length (Le) 3.11 percentage reduction of area Z maximum change in cross-sectional area which has
34、 occurred during the test (So? Su) expressed as a percentage of the orignal cross-sectional area (So) 3.12 maximum force Fm the maximum force which the test piece withstands during the test after any yielding has taken place NOTEFor brittle materials, it is the maximum value during the test. 3.13 st
35、ress force at any moment during the test divided by the original cross-sectional area (So) of the test piece 3.13.1 tensile strength Rm stress corresponding to the maximum force (Fm) 3.13.2 yield strength when the metallic material exhibits a yield phenomenon, a point during the test at which plasti
36、c deformation occurs without any increase in the force 3.13.2.1 upper yield strength ReH value of stress at which the first decrease in force is observed See Figure 1. 3.13.2.2 lower yield strength ReL lowest value of stress during plastic yielding, ignoring any transient effects See Figure 1. 3.13.
37、3 proof strength, non-proportional extension Rp stress at which the non-proportional extension is equal to a specified percentage of the extensometer gauge length (Le) See Figure 2. NOTEThe symbol used is followed by a suffix giving the prescribed percentage, e.g.: Rp0,2. Copyright International Org
38、anization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 15579:2000(E) 4 ISO 2000 All rights reserved 4Symbols and designations
39、 Symbols and corresponding designations are given in Table 1. Table 1 Symbols and designations SymbolUnitDesignation ammThickness of a flat test piece or wall thickness of a tube bmmWidth of the parallel length of a flat test piece or average width of the longitudinal strip taken from a tube or widt
40、h of flat wire dmmDiameter of the parallel length of a cylindrical test piece or diameter of a circular wire LommOriginal gauge length LummFinal gauge length after fracture LcmmParallel length LemmExtensometer gauge length So mm2 Original cross-sectional area of the parallel length Su mm2 Minimum cr
41、oss-sectional area after fracture (final cross-sectional area) Z%Percentage reduction of area: 100 _ o uo ? S SS A%Percentage elongation after fracture: 100 o ou ? L LL _ At%Percentage total elongation at fracture FmNMaximum force ReH N/mm2 Upper yield strength ReL N/mm2 Lower yield strength Rm N/mm
42、2 Tensile strength Rp N/mm2 Proof strength, non-proportional extension ?CSpecified temperature ?iCIndicated temperature 5Principle The test consists of straining a test piece by a tensile force, generally to fracture, for the purpose of determining one or more of the mechanical properties defined in
43、 clause 3. The test is carried out at a specified temperature which is between?10 C and?196 C. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/19/2007 04:03:02 MDTNo reproduction or netw
44、orking permitted without license from IHS -,-,- ISO 15579:2000(E) ISO 2000 All rights reserved5 6Apparatus 6.1Testing machine The testing machine shall be verified in accordance with ISO 7500-1 and shall be of at least class 1, unless otherwise specified in the product standard. 6.2Extensometer When
45、 using an extensometer to measure the extension, the extensometer shall be of class 1 (see ISO 9513) for the determination of the proof stress for non-proportional elongation; for the determination of other properties (corresponding to higher elongations) an extensometer of class 2 (see ISO 9513) ca
46、n be used. The extensometer gauge length shall be not less than 10 mm and shall be centrally located in the mid-region of the parallel length and along the centre axis. The extensometer should preferably be of the type that is capable of measuring extension on both sides of a test piece thus enablin
47、g the operator to determine the mean of the two readings. Any part of the extensometer projecting beyond the cooling device shall be protected from air currents so that fluctuations in the ambient temperature have only a minimal effect on the readings. It is recommended that reasonable stability of
48、the temperature and speed of the air surrounding the testing machine be maintained. 6.3Cooling device 6.3.1General The cooling device shall be capable of cooling the test piece to the specified temperature ?. The means of cooling can be, for example: ?by refrigeration unit; ?by expansion of compressed gas (e.g. CO2or N2); ?by immersion in a liquid maintained at its boiling point (e.g. N2) or